Abstract: An electronic device includes a processing unit with a memory, a JTAG interface with test-data-input and test-mode-select lines coupled to the processing unit, a bridge circuit, and a multiplexer circuit. The bridge circuit includes a serial communication interface receiving a serial data input signal which conveys an input serial data frame. The bridge circuit includes a serial-to-parallel converter circuit block receiving the input serial data frame, processing the input serial data frame to read first and second subsets of input binary values therefrom, and transmitting the first subset via a first output signal and the second subset via a second output signal. The multiplexer circuit selectively propagates a received test-data-input signal or the first output signal to the test data input line, and selectively propagates a test-mode-select signal or the second output signal to the test mode select line of the JTAG interface.

Abstract: A scan test device includes a scan flip flop circuit and a clock gating circuit. The scan flip flop circuit is configured to receive a scan input signal according to a scan clock signal, and to output the received scan input signal to be a test signal. The clock gating circuit is configured to selectively mask the scan clock signal according to a predetermined bit of the test signal and a scan enable signal, in order to generate a test clock signal for testing at least one core circuit.

Abstract: Improved techniques for recovering from an error condition without requiring a re-transmittal of data across a high-speed data link and for improved power usage are disclosed herein. A data stream is initiated. This stream includes different types of packets. Error correcting code (ECC) is selectively imposed on a control data type packet. A transmitter node and a receiver node are connected via a hard link that has multiple virtual channels. Each virtual channel is associated with a corresponding power-consuming node. When the receiver node receives the control data type packet, error correction is performed if needed without re-transmittal. When a final data type packet is transmitted for each virtual channel, the transmitter node transmits an end condition type packet. A corresponding power-consuming node that corresponds to the respective virtual channel transitions from an active state to a low power state.

Abstract: A memory access technology and a computer system, where the computer system includes a memory controller and a medium controller connected to the memory controller. In the computer system, when detecting that an error occurs in first data that is returned by the medium controller in response to a first send command, the memory controller determines sequence information of the first send command in a plurality of send commands that have been sent by the memory controller within a time period from a time point at which the first send command is sent to a current time, and sends a data retransmission command to the medium controller to instruct the medium controller to resend the first data based on the sequence information.

Abstract: In various examples, a test system is provided for executing built-in-self-test (BIST) on integrated circuits deployed in the field. The integrated circuits may include a first device and a second device, the first device having direct access to external memory, which stores test data, and the second device having indirect access to the external memory by way of the first device. In addition to providing a mechanism to permit the first device and the second device to run test concurrently, the hardware and software may reduce memory requirements and runtime associated with running the test sequences, thereby making real-time BIST possible in deployment. Furthermore, some embodiments permit a single external memory image to cater to different SKU configurations.

Abstract: A method of testing an integrated circuit device, that operates at a clock frequency and that has at least one scan chain that includes a plurality of registers separated by combinatorial logic, includes establishing a respective scan chain test pattern for testing the scan chain where the scan chain test pattern includes a respective bit for each register in the plurality of registers of the scan chain, determining in advance a respective timing delay for each pair of adjacent registers in the scan chain, and, within a single clock period of the clock frequency, applying, in parallel, each bit of the respective scan chain pattern to a respective register in the plurality of registers in the scan chain, each bit of the respective scan chain pattern being applied to its respective register at a respective temporal offset, within the single clock period, based on the respective timing delay.

Abstract: This disclosure describes a reduced pin bus that can be used on integrated circuits or embedded cores within integrated circuits. The bus may be used for serial access to circuits where the availability of pins on ICs or terminals on cores is limited. The bus may be used for a variety of serial communication operations such as, but not limited to, serial communication related test, emulation, debug, and/or trace operations of an IC or core design. Other aspects of the disclosure include the use of reduced pin buses for emulation, debug, and trace operations and for functional operations.

Abstract: A method can be used to test an electronic circuit. The method includes applying a test stimulus signal to the input node, collecting a sequence of N-bit digital test data at the output port. The N-bit digital test data is determined by the test stimulus signal applied to the input node. The method also includes applying N-bit to R-bit lossless compression to the N-bit digital test data to obtain R-bit compressed test data (R is less than N) and making the R-bit compressed test data available in parallel format over R output pins of the circuit.

Abstract: A method for protecting a reconfigurable digital integrated circuit includes multiple parallel processing channels each comprising an instance of a functional logic block and an error detection unit, the method comprising the successive steps of: activating the error detection unit in order to detect an error in at least one processing channel, executing the data replay mechanism, and then activating the error detection unit in order to detect an error in at least one processing channel, if an error is detected again, executing a self-test on each processing channel, for each processing channel, if the self-test does not detect any error, executing the data replay mechanism for this processing channel, if the self-test detects an error, reconfiguring that part of the configuration memory associated with this processing channel.

Abstract: A controller for a memory component comprises a processing unit and at least one memory unit coupled to the processing unit, the memory unit comprising at least a first area for storing a user firmware and a second area for storing a controller firmware; the processing unit is configured to capture a memory address of a program instruction to be executed, compare the memory address with a reference value, and, based on that comparison, enable/restricting actions associated with the program instruction. A related memory component and related methods are also disclosed.

