Abstract: A memory device includes a bitcell array having a plurality of bitcells, a dummy wordline, a dummy row cell pulldown, and a write tracker coupling the dummy wordline to the dummy row cell pulldown. The write tracker is configured as a transmission gate during a read operation on the bitcell array, and is configured as having only one or more active nMOSFETs during a write operation on the bitcell array.

Abstract: A movable platform, comprising a structural element, a display structured and arranged to be coupled to the structural element, a first flexible support with a first end structured and arranged to be coupled to the structural element and a second end structured and arranged to be coupled to a support structure. The platform further comprises a sensor structured and arranged to provide data representative of movement of the display and at least one actuator, wherein the at least one actuator is structured and arranged to move the display based on at least one control signal. The platform further comprises a control module structured and arranged to send the at least one control signal to the at least one actuator, and operable to determine the at least one control signal based on the data representative of movement of the display and a reference signal.

Abstract: A method and an apparatus are provided for sending a prompt message. The apparatus receives a status of a movable article corresponding to a sensor. The apparatus obtains a working status of an air cleaner bound with the sensor when the movable article corresponding to the sensor is in an open status. The apparatus detects whether the working status of the air cleaner is an on status. The apparatus sends the prompt message in a predetermined manner when it is detected that the working status of the air cleaner is the on status, in which the prompt message is configured to indicate to close the movable article in a room containing the air cleaner or to turn off the air cleaner.

Abstract: A nonvolatile memory includes a first array bank coupled to a first bit-line, a second array bank coupled to a second bit-line, a pre-charging circuit, a first selection circuit, a second selection circuit, and a sense amplifier. An address enable signal sent to the first selection circuit controls whether the pre-charging circuit needs to pre-charge the first bit-line and the second bit-line. The sense amplifier is configured to compare a first voltage from the first output terminal of the pre-charging circuit with a second voltage from the second output terminal of the pre-charging circuit to obtain a result indicating data information stored in the first array bank or in the second array bank. The second selection circuit is configured to connect a reference current to the first input terminal or the second input terminal of the sense amplifier based on a first word-line signal and a second word-line signal.

Abstract: A method of operating a semiconductor device can include determining in which of a plurality of voltage windows the first power supply potential is located; changing at least one voltage window signal when the first power supply potential moves from one voltage window into another of the voltage windows; detecting a change in the at least one voltage window signal; and generating at least one read assist signal in response to the at least one voltage window signal; wherein the at least one read assist signal alters a read operation to a static random access memory (SRAM) cell, as compared to the read operation without the at least one read assist signal.

Abstract: A memory includes first and second select gate transistors, memory cells, a source line, a bit line, a selected word line which is connected to a selected memory cell as a target of a verify reading, a non-selected word line which is connected to a non-selected memory cell except the selected memory cell, a potential generating circuit for generating a selected read potential which is supplied to the selected word line, and generating a non-selected read potential larger than the selected read potential, which is supplied to the non-selected word line, and a control circuit which classifies a threshold voltage of the selected memory cell to one of three groups by verifying which area among three area which are isolated by two values does a cell current of the selected memory cell belong, when the selected read potential is a first value.

Abstract: A memory access module for performing memory access management of a storage device includes a plurality of storage cells. Each storage cell has a number of possible bit(s) directly corresponding to possible states of the storage cell. The memory access module further includes: a read only memory for storing a program code; and a microprocessor, coupled to the read only memory, for executing the program code to perform the following steps: performing a plurality of sensing operations, wherein a first sensing operation corresponds to a first sensing voltage, and each subsequent sensing operation corresponds to a sensing voltage determined according to a result of the previous sensing operation; using the plurality of sensing operations to generate a first digital value and a second digital value of a storage cell; using the first and the second digital value to obtain soft information of a same bit stored in the storage cell; and using the soft information to perform soft decoding.

Abstract: A memory device that includes a substrate of semiconductor material of a first conductivity type, first and second regions spaced apart in the substrate and having a second conductivity type different than the first conductivity type, with a continuous channel region in the substrate extending between the first and second regions. A first floating gate is disposed over and insulated from a first portion of the channel region adjacent to the first region. A second floating gate is disposed over and insulated from a second portion of the channel region adjacent to the second region. A word line gate is disposed over and insulated from a third portion of the channel region between the first and second channel region portions. A first erase gate disposed over and insulated from the first region. A second erase gate disposed is over and insulated from the second region.

Abstract: A stacked semiconductor package includes a functional silicon die, and a test controller having signature accumulation logic embedded therein. A fabric to route transactions is between the test controller and a far memory controller of the functional silicon die. The far memory controller includes a physical memory interface having no physical memory attached. A Two Level Memory (2LM) controller is included having logic to modify received transactions to indicate a cache miss forcing all received transactions to be routed to the far memory controller via the fabric. An auto response mechanism is included to observe the transactions on the fabric and route responses and completions issued in reply to the transactions back to an agent having initiated the transactions.

Abstract: A memory circuit includes: cells arranged in rows and columns so that the rows are grouped to form banks each including one or more rows, each cell including: a bistable circuit storing data; and a non-volatile element storing data stored in the bistable circuit in a non-volatile manner and restoring data stored in a non-volatile manner to the bistable circuit; and a controller that performs a store operation on each row in turn; sets a voltage supplied, as a power-supply voltage, to cells in a first bank, which includes a row on which the store operation is performed, of the banks to a first voltage; and sets a voltage supplied, as a power-supply voltage, to cells in a bank of the banks other than the first bank to a second voltage that is less than the first voltage but at which data in the bistable circuit is retained.

