Patents Examined by Kara Geisel
  • Patent number: 7253894
    Abstract: Optical systems that provide for simultaneous images and spectra from an object, such as a tissue sample, an industrial object such as a computer chip, or any other object that can be viewed with an optical system such as a microscope, endoscope, telescope or camera. In some embodiments, the systems provide multiple images corresponding to various desired wavelength ranges within an original image of the object, as well as, if desired, directional pointer(s) that can provide both an identification of the precise location from which a spectrum is being obtained, as well as enhancing the ability to point the device.
    Type: Grant
    Filed: February 7, 2005
    Date of Patent: August 7, 2007
    Assignee: Perceptronix Medical, Inc.
    Inventors: Haishan Zeng, Stephen Lam, Branko Mihael Palcic
  • Patent number: 7251026
    Abstract: Excitation light of a selected wavelength from an excitation monochromator is directed along the long axis of a flow cell containing the sample to be analyzed, generating fluorescence. An emission monochromator is positioned at right angles to the plane of the excitation monochromator and receives the fluorescence from the flow cell utilizing optical components positioned such that the entrance slit of the emission monochromator is aligned with the long axis of the emission window. The intensity of the output from the flow cell is further maximized by positioning a retro-reflecting mirror at the end of the flow channel to effectively double the path-length of the excitation beam, and a reflecting surface on the side of the cell opposite the emission window to increase the collection efficiency and thereby increase the sensitivity of the detector.
    Type: Grant
    Filed: August 28, 2003
    Date of Patent: July 31, 2007
    Assignee: Waters Investments Limited
    Inventor: Anthony C. Gilby
  • Patent number: 7248350
    Abstract: The invention is directed to a method for determining repairability of an original clear coat applied over a darkly pigmented substrate with a corresponding repair clear coat used in repairing damaged original vehicle coatings. The method non-destructively determines the refractive indices of the original clear coat and the corresponding repair clear coats by acquiring the reflection spectrum of these coats with a spectrophotometer with d/8° measurement geometry with and without the specular components followed by determining the refractive indices with the assistance of the differential spectrum between the reflection spectrums with and without the specular components, and then comparing the refractive indices to determine difference between these refractive indices, wherein when the difference between the refractive indices of the original arid repair clear coats is within an acceptable range, the repair clear coat is used for repairing the original clear coat.
    Type: Grant
    Filed: April 27, 2004
    Date of Patent: July 24, 2007
    Assignee: E. I. du Pont de Nemours and Company
    Inventor: Wilhelm Kettler
  • Patent number: 7248362
    Abstract: A small-spot imaging, spectrometry instrument for measuring properties of a sample has a polarization-scrambling element, such as a birefringent plate depolarizer, incorporated between the polarization-introducing components of the system, such as the beamsplitter, and the microscope objective of the system. The plate depolarizer varies polarization with wavelength, and may be a Lyot depolarizer with two plates, or a depolarizer with more than two plates (such as a three-plate depolarizer). Sinusoidal perturbation in the resulting measured spectrum can be removed by data processing techniques or, if the depolarizer is thick or highly birefringent, the perturbation may be narrower than the wavelength resolution of the instrument.
    Type: Grant
    Filed: November 15, 2006
    Date of Patent: July 24, 2007
    Assignee: Tokyo Electron Limited
    Inventors: Adam E. Norton, Kenneth C. Johnson, Fred E. Stanke
  • Patent number: 7242469
    Abstract: New and improved applications of Raman Scattering are disclosed. These applications may be implemented with or without using an enhanced nano-structured surface that is trademarked as the RamanNanoChip™ disclosed in a pending patent. As a RamanNanoChip™ provides much higher sensitivity in SERS compared with conventional enhance surface, broader scopes of applications are now enabled and can be practically implemented as now disclosed in this application. Furthermore, a wide range of applications is achievable as new and improved Raman sensing applications. By applying the analysis of Raman scattering spectrum, applications can be carried out to identify unknown chemical compositions to perform the tasks of homeland security; food, drug and drinking materials safety; early disease diagnosis; environmental monitoring; industrial process monitoring, precious metal and gem authentications, etc.
