Abstract: A memory calibration system includes a memory array having a plurality of memory cells, a sensing circuit coupled to the memory array, and calibration circuitry. A pattern of test data is applied to the memory array in order to generate calibration information based on output provided by the first sensing circuit in response to the application of the pattern of test data to the memory array. The generated calibration information is stored in a distributed manner within memory cells of the memory array. Some of the generated calibration information may be combined with data values stored in the plurality of memory cells as part of one or more operations on the stored data values.

Abstract: A distributed computing system for artificial intelligence in autonomously appreciating a circumstance context of a smart device. Raw context data is detected by sensors associated with the smart device. The raw context data is pre-processed by the smart device and then provided to a cloud based server for further processing. At the cloud based server, various sets of feature data are obtained from the pre-processed context data. The various sets of feature data are compared with corresponding classification parameters to determine a classification of a continuous event and/or a classification of transient event, if any, which occur in the context. The determined classification of the continuous event and the transient event will be used to autonomously configure the smart device or another related smart device to fit the context.

Abstract: A successive approximation analog-to-digital converter includes a digital-to-analog converter DAC configured to receive a digital signal. First conversion units of the DAC are configured to sample an analog signal via a first switch and provide a first level voltage. Each first conversion unit includes a first capacitor array and a first switch array controlled from the digital signal. A single second conversion unit of the DAC is configured to provide a second level voltage. The second conversion unit includes a second capacitor array and a second switch array. A comparator operates to compare each of the first level voltages to the second level voltage and to provide a comparison signal based on each comparison and actuation of a set of third switches. A control circuit closes the first switches simultaneously and closes the third switches successively for the conversion of each sampled analog signal.

Abstract: A delay circuit applies a one sample delay to a first digital sinusoid signal and outputs a delayed digital sinusoid signal. The first digital sinusoid signal and the delayed digital sinusoid signal are then added to each other by an adder circuit to generate an added digital sinusoid signal. A gain scaling circuit applies a scaling factor to the added digital sinusoid signal to generate a second digital sinusoid signal. Samples of the first and second digital sinusoid signals are alternately selected by a multiplexing circuit to generate a third digital sinusoid signal having twice as many samples as the first digital sinusoid signal over a same sinusoid period.

Abstract: The disclosure concerns an electronic device comprising a HEMT transistor, called main transistor, and at least another HEMT transistor, called additional transistor, stacked on each other. The main transistor and the additional transistor comprise a common drain electrode and, respectively, a main source electrode and an additional source electrode, arranged so that electric conduction paths likely to be formed by the two conduction layers are connected in parallel when one and the other of the HEMT transistors are in the conductive state.

Abstract: An integrated circuit includes a successive approximation register (SAR) analog-to-digital converter (ADC). The ADC includes a bit step selector. During testing of the ADC, the bit step selector selects a number of bits to be tested for a next analog test voltage based on digital values that are within an integer delta value of most recent digital value for a most recent analog test voltage.

Abstract: A transmission gate circuit for use, for example, as a switching element of an analog multiplexer, includes an input configured to receive an input signal, an output and a control input configured to receive a switch control signal. A transmission gate switch is coupled between the input and the output. A level shifting circuit generates a level shifted switch control signal from the switch control signal, and applies that level shifted switch control signal to a control terminal of the transmission gate switch. The control terminal of the transmission gate switch can instead receive the switch control signal in situations where a voltage of the input signal is suitably high to support linear operation of the transmission gate switch.

Abstract: An integrated circuit die has a peripheral edge and a seal ring extending along the peripheral edge and surrounding a functional integrated circuit area. A test logic circuit located within the functional integrated circuit area generates a serial input data signal for application to a first end of a sensing conductive wire line extending around the seal ring between the seal ring and the peripheral edge of the integrated circuit die. Propagation of the serial input data signal along the sensing conductive wire line produces a serial output data signal at a second end of the sensing conductive wire line. The test logic circuit compares data patterns of the serial input data signal and serial output data signal to detect damage at the peripheral edge of the integrated circuit die.

Abstract: A quad signal generator circuit generates four 2N-1 bit control signals in response to a 2N-1 bit thermometer coded signal. A digital-to-analog converter (DAC) circuit has 2N-1 unit DAC elements, with each unit DAC element including four switching circuits controlled by corresponding bits of the four 2N-1 bit control signals. Outputs of the 2N-1 unit DAC elements are summed to generate an analog output signal. The quad signal generator circuit controls a time delay applied to clock signals relative to the 2N-1 bit thermometer coded signal and a time delay applied to the 2N-1 bit thermometer coded signal relative to the delayed clock signals in logically generating the four 2N-1 bit control signals. The analog output signal may be a feedback signal in a sigma-delta analog-to-digital converter (ADC) circuit that includes a multi-bit quantization circuit operating to quantize a filtered loop signal to generate the 2N-1 bit thermometer coded signal.

Abstract: An integrated circuit includes a pulse width modulator. The pulse width modulator includes a multiplexer that receives a plurality of data delay signals. Each of the data delay signals is based on a data signal and a respective clock phase signal. The multiplexer includes a first multiplexer stage and a second multiplexer stage. The first multiplexer stage receives all of the data delay signals and has a relatively large delay. The second multiplexer stage receives to output signals from the first multiplexer stage and has a relatively small delay. The second multiplexer stage outputs a pulse width modulation signal that can have a pulse width corresponding to the offset between two adjacent clock phase signals.

