Abstract: A non-volatile memory of a complementary type includes sectors of memory cells, with each cell formed by a direct memory cell and a complementary memory cell. Each sector is in a non-written condition when the corresponding memory cells are in equal states and is in a written condition wherein each location thereof stores a first logic value or a second logic value when the memory cells of the location are in a first combination of different states or in a second combination of different states, respectively. A sector is selected and a determination is made as to a number of memory cells in the programmed state and a number of memory cells in the erased state. From this information, the condition of the selected sector is identified from a comparison between the number of memory cells in the programmed state and the number of memory cells in the erased state.

Abstract: Cantilever probes are produced for use in a test apparatus of integrated electronic circuits. The probes are configured to contact corresponding terminals of the electronic circuits to be tested during a test operation. The probe bodies are formed of electrically conductive materials. On a lower portion of each probe body that, in use, is directed to the respective terminal to be contacted, an electrically conductive contact region is formed having a first hardness value equal to or greater than 300 HV; each contact region and the respective probe body form the corresponding probe.

Abstract: A digital processor, such as, e.g., a divider in a PID controller, performs a mathematical operation such as division (or multiplication) involving operands represented by strings of bit signals and an operator to produce an operation result. The processor is configured by identifying first and second power-of-two approximating values of the operator as the nearest lower and nearest higher power-of-two values to the operator. The operation is performed on the input operands by means of the first and second power-of-two approximating values of the operator by shifting the bit signals in the operands by using the first and second power-of-two approximating values in an alternated sequence to produce: first approximate results by using the first power-of-two approximating value, second approximate results by using the second power-of-two approximating value. The average of the first and second approximate results is representative of the accurate result of the operation.

Abstract: A method for indexing electronic devices includes: forming first chips in a first wafer, forming second chips in a second wafer, forming the electronic devices by coupling each first chip with a corresponding second chip, and forming an index on each electronic device. The index is indicative of a position of the corresponding first chip in the first wafer. The step of forming an index includes forming a first portion of the index on the first chip, and forming a second portion of the index on the second chip.

Abstract: A circuit with galvanic isolation includes a series of n cascaded transformers including a first transformer and a last transformer in the series. A transmitter is coupled to the primary winding of the first transformer in the series of cascaded transformers, the transmitter being configured for supplying to the primary winding a transmission signal as a function of an input signal. A receiver is coupled to the secondary winding of the last transformer of the series of cascaded transformers and is configured for receiving at the secondary winding a reception signal transmitted over the series of cascaded transformers. A predistortion module is configured for applying to the transmission signal a predistortion including an (n?1)-fold integration, where n is the number of cascaded transformers, of a transmission signal that would be supplied to the input of a sole transformer present in a single-transformer solution.

Abstract: An apparatus for the thermal testing of electronic devices may include a universal base board for coupling to an electronic driver unit for receiving electrical signals therefrom, and a plurality of test boards arranged on the base board. Each test board may include a holder for receiving a device under test and routing thereto electrical signals from the electronic driver unit as well as an adaptation board to the base board. Each test board may include a respective electrically powered heating element for heating the electronic device received thereat.

Abstract: A phase change memory includes an L-shaped resistive element having a first part that extends between a layer of phase change material and an upper end of a conductive via and a second part that rests at least partially on the upper end of the conductive via and may further extend beyond a peripheral edge of the conductive via. The upper part of the conductive via is surrounded by an insulating material that is not likely to adversely react with the metal material of the resistive element.

Abstract: A circuit for generating a bandgap voltage includes a circuit module for generation of a base-emitter voltage difference comprising a pair of PNP bipolar substrate transistors which identify a first current path and a second current path. A first current mirror of an n type is connected between the first and second branches and is further connected via a resistance for adjustment of the bandgap voltage to the second bipolar transistor. A second current mirror of a p type is connected between the first and second branches, and connected so that the current mirrors repeat current of each other. In operation to generate the bandgap voltage, current flows from the supply voltage to ground only through said the first and second bipolar substrate transistors.

Abstract: A method for manufacturing a microelectronic semiconductor device comprising the steps of: forming a trench in a body, the trench having side walls, a opening, and a bottom; forming a sacrificial layer in the trench; forming a recess in the sacrificial layer; forming a restriction structure between the sacrificial layer and the opening of the trench, defining a through hole for access to the sacrificial layer; completely removing the sacrificial layer through said through hole; and depositing a metal layer over the body, thus closing the opening of the trench and forming an electron-emission cathode tip.

Abstract: A diagnostic circuit is used for detecting the load status of an audio amplifier. The audio amplifier includes two output terminals for connection to a speaker. The diagnostic circuit may include a first circuit, which configured to generate a first signal indicating whether a signal provided via the two output terminals comprises an audio signal. A second circuit can be configured to detect a first measurement signal being indicative for the output current provided via the two output terminals, and to compare the first measurement signal with at least one threshold in order to generate a second signal indicating whether the output current has a low current amplitude profile or a high current amplitude profile. A third circuit can be configured to generate a diagnostic signal as a function of the first and the second signal.

Abstract: A micro-electro-mechanical device, wherein a platform is formed in a top substrate and is configured to turn through a rotation angle. The platform has a slit and faces a cavity. A plurality of integrated photodetectors is formed in a bottom substrate so as to detect the light through the slit and generate signals correlated to the light through the slit. The area of the slit varies with the rotation angle of the platform and causes diffraction, more or less marked as a function of the angle. The difference between the signals of two photodetectors arranged at different positions with respect to the slit yields the angle.

