Patents Examined by Edward R. Cosimano
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Patent number: 7818141Abstract: The invention relates to a vibration dosimeter (2) and a method for determining the daily vibrational loading of persons who are exposed to mechanical oscillations at their place of work due to the operation of a work means and in particular of a manually operated electronic tool (4, 6). What is provided is that the dosimeter (2) comprises a determination device (12, 18) for determining the effective daily operating duration of the work means (4, 6), a computer device (22) for calculating a daily work time until a specified trigger value or exposition limit value of the vibrational loading is reached from a work-means-typical vibration value and the trigger value or exposition limit value, and a comparison device (24) for comparing the determined effective daily operating duration of the work means with the calculated daily work time until the specified trigger value is reached.Type: GrantFiled: January 15, 2007Date of Patent: October 19, 2010Assignee: Robert Bosch GmbHInventors: Markus Roth, Andreas Strasser
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Patent number: 7813898Abstract: Software (140) for processing measurements from a distributed sensing system (100) receives the measurements, and generates a graphical representation of the measurements indicating their location or time sequence, and a representation of locations of physical features along the path (50), or times of external events, the representations being scaled and associated to provide a visual correlation between the locations of the measurements and locations of the physical features, or between times of measurements and times of external events. The enhanced visual correlation can lead to cost savings if more rapid interpretation of large volumes of measurements can give warning of changes such as subsidence of structures, or of ingress of water into oil wells, for example in time for remedial action to be taken.Type: GrantFiled: July 22, 2005Date of Patent: October 12, 2010Assignee: Sensornet LimitedInventors: Tom Richard Parker, Kin-Wei Lee
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Patent number: 7809517Abstract: A system for testing integrated circuit products and other devices under test (DUT) includes a DUT tester, which stimulates the devices under test and analyzes signals from the devices under test. A device interface board transports signals between the DUT tester and the devices under test. A test board is coupled to the device interface board and used to generate measurements associated with the devices under test, such as phase noise or phase jitter measurements. The test board could, for example, include a phase detector for detecting a phase difference between two signals and a control loop for adjusting at least one of the two signals to maintain an average of zero DC volts at an output of the phase detector. A customization module could also be used to customize the test board. The customization module could include a phase shifter, a phase-locked loop synthesizer, and/or an oscillator.Type: GrantFiled: September 7, 2007Date of Patent: October 5, 2010Assignee: National Semiconductor CorporationInventor: Lawrence H. Zuckerman
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Patent number: 7809513Abstract: A method and system of compensating for environmental effect when detecting signals using a structural health monitoring system includes collecting baseline data signals for one or more values of the environmental effect variable from signals transmitted along selected paths between transducers in an array attached to the structure. A threshold is selected based on the baseline data for determining if the signal is detected. Current data signals are collected and matched to the best fit baseline data. The value of the environmental effect variable is determined on the basis of the matching. A signal is detected according to the selected threshold.Type: GrantFiled: December 7, 2007Date of Patent: October 5, 2010Assignee: Acellent Technologies, Inc.Inventors: Shawn J. Beard, Bao Liu, Fu-Kuo Chang
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Patent number: 7805258Abstract: A method of testing a wafer after a current top layer is formed over the wafer. Stress data is collected for the wafer after forming the current top layer. The stress data is derived from changes in wafer curvature. The stress data includes: stress-xx in an x direction and stress-yy in a y direction for each area of a set of finite areas on the wafer, the stress-xx and stress-yy both being derived from wafer-curvature-change-xx in the x direction for each area of the set of finite areas and from wafer-curvature-change-yy in the y direction for each area of the set of finite areas; and the stress-xy being derived from wafer-curvature-change-xy, wherein wafer-curvature-change-xy is a change in wafer twist in the x-y plane for each area of the set of finite areas. A stress gradient vector (and/or its norm) is calculated and used to evaluate the investigating single or multiple accumulated layer.Type: GrantFiled: February 16, 2007Date of Patent: September 28, 2010Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Hsueh-Hung Fu, Chih-Wei Chang, Shih-Chang Chen, Chin-Piao Chang, Shing-Chyang Pan, Wei-Jung Lin, Tsung-Hsun Huang
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Patent number: 7797115Abstract: Capacitive detection systems, modules, and methods. In one embodiment, time interval measurement(s) are generated that are monotonic functions of the capacitance(s) of capacitive sensor(s) in a capacitive sensing area. In one embodiment, the generated time interval measurement(s), or any other monotonic function(s) of capacitance(s) of capacitive sensor(s) in a capacitive sensing area, may be analyzed to detect the presence of an object near the capacitive sensing area and/or to detect the position of an object near the capacitive sensing area.Type: GrantFiled: August 13, 2007Date of Patent: September 14, 2010Assignee: Nuvoton Technology CorporationInventors: Nir Tasher, Vladimir Abramov, Yehezkel Friedman
