Abstract: One or more embodiments to iteratively detect and decode data transmitted in a wireless communication system, featuring a MIMO detector and a soft input soft-output error-correction-code decoder. More specifically, a method suitable for iterative detection and decoding schemes is proposed, which is able to output near optimal bit soft information processing efficiently given input bit soft information. First, a transmitting source is selected as a reference layer, wherein the associated symbol represents a reference transmit symbol. Subsequently, a set of candidate values are identified for the reference transmit symbol. For each candidate value a candidate transmit sequence is estimated through a novel spatial decision feedback equalization process based on both Euclidean distance metrics and the a-priori soft information provided by the SISO ECC decoder. The novel DFE technique uses a novel bit metric.

Abstract: A method and a system for protecting a static digital datum contained in a first element of an electronic circuit, intended to be exploited by a second element of this circuit, in which: on the side of the first element, the static datum is converted into a dynamic data flow by at least one first linear shift feedback register representing a different polynomial according to the value of the static datum; the dynamic flow is transmitted to the second element; and on the side of the second element, the received dynamic flow is decoded by at least one second shift register representing at least one of the polynomials that has been used by the first element.

Abstract: A coprocessor includes a calculation unit for executing at least one command, and a securization device. The securization device includes an error detection circuit for monitoring the execution of the command so as to detect any execution error, putting the coprocessor into an error mode by default as soon as the execution of the command begins, and lifting the error mode at the end of the execution of the command if no error has been detected, an event detection circuit for monitoring the appearance of at least one event to be detected, and a masking circuit for masking the error mode while the event to be detected does not happen, and declaring the error mode to the outside of the coprocessor if the event to be detected happens while the coprocessor is in the error mode. Application in particular but not exclusively to coprocessors embedded in integrated circuits for smart cards.

Abstract: A channel equalizer arranged to receive a data signal encoded by a plurality of amplitude levels, the circuitry including a filter having a plurality of taps, each tap generating an output signal based on a coefficient, an input for receiving an error signal for adapting the coefficients, and an output for outputting a filtered signal; and blind error generation circuitry arranged to generate the error signal, the blind error generation circuitry including: error estimating circuitry arranged to estimate the error of the filtered signal based on maximum likelihood; and adding circuitry coupled to the error estimating circuitry and to the output of the filter and arranged to add at least part of the filtered signal to the error estimated by the error estimating circuitry to generate the error signal.

Abstract: PDs that can be supplied through the LAN line are discriminated from PDs that cannot be so supplied as a function of the resistance of the supply line and of the voltage drop caused by nonlinear elements in series therewith. The values of these two parameters are estimated by applying two distinct voltages to the supply terminals of the LAN line and sensing the relative steady-state currents absorbed by the power supply line, and by processing voltage and current values for estimating the resistance of the line and the voltage drop caused by nonlinear elements connected in series therewith.

Abstract: A method of testing integrated circuits is provided. The method includes establishing at least one first physical communication channel between a test equipment and a respective group of integrated circuits under test by having probes of the test equipment contacting at least one corresponding physical contact terminal of each integrated circuit of the respective group. The method further includes having the test equipment exchanging, over the at least one first physical communication channel, the same test stimuli with each integrated circuit of the group. The method still further includes having each integrated circuit of the group establishing a corresponding second physical communication channel with the test equipment by having at least one physical contact terminal of the integrated circuit contacted by a corresponding probe of the test equipment.

Abstract: A method for realizing a nanometric circuit architecture includes: realizing plural active areas on a semiconductor substrate; realizing on the substrate a seed layer of a first material; realizing a mask-spacer of a second material on the seed layer in a region comprised between the active areas; realizing a mask overlapping the mask-spacer and extending in a substantially perpendicular direction thereto; selectively removing the seed layer exposed on the substrate; selectively removing the mask and the mask-spacer obtaining a seed-spacer comprising a linear portion extending in that region and a portion substantially orthogonal thereto; realizing by MSPT from the seed-spacer an insulating spacer reproducing at least part of the profile of the seed-spacer; realizing by MSPT a nano-wire of conductive material from the seed-spacer or insulating spacer, the nano-wire comprising a first portion at least partially extending in the region and a second portion contacting a respective active area.

Abstract: An integrated thermoelectric generator includes a semiconductor. A set of thermocouples are electrically connected in series and thermally connected in parallel. The set of thermocouples include parallel semiconductor regions. Each semiconductor region has one type of conductivity from among two opposite types of conductivity. The semiconductor regions are electrically connected in series so as to form a chain of regions having, alternatingly, one and the other of the two types of conductivity.

Abstract: The present disclosure relates to solid state image sensors in digital imaging systems, more particularly to an image quality learning method and system for solid state image sensors. One of the advantages of the method according to an embodiment of the present disclosure is to allow the implementation of a digital machine vision system with a faster convergence of an Image Quality algorithm, which results in a shorter delay for the user. According to an embodiment of the present disclosure, the method is performed as a recursive algorithm which tends to converge to an Image Quality setting satisfying image quality criteria.