Abstract: A level shifter circuit includes: an input stage for receiving an input signal switchable between a first and a second input level and an output stage to produce a drive signal for the load that is switchable between a first and a second output level. A level translator translates the input signal switching between the input levels into the output stage switching between the output levels. A feedback element coupled to the output stage transfers to the input stage a feedback signal representative of the output level of the output stage. The input stage includes control circuitry sensitive to the input signal and the feedback signal for detecting undesired switching of the output stage between the first and second output levels occurring in the absence of input signal switching between the first and second input levels. The control circuitry inverts the output level of the output stage resulting from undesired switching.

Abstract: A thin film amorphous silicon solar cell may have front contact between a hydrogenated amorphous silicon layer and a transparent conductive oxide layer. The cell may include a layer of a refractory metal, chosen among the group composed of molybdenum, tungsten, tantalum and titanium, of thickness adapted to ensure a light transmittance of at least 80%, interposed therebetween, before growing by PECVD a hydrogenated amorphous silicon p-i-n light absorption layer over it. A refractory metal layer of just about 1 nm thickness may effectively shield the oxide from the reactive plasma, thereby preventing a diffused defect when forming the p.i.n. layer that would favor recombination of light-generated charge carriers.

Abstract: A system, such as a System-on-Chip includes an interface component or PLUG which generates transactions over an IP block, such as an interconnect serving one or more clients via virtual channels. The client or clients are mapped onto the virtual channels via client/virtual channel mappings. The virtual channels are provided as a first set of virtual channels in the interface component which cooperate with a second set of virtual channels in the IP block. First and second client/virtual channel mappings for the first set of virtual channels and the second set of virtual channels are provided. The first and second client/virtual channel mappings are separately programmable and mutually decoupled from one another.

Abstract: An integrated AMR magnetoresistive sensor has a magnetoresistor, a set/reset coil and a shielding region arranged on top of each other. The set/reset coil is positioned between the magnetoresistor and the shielding region. The magnetoresistor is formed by a magnetoresistive strip of an elongated shape having a length in a first direction parallel to the preferential magnetization direction and a width in a second direction perpendicular to the first direction. The set/reset coil has at least one stretch extending transversely to the magnetoresistive strip. The shielding region is a ferromagnetic material and has a width in the second direction greater than the width of the magnetoresistive strip so as to attenuate the external magnetic field traversing the magnetoresistive strip and increase the sensitivity scale of the magnetoresistive sensor.

Abstract: A method for real-time calibration of a gyroscope, configured for supplying a value of angular velocity that is function of a first angle of rotation about a first angular-sensing axis that includes defining a time interval, acquiring from an accelerometer an equivalent value of angular velocity that can be associated to the first angle of rotation; calculating a deviation between the value of angular velocity and the equivalent value of angular velocity; iteratively repeating the previous steps through the time interval, incrementing or decrementing an offset variable by a first predefined value on the basis of the values assumed by the deviations during the iterations, and updating the value of angular velocity as a function of the offset variable.

Abstract: The present disclosure is directed to multichannel transducer devices and methods of operation thereof. One example device includes at least two acquisition modules that have different sensitives and a signal processing stage that generates a blended signal representative of a lower gain signal mapped onto a higher gain signal. One example method of operation includes receiving a first signal from a first sensor having a first sensitivity, receiving a second signal from a second sensor having a second sensitivity that is different from the first sensitivity, generating a blended signal by mapping the second signal to the first signal, outputting the first signal while the first signal is below a first threshold and above a second threshold, and outputting the blended signal when the first signal is above the first threshold and when the first signal is below the second threshold.

Abstract: A multi-device module, comprising: a first substrate, which houses a first MEMS transducer, designed to transduce a first environmental quantity into a first electrical signal, and an integrated circuit, coupled to the first MEMS transducer for receiving the first electrical signal; a second substrate, which houses a second MEMS transducer, designed to transduce a second environmental quantity into a second electrical signal; and a flexible printed circuit, mechanically connected to the first and second substrates and electrically coupled to the integrated circuit and to the second MEMS transducer so that the second electrical signal flows, in use, from the second MEMS transducer to the integrated circuit.

Abstract: A circuit includes a multiplier, an adder, a first result register and a second result register coupled to outputs of the multiplier and the adder, respectively. The circuit further includes: a first selection unit configured to selectively provide, to the multiplier and in response to a first control signal, a first value from a first plurality of values; and a second selection unit configured to selectively provide, to the multiplier and in response to a second control signal, a second value from a second plurality of values. The circuit also includes: a third selection unit configured to selectively provide, to the adder and in response to a third control signal, a third value from a third plurality of values; and a fourth selection unit configured to selectively provide, to the adder and in response to a fourth control signal, a fourth value from a fourth plurality of values.

Abstract: A system includes a processing circuit and a circuit configured to output a given number N of bits of configuration information to be used by the processing circuit. The circuit includes a non-volatile programmable memory configured to output a first group of N bits, N terminals for receiving a second group of N bits, and N logic gates. A first input terminal of each logic gate is connected to a respective bit of output from the non-volatile programmable memory and wherein a second input terminal of each logic gate is connected to a respective terminal of the N terminals.