Abstract: This application discloses an information exchange method and apparatus. In the method, a terminal device transmits attach request information to a core network device, receives attach accept information of the core network device, where the attach accept information includes a first integrity check code; the terminal device obtains a second integrity check code based on the attach accept information; and the terminal device obtains, if the first integrity check code is the same as the second integrity check code, a third integrity check code based on encrypted attach complete information, and transmits encrypted attach complete information to which the third integrity check code is added to the core network device. This reduces data exchange procedures, reduces an amount of data of exchanged information, and reduces a time consumed in an information exchange process performed between the terminal device and the core network device.

Abstract: A method for forming a semiconductor device includes forming a metal gate stack having a gate dielectric layer and a gate electrode disposed over the gate dielectric layer. The gate electrode includes a first metal layer and a second metal layer. The method further includes performing a plasma treatment to a top surface of the metal gate stack and forming a conductive layer over the treated top surface of the metal gate stack. A top portion of the conductive layer is formed above a top surface of the gate dielectric layer, and a bottom portion of the conductive layer penetrates into the first and the second metal layers of the gate electrode at different distances.

Abstract: A defect inspection system is disclosed, and comprises a linear light source, N number of cameras, a display device, a tag reader, and a modular electronic device, in which the linear light source, the cameras and the modular electronic device are used for conducting a defect inspection of an article. On the other hand, the display device, the tag reader and the modular electronic device are adopted for conducting in production of at least one labeled example. Therefore, the modular electronic device is allowed to apply a machine learning process to an image classifier under using a training dataset containing the labeled examples, thereby producing at least one new defect recognition model or updating the existing defect recognition model.

Abstract: The disclosure related to a resin composition for molding device for dental restoration comprising 10 to 50 parts by weight of an urethane acrylate oligomer with a functionality less than 4, 20 to 40 parts by weight of morpholino-group containing acrylate monomera morpholino-group containing acrylate monomer, 10 to 40 parts by weight of a polymerizable acrylate monomer composition and 0.5 to 5 parts by weight of a photoinitiator, wherein the polymerizable acrylate monomer composition comprises 40 to 60 parts by weight of an alicyclic acrylate monomer and 40 to 60 parts by weight of ether-bond containing aliphatic acrylate monomeran ether-bond containing aliphatic acrylate monomer. The shore hardness of the resin composition after being cured of the present invention is not less than 70D and the flexural strain thereof is not less than 0.15.

Abstract: Apparatus, methods and instructions for disinfecting air. The apparatus may include, and the methods may involve, a fixture. The fixture may include a germicidal light source. The fixture may include a fan. The fan may circulate air through a volume into which the germicidal light source propagates germicidal light. The light source may be configured to emit, upward from a horizontal plane, a beam that, absent reflection off an environmental object, does not cross the horizontal plane. The apparatus may include a shield that prevents light from the light source from crossing the horizontal plane. The sensor may face upward from the horizontal plane. The sensor may face downward from the horizontal plane.

Abstract: Apparatus, methods and instructions for disinfecting air. The apparatus may include, and the methods may involve, a fixture. The fixture may include a germicidal light source. The fixture may include a fan. The fan may circulate air through a volume into which the germicidal light source propagates germicidal light. The light source may be configured to emit, upward from a horizontal plane, a beam that, absent reflection off an environmental object, does not cross the horizontal plane. The apparatus may include a shield that prevents light from the light source from crossing the horizontal plane. The sensor may face upward from the horizontal plane. The sensor may face downward from the horizontal plane.

Abstract: The present disclosure provides a semiconductor device and a method of forming the same. The semiconductor device includes a first channel members being vertically stacked, a second channel members being vertically stacked, an n-type work function layer wrapping around each of the first channel members, a first p-type work function layer over the n-type work function layer and wrapping around each of the first channel members, a second p-type work function layer wrapping around each of the second channel members, a third p-type work function layer over the second p-type work function layer and wrapping around each of the second channel members, and a gate cap layer over a top surface of the first p-type work function layer and a top surface of the third p-type work function layer such that the gate cap layer electrically couples the first p-type work function layer and the third p-type work function layer.

Abstract: A semiconductor device includes a stack of semiconductor layers vertically arranged above a semiconductor base structure, a gate dielectric layer having portions each surrounding one of the semiconductor layers, and a gate electrode surrounding the gate dielectric layer. Each portion of the gate dielectric layer has a top section above the respective semiconductor layer and a bottom section below the semiconductor layer. The top section has a top thickness along a vertical direction perpendicular to a top surface of the semiconductor base structure; and the bottom section has a bottom thickness along the vertical direction. The top thickness is greater than the bottom thickness.

Abstract: An array substrate, a fabrication method of the array substrate and a mask, where a metal film is provided on a substrate, a first groove and a second groove are formed on the metal film, the bottom surface of the first groove is closer to the substrate compared to that of the second groove, a projection of the first groove on a plane parallel to the substrate is located within that of the second groove, thereby reducing a slope of a notch sidewall, avoiding the sliding of formed subsequent film layers off the first notch sidewall; the metal film may be covered by the subsequent film layers, improving the performance of the array substrate.

