Abstract: A nonvolatile latch circuit and a system on a chip are provided with the same feature detection of change of latch data in an active period to store new data in a latch without an additional data storage time. The nonvolatile latch circuit does not require an additional data storage period but detects change of latch data in the active period to store new data in a nonvolatile latch unit. When power is accidentally off, new data are constantly stored in the nonvolatile latch unit, thereby preventing data loss and improving an operating speed without a booting time for restoring data.

Abstract: A nonvolatile ferroelectric memory device is provided so as to control read/write operations of a nonvolatile memory cell using a channel resistance of the memory cell which is differentiated by polarity states of a ferroelectric material. In the memory device, an insulating layer is formed on a bottom word line, and a floating channel layer comprising a N-type drain region, a P-type channel region and a N-type source region is formed on the insulating layer. Then, a ferroelectric layer is formed on the floating channel layer, and a word line is formed on the ferroelectric layer. As a result, the resistance state induced to the channel region is controlled depending on the polarity of the ferroelectric layer, thereby regulating the read/write operations of the memory cell array.

Abstract: A nonvolatile ferroelectric memory device is provided so as to control read/write operations of a nonvolatile memory cell using a channel resistance of the memory cell which is differentiated by polarity states of a ferroelectric material. In the memory device, an insulating layer is formed on a bottom word line, and a floating channel layer comprising a N-type drain region, a P-type channel region and a N-type source region is formed on the insulating layer. Then, a ferroelectric layer is formed on the floating channel layer, and a word line is formed on the ferroelectric layer. As a result, the resistance state induced to the channel region is controlled depending on the polarity of the ferroelectric layer, thereby regulating the read/write operations of the memory cell array.

Abstract: A capacitor applied to a voltage multiplier and a modulator/demodulator of a RFID device is formed as a nonvolatile ferroelectric capacitor formed by the same process of a memory cell capacitor. The nonvolatile ferroelectric capacitor has a high dielectric constant to reduce the area of the capacitor.

Abstract: A nonvolatile ferroelectric memory device includes a plurality of memory cells connected serially between a bit line and a sensing line, a first switching unit configured to selectively connect the memory cells to the bit line in response to a first selecting signal, and a second switching unit configured to selectively connect the memory cells to the sensing line in response to a second selecting signal. The first switching unit and the second switching unit have the same structure as that of the memory cell.

Abstract: A method for driving a semiconductor memory device, includes initializing first data corresponding to a refresh time of each corresponding row included in a cell array; storing second data corresponding to column data included in the first row after entering a self refresh mode; setting the first data corresponding to the first row by detecting the refresh time of the first row while performing refresh operations on the other rows in the cell array according to a refresh period selected based on the corresponding first data for predetermined refresh cycles, wherein the refresh operation is not performed on the first row during the predetermined refresh cycles; restoring the second data to the first row; and repeating the above steps for the other rows to thereby set the corresponding first data until the setting step is completed for all rows or the self refresh mode expires.

Abstract: A semiconductor memory device includes a first cell array including a plurality of unit cells and a bit line sense amplifying unit for sensing and amplifying data signals stored in the unit cells. Each unit cell is provided with a PMOS transistor and a capacitor. Therefore, the semiconductor memory device efficiently operates with low voltage without any degradation of operation speed.

Abstract: The present invention discloses improved semiconductor device and method for manufacturing wherein one side of a source and drain region and a portion of a channel region are disposed on a buried oxide layer formed on a semiconductor substrate and the side of the source and drain region and another portion of the channel region are disposed on a Si epitaxial layer formed on a semiconductor substrate.

Abstract: A RFID device having a nonvolatile ferroelectric memory regulates bit line capacitance to optimize a bit line sensing margin and minimize power consumption. The RFID device having an analog block adapted and configured to transmit and receive a radio frequency signal to/from an external communication apparatus, a digital block adapted and configured to receive a power voltage and the radio frequency signal from the analog block, transmit a response signal to the analog block and output a memory control signal, and a memory adapted and configured to store data and regulate bit line capacitance.

Abstract: A semiconductor memory device having a cell array area for reading or storing data, including: a normal cell block including a plurality of normal cells, each being coupled to one of a bit line and a bit line bar for storing a data; and a reference cell block including a plurality of reference cell units, each including a reference capacitor, a first reference transistor for connecting a first terminal of the reference capacitor to the bit line, a second reference transistor for connecting the first terminal of the reference capacitor to the bit line bar, and a third reference transistor connected to a reference voltage for supplying the reference voltage to the first terminal of the reference capacitor.

Abstract: A data input/output driver for use in a semiconductor memory device includes a data transmitting block for transmitting a data between an inside and an outside of the semiconductor memory device and generating a data driving signal in order to indicate a timing of outputting the data. A reference data generating block generates a reference data. A switching block outputs the reference data in response to the data driving signal. The data and the reference data are combined as an output signal.