    Type: Grant
    Filed: November 12, 2004
    Date of Patent: July 10, 2007
    Assignee: Opto Trace Technologies, Inc.
    Inventors: Hong Wang, Zhimin Liu
  • Patent number: 7239394
    Abstract: A device for determining the result of an assay may include a computation circuit, responsive to a signal representing the amount of an analyte or the rate of accumulation of an analyte, to: compare the signal to a first threshold; compare the signal to a second threshold, the second threshold being less than the first threshold; generate an output signal if the signal exceeds the first threshold or the signal is less than the second threshold, the output signal indicative of a first result if the signal exceeds the first threshold, or, alternatively, the output signal indicative of a second result if the signal is less than the second threshold; and terminate the assay if the signal exceeds the first threshold or the signal is less than the second threshold.
    Type: Grant
    Filed: December 19, 2003
    Date of Patent: July 3, 2007
    Assignee: Inverness Medical Switzerland GmbH
    Inventors: Stephen Paul Sharrock, Andrew Peter Phelan
  • Patent number: 7233397
    Abstract: Methods and apparatus are provided that print a set of similar color patches using a color output device, determine colorimetric values for each color patch, calculate a standard deviation value for each of the colorimetric values, and calculate a numerical value that is a function of the standard deviation values and that represents the colorimetric deviation of the set.
    Type: Grant
    Filed: December 22, 2003
    Date of Patent: June 19, 2007
    Assignee: Electronics For Imaging, Inc.
    Inventor: Darren Cumming
  • Patent number: 7233390
    Abstract: A method for simulating the optical properties of samples having non-uniform line edges includes creating a model for the sample being analyzed. To simulate roughness, lines within the model are represented as combinations of three dimensional objects, such as circular or elliptical mesas. The three-dimensional objects are arranged in a partially overlapping linear fashion. The objects, when spaced closely together resemble a line with edge roughness that corresponds to the object size and pitch. A second method allows lines within the model to vary in width over their lengths. The model is evaluated using a suitable three-dimensional technique to simulate the optical properties of the sample being analyzed.
    Type: Grant
    Filed: March 8, 2004
    Date of Patent: June 19, 2007
    Assignee: Therma-Wave, Inc.
    Inventors: Yia-Chung Chang, Hanyou Chu, Jon Opsal
  • Patent number: 7230690
    Abstract: A method and apparatus for ensuring consistency of color and cosmetic appearance of injection molded parts used in the fabrication of enclosures for information handling systems. A sample of polymer material having a texture and color in accordance with a predetermined specification is inspected by a spectrophotometer and the results of the measurements are stored in a cosmetic feature database of a manufacturing system. A plurality of enclosures for the information handling systems are then manufactured using information stored in the cosmetic feature database. Each of the enclosures has a molded feature that can be used to verify surface finish quality and color consistency of the injection molded parts used to fabricate the enclosure. In a production run for fabricating a plurality of enclosures, one of the enclosures can be removed from the production line and a molded feature can be inspected to determine whether the molded parts comply with predetermined standards for color and surface finish.
    Type: Grant
    Filed: April 6, 2004
    Date of Patent: June 12, 2007
    Assignee: Dell Products L.P.
    Inventors: Randall T. Smith, David Williams
  • Patent number: 7230707
    Abstract: Systems, methodologies, media, and other embodiments associated with color measuring are described. One exemplary system embodiment includes a spectrophotometer, one or more light sources for illuminating an interior of the spectrophotometer, and a digital camera configured at a port of the spectrophotometer and being configured to measure light components from a sample. In the present invention, segmentation logic is provided for the spectrophotometer that is configured to employ computational image segmentation to characterize specular reflection from a sample and to characterize a selected patch or portion from the test sample, such as a selected color in a multicolor pattern. In accordance with the present invention, the spectrophotometer and the included digital camera may be color-characterized in situ.
