Abstract: A common-source circuit including two branches in parallel between a terminal of application of a voltage and a current source, each branch comprising: a series association of a resistor and a transistor, having their junction point defining an output terminal of the branch; a first switch connecting an input terminal of the branch to a control terminal of the transistor; and a controllable stage for amplifying data representing the level present on the output terminal of the opposite branch.

Abstract: An embodiment relates to a decoder for decoding CABAC encoded video data in real time for HDTV applications. The decoder comprises a binary arithmetic decoder block for converting an input bit stream into a bin string, a context memory for storing a plurality of context values, and a plurality of finite state machines. Each of the finite state machines is adapted for decoding a particular one of the H.264 syntax elements by providing the binary arithmetic decoder block with an index of the relevant context value within the context memory and by converting the resulting bin stream into a value of the current syntax element. In this manner, a performance of one bin per cycle may be achieved.

Abstract: An adaptive temporal motion filter for a video decoder system operates in an infinite impulse response (IIR), a max or a bypass mode. The adaptive temporal motion filter includes an adaptive time constant control module and a filter gain module. A gain factor of the filter gain module is varied by the adaptive time constant control module for every pixel in a current composite video signal. The adaptive time constant control module selects a variable gain for the filter gain module based on the motion magnitude, motion polarity and chroma luma status of the pixel.

Abstract: A word-line driver includes first, second and third transistors. The first transistor includes a gate terminal driven by a first group selection signal, a first conduction terminal driven by a second sub-group selection signal and a second conduction terminal coupled to the word-line. The second transistor includes a gate terminal driven by a second group selection signal, a second conduction terminal driven by the second sub-group selection signal, and a first conduction terminal coupled to the word-line. The third transistor includes a gate terminal driven by a third the group selection signal, a first conduction terminal driven by a first sub-group selection signal, and a second conduction terminal coupled to the word-line.

Abstract: A system for power measurement in an electronic device includes a sensing unit, an analog-to-digital converter (ADC) and a controller. The sensing unit senses voltage across a power source and modulates a carrier signal based on the sensed voltage. The ADC converts a combination of the modulated carrier signal and audio signals received by the electronic device to generate a digitized combined signal and provides the digitized combined signal to the controller. The controller separates digitized modulated carrier signal and digitized audio signals. The digitized modulated carrier signal is demodulated to generate an output signal that provides a measure of the power consumed by the electronic device.

Abstract: A solution for managing a storage device based on a flash memory is proposed. A corresponding method starts with the step for mapping a logical memory space of the storage device (including a plurality of logical blocks) on a physical memory space of the flash memory (including a plurality of physical blocks, which are adapted to be erased individually). The physical blocks include a set of first physical blocks (corresponding to the logical blocks) and a set of second—or spare—physical blocks (for replacing each bad physical block that is unusable). The method continues by detecting each bad physical block. Each bad physical block is then discarded, so to prevent using the bad physical block for mapping the logical memory space.

Abstract: A dynamic element matching (DEM) scheme is implemented in a crawling code generator for converting a b-bit binary input code into a (2b?1)-bit digital output code. A random generator determines for every conversion step a direction. A decimal difference between the current and previous binary input is calculated. The new crawling output code is determined based on the previous crawling output code, the direction and the decimal difference. The DEM scheme is used in a digital-to-analog converter such that the crawling output code switches digital-to-analog converting elements that output analog signals that are then summed to be the final analog signal.

Abstract: In a method for recovery of a clock from a received digital data stream and an apparatus for recovering a clock from a received digital data stream, phase-shifted clock signals are generated from a receiver's clock. After selecting one of the phase-shifted clock signals, two other phase-shifted clock signals are determined. Depending on sample values taken at rising/falling edges of the three selected phase-shifted clock signals, counter values are increased and compared. The selection of phase-shifted clock signals and the steps of sampling the input digital data stream, comparing the values and increasing counter values, if required, are repeatedly performed until the comparison result of the counter values indicates that one of the latter determined phase-shifted clock signals strobes the received digital data stream in the centre of a bit period.

Abstract: A sensing circuit for use in a semiconductor memory device includes first and second conducting lines for conducting a bit signal to and from a memory cell. The circuit further includes a sense amplifier coupled to the first and second conducting lines for sensing a bit signal, a charge storing element for generating a predefined potential, and first and second switching element respectively coupled to the first and second conducting lines. The first and second switching elements are selectively controllable to connect the first and second conducting line to the charge storing element so as to induce the generated predefined voltage on the first or second conducting lines.

Abstract: A memory circuit includes a first memory cell node capacitor, a first memory cell node transistor, a second memory cell node having a second memory cell node capacitor and a second memory cell node transistor, and a pre-charging circuit for pre-charging the first and second memory cell nodes to first and second voltage levels, respectively. The circuit includes a reference memory cell having first and second reference cell transistors with an equalizing transistor between, and a sense amplifier that detects a potential difference between reference bit lines from the reference memory cell and the first or second memory cell node, respectively. The reference cell transistors and equalizing transistor perform a first voltage equalization of the memory cell nodes at a predetermined voltage and a second voltage equalization of the memory cell nodes based on first or second reference signals respectively input to the first or second reference cell transistor.