Abstract: A data input buffer in a semiconductor is capable of avoiding operation speed deterioration of the data input buffer due to the temperature condition or process characteristic. The data input buffer in a semiconductor device includes an input detecting unit for detecting logic level of input data by comparing the voltage level of the input data with a reference voltage, a current driving capability adjusting unit for adjusting current driving capability of the input detecting unit based on at least one of temperature condition and process characteristic, and a buffering unit for buffering the output signal from the input detecting unit.

Abstract: A RFID device has a nonvolatile ferroelectric memory including a memory cell array area supplied only with a high voltage and a peripheral area supplied with a low voltage, thereby reducing power consumption. The RFID device includes an antenna adapted and configured to transceive a radio frequency signal from an external communication apparatus, an analog block adapted and configured to generate a power voltage in response to the radio frequency signal received from the antenna, a digital block adapted and configured to receive the power voltage from the analog block, transmit a response signal to the analog block and output a memory control signal, and a memory adapted and configured to generate a high voltage with the power voltage and access data in response to the memory control signal.

Abstract: A semiconductor device has a silicon substrate, in which an active region is formed between two device isolation films and a gate is formed on the surface of the active region. The silicon substrate has a laterally etched portion in the active region below the surface of the active region on the side near the device isolation film. An insulating film is formed on the laterally etched portion of the silicon substrate. A conductive electrode is formed on the insulating film, through which an external voltage is applied to adjust a threshold voltage. The device isolation film is formed on the conductive electrode. None or some pockets of vacant cavity is present between the device isolation film and the conductive electrode.

Abstract: The present invention provides a semiconductor design technology, in particular a data input buffer for use therein. This data input buffer secures a data level sensing margin in a weak data transmission cycle upon an asymmetrical data pattern transmission. Specifically, the present invention provides a technology of improving a level sensing margin in a weak data transmission cycle following after adjusting a reference level for input sensing by a constant level toward a strong data direction in a strong data transmission cycle (in case of repeating data with same polarity) by tracing a pattern of transmission data. Further, the present invention employs a method of adjusting an amount of current that flows in a data input part and a reference voltage input part to make a pull-up/pull-down of the reference level without a change of the reference voltage that is constant voltage.

Abstract: A semiconductor memory device having a test control circuit includes a cell array, a BIST (built-in self test) circuit adapted and configured to perform a BIST operation on the cell array, a BISR (built-in self repair) circuit adapted and configured to perform a BISR operation on the cell array, and a command decoder adapted and configured to generate a first control signal for selecting a BIST operation by the BIST circuit or a test by an external tester and a second control signal for controlling a BISR operation by the BISR circuit. As a result, a test by an external tester, a BIST (built-in self test) and a BISR (built-in self repair) are individually performed in response to an additional command signal.

Abstract: A semiconductor memory device having a cell array area for reading or storing data, including: a normal cell block including a plurality of normal cells, each being coupled to one of a bit line and a bit line bar for storing a data; a reference cell block including a plurality of reference cell units, each including a reference capacitor, a first reference metal oxide semiconductor (MOS) transistor for connecting the reference capacitor to the bit line, and a second reference MOS transistor for connecting the reference capacitor to the bit line bar; and a third reference MOS transistor coupled to the reference cell block for charging the reference capacitor with a reference voltage.

Abstract: A RFID device has a nonvolatile ferroelectric memory including a memory cell array area supplied only with a high voltage and a peripheral area supplied with a low voltage, thereby reducing power consumption. The RFID device includes an antenna adapted and configured to transceive a radio frequency signal from an external communication apparatus, an analog block adapted and configured to generate a power voltage in response to the radio frequency signal received from the antenna, a digital block adapted and configured to receive the power voltage from the analog block, transmit a response signal to the analog block and output a memory control signal, and a memory adapted and configured to generate a high voltage with the power voltage and access data in response to the memory control signal.

Abstract: A nonvolatile semiconductor memory device is provided for a high-powered system without the need for an additional system setting process to set the system initialization state after power-on to the previous state. The nonvolatile semiconductor memory device comprises a pull-up driving unit configured to include a plurality of nonvolatile cells for storing inputted data and to pull up a storage node, a pull-down driving unit configured to pull down the storage node, and a plurality of data registers including a data input/output unit configured to selectively input/output data between a bit line and the storage node depending on a voltage applied to a word line.

Abstract: A RFID device having a nonvolatile ferroelectric memory regulates bit line capacitance to optimize a bit line sensing margin and minimize power consumption. The RFID device having an analog block adapted and configured to transmit and receive a radio frequency signal to/from an external communication apparatus, a digital block adapted and configured to receive a power voltage and the radio frequency signal from the analog block, transmit a response signal to the analog block and output a memory control signal, and a memory adapted and configured to store data and regulate bit line capacitance.