Abstract: Systems and methods for correcting data errors in memory caused by high-temperature processing of the memory are provided. An integrated circuit (IC) die including a memory is formed. Addresses of memory locations that are susceptible to data loss when subjected to elevated temperatures are determined. Bits of data are written to the memory, where the bits of data include a set of bits written to the memory locations. The set of bits are written to a storage device of the IC die that is not susceptible to data loss when subjected to the elevated temperatures, the subset of bits comprise compressed code. At least one of the bits stored at the addresses is overwritten after subjecting the IC die to an elevated temperature. The at least one of the bits is overwritten based on the set of bits written to the storage device.

Abstract: A DDR5 SDRAM DIMM slot detection system and a method thereof are disclosed. A first detection board is serially connected to a second detection board, a JTAG controller converts a DIMM detection instruction, which is generated by a detection device, into a DIMM detection instruction in JTAG format; the DIMM detection instruction in JTAG format is provided to the first detection board or second detection board through the adapter circuit board, so as to detect DDR5 SDRAM DIMM slots of the circuit board under test, thereby achieving the technical effect of improving efficiency in detection for DDR5 SDRAM DIMM connection interface.

Abstract: A bit interleaver, a bit-interleaved coded modulation (BICM) device and a bit interleaving method are disclosed herein. The bit interleaver includes a first memory, a processor, and a second memory. The first memory stores a low-density parity check (LDPC) codeword having a length of 64800 and a code rate of 3/15. The processor generates an interleaved codeword by interleaving the LDPC codeword on a bit group basis. The size of the bit group corresponds to a parallel factor of the LDPC codeword. The second memory provides the interleaved codeword to a modulator for 16-symbol mapping.

Abstract: The disclosure describes a novel method and apparatus for making device TAPs addressable to allow device TAPs to be accessed in a parallel arrangement without the need for having a unique TMS signal for each device TAP in the arrangement. According to the disclosure, device TAPs are addressed by inputting an address on the TDI input of devices on the falling edge of TCK. An address circuit within the device is associated with the device's TAP and responds to the address input to either enable or disable access of the device's TAP.

Abstract: A memory controller includes: a test module for generating a test command, a test address, and test data during a test operation; a refresh control module for receiving the test command and the test address as an active command and an active address, and generating a first target address by sampling the active address according to the active command, during the test operation; a command/address generation module for providing the active address together with the active command, and providing the first target refresh command together with the first target address to a memory device, while determining whether to repair the active address according to a repair control signal; and a repair analysis module for generating the repair control signal based on a comparison result of the test data and read data from the memory device, during the test operation.

Abstract: Testing of integrated circuits is achieved by a test architecture utilizing a scan frame input shift register, a scan frame output shift register, a test controller, and a test interface comprising a scan input, a scan clock, a test enable, and a scan output. Scan frames input to the scan frame input shift register contain a test stimulus data section and a test command section. Scan frames output from the scan frame output shift register contain a test response data section and, optionally, a section for outputting other data. The command section of the input scan frame controls the test architecture to execute a desired test operation.

Abstract: Data verification technology for ordered event stream (OES) events written into an ordered event stream storage system is disclosed. The verification technology provides perfect reliability. The verification technology further requires low storage overhead in comparison to typical checksums, storing replicated data, etc. Test event data can be generated in a reproducible manner based upon determined OES metadata. OES metadata can be determined from input received via a user interface, via characteristics of an OES storage system, etc., and can be stored for later use in data verification. The test event data can be stored to a portion of an OES storage system under test. The stored test event data can subsequently be verified by using the stored OES metadata to regenerate test event data for comparison to the stored test event data. The test event ordering can be verified via sequence information included in the stored test event data.

Abstract: An exemplary testing environment can operate in a testing mode of operation to test whether a memory device or other electronic devices communicatively coupled to the memory device operate as expected or unexpectedly as a result of one or more manufacturing faults. The testing mode of operation includes a shift mode of operation, a capture mode of operation, and/or a scan mode of operation. In the shift mode of operation and the scan mode of operation, the exemplary testing environment delivers a serial input sequence of data to the memory device. In the capture mode of operation, the exemplary testing environment delivers a parallel input sequence of data to the memory device.

Abstract: A test control port (TCP) includes a state machine SM, an instruction register IR, data registers DRs, a gating circuit and a TDO MX. The SM inputs TCI signals and outputs control signals to the IR and to the DR. During instruction or data scans, the IR or DRs are enabled to input data from TDI and output data to the TDO MX and the top surface TDO signal. The bottom surface TCI inputs may be coupled to the top surface TCO signals via the gating circuit. The top surface TDI signal may be coupled to the bottom surface TDO signal via TDO MX. This allows concatenating or daisy-chaining the IR and DR of a TCP of a lower die with an IR and DR of a TCP of a die stacked on top of the lower die.

Abstract: Provided are a signaling coding and modulation method and a demodulation and decoding method and device, characterized in that the method comprises the steps of: extending signaling which has been subjected to first predetermined processing according to an extension pattern table to obtain an extended codeword, and conducting predetermined coding on the extended codeword to obtain a encoded codeword; conducting parity bit permutation on a parity bit portion in the encoded codeword and then splicing the permutated parity bits to the end of information bits in the encoded codeword, to obtain a permutated encoded codeword; according to the length of the signaling, punching the permutated encoded codeword according to a predetermined punching rule to obtain a punched encoded codeword; and conducting second predetermined processing on the punched encoded codeword to obtain a tuple sequence, which is used for mapping, and then mapping the tuple sequence.