    Type: Grant
    Filed: December 17, 2004
    Date of Patent: June 12, 2007
    Assignee: Datacolor Holding AG
    Inventors: Alan Ingleson, David Slocum, Michael H. Brill
  • Patent number: 7227637
    Abstract: The subject invention relates to a broadband optical metrology system that segregates the broadband radiation into multiple sub-bands to improve overall performance. Each sub-band includes only a fraction of the original bandwidth. The optical path—the light path that connects the illuminator, the sample and the detector—of each sub-band includes a unique sub-band optical system designed to optimize the performance over the spectral range spanned by the sub-band radiation. All of the sub-band optical systems are arranged to provide small-spot illumination at the same measurement position. Optional purging of the individual sub-band optical paths further improves performance.
    Type: Grant
    Filed: April 7, 2006
    Date of Patent: June 5, 2007
    Assignee: Therma-Wave, Inc.
    Inventors: David Y. Wang, Lawrence Rotter, Jeffrey T. Fanton, Jeffrey E. McAninch
  • Patent number: 7227634
    Abstract: A method is disclosed for controlling a lighting fixture of a kind having individually colored light sources, e.g., LEDs, that emit light having a distinct luminous flux spectrum that varies in its initial spectral composition, that varies with temperature, and that degrades over time. The method controls such fixture so that it projects light having a predetermined desired flux spectrum despite variations in initial spectral characteristics, despite variations in temperature, and despite flux degradations over time.
    Type: Grant
    Filed: June 6, 2005
    Date of Patent: June 5, 2007
    Inventor: David W. Cunningham
  • Patent number: 7227624
    Abstract: An apparatus (100) senses a degree of cleanliness of a plasma reactor having a chamber (102) containing a plasma (103) that emits light (104) during a process conducted in the chamber (102). The apparatus (100) also has a light sensing element (180), configured to sense an intensity of the light (104) emitted by the plasma (103) after the light (104) passes through a film (135) that accrues in the chamber (102) during the process, and to provide a light intensity indication signal, and an electronics assembly (170) configured to receive the light intensity indication signal and to provide an indication of the degree of cleanliness of the plasma reactor.
    Type: Grant
    Filed: July 24, 2002
    Date of Patent: June 5, 2007
    Assignee: Tokyo Electron Limited
    Inventors: Steven T. Fink, Thomas Windhorn
  • Patent number: 7227639
    Abstract: A method and apparatus for determining a color and brightness of an LED includes a sensor having a plurality of filters and an output probe connected to the sensor, the output probe providing a color output and a brightness output in a single signal. The sensor may further include an input probe connected to the sensor providing power and a ground probe connected to the sensor providing a grounded connection to the sensor. The plurality of filters in the sensor are preferably configured in a matrix array of color receptors having different colors.
    Type: Grant
    Filed: April 4, 2006
    Date of Patent: June 5, 2007
    Assignee: Test Coach Corporation
    Inventor: Kevin Schmitt
  • Patent number: 7221451
    Abstract: A method for measuring a spectrum of a terahertz pulse includes generating a terahertz pulse using an ultrashort pulsed pumping light, generating a white light pulse using an ultrashort pulsed probe light, stretching and chirping the white light pulse modulating the chirped white light pulse such that the terahertz pulse and the chirped white light pulse irradiate into an electro-optic crystal synchronously, so that the chirped white light pulse is modulated by an electric field signal induced at the electro-optic crystal irradiated by the terahertz pulse, detecting a spectrum of chirped white light pulse modulated at the electro-optic modulating step by a multi-channeled detector, analyzing an electric field of the teraherz pulse irradiated to the electro-optic crystal from the spectrum of the chirped white light pulse detected by the multi-channeled spectrum detecting step, and transforming the analyzed electric field signal into a frequency spectrum of the terahertz pulse.
    Type: Grant
    Filed: August 26, 2004
    Date of Patent: May 22, 2007
    Assignee: Aisin Seiki Kabushiki Kaisha
    Inventors: Hideyuki Ohtake, Koichiro Tanaka, Masaya Nagai, Junpei Yamashita, Kumiko Yamashita
  • Patent number: 7221440
    Abstract: The present invention relates to ink output in ink jet printing systems. A refractometer is used to control the concentration of inks used in continuous ink jet printers. A concentration detector measures the total amount of light reflected from a surface. Changes in the ink cause a definite change in sensor output. As the refractive index is changed, shifting the critical angle for internal reflection, more or less light is reflected to the sensor. The index of refraction can be determined from the sensor once corrections are made to account for temperature dependencies of the sensor and light source and baseline measurement of reflected light amplitude. These dependencies are carried out in the refractometer.
