Patents Examined by Edward R. Cosimano
  • Patent number: 7698078
    Abstract: A method of communicating with an electric vehicle wherein the method includes a step of installing a communication device in the electric vehicle. The method also includes establishing a connection from the vehicle to a network. The methodology also includes controlling and monitoring a battery in the electric vehicle.
    Type: Grant
    Filed: July 18, 2007
    Date of Patent: April 13, 2010
    Assignee: Tesla Motors, Inc.
    Inventors: Kurt Kelty, Marc Tarpenning, Scott Kohn
  • Patent number: 7698068
    Abstract: A method for providing data useful in procedures associated with the oral cavity, in which at least one numerical entity representative of the three-dimensional surface geometry and color of at least part of the intra-oral cavity is provided and then manipulated to provide desired data therefrom.
    Type: Grant
    Filed: June 17, 2005
    Date of Patent: April 13, 2010
    Assignee: Cadent Ltd.
    Inventor: Noam Babayoff
  • Patent number: 7693688
    Abstract: A field bus distribution unit (VE) designed for use in process automation technology involving several field devices. The unit is equipped with a microcontroller ?C, which is connected to the field bus (FB) and transmits device-specific information of the field devices that are connected to a field bus distribution unit (VE).
    Type: Grant
    Filed: August 29, 2008
    Date of Patent: April 6, 2010
    Assignee: Endress + Hauser Process Solutions AG
    Inventor: Eugenio Ferreira Da Silva Neto
  • Patent number: 7689375
    Abstract: A position detecting system and method for an electronic device used an audio signal input module of the electronic device and a signal receiver to connect to the audio signal input module convert an external position signal into an audio signal. A position detecting software running on the electronic device analyzes the audio signal. Accordingly, the current position of the electronic device is obtained. The audio signal input module of the electronic device is employed as an input port for the external position signal, thus saving the construction cost of the system. Besides, the current position of the electronic device with an ever-changing position can be obtained during a test process, such that the electronic device can start or stop a test item accordingly.
    Type: Grant
    Filed: November 1, 2007
    Date of Patent: March 30, 2010
    Assignee: Inventec Corporation
    Inventors: Juen Liou, Tom Chen, Win-Harn Liu
  • Patent number: 7684959
    Abstract: The stability index objectively reflects system reliability and yet intuitively reflects the user experience on the system while also providing an understanding of how/when/why problems began.
    Type: Grant
    Filed: February 14, 2007
    Date of Patent: March 23, 2010
    Assignee: Microsoft Corporation
    Inventors: Mario R. Garzia, Mingtian Ni, Todor Ivanov Jivakov, Peng Li
  • Patent number: 7684949
    Abstract: In an embodiment, an integrated circuit or chip is supplied to its intended application and a measurement quantity representing the state of one or a plurality of electrical connections in the chip is determined within the application environment of the chip and, if the measurement quantity determined does not correspond to predefined criteria, a corresponding signal is output.
    Type: Grant
    Filed: August 23, 2007
    Date of Patent: March 23, 2010
    Assignee: Infineon Technologies AG
    Inventor: Henrich Koerner
  • Patent number: 7684950
    Abstract: The invention relates to an arrangement for detecting and transmitting test data from a housing (10) including a pressure chamber (11) that is filled with a high-pressure fluid and is homogeneously pressurized via strip conductors (21) which are connected to a sensor (23) and are guided out of the housing (10). A circuit board (12), both faces of which are subjected to the pressure prevailing in the pressure chamber (11) and at least one portion (30) of which extends out of the housing is disposed inside the pressure chamber (11) as a support of the strip conductors (21). The housing (10) that encloses the pressure chamber (11) is separated on the plane of the printed board (12), the faces of the housing halves (13, 14) clamping the printed board (12) in such a way that radial forces exercised within the printed board when pressure is applied are absorbed by the housing.
    Type: Grant
    Filed: March 31, 2004
    Date of Patent: March 23, 2010
    Assignee: Parker-Hannifin Corporation
    Inventor: Gerd Scheffel
  • Patent number: 7680600
    Abstract: A method for data processing includes transforming measurement data acquired in the time domain during an oilfield operation into a second domain to produce transformed data; identifying distortions in the transformed data; removing the distortions from the transformed data; and transforming back from the second domain to the time domain to produce cleaned-up data. The transforming measurement data may use a Fourier transform or a wavelet transform. The method may further include compressing the cleaned-up data or reconstructing signals from the cleaned-up data. A method for data processing includes decomposing measurement data, which are acquired in an oilfield operation, using a low pass filter to produce a first dataset; decomposing the measurement data using a high pass filter to produce a second dataset; removing distortions from the second dataset to yield a corrected second dataset; and reconstructing a corrected dataset from the first dataset and the corrected second dataset.
