Abstract: An FPGA interface device includes a microcontroller having a parallel port, a serial memory having an output port, and an on-board FPGA having a serial port coupled to the output port of the serial PROM and having a parallel port coupled to the parallel port of the microcontroller. The configuration design for the FPGA interface device's on-board FPGA and the firmware code for the interface device's microcontroller are stored in the serial memory. Upon power-up, the on-board FPGA reads the configuration design from the serial memory, and then configures itself accordingly. After properly configured, the on-board FPGA serially reads the microcontroller firmware code from the serial memory, parallelizes the firmware code, and thereafter enables the microcontroller to access the resulting parallel firmware code.

Abstract: An integrated circuit (I/C) assembly includes a dedicated voltage sensor line for determining with a high degree of accuracy the operating voltage at a predetermined sensor point on the IC die. The dedicated voltage sensor line connects the sensor point to an input/output (I/O) structure of the IC die, which in turn is connected to a voltage sense pin on the package of the IC assembly. In this manner, an end user can accurately monitor the operating voltage at the voltage sensor point on the IC. Additionally, an end user can connect a control circuit to the voltage sensor pin to control either the supply voltage or secondary parameters.

Abstract: Structures and methods for transferring data from non-volatile to volatile memories. An extra bit, called a “transfer bit”, is included in each data word. The transfer bit is set to the programmed value, and is monitored by a control circuit during the memory transfer. If the supply voltage is sufficient for correct programming, the transfer bit is read as “programmed”, and the data transfer continues. If the supply voltage is below the minimum supply voltage for proper programming, the transfer bit is read as “erased”, and the data transfer is reinitiated. In one embodiment, a second transfer bit set to the “erased” value is included in each word.

Abstract: Method and circuits to create reduced field programmable gate arrays (RFPGA) from the configuration data of field programmable gate arrays (FPGA) are disclosed. The configurable elements of the FPGA are replaced with standard cell circuits that reproduce the functionality of the configured FPGA. Specifically, reduced logic blocks are derived from the configuration data of configurable logic blocks. Similarly, reduced input/output blocks and reduced matrices are derived from the configuration data for input/output blocks and programmable switch matrices of the FPGA, respectively. A database can be expanded as new reduced logic block models are created for configurable logic block models that were not in the database. Similarly, a database can be used for the input/output blocks and programmable switch matrices of an FPGA.

Abstract: Novel structures for implementing wide multiplexers from user designs in FPGA CLBs. Input multiplexers providing the function generator data input signals are modified to function not just based on values stored in configuration memory cells, but also under the control of user signals. Thus, the input multiplexers of the invention are much more flexible than traditional input multiplexers. In one embodiment, the improved data input multiplexer is provided on two of four data input terminals of the function generator, enabling the implementation of an 8-to-1 multiplexer using only a single function generator. Another embodiment applies the concept of mixed memory cell and user control of a multiplexer to the general interconnect structure of an FPGA.

Abstract: A method of configuring FPGAs for reconfigurable computing comprises a software environment for reconfigurable coprocessor applications. This environment comprises a standard high level language compiler (i.e. Java) and a set of libraries. The FPGA is configured directly from a host processor, configuration, reconfiguration and host run-time operation being supported in a single piece of code. Design compile times on the order of seconds and built-in support for parameterized cells are significant features of the inventive method.

Abstract: A method and system are provided for increasing the accuracy of AC parametric testing. The invention provides a method of precisely estimating signal propagation delay time in an integrated circuit testing apparatus, wherein a plurality of signal propagation delay time measurements are taken and additional delay times are estimated by linearly interpolating the measured delays. A desired test point (desired output voltage at a given time) is established. Using a sample device, a slope is established on a time vs. voltage plot for a line through the desired test point. Where a desired test point falls between strobe times on a tester, linear extrapolation is used to calculate what voltages must be tested for at the two bracketing strobe times in order to guarantee the desired performance at the desired test point. One or more devices are then tested for the calculated voltages at the corresponding bracketing strobe times.

Abstract: A fast, space-efficient lookup table (LUT) for programmable logic devices (PLDs) in which the write decoder, read decoder and memory block of the LUT are modified to improve performance while providing a highly efficient layout. Both the write decoder and the read decoder are controlled by LUT input signals, and data signals are transmitted directly to each memory circuit of the memory block (i.e., without passing through the write decoder). The read decoder includes a multiplexing circuit made up of a series of multiplexers that are directly controlled by the input signals received from the interconnect resources of the PLD. In one embodiment, a configurable logic block is provided with a single write decoder that is shared by a first LUT and a second LUT.

Abstract: Memory cell structures and related circuitry for use in non-volatile memory devices can be fabricated utilizing standard CMOS processes, for example, 0.18 micron or 0.15 micron processes. Advantageously, the cell structures can be programmed so that a conductive path is formed between like type materials, for example, between a p-type gate and a p-type source/drain region or an n-type gate and an n-type source/drain region. Programming cells in this manner advantageously provides a programmed cell having a low, linear resistance after programming.

Abstract: A negative voltage detector including a resistor divider circuit is used to translate a negative voltage into a standard CMOS logic low or logic high value. The small area consumed by the negative voltage divider allows multiple device placement within a logic device without the consumption of much area on the logic device. Additionally, the multiple devices placed may detect different negative voltage thresholds with a simple tuning of device components.

