Abstract: Disclosed is a technique capable of reducing loss at the time of switching in a diode. A diode disclosed in the present specification includes a cathode electrode, a cathode region made of a first conductivity type semiconductor, a drift region made of a low concentration first conductivity type semiconductor, an anode region made of a second conductivity type semiconductor, an anode electrode made of metal, a barrier region formed between the drift region and the anode region and made of a first conductivity type semiconductor having a concentration higher than that of the drift region, and a pillar region formed so as to connect the barrier region to the anode electrode and made of a first conductivity type semiconductor having a concentration higher than that of the barrier region. The pillar region and the anode are connected through a Schottky junction.

Abstract: A semiconductor device includes a semiconductor region having charge carriers of a first conductivity type, a transistor cell in the semiconductor region, and a semiconductor channel region in the transistor cell and having a first doping concentration of charge carriers of a second conductivity type. A semiconductor auxiliary region in the semiconductor region has a second doping concentration of charge carriers of the second conductivity type, which is at least 30% higher than the first doping concentration. A pn-junction between the semiconductor auxiliary region and the semiconductor region is positioned as deep or deeper in the semiconductor region as a pn-junction between the semiconductor channel region and the semiconductor region. The semiconductor auxiliary region is positioned closer to the semiconductor channel region than any other semiconductor region having charge carriers of the second conductivity type and that forms a further pn-junction with the semiconductor region.

Abstract: The present invention relates generally to semiconductor devices and more particularly, to a structure and method of forming a fin using double trench epitaxy. The fin may be composed of a III-V semiconductor material and may be grown on a silicon, silicon germanium, or germanium substrate. A double trench aspect ratio trapping (ART) epitaxy method may trap crystalline defects within a first trench (i.e. a defective region) and may permit formation of a fin free of patterning defects in an upper trench (i.e. a fin mold). Crystalline defects within the defective region may be trapped via conventional aspect ratio trapping or three-sided aspect ratio trapping. Fin patterning defects may be avoided by utilizing a fin mold to grow an epitaxial fin and selectively removing dielectric material adjacent to a fin region.

Abstract: The present disclosure provides a semiconductor structure. The semiconductor structure includes a fin structure on a substrate; a first gate stack and a second gate stack formed on the fin structure; a dielectric material layer disposed on the first and second gate stacks, wherein the dielectric layer includes a first portion disposed on a sidewall of the first gate stack with a first thickness and a second portion disposed on a sidewall of the second gate stack with a second thickness greater than the first thickness; a first gate spacer disposed on the first portion of the dielectric material layer; and a second gate spacer disposed on the second portion of the dielectric material layer.

Abstract: An image sensor includes a substrate including opposite first and second surfaces, first and second gates, on the first surface of the substrate, which each extend in a first direction, a first isolation layer in the substrate between the first and second gates and having a first width in a second direction crossing the first direction, a second isolation layer on the first isolation layer, in the substrate, and having a second width smaller than the first width in the second direction. The second isolation layer is closer to the second surface of the substrate than the first isolation layer. A vertical distance between the first isolation layer and the second isolation layer is ? or less of a height of the first isolation layer.

Abstract: A semiconductor package structure includes a first redistribution layer, a second redistribution layer and an interconnecting structure. The first redistribution layer has a first surface and a second surface opposite to each other. The second redistribution layer is disposed over the first surface of the first redistribution layer, wherein the second redistribution layer has a third surface and a fourth surface opposite to each other, and the third surface facing the first surface. The interconnecting structure is disposed between and electrically connected to the first redistribution layer and the second redistribution layer, wherein the interconnecting structure comprises a conductive post and a conductive bump stacked to each other.

Abstract: The present application discloses an array substrate having a display area and a peripheral area. The array substrate includes a plurality of first thin film transistors respectively in a plurality of subpixels in the display area; and a plurality of second thin film transistors in the peripheral area, an oxygen content in active layers of the plurality of first thin film transistors being higher than that in active layers of the plurality of second thin film transistors.