Abstract: A method for protecting a calculation, by an electronic circuit, of a modular exponentiation of a digital quantity, wherein: a first variable is initialized with a random quantity increased by once unit; a second variable is initialized with the product of the digital quantity by the random quantity; a third variable is initialized with the digital quantity; iteratively for all the bits at 1 of an exponent of the modular exponentiation, the first variable is updated by: a) multiplying its content by that of the third variable; and b) subtracting thereto the content of the second variable increased by the random quantity; and once all the bits of the exponent have been processed, the content of the first variable is decreased by the random quantity to provide the result of the modular exponentiation.

Abstract: A band-gap reference voltage generator for generating a stable band-gap reference voltage including a chopped band-gap circuit, a first sample and hold circuit coupled to the chopped band-gap circuit, a second sample and hold circuit coupled to the chopped band-gap circuit, and an output circuit coupled to the first and second sample and hold circuits for generating the stable band-gap reference voltage.

Abstract: A phase-locked loop double-point modulator may include a frequency divider having a ratio which can be changed by a first modulation signal, and an oscillator, a frequency of which can be changed by a second modulation signal correlated to the first modulation signal. A calibration circuit may be configured, in a calibration mode, to match the gains of the first and second modulation signals based on frequency measurements of the oscillator for two different calibration values of the second modulation signal. The phase-locked double-point modulator may also include an attenuator having a constant ratio greater than 1 and placed in the path of the second modulation signal, and a selector switch configured to be controlled by the calibration circuit to reduce the ratio of the attenuator in the calibration mode.

Abstract: A system for assembling electronic chips in a package, including a first lead frame defining chip reception areas; and a second lead frame defining chip coverage areas, the frames including, at least at their periphery, pairs of mutually-cooperating elements for maintaining the frames together.

Abstract: A method for protecting a calculation on an elliptic curve, by an electronic circuit, wherein a point of an elliptic curve is multiplied by a digital quantity, comprising the steps of: initializing a first variable with a value which is a function of a random quantity; initializing at least a second variable with a value which is a function of the digital quantity; at least for a bit at 1 of the digital quantity, the first variable is updated by: a) subtracting a multiple of the random quantity; and b) adding the content of the second variable; and once all the bits of the digital quantity have been processed, subtracting from the first variable the product of the point to by the random quantity to provide the result.

Abstract: An embodiment of a microelectromechanical device having a first structural element, a second structural element, which is mobile with respect to the first structural element, and an elastic supporting structure, which extends between the first and second structural elements to enable a relative movement between the first and second structural elements. The microelectromechanical device moreover possesses an anti-stiction structure, which includes at least one flexible element, which is fixed only with respect to the first structural element and, in a condition of rest, is set at a first distance from the second structural element. The anti-stiction structure is designed to generate a repulsive force between the first and second structural elements in the case of relative movement by an amount greater than the first distance.

Abstract: An imaging optical module is designed to be placed in front of an optical image sensor of a semiconductor component. The module includes at least one element which has a refractive index that varies between its optical axis and its periphery, over at least an annular part and/or over its central part. The element may be a tablet in front of the semiconductor sensor or a lens in front of the semiconductor sensor. The direction of variation in refractive index may be oppositely oriented with respect to the table and lens.

Abstract: A method of improving voice quality in a packet based network. The method includes receiving an incoming call from a first endpoint and matching capabilities between the first endpoint and the second endpoint. The method also includes completing the incoming call if the capabilities match and tracking the packet loss associated with the network. The method also includes negotiating the voice quality based on the tracking and the capabilities. Also described is a devices and system for a similar method.

Abstract: An electronic integrated device may include a signal generation stage arranged to generate a first signal representative of an under voltage lockout logic signal. The signal generation stage may include a voltage divider block arranged to provide an internal reference voltage signal to a bandgap core group based upon a reference signal. The bandgap core group may generate the first signal based upon the internal reference voltage signal. The bandgap core group may further include a first generation module arranged to generate a output regulated reference voltage signal based upon the internal reference voltage signal, and a second generation module arranged to generate the first signal based upon the internal reference voltage signal and a driving signal obtained by a preliminary processing of the internal reference voltage signal by a bandgap core module included within the band gap core group.

Abstract: The invention concerns a conducting layer having a thickness of between 1 and 5 atoms, an insulated gate being formed over a part of the conducting layer.

Abstract: A device for controlling an image sensor including at least one photosensitive cell including a photodiode capable of discharging into a sense node via a first MOS transistor, the sense node being connected to the gate of a second MOS transistor having its source connected to a processing system. The device includes a bias circuit capable of increasing the voltage of the source during the discharge of the photodiode into the sense node.