Abstract: A method of redistribution layer routing for 2.5D integrated circuit packages is proposed, which is executed by a computer, the method comprising using the computer to perform the following: performing a MMSIM (modulus-based matrix splitting iteration method) based routing to assign pre-assignment nets to tracks such that total vertical distance from each bump pair to the assigned track is minimized; and performing a MWMCBM (minimum weighted maximum cardinality bipartite matching) based routing for bumps connected to the assigned tracks according to matching result to complete redistribution layer routing for integrated circuit packages.

Abstract: A triple well isolated diode including a substrate having a first conductivity type and a buried layer in the substrate. The buried layer has a second conductivity type opposite to the first conductivity type. The triple well isolated diode includes an epi-layer over the substrate and the buried layer. A portion of the epi-layer having the first conductivity type contacts the buried layer. The triple well isolated diode includes a first well, a second well, a third well and a deep well in the epi-layer. The first well and the third well have the second conductivity type. The second well and the deep well have the first conductivity type. The second well surrounds sides of the first well. The third well surrounds sides of the second well. The deep well extends beneath the first well to electrically connect to the second well on opposite sides of the first well.

Abstract: A semiconductor structure is disclosed. The semiconductor structure includes: a substrate; a gate structure formed over the substrate; a source region and a drain region formed in the substrate on either side of the gate structure, the source region and the drain region both having a first type of conductivity; and a field plate formed over the substrate between the gate structure and the drain region; wherein the field plate is coupled to the source region or a bulk electrode of the substrate. An associated method for fabricating the semiconductor structure is also disclosed.

Abstract: A method of making a curved electrochromic film includes: disposing a UV curable adhesive layer between a first electrochromic member and a second electrochromic member to form an electrochromic film semi-product in flat form; arching the electrochromic film semi-product between the first and second bending members of a forming apparatus and by moving the first and second bending members toward each other; and curing the UV curable adhesive layer using a UV light source while the electrochromic film semi-product is arched. Forming apparatuses for forming a flat electrochromic film semi-product into a curved electrochromic film are also disclosed.

Abstract: A manufacturing method of a semiconductor device includes the following steps. A first stacked structure and a second stacked structure are formed on a core region and an input/output (I/O) region of a semiconductor substrate respectively. The first stacked structure includes a first patterned oxide layer, a first patterned nitride layer, and a first dummy gate. The second stacked structure includes a second patterned oxide layer, a second patterned nitride layer, and a second dummy gate. The first dummy gate and the second dummy gate are removed for forming a first recess above the core region and a second recess above the I/O region. A first gate structure is formed in the first recess and a second gate structure is formed in the second recess. The first patterned nitride layer is removed before the step of forming the first gate structure in the first recess.

Abstract: A manufacturing method of a semiconductor device includes the following steps. A first stacked structure and a second stacked structure are formed on a core region and an input/output (I/O) region of a semiconductor substrate respectively. The first stacked structure includes a first patterned oxide layer, a first patterned nitride layer, and a first dummy gate. The second stacked structure includes a second patterned oxide layer, a second patterned nitride layer, and a second dummy gate. The first dummy gate and the second dummy gate are removed for forming a first recess above the core region and a second recess above the I/O region. A first gate structure is formed in the first recess and a second gate structure is formed in the second recess. The first patterned nitride layer is removed before the step of forming the first gate structure in the first recess.

Abstract: A semiconductor device and method for forming the semiconductor device are provided. In some embodiments, a semiconductor substrate comprises a device region. An isolation structure extends laterally in a closed path to demarcate the device region. A first source/drain region and a second source/drain region are in the device region and laterally spaced. A sidewall of the first source/drain region directly contacts the isolation structure at a first isolation structure sidewall, and remaining sidewalls of the first source/drain region are spaced from the isolation structure. A selectively-conductive channel is in the device region, and extends laterally from the first source/drain region to the second source/drain region. A plate comprises a central portion and a first peripheral portion. The central portion overlies the selectively-conductive channel, and the first peripheral portion protrudes from the central portion towards the first isolation structure sidewall.

Abstract: A seatpost has a post body, an adjusting mount, a connecting unit, and a connecting bracket. The post body has a supporting base disposed at an upper end of the post body. The supporting base has a bore formed through a rear end of the supporting base. The adjusting mount is connected to the supporting base and has a passing hole disposed at a rear end of the adjusting mount. The connecting unit is connected to the adjusting mount and has a connecting portion having a threaded hole. A bolt passes through the bore, the passing hole, and is screwed with the threaded hole. The connecting bracket has a front end connected to the connecting portion, a rear end opposite the front end, and an assembling board disposed at the rear end of the connecting bracket for assembling a taillight or a bicycle license plate.

Abstract: A component such as a display may have a substrate and thin-film circuitry on the substrate. The thin-film circuitry may be used to form an array of pixels for a display or other circuit structures. Metal traces may be formed among dielectric layers in the thin-film circuitry. Metal traces may be provided with insulating protective sidewall structures. The protective sidewall structures may be formed by treating exposed edge surfaces of the metal traces. A metal trace may have multiple layers such as a core metal layer sandwiched between barrier metal layers. The core metal layer may be formed from a metal that is subject to corrosion. The protective sidewall structures may help prevent corrosion in the core metal layer. Surface treatments such as oxidation, nitridation, and other processes may be used in forming the protective sidewall structures.