Abstract: The invention discloses an AMOLED doubled-sided display, with the OLED array layer comprising a plurality of top-emitting OLED units and a plurality of bottom-emitting OLED units arranged in an array, wherein the top emitting and bottom-emitting OLED units being arranged alternatingly in at least one of the horizontal direction or vertical direction; the top-emitting and bottom-emitting OLED units having different thickness for respective anodes and cathodes, to realize the top-emitting characteristics of the top-emitting OLED units and the bottom-emitting characteristics of the bottom-emitting OLED units; as such, by designing an algorithm for a single IC to control image displaying, only a display panel and a control IC are sufficient to achieve double-sided displaying, and able to ensure an observer standing in front of the display panel will not see mirrored image or directional distorted image, as well as achieve low-cost and quality display result.

Abstract: A display panel comprises a base substrate and a plurality of gate lines and data lines arranged on the base substrate. The gate lines and the data lines are crisscrossed to define a plurality of pixel regions. The display panel further comprises pixel electrodes arranged within the pixel regions and common electrodes arranged in opposite to the pixel electrodes, wherein an orthographic projection of the common electrodes on the substrate is not overlapped with an orthographic projection of the gate lines on the substrate, and/or the orthographic projection of the common electrodes on the substrate is not overlapped with an orthographic projection of the data lines on the substrate.

Abstract: A method of making a semiconductor device comprising the steps of providing a first manufacturing line, providing a second manufacturing line, and forming a first redistribution interconnect structure using the first manufacturing line while forming a second redistribution interconnect structure using the second manufacturing line. The method further includes the steps of testing a first unit of the first redistribution interconnect structure to determine a first known good unit (KGU), disposing a known good semiconductor die (KGD) over the first KGU of the first redistribution interconnect structure, and dicing the first KGU and KGD from the first redistribution interconnect structure.

Abstract: A semiconductor device includes a substrate including a first region and a second region, memory transistors on the first region, a first interconnection layer on the memory transistors and including first interconnection lines, and a second interconnection layer on the first interconnection layer and including second interconnection lines. The second interconnection lines on the first region include a first line extending along a first direction and spaced from the second region by a first distance along the first direction, and a second line extending along the first direction, spaced from the first line along a second direction intersecting the first direction, and having a width smaller than that of the first line. The first line includes a protrusion extending along a third direction toward the substrate. The protrusion is spaced from the second region by a second distance along the first direction greater than the first distance.

Abstract: A thin film transistor array formed substrate including a gate electrode, a gate insulation layer, a source wiring structure including a source wiring and a source electrode, a drain electrode, a pixel electrode connected to the drain electrode, a semiconductor layer formed in a stripe shape having a longitudinal side extending in a direction that the source wiring extends, and a protection layer formed to cover an entire portion of the semiconductor layer. The source wiring structure has notch portions positioned in the direction that the source wiring extends such that the notch portions overlap with the gate electrode, the source wiring has a first portion having a first width where the notch portions are formed and a second portion having a second width larger than the first width where no notch portions are formed, and the source wiring has an opening in the second portion.

Abstract: A method for fabricating a phase shift mask includes preparing a transmissive substrate on which a first mask region and a second mask region surrounding the first mask region are defined. In the first mask region, main patterns are formed having a first pitch in a first direction and a second direction perpendicular to the first direction. Each of the main patterns has a first area. In at least one row, assist patterns are formed at the first pitch to surround the main patterns. Each of the assist patterns has a second area less than the first area. In the second mask region, dummy patterns are formed in a plurality of rows. The dummy patterns surround the assist patterns at the first pitch. Each of the dummy patterns has a third area greater than the first area.

Abstract: A semiconductor device includes transistors over a substrate, and first, second, and third metallization layers over the transistors. The first, second, and third metallization layer includes first, second, and third metal features, respectively. The second metal features are oriented lengthwise substantially perpendicular to the first metal features, and the third metal features are oriented lengthwise substantially parallel to the first metal features. The first, second, and third metal features have a first, second, and third thickness, respectively, along a first direction perpendicular to a top surface of the substrate. The second thickness is smaller than both the first and the third thicknesses.