Abstract: The present invention provides a built-in self-repairable memory. The invention repairs a faulty IC through hard fuses, as well as through available redundancy in memories on chip. As the faults are not present in all the memories, the invention uses a lesser number of fuses to actually make a repair and thus results in a yield enhancement. The fuse data is stored in a compressed form and then decompressed as a restore happens at the power on. The fuse data interface with the memory to be repaired is serial. The serial links decreases the routing congestion and hence gain in area as well as gain in yield (due to lesser defects and reduced area).

Abstract: A low dropout voltage regulator (LDO) includes a bias voltage generator, a differential error amplifier, an output driver, a controlled active load, a Double Ended Cascode Miller compensation block. The bias voltage generator produces a plurality of bias voltages. The differential error amplifier produces a differential output voltage based on the difference between a reference voltage and a function of the output voltage. The input terminal of the output driver is coupled to one output of the differential error amplifier. The substrate terminal of the output driver is capacitively coupled to the output node and resistively coupled to the input supply node. The controlled active load is coupled to the output of the output driver, and its control terminal is coupled to a function of the second output of the differential error amplifier.

Abstract: A multi-threshold complementary metal-oxide semiconductor technology (MTCMOS technology) master slave flip-flop with a single clock signal includes a master storage element configured to store an input data in response to a clock signal transition and a slave storage element configured to receive data from the master storage element and to output the received data in response to an opposite clock signal transition. The master storage element includes low threshold voltage transistors, the slave storage element includes high threshold voltage transistors, and the master and the slave storage elements are provided with a single clock signal.

Abstract: A system for testing faults in shadow logic includes a sequential block coupled to a shadow logic block and a delaying block to receive test patterns for testing the shadow logic block. The delaying block delays the test patterns by an access time of the sequential block to generate delayed test patterns. The delayed test patterns are passed to the shadow logic block for testing faults.

Abstract: A system for testing multi-clock domains in an integrated circuit (IC) includes a plurality of clock sources coupled to a plurality of clock controllers. Each of the clock sources generates a fast clock associated with one of the multi-clock domains. Each of the clock controllers is configured to provide capture pulses to test one clock domain. The capture pulses provided to a clock domain are at a frequency of a fast clock associated with the clock domain. The clock controllers operate sequentially to provide the capture pulses to test the clock domains.

Abstract: A chip configuration for dual board voltage compatibility comprising ballast I/O pads, regulator control block and VDDCO pad. If 1.8V is available on board, all 1.8V pads are connected to the package pins and the VDDCO pad is double bonded with one 1.8V package pin. This ensures that the regulator is in operation providing 1.2V supply to the core. If 1.2V is available on board, all 1.2V pads are bonded to the package pins and VDDCO pad is left unbonded. A weak pulldown ensures that the regulator is inoperational and the gate voltage of ballast transistor is pulled up. Now 1.2V pads directly get supply from the board through package pins and is provided to the core without suffering IR drop.

Abstract: An integrated test device reduces external wiring congestion to a memory. The integrated test device provides for separate decoder testing and debugging to find specific errors in the memory. The device also helps in reducing the complexity of the test of external BIST. Furthermore, the number of clock cycles required for the decoder testing for an N-address memory is reduced from 4N cycles to N clock cycles. Additionally, the access time for the memory is reduced as the test device is used as a pipelining device in normal operation mode.

Abstract: A system having an input and output buffer includes a dynamic driver reference generator to generate dynamic driver reference signals based on a data signal and an IO buffer supply voltage, a level shifter to generate level shifted signals based, in part, on the dynamic driver reference signals, and a driver having at least one stress transistor. The driver dynamically adjusts a voltage across the stress transistor based on at least one of dynamic driver reference signals, the level shifted signals, and a current state of an IO pad.

Abstract: A solution for restoring operation of a storage device based on a flash memory is proposed. The storage device emulates a logical memory space (including a plurality of logical blocks each one having a plurality of logical sectors), which is mapped on a physical memory space of the flash memory (including a plurality of physical blocks each one having a plurality of physical sectors for storing different versions of the logical sectors). A corresponding method starts by detecting a plurality of conflicting physical blocks for a corrupted logical block (resulting from a breakdown of the storage device). The method continues by determining a plurality of validity indexes (indicative of the number of last versions of the logical sectors of the corrupted logical block that are stored in the conflicting physical blocks). One ore more of the conflicting physical blocks are selected according to the validity indexes. The selected conflicting physical blocks are then associated with the corrupted logical block.

Abstract: A difference between a reference clock and feedback clock is detected to generate a difference signal that is filtered to generate a voltage controlled oscillator control signal and produce an oscillation signal having an oscillation frequency. A first frequency dividing circuit divides the oscillation signal by a selected one of a number of first frequency divisors to generate an output signal at a selected frequency. A second frequency dividing circuit divides the output signal by a selected one of a number of second frequency divisors to generate the feedback clock. The frequency divisors are selected by a frequency selection signal. The first frequency dividing circuit samples the frequency selection signal at the rate of the oscillation signal divided by a least common multiple of the plurality of first frequency divisors. The second frequency dividing circuit samples the sampled frequency selection signal at the rate of the feedback clock.