Abstract: A method of utilizing an audio signal to transmit data for conducting electronic transactions includes in a user device, converting user identification data into a first audio signal and transmitting the first audio signal to a base device; in the base device, converting the first audio signal into the user identification data; in the base device, transmitting the user identification data and transaction content to a server device; and in the server device, obtaining authorization of a validation entity by utilizing the user identification data and the transaction content, for obtaining a transaction number and transmitting the transaction number to the base device.

Abstract: A semiconductor structure is disclosed. The semiconductor structure includes: a substrate; a gate structure formed over the substrate; a source region and a drain region formed in the substrate on either side of the gate structure, the source region and the drain region both having a first type of conductivity; and a field plate formed over the substrate between the gate structure and the drain region; wherein the field plate is coupled to the source region or a bulk electrode of the substrate. An associated method for fabricating the semiconductor structure is also disclosed.

Abstract: A touch control device includes a cover lens, a groove, a fingerprint, and a touch sensing structure. The cover lens has a first surface and a second surface opposite to the first surface, in which the first surface is a touch surface. The groove is disposed on the second surface and has a top surface and a side surface adjacent to the top surface, in which an angle between the top surface and the side surface is greater than 90°. The fingerprint recognition structure is at least partially disposed on the top surface of the groove. The touch sensing structure is disposed on the second surface.

Abstract: Power Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) and methods of forming the same are provided. A power MOSFET may comprise a first drift region formed at a side of a gate electrode, and a second drift region beneath the gate electrode, adjacent to the first drift region, with a depth less than a depth of the first drift region so that the first drift region and the second drift region together form a stepwise shape. A sum of a depth of the second drift region, a depth of the gate dielectric, and a depth of the gate electrode may be of substantially a same value as a depth of the first drift region. The first drift region and the second drift region may be formed at the same time, using the gate electrode as a part of the implanting mask.

Abstract: A semiconductor device includes a substrate and a gate structure over a top surface of the substrate. The semiconductor device further includes a source in the substrate on a first side of the gate structure. The semiconductor device further includes a drain in the substrate on a second side of the gate structure. The semiconductor device further includes a first well having a first dopant type, wherein the first well surrounds the source. The semiconductor device further includes a second well having a second dopant type opposite the first dopant type, wherein the second well surrounds the drain, an entirety of an upper most surface of the second well between the drain and the first well is coplanar with the top surface of the substrate, and the second well is spaced from the first well.

Abstract: The disclosure provides a 3D image display device. The 3D image display device includes a display module having multiple sub-pixels, a driving module, and an optical module disposed opposite to the display module. The driving module is electrically connected to the sub-pixels. The optical module provides a normal view zone and a reverse view zone. A plurality of view images are arranged in the normal view zone and the reverse view zone. The view images in the normal view zone are arranged in a forward order, the view images in the reverse view zone are arranged in a reverse order, and the width of the normal view zone is greater than the width of the reverse view zone.

Abstract: A container has a body, two handles, a handle combination structure, and two lids. The body has a body space formed in the body. The handles are connected with the body, and each handle has two connecting portions and two bent grooves. The connecting portions are formed between the handle and the body and are bendable. The bent grooves are defined in the handle and are adjacent respectively to the connecting portions of the handle. The handle combination structure is formed on the handles to selectively combine the two handles with each other. The lids are connected with the body and are respectively located in spaces which are respectively formed between the body and the handles. Each lid has a connecting portion formed between the body and the lid and being bendable.

Abstract: A metal-oxide-semiconductor field effect transistor (MOSFET) includes a substrate and a gate structure over a top surface of the substrate. The MOSFET further includes a source in the substrate on a first side of the gate structure and a drain in the substrate on a second side of the gate structure opposite the first side. The gate structure includes a variable thickness gate dielectric layer. The variable thickness gate dielectric layer includes a first portion closest to the drain, the first portion having a first thickness. The variable thickness gate dielectric layer further includes a second portion distal from the drain, the second portion having a second thickness less than the first thickness.

Abstract: The present disclosure provides a transistor structure, including a self-aligned source-drain structure surrounded by an insulating structure and a gate of a second conductive type separated from the source and the drain by the insulating structure. The self-aligned source-drain structure includes a source and a drain of a first conductive type, a channel between the source and the drain, and a polysilicon contact over and aligned with the channel. A method for manufacturing the transistor structure is also provided in the present disclosure.

Abstract: The present disclosure provides a transistor structure, including a self-aligned source-drain structure surrounded by an insulating structure and a gate of a second conductive type separated from the source and the drain by the insulating structure. The self-aligned source-drain structure includes a source and a drain of a first conductive type, a channel between the source and the drain, and a polysilicon contact over and aligned with the channel. A method for manufacturing the transistor structure is also provided in the present disclosure.