    Type: Grant
    Filed: July 22, 2004
    Date of Patent: May 22, 2007
    Assignee: Eastman Kodak Company
    Inventors: James D. McCann, Daniel J. DeVivo, Jeffrey S. Trapp
  • Patent number: 7215422
    Abstract: A spectrometer assembly (10) is disclosed. The assembly includes a light source (11) with a continuous spectrum. A pre-monochromator (2) generates a spectrum with a relatively small linear dispersion from which a spectral portion is selectable, the spectral bandwidth of the spectral portion being smaller than or equal to the bandwidth of the free spectral range of the order in the echelle spectrum. The centre wavelength of the selected spectral interval is measurable with maximum blaze efficiency. The assembly also includes an echelle spectrometer (4) with means for wavelength calibration, an entrance slit (21) at the pre-monochromator (2), an intermediate slit assembly (50) with an intermediate slit (3) and a spatially resolving light detector (5) in the exit plane of the spectrometer for the detection of wavelength spectra.
    Type: Grant
    Filed: January 28, 2003
    Date of Patent: May 8, 2007
    Assignees: Gesellschaft zur Förderung der Analytischen Wissenschaften e.V., Gesellschaft zur Förderung angewandter Optik, Optoelektronik, Quantenelektronik und Spektroskonie e. V.
    Inventors: Stefan Florek, Helmut Becker-Ross, Uwe Heitmann
  • Patent number: 7206072
    Abstract: The discriminating method utilizes first to third sensors respectively having spectral sensitivities corresponding to three primary colors and a fourth sensor having a spectral sensitivity that does not overlap the spectral sensitivities corresponding to the three primary colors as sensors constituting an image pickup system, and discriminates a light source type of a photographic light source by using information obtained by the first to fourth sensors. The image forming method corrects image data of an input image using the light source type discriminated by the above light source type discriminating method.
    Type: Grant
    Filed: October 6, 2003
    Date of Patent: April 17, 2007
    Assignee: Fujifilm Corporation
    Inventors: Koji Takahashi, Hideyasu Ishibashi, Makoto Yamada
  • Patent number: 7203402
    Abstract: Methods and apparatus for generating a frequency comb and for its use in analyzing materials and in telecommunications. The frequency comb is generated by passing pulsed light from a laser through an optical fiber having a constriction. The frequency comb comprises a plurality of monochromatic components separated in frequency by a substantially constant frequency increment. The monochromatic components are used to probe materials for analysis. In preferred embodiments, the materials are DNA, RNA, PNA and other biologically important molecules and polymers. Optical responses are observed and used to analyze or identify samples. In telecommunication applications, the individual monochromatic components serve as carriers for individual communication channels that can carry information of any of a variety of types, such as voice, data and images.
    Type: Grant
    Filed: January 30, 2006
    Date of Patent: April 10, 2007
    Assignee: Menlo Biocombs, Inc.
    Inventors: Theodor W. Haensch, Michael Mei, Ronald Holzwarth, Frederick R. Blume
  • Patent number: 7199876
    Abstract: A hyperspectral imager including a first optical sub-system, at least one slit element, a second optical sub-system, at least one reflective dispersive element located at a center plane, and at least one detecting element located at substantially an image surface. During operation, the first optical sub-system images, onto the slit element(s), electromagnetic radiation originating at a source. The second optical sub-system substantially collimates, at a center plane, electromagnetic radiation emanating from the slit element(s). The second optical sub-system also images, onto the image surface, the electromagnetic radiation reflected from the reflective dispersive element(s). The detecting element(s) detect the dispersed electromagnetic radiation reflected from the reflective dispersive element(s).
    Type: Grant
    Filed: December 31, 2003
    Date of Patent: April 3, 2007
    Assignee: Wavefront Research, Inc.
    Inventor: Thomas A. Mitchell