    Type: Grant
    Filed: July 25, 2007
    Date of Patent: March 16, 2010
    Assignee: Schlumberger Technology Corporation
    Inventors: Andrew Carnegie, Kai Hsu, Julian Pop
  • Patent number: 7680631
    Abstract: A system for analyzing linear data is provided. The system comprises a datastore of linear data correlated by distance; a library of functions that may be performed on the linear data; computer executable code stored on a computer readable medium for performing an analysis of the sets of linear data based on the functions in the library.
    Type: Grant
    Filed: December 12, 2005
    Date of Patent: March 16, 2010
    Assignee: Bentley System, Inc.
    Inventors: Ernest Theodore Selig, IV, Gerald Cardillo
  • Patent number: 7680622
    Abstract: An integrated circuit comprises a power device located on a die. The power device is operably coupled to a processing function, wherein the signal processing function is operably coupled to two or more temperature sensors. A first temperature sensor is operably coupled to the power device to measure a temperature of the power device and the second temperature sensor is located, such that it measures a substantially ambient temperature related to the die. The signal processing function determines the temperature gradient therebetween.
    Type: Grant
    Filed: April 13, 2005
    Date of Patent: March 16, 2010
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Philippe Dupuy, Laurent Guillot, Eric Moreau, Pierre Turpin
  • Patent number: 7680621
    Abstract: A test instrument network for testing a plurality of DUTs includes a plurality of communicating script processors, the script processors being adapted to execute computer code; and a plurality of measurement resources controllable by the script processors in response to executed computer code, the measurement resources being adapted to test the DUTs. Each script processor and measurement resource may be arbitrarily assigned by the controller to one of at least two groups, only one script processor being assigned to be a master script processor, any other script processor being a slave script processor and any group not including the master script processor being a remote group. The master script processor is exclusively authorized to initiate code execution on any script processor in a remote group. Any slave script processor is only able to initiate operation of measurement resources in it own group.
    Type: Grant
    Filed: August 15, 2007
    Date of Patent: March 16, 2010
    Assignee: Keithley Instruments, Inc.
    Inventor: Todd A. Hayes
  • Patent number: 7680626
    Abstract: Systems and methods are provided for analyzing the timing of circuits, including integrated circuits, by taking into account the location of cells or elements in the paths or logic cones of the circuit. In one embodiment, a bounding region may be defined around cells or elements of interest, and the size of the bounding region may be used to calculate a timing slack variation factor. The size of the bounding region may be adjusted to account for variability in timing delays. In other embodiments, centroids may be calculated using either the location or the delay-weighted location of elements or cells within the path or cone and the centroids used to calculate timing slack variation factor. The timing slack variation factors are used to calculate a new timing slack for the path or logic cone of the circuit.
    Type: Grant
    Filed: May 29, 2007
    Date of Patent: March 16, 2010
    Assignee: International Business Machines Corporation
    Inventors: David J. Hathaway, Jerry D. Hayes, Anthony D. Polson
  • Patent number: 7676340
    Abstract: With regard to a temperature sensor, a control logic circuit conducts control of the temperature sensor. During preparation of the temperature sensor, the control logic circuit reads the result of measurement of the property pertaining to the ambient temperature from the temperature sensor circuit, obtains the initial value and correction value from the result, and stores the pertinent values in the fuse memory. At times of operation of the temperature sensor, the control logic circuit reads the initial value and correction value from the fuse memory, and corrects the measurement values of the temperature sensor circuit using the pertinent values.
    Type: Grant
    Filed: February 2, 2006
    Date of Patent: March 9, 2010
    Assignee: Yamaha Corporation
    Inventors: Shoji Yasui, Masayoshi Omura, Makoto Kaneko
  • Patent number: 7676339
    Abstract: A method of compensating a measurement. The method includes determining a zero-point, determining a rate of change of the zero-point, and compensating the measurement based on the rate of change of the zero-point and/or the zero-point. In one embodiment, the compensated measurement is used to control a safety device in a vehicle.