Abstract: A perpendicularly magnetized magnetic tunnel junction (p-MTJ) is disclosed wherein a free layer (FL) has a first interface with a MgO tunnel barrier, a second interface with a Mo or W Hk enhancing layer, and is comprised of FexCoyBz wherein x is 66-80, y is 5-9, z is 15-28, and (x+y+z)=100 to simultaneously provide a magnetoresistive ratio >100%, resistance x area product <5 ohm/?m2, switching voltage <0.15V (direct current), and sufficient Hk to ensure thermal stability to 400° C. annealing. The FL may further comprise one or more M elements such as O or N to give (FexCoyBz)wM100-w where w is >90 atomic %. Alternatively, the FL is a trilayer with a FeB layer contacting MgO to induce Hk at the first interface, a middle FeCoB layer for enhanced magnetoresistive ratio, and a Fe or FeB layer adjoining the Hk enhancing layer to increase thermal stability.

Abstract: The invention discloses an organic light-emitting display panel, an electronic device and a method for manufacturing the same. The organic light-emitting display panel includes: pixel regions on a substrate which emit light of various colors; each pixel region includes a first electrode, a light-emitting functional layer and a second electrode, one of the first electrode and the second electrode is light exit side electrode(s); an optical coupling layer is set on one side of the light exit side electrode far from the light-emitting functional layer; the refractive index of the optical coupling layer in the blue light wavelength region is 2 to 2.3; the difference between the refractive index of the optical coupling layer in the blue light wavelength region and that in the green light wavelength region is less than or equal to 0.2.

Abstract: A display panel includes a substrate which includes a display region and a non-display region. The display panel further includes a plurality of OLED cells provided in the display region; a monitoring electrode provided in the non-display region, the monitoring electrode being capable of reacting with water and/or oxygen so that the resistance thereof changes; and a thin film encapsulation layer at least covering the display region and the monitoring electrode. A manufacturing method of the display panel is also provided.

Abstract: A semiconductor device and method of forming the same, the semiconductor device includes a substrate, first plug, a magnetoresistive random access memory (MRAM) structure, a spacer layer, a seal layer and a first conductive pattern. The substrate has a first region and a second region, and the first plug is disposed on a dielectric layer disposed on the substrate, within the first region. The MRAM structure is disposed in the dielectric layer and electrically connected to the first plug. The spacer layer is disposed both within the first region and the second region, to cover the MRAM structure. The seal layer is disposed on the MRAM structure and the first plug, only within the first region. The first conductive pattern penetrates through the seal layer to electrically connect the MRAM structure.

Abstract: Integrated circuit devices include a substrate including first and second fin-type active regions and first and second gate structures. The first gate structure includes first gate insulating layer on the first fin-type active region to cover upper surface and both side surfaces of the first fin-type active region, first gate electrode on the first gate insulating layer and has first thickness in first direction perpendicular to upper surface of the substrate, and second gate electrode on the first gate electrode. The second gate structure includes second gate insulating layer on the second fin-type active region to cover upper surface and both side surfaces of the second fin-type active region, third gate insulating layer on the second gate insulating layer, third gate electrode on the third gate insulating layer and has second thickness different from the first thickness in the first direction, and fourth gate electrode on the third gate electrode.

Abstract: A technique relates to forming a self-aligning field effect transistor. A starting punch through stopper comprising a substrate having a plurality of fins patterned thereon, an n-type field effect transistor (NFET) region, a p-type field effect transistor (PFET) region, and a center region having a boundary defect at the interface of the NFET region and the PFET region is first provided. The field effect transistor is then masked to mask the NFET region and the PFET region such that the center region is exposed. A center boundary region is then formed by etching the center region to remove the boundary defect.