Abstract: Provided are a method and apparatus for endurance friendly programming using lower voltage thresholds. A non-volatile memory has storage cells organized as pages programmed using a first number of threshold voltage levels. The storage cells are organized into storage cell groups to which data is written. Each storage cell group is programmed to store a first number of bits of information. A memory controller selects a second number of bits of information from pages less than the first number of bits of information. The memory controller programs the storage cells of the storage cell group using threshold voltage levels from a second number of threshold voltage levels, wherein the second number of threshold voltage levels is less than the first number of threshold voltage levels and comprises a lowest of the first number of threshold voltage levels.

Abstract: Technology for writing data to a phase change memory array is disclosed. In an example, a method may include identifying mask logic for masking cells in the phase change memory array and routing the mask logic to the cells. The method may further include routing input data to the cells. Set and reset pulses for the cells may be selectively prevented or inhibited based on the mask logic.

Abstract: A semiconductor memory device includes a memory cell, a bit line electrically connected to the memory cell, a sense amplifier electrically connected to the bit line and including a first latch, and a controller configured to execute a write operation on the memory cell. The write operation includes a first program operation followed by a verify operation that includes a step of updating data of the first latch and a second program operation that includes a step of pre-charging the bit line, wherein the step of pre-charging the bit line is initiated prior to the data of the first latch is updated.

Abstract: A structure includes a word-line, a bit-line, and an anti-fuse cell. The anti-fuse cell includes a reading device, which includes a first gate electrode connected to the word-line, a first gate dielectric underlying the first gate electrode, a drain region connected to the bit-line, and a source region. The first gate dielectric has a first thickness. The drain region and the source region are on opposite sides of the first gate electrode. The anti-fuse cell further includes a programming device including a second gate electrode connected to the word-line, and a second gate dielectric underlying the second gate electrode. The second gate dielectric has a second thickness smaller than the first thickness. The programming device further includes a source/drain region connected to the source region of the reading device.

Abstract: A nonvolatile memory system includes a nonvolatile memory device and a memory controller that controls the nonvolatile memory device. The nonvolatile memory device includes multiple memory blocks. Each of the memory blocks includes memory cells. Each of the memory cells has any one of an erase state and one of multiple different program states. An operation method of the nonvolatile memory system includes receiving a physical erase command from an external device. The operation method also includes performing a fast erase operation, responsive to the received physical erase command, with respect to at least one memory block so that first memory cells of the at least one memory block have a fast erase state different from the erase state.

Abstract: A memory and a reference circuit calibration method are provided. The memory includes: a memory array including a plurality of memory cells; a reference circuit including a reference memory cell and a reference connection terminal, wherein the reference memory cell is a same as the memory cell; a calibration circuit including a calibration connection terminal, and a mirror circuit including a first mirror terminal and a second mirror terminal, wherein the first mirror terminal is connected to the reference connection terminal, and the second mirror terminal is connected to the calibration connection terminal; a clamp circuit, configured to set one of a voltage of the reference connection terminal and a voltage of the calibration connection terminal as a preset voltage and to set the other thereof as a comparison voltage; and a comparison circuit configured to input the comparison voltage and the preset voltage, and to output a comparison result.

Abstract: A semiconductor system may include: an external channel including a CA (Command/Address) channel, and first and second data channels; and first and second semiconductor chips, which are coupled in common to the CA channel and coupled to respective different ones of the first and second data channels, and each of which includes a coupling information pad. A first value may be inputted to the coupling information pad of one of the first and second semiconductor chips that is coupled to the first data channel, and a second value may be inputted to the coupling information pad of the other semiconductor chip that is coupled to the second data channel. Each of the first and second semiconductor chips selectively stores setting information using CA information applied to the CA channel and a value inputted to the corresponding coupling information pad.

Abstract: A system for dual mode operation having power saving and active modes in a stacked circuit topology having logic preservation is provided. The system includes a pre-charge circuit and a sleep mode control circuit for providing a signal to disable a plurality of circuit elements and switching a mode of the system, the sleep mode control circuit being coupled to the pre-charge circuit and further being coupled to a logic function circuit, wherein the plurality of circuit elements comprise logic gates and transistor devices. The system also includes a keeper circuit coupled to the global bitline, and the logic function circuit coupled to a solar bitline, wherein the logic function circuit preserves a state of the solar bitline, the state of the global bitline determines the state of the solar bitline. The system includes an effective pull-up transistor coupled to the sleep mode control circuit and the logic function circuit.

Abstract: Physical superconducting qubits are controlled according to an “encoded” qubit scheme, where a pair of physical superconducting qubits constitute an encoded qubit that can be controlled without the use of a microwave signal. For example, a quantum computing system has at least one encoded qubit and a controller. Each encoded qubit has a pair of physical superconducting qubits capable of being selectively coupled together. Each physical qubit has a respective tunable frequency. The controller controls a state of each of the pair of physical qubits to perform a quantum computation without using microwave control signals. Rather, the controller uses DC-based voltage or flux pulses.

Abstract: Stacked semiconductor packages and methods for performing bare die testing on a functional silicon die in a stacked semiconductor package are described. In an example, a stacked semiconductor package includes a functional silicon die, a test controller having signature accumulation logic embedded therein, and a fabric to route transactions between the test controller and any of a plurality of near memory controllers of the functional silicon die.