    Type: Grant
    Filed: September 28, 2005
    Date of Patent: March 9, 2010
    Assignee: Robert Bosch GmbH
    Inventor: Chad Van Fleet
  • Patent number: 7676327
    Abstract: A technique for decomposing a recorded wave field represented in a set of multicomponent, marine seismic data centers around a computer-implemented method including: estimating the statistics of the noise terms in each one of a predetermined group of seismic measurements in a seismic data set acquired in a marine survey; modeling the physical propagation of a recorded wave field represented in the seismic data set from the estimated statistics; and estimating a directional component of the recorded wave field from the physical propagation model that minimizes error relative to the seismic measurements.
    Type: Grant
    Filed: April 26, 2007
    Date of Patent: March 9, 2010
    Assignee: WesternGeco L.L.C.
    Inventors: Ahmet Kemal Ozdemir, Ali Ozbek
  • Patent number: 7676326
    Abstract: A method and system of detecting and mapping a subsurface hydrocarbon reservoir includes determining ratio data for a plurality of orthogonal spectral components of naturally occurring low frequency background seismic data. The ratio data may be compared, plotted, contoured and displayed as a subsurface hydrocarbon reservoir map or a hydrocarbon potential map. The ratio data may represent a vertical spectral component of the seismic data over a horizontal spectral component of the seismic data. The subsurface hydrocarbon reservoir map may include contouring the ratio data over a geographical area associated with the seismic data.
    Type: Grant
    Filed: June 2, 2007
    Date of Patent: March 9, 2010
    Assignee: Spectraseis AG
    Inventors: Yuri Podladchikov, Marc-André Lambert, Rodolphe Dewarrat, Stefan Schmalholz
  • Patent number: 7668697
    Abstract: A method to be implemented on or in a computer is disclosed, where the method includes data collection, calibration, candidate selection, and analysis of data streams associated with each candidate to classify single molecule fluorescence resonance energy transfer events. Once classified, the classification can be related to the nature of the events, such as the identification of dNTP incorporation during primer extension to obtain a base read out of an unknown template.
    Type: Grant
    Filed: February 6, 2007
    Date of Patent: February 23, 2010
    Inventors: Andrei Volkov, Costa M. Colbert, Ivan Pan, Anelia Kraltcheva, Mitsu Reddy, Nasanshargal Battulga, Michael A. Rea, Keun Woo Lee, Susan H. Hardin, Brent Mulder, Chris Hebel, Alok Bandekar
  • Patent number: 7664614
    Abstract: A method of inspecting defect of a mask is provided. In this method, a database for storing a plurality of virtual simulation models is created. The virtual simulation models are determined by a plurality of factors including an optical effect and a chemical effect during the transferring the pattern of a mask to the photoresist layer on a wafer. A mask defect image is acquired. A simulation contour of the mask defect image is generated from at least one virtual simulation model in the database. Next, the acceptability of the mask is determined.
    Type: Grant
    Filed: November 2, 2007
    Date of Patent: February 16, 2010
    Assignee: United Microelectronics Corp.
    Inventors: Te-Hung Wu, Shih-Ming Yen, Chih-Hao Wu, Chuen-Huei Yang
  • Patent number: 7664608
    Abstract: A pattern inspection apparatus which compares images of regions, corresponding to each other, of patterns that are formed so as to be identical and judges that non-coincident portions in the images are defects. The pattern inspection apparatus is equipped with an image comparing section which plots individual pixels of an inspection subject image in a feature space and detects excessively deviated points in the feature space as defects. Defects can be detected correctly even when the same patterns in images have a brightness difference due to a difference in the thickness of a film formed on a wafer.
    Type: Grant
    Filed: July 12, 2007
    Date of Patent: February 16, 2010
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yuta Urano, Akira Hamamatsu, Shunji Maeda, Kaoru Sakai
  • Patent number: 7660687
    Abstract: A method of increasing consistency between separate parametric measurement readings that are taken with an electron beam imaging tool at different times within a period of time, by correcting drift in the imaging tool at a time frequency that is less than a time period during which the drift is anticipated to be undesirably large.
    Type: Grant
    Filed: May 25, 2006
    Date of Patent: February 9, 2010
    Assignee: KLA-Tencor Corporation
    Inventors: Indranil De, Mark A. McCord, David L. Adler