Abstract: A communication method and a communications apparatus are provided. The communication method includes: sending, by a terminal device, a first indication message, where the first indication message is used to indicate a first time type and/or a first time precision, or the first indication message is used to indicate an access network device to send time information to the terminal device; receiving, by the terminal device, the time information; and synchronizing, by the terminal device, a time of the terminal device based on the time information. Correspondingly, a communications apparatus is further provided. According to the embodiments of this application, the terminal device can obtain, based on requirements of different application scenarios, a time type and/or time precision preferred by the terminal device.

Abstract: A method includes providing a structure having a first channel member and a second channel member over a substrate. The first channel member is located in a first region of the structure and the second channel member is located in a second region of the structure. The method also includes forming a first oxide layer over the first channel member and a second oxide layer over the second channel member, forming a first dielectric layer over the first oxide layer and a second dielectric layer over the second oxide layer, and forming a capping layer over the second dielectric layer but not over the first dielectric layer. The method further includes performing an annealing process to increase a thickness of the second oxide layer under the capping layer.

Abstract: A device includes a semiconductor substrate, a fin structure on the semiconductor substrate, a gate structure on the fin structure, and a pair of source/drain features on both sides of the gate structure. The gate structure includes an interfacial layer on the fin structure, a gate dielectric layer on the interfacial layer, and a gate electrode layer of a conductive material on and directly contacting the gate dielectric layer. The gate dielectric layer includes nitrogen element.

Abstract: An n-type field effect transistor includes semiconductor channel members vertically stacked over a substrate, a gate dielectric layer wrapping around each of the semiconductor channel members, and a work function layer disposed over the gate dielectric layer. The work function layer wraps around each of the semiconductor channel members. The n-type field effect transistor also includes a WF isolation layer disposed over the WF layer and a gate metal fill layer disposed over the WF isolation layer. The WF isolation layer fills gaps between adjacent semiconductor channel members.

Abstract: A motor controlling system is disclosed. The motor controlling system is integrated in an apparatus having roll-to-roll mechanism, and comprises a linear light source, N number of cameras and a modular electronic device. When a roll of continuous web material is discharged by an unwinding unit of the roll-to-roll mechanism so as to be further transferred to an inspection unit, the cameras are controlled by the modular electronic device to capture a plurality of time-consecutive material image frames. Subsequently, the modular electronic device conducts a defection inspection for a segment of the continuous web material by applying an image process to the material image frames. As a result, in case of there being at least one defect found, the modular electronic device stops a plurality of motors of the apparatus from running, thereby making the segment of the continuous web material be positioned on an inspection platform.

Abstract: A pickleball paddle includes a paddle body and a handle connected to the paddle body. The paddle body has at least one hollow cylindrical space therein. An angle is formed between an axis of the hollow cylindrical space and front and back face-plates of the paddle body. The hollow cylindrical space has an axial length and a radial length. The axial length is greater than the radial length. At least one rolling member that can roll back and forth along an axial direction of the hollow cylindrical space is disposed in the hollow cylindrical space. The pickleball paddle can enhance an explosive force for hitting a ball.

Abstract: A time of flight (TOF) measurement method and apparatus are provided, including a controller, a time to digital converter, a pulse transmitter, and a pulse receiver. The controller is configured to control, in a working period according to a predetermined transmit rule, the pulse transmitter to sequentially send M transmit pulses. The pulse receiver is configured to receive N feedback pulses in the working period. The time to digital converter is configured to obtain time of flight information corresponding to the N feedback pulses. The controller is further configured to obtain a target time of flight based on the time of flight information corresponding to the N feedback pulses, and obtain a target distance based on the target time of flight.

Abstract: Examples of determining electronic component authenticity via electronic signal signature measurement are discussed. Reference pin identifiers corresponding to pins of a known authentic electronic component are determined. Measurement values corresponding to characteristics of pins of an electronic component are obtained, and pin identifiers based on the measurement values are generated. Accordingly, an indication that the electronic component is authentic can be provided based at least in part on a comparison of the pin identifiers and the reference pin identifiers.

Abstract: This application provides a communication method and a communications device. The method includes: obtaining, by a first communications device, authorization information, where the authorization information indicates that a second communications device is a device that needs to perform time synchronization; and providing, by the first communications device, time information for the second communications device based on the authorization information; or obtaining, by the first communications device, authorization information, where the authorization information indicates that the second communications device is not a device that needs to perform time synchronization; and skipping, by the first communications device, providing time information for the second communications device based on the authorization information, to avoid broadcasting the time information to all communications devices, so that a time synchronization service can be provided for a specific communications device.

Abstract: An optical transmitting apparatus is disclosed, in the apparatus, an array light source include M*N light sources, and an included angle between any column of light sources in the N columns of light sources and any row of light sources in the M rows of light sources is a preset angle. The array light source is located on a first side of a collimating lens, a plane on which the array light source is located is perpendicular to an optical axis of the collimating lens, and a distance between the plane on which the array light source is located and a center point of the collimating lens is a focal length of the collimating lens. An rotatable scanning mirror is located on a second side of the collimating lens, and a center point of a reflective surface of the scanning mirror is on the optical axis of the collimating lens.