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Patent number: 7797131Abstract: A method and circuit are provided for measuring frequency response performance of an integrated circuit by providing a pulse having a rising edge and a falling edge where the pulse is provided to a plurality of serially connected components. The number of these components which have propagated the leading edge of the pulse before the occurrence of the falling edge provide a numeric indication of the circuit's frequency response and performance.Type: GrantFiled: August 24, 2007Date of Patent: September 14, 2010Assignee: International Business Machines CorporationInventors: Deepak K. Singh, Francois Ibrahim Atallah, David John Seman
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Patent number: 7797110Abstract: A Laplace transform system comprising a processor, a measured time domain wavefield, a velocity model, and Laplace damping constants, wherein the processor is programmed to calculate a substantially about zero frequency component of a Fourier transform of a time domain damped wavefield, wherein the time domain damped wavefield is damped by the Laplace damping constants to obtain long wavelength velocity information for deeper subsurface regions.Type: GrantFiled: November 19, 2007Date of Patent: September 14, 2010Assignee: Shin's GeophysicsInventor: Changsoo Shin
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Patent number: 7792660Abstract: Provides methods, systems and apparatus for generating alerts for a system process that obtains raw channel data over time from one or more monitored channel of the system process. An example method includes processing the raw channel data to form time dependent signals based one or more user specified processing rules. The method produces alerts based on the deviation in behavior in one or more channels, where the deviation is quantified by a numeric level computed by comparing signals for varying time intervals with historically normal baseline signals. The method may include filtering the alerts to selectively form reportable alerts that are presented to the user based on user specified filtering rules.Type: GrantFiled: October 26, 2007Date of Patent: September 7, 2010Assignee: International Business Machines CorporationInventor: Vijay Sourirajan Iyengar
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Patent number: 7792659Abstract: A device, such as a heat meter for measurements of hot tap water energy usage, separated from building heating energy usage, in a district heating substation. The device is connected only to sensors attached to the supply pipe and return pipe of the district heating substation. A device, such as a heat meter, has a detector to detect a deviation in the total power (P) usage in the district heating substation which deviation depends on the use of warm tap water.Type: GrantFiled: November 2, 2006Date of Patent: September 7, 2010Assignee: Kyab Lulea ABInventor: Kimmo Yliniemi
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Patent number: 7788066Abstract: Noise discrimination in signals from a plurality of sensors is conducted by enhancing the phase difference in the signals such that off-axis pick-up is suppressed while on-axis pick-up is enhanced. Alternatively, attenuation/expansion are applied to the signals in a phase difference dependent manner, consistent with suppression of off-axis pick-up and on-axis enhancement. Nulls between sensitivity lobes are widened, effectively narrowing the sensitivity lobes and improving directionality and noise discrimination.Type: GrantFiled: October 9, 2007Date of Patent: August 31, 2010Assignee: Dolby Laboratories Licensing CorporationInventors: Jon C. Taenzer, Bruce G. Spicer
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Patent number: 7783447Abstract: Two robotic arms roam in separate, non-overlapping areas of a test station, avoiding collisions. A traveling buffer moves along x-tracks between a front position and a back position. In the front position, a first robotic arm loads IC chips from an input tray or stacker into buffer cavities in the traveling buffer. The traveling buffer then moves along the x-tracks to the back position, where a second robotic arm moves chips from the traveling buffer to test boards for testing. After testing, the second robotic arm moves chips to a second traveling buffer, which then moves along tracks to a front position for unloading by the first robotic arm. Two traveling buffers may move on the same tracks in a loop. The buffer cavities in the traveling buffer move on internal tracks to expand and contract spacing and pitch between the front and back positions to match test-board pitch.Type: GrantFiled: November 24, 2007Date of Patent: August 24, 2010Assignee: Kingston Technology Corp.Inventors: Ramon S. Co, Tat Leung Lai, Calvin G. Leong
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Patent number: 7779600Abstract: The invention provides a method of constructing a building roof made from Expanded PolyStyrene (EPS) which is coated on the inside and outside with Glass Fiber Reinforced Concrete (GFRC). The building roof is designed in a CAD program. The roof is then constructed of beams, such as I-shaped beams, of foam and GFRC.Type: GrantFiled: January 10, 2006Date of Patent: August 24, 2010Inventor: Nasser Saebi