Abstract: A system and method for designing schematic diagrams of electronic circuits is provided. A library of electronic components represented in graphical form are selectable by a user for inclusion into a schematic diagram. The components are connected together to define a circuit that performs a function. In order to simulate and test a particular portion of the circuit rather than the entire circuit, the present invention provides a disabling routine that disables portions of the circuit not to be included in the simulation. The present invention allows a circuit designer/tester to focus on desired areas of a circuit while ignoring others.

Abstract: A component-based method and system for structured use of a plurality of software tools. In various embodiments, components are used to package objects that are constructed to test an electronic circuit design using different software tools. Flow files describe different execution sequences for selected ones of the plurality of software tools, and a first set of objects contains one or more methods for interfacing with a selected one or more of the flow files. A second set of objects contains one or more methods for collecting data from the software tools and entering the data in a database. The components include one or more methods that invoke one or more methods of the first and second sets of objects.

Abstract: Interconnecting logic provides connectivity of an embedded fixed logic circuit, or circuits, with programmable logic fabric of a programmable gate array such that the fixed logic circuit functions as an extension of the programmable logic fabric. The interconnecting logic includes interconnecting tiles and may further include interfacing logic. The interconnecting tiles provide selective connectivity between inputs and/or outputs of the fixed logic circuit and the interconnects of the programmable logic fabric. The interfacing logic, when included, provides logic circuitry that conditions data transfers between the fixed logic circuit and the programmable logic fabric.

Abstract: FPGAs that contain at least one localized defect may be used to implement some designs if the localized defect is not used in the designs. To determine if the FPGA is suitable to implement a design, the design is loaded into the FPGA. The FPGA is tested to determine whether it can execute the design accurately even with the localized defect. The FPGA will be marked as suitable for that design if it passes the test. If the FPGA is found to be unsuitable for one design, additional designs may be tested. Thus, a FPGA manufacturer can sell FPGAs that are normally discarded. As a result, the price of these FPGAs could be set significantly low.

Abstract: An interface apparatus including a nesting member having a central test area, a positioning member surrounding the test area, and several removable adapters held by the positioning member to expose a selected portion of the test area. Each removable adapter includes a central opening that is sized to receive a corresponding ball grid array integrated circuits (BGA IC). During a first test procedure, a relatively small BGA IC is inserted through the relatively small central opening of a corresponding first adapter. The first adapter is then removed and replaced with a second adapter having a relatively large central opening. A second test procedure is then performed by inserting a relatively large BGA IC through the relatively large central opening formed in the second adapter.

Abstract: A phase-locked loop (PLL) having a wide range of oscillator output frequencies and a wide range of loop divider values is realizable in integrated form because the total capacitance of its loop filter is small. The PLL includes a first phase detector, a second phase detector, a programmable tapped-delay-line oscillator, a divide-by-M loop divider, and a programmable on-chip loop filter. The programmable filter is programmed to realize one of many loop filters. In a first step, oscillator output is fed back via the loop divider to the first phase detector. Oscillator frequency is decremented by changing tap selection inside the oscillator until the first phase detector determines that the frequency of the signal fed back via the loop divider (divide-by-M) is smaller than the frequency of an input signal. The tap control at which this frequency lock condition occurred, along with value M, is then used to determine which of the many loop filters will be used in a phase lock step.

Abstract: A method for generating a circuit design using specified input characteristics and desired output characteristics. An algorithm is used to generate candidate circuits from the desired circuit characteristics. The candidate circuit is tested with a stimulating test apparatus to provide actual output characteristics in response to the specified input characteristics. If the actual and desired output characteristics do not match, the candidate circuit is modified and re-tested. The design process may be automated or manual.

Abstract: A post PLL filter is coupled to the output terminal of a phase locked loop. The post PLL filter reduces the jitter of the PLL output clock signal by increasing the Q of the phase locked loop. In addition, some embodiments of the present invention also provides amplitude magnification of the PLL output clock signal.

Abstract: A system and method for evolving configuration bitstreams for a programmable logic device are disclosed. A plurality of data structures having respective sets of data are established. From the sets of data, respective configuration bitstreams are generated, wherein the sets of data are mapped to positions in the bitstreams. The configuration bitstreams are then evaluated for relative suitability to meet predetermined criteria when deployed on a programmable logic device. From the relative suitability of the configuration bitstreams, next-generation data for the data structures are generated using a genetic algorithm applied to sets of data. In the various embodiments, the configuration bitstreams eliminate resource contentions, selectively eliminate asynchronous behavior, include built-in test circuits, and are relocatable. Multiple populations of configuration bitstreams can evolve in parallel over a network.

Abstract: Described is a test circuit that can be instantiated on a programmable logic device to perform at-speed functional tests of programmable resources, including internal memory and routing resources. The resources to be tested are configured to instantiate a counter circuit connected to the address terminals of a linear-feedback shift register (LFSR). LFSRs are cyclic, in the sense that when clocked repeatedly they go through a fixed sequence of states. Consequently, an LFSR that starts with a known set of data has a predictable set of data after a given number of clock periods. The LFSR is preset to a known count and clocked a known number of times. The resulting count is then compared with a reference. If the resulting count matches the reference, then all of the resources used to implement the test circuit, including the memory and routing resources used to implement the LFSR, are deemed fully functional at the selected clock speed.