Abstract: A circuit includes: a first power domain including: an isolation cell, a first selection circuit having inputs for receiving a first functional signal and a first test signal and an output for controlling the isolation cell, and a second selection circuit having inputs for receiving a second functional signal and a second test signal and an output coupled to a signal input of the isolation cell; a second power domain including: a first circuit having an input coupled to a signal output of the isolation cell, a first observation element coupled to the signal output of the isolation cell, and a second observation element coupled to an output of the first circuit; where, when in test mode, the first selection circuit controls the isolation cell based on the first test signal, and the second selection circuit provides the second test signal to the signal input of the isolation cell.

Abstract: An offset-cancellation circuit having a first amplification stage with a gain of the first amplification stage and configured to receive an offset voltage of a first amplifier. A storage element is configured to be coupled to and decoupled from the first amplification stage and configured to store a potential difference output by the first amplification stage. The potential difference is determined by the offset voltage of the first amplifier and the gain of the first amplification stage. A second amplification stage is coupled to the storage element and configured to receive the potential difference from the storage element when the storage element is decoupled from the first amplification stage and configured to deliver an offset-cancellation current. The offset-cancellation current is determined by the potential difference and a gain of the second amplification stage.

Abstract: A system includes an addressable memory array, one or more processing cores, and an accelerator framework coupled to the addressable memory. The accelerator framework includes a Multiply ACcumulate (MAC) hardware accelerator cluster. The MAC hardware accelerator cluster has a binary-to-residual converter, which, in operation, converts binary inputs to a residual number system. Converting a binary input to the residual number system includes a reduction modulo 2m and a reduction modulo 2m?1, where m is a positive integer. A plurality of MAC hardware accelerators perform modulo 2m multiply-and-accumulate operations and modulo 2m?1 multiply-and-accumulate operations using the converted binary input. A residual-to-binary converter generates a binary output based on the output of the MAC hardware accelerators.

Abstract: A charge pump circuit includes a boost capacitor driven by a first clock signal and a bootstrap capacitor driven by a second clock signal. The first and second clock signals have different duty cycles, with the duty cycle of the second clock signal being smaller than the duty cycle of the first clock signal. An input transistor is coupled between an input node and a boost node coupled to the boost capacitor. The control terminal of the input transistor is coupled to the bootstrap capacitor. A bootstrap transistor coupled between the boost node and the control terminal of the input transistor is driven by a logical inverse of the first clock signal.

Abstract: A method is provided to access a data storage memory that stores data signals in a plurality of indexed memory locations. An access control circuit receives a memory access request signals from a processing circuit. The method includes replicating the respective memory access request signals to provide for each a respective replicated memory access request signal, accessing indexed internal memory locations to retrieve a first data signal retrieved as a function of the respective memory access request signal and a second data signal retrieved as a function of the respective replicated memory access request signal, and checking for identity the first data signal and the at least one second data signal. The access control circuit transmits to the processing circuit a data signal or an integrity error flag signal as a result of the identity check.

Abstract: A circuit and methods of operation thereof are provided for robust protection against soft errors. The circuit includes a first set of storage elements coupled to and configured to sample a set of data inputs at a first set of times. The circuit includes a second set of storage elements coupled to and configured to sample the set of data inputs at a second set of times. A first parity generator generates a first parity check for the set of data inputs and a second parity generator generates a second parity check for output of the first set of storage elements. An error correction unit compares the first parity check and the second parity check to detect occurrences of error conditions in the circuit. The error correction unit may control output or operating characteristics of the circuit as a result of error conditions detected.

Abstract: A PLL includes an input comparison circuit comparing a reference signal to a divided feedback signal to thereby control a charge pump that generates a charge pump output signal. A filter receives the charge pump output signal when a switch is closed, and produces an oscillator control signal causing an oscillator to generate an output signal. Divider circuitry divides the output signal by a divisor to produce the divided feedback signal. Divisor generation circuitry changes the divisor over time so the output signal ramps from a start frequency to an end frequency. Modification circuitry stores a first oscillator control signal equal to the value of the oscillator control signal when the frequency of the output signal is the start ramp frequency. When the frequency of the output signal reaches the end ramp frequency, the switch is opened, and the stored first oscillator control signal is applied to the loop filter.

Abstract: A memory array arranged as a plurality of memory cells. The memory cells are configured to operate at a determined voltage. A memory management circuitry coupled to the plurality of memory cells tags a first set of the plurality of memory cells as low-voltage cells and tags a second set of the plurality of memory cells as high-voltage cells. A power source provides a low voltage to the first set of memory cells and provides a high voltage to the second set of memory cells based on the tags.

Abstract: A voltage supply circuit and a method for controlling a voltage supply circuit are provided. The voltage supply circuit includes a positive charge pump stage that generates a positive voltage and a negative charge pump stage that generates a negative voltage. The voltage supply circuit also includes a control stage that compares a voltage representative of the negative voltage with a reference voltage and causes a slope of the positive voltage to decrease when the voltage representative of the negative voltage exceeds the reference voltage.

Abstract: A DC-DC converter includes an inverter converting a DC supply voltage to a time varying signal. A transformer has a primary winding coupled to the inverter through an LC-tank circuit. A diode structure includes a first diode pair coupled in series between a high-voltage bus and a negative output, and a second diode pair coupled in series between the high-voltage bus and the negative output. The transformer has a secondary winding with a first terminal coupled to a tap between the first diode pair and a second terminal coupled to a tap between the second diode pair. A high-voltage bus transistor selectively couples the high-voltage bus to a positive output in response to a high-voltage bus gate drive signal. A low-voltage bus transistor selectively couples a low-voltage bus at a center tap of the secondary winding to the positive output in response to a low-voltage bus gate drive signal.