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Patent number: 7783434Abstract: Mass flow meter having at least one measurement tube, through which mass flows, as an oscillation body which can be set in mechanical oscillation by means of an excitation unit, the oscillation behavior of which varying as a function of the mass flow can be recorded via at least one oscillation sensor in order to determine the mass flow, wherein in order to eliminate noise signals from the measurement voltage (sen) recorded via the oscillation sensor computational technology means are provided for forming a complex conjugate spectrum (|sa1j|) from the spectrum of the excitation voltage (seD) as well as a vector product between this (|sa1j|) and the measurement voltage (sen) for the purpose of filtering, in order, by further computational technology means for inverse Fourier transformation, to obtain the signal relationship associated with the vector product between the excitation voltage (seD) and the measurement voltage (sen) so that the processed measurement voltage (sa1) resulting therefrom then predominanType: GrantFiled: April 25, 2007Date of Patent: August 24, 2010Assignee: ABB AGInventors: Dieter Keese, Thomas Blume
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Patent number: 7778799Abstract: Described are computer-based methods and apparatuses for automated self test for a thermal processing system. A signal to execute the automated self test is received. The automated self test is executed. The execution includes executing one or more self test instructions for the one or more subsystems of the system. Data can be received from sensors associated with the subsystems. The data can be analyzed to determine the results of the automated self test for the thermal processing system.Type: GrantFiled: January 2, 2007Date of Patent: August 17, 2010Assignee: Hypertherm, Inc.Inventors: Aaron Donald Brandt, Richard Ray Anderson, Christopher Scott Passage, Wayne Chin
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Patent number: 7778780Abstract: One aspect of the invention relates to a method (10) for characterizing a well (700) using distributed temperature sensor (DTS) data to optimise a well model (12). The method comprises providing a well model of flow and thermal properties (12a, 12b) of the well (700), where the well model (12) has a plurality of adjustable physical parameters, providing a data set made up of a plurality of DTS temperature profiles of the well (700) taken at different times during operation of the well (700), and running the well model (12) with different combinations of the plurality of adjustable physical parameters to match to the plurality of DTS temperature profiles. The DTS temperature profiles may also be pre-processed to make them consistent with one another.Type: GrantFiled: May 27, 2005Date of Patent: August 17, 2010Assignee: Schlumberger Technology CorporationInventors: Stephen J. Kimminau, Mohammed Rupawalla, Kashif Rashid, David Michael Hargreaves, Cyril Lagrange
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Patent number: 7778783Abstract: A substance analyzer utilizing Prompt Gamma Neutron Activation Analysis for identifying characteristics of a substance and method of manufacturing the same are disclosed. The analyzer is small enough to be portable and to allow its use in many applications where current analyzers cannot be utilized. The analyzer uses a neutron radiation source and a gamma-ray detector to activate the sample material and detect the prompt gamma rays emitted by the sample material. A novel housing for such an analyzer and method for making the housing are also described. Novel methods of operating such an analyzer including via a communications network are also disclosed. Also disclosed are data analysis methods that improve the accuracy and sensitivity of the results of such material analysis.Type: GrantFiled: December 18, 2006Date of Patent: August 17, 2010Assignee: Sabia, Inc.Inventors: Clinton L. Lingren, David B. Cook, James F. Miller, Stephen J. Foster
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Patent number: 7774154Abstract: In the digitizer, a plurality of ADCs convert a plurality of analogue signals output from the device to be tested, to digital signals, respectively. The processing circuit is configured as a software-independent circuit and processes a plurality of digital signals output from the plurality of ADCs. The processing circuit is formed on the FPGA. In the processing circuit, the FFT circuit performs complex Fourier transform on two digital signals.Type: GrantFiled: June 8, 2007Date of Patent: August 10, 2010Assignee: Advantest CorporationInventors: Norimasa Sato, Kenji Inaba
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Patent number: 7774139Abstract: A method of collecting weather data includes determining probable occurrences of weather events. Contact information corresponding to a plurality of users is maintained. Weather collection devices are sent to the plurality of users prior to the occurrence of the probable weather event. Data is collected by the weather collection devices upon the actual occurrence of the probable weather event.Type: GrantFiled: August 10, 2007Date of Patent: August 10, 2010Assignee: Strategic Design Federation W, Inc.Inventors: Bruce L. Rose, Ian James Miller, Eli L. Wendkos
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Patent number: 7769565Abstract: A measurement information display method includes: generating measurement information of a sample according to progress of measurement of the sample by a measurement unit for measuring the sample, and accumulating the measurement information in a storage part, the measurement information including state information indicating a state of the measurement by the measurement unit; accepting extracting information including an extracting condition regarding the state of measurement of the sample used in extracting the accumulated measurement information, and storing the extracting information in a memory; accepting a selection of the extracting information stored in the memory; extracting the measurement information from the accumulated measurement information according to the selected extracting information; and displaying the extracted measurement information.Type: GrantFiled: August 24, 2007Date of Patent: August 3, 2010Assignee: Sysmex CorporationInventors: Kyozo Fujita, Hiroyuki Fujino, Yoshihiro Mishima