Abstract: A vertical semiconductor device includes odd and even cell blocks, and odd and even block pad structures. Each of the odd cell blocks includes first conductive line structures including conductive lines and insulation layers alternatively stacked in a first direction. Each of the even cell blocks includes second conductive line structures having substantially the same shape as the first conductive line structures. The odd block pad structure is connected to first edge portions of the first conductive line structures. The even block pad structure is connected to second edge portions, opposite the first edge portions, of the second conductive line structures. Each of the odd cell blocks and the even cell blocks has a first width in a third direction. Each of the odd and even block pad structures is formed on a region of a substrate having a second width greater than the first width in the third direction.

Abstract: An air blower enables cold-air dehumidification by removing moisture in summer, can supply instantaneous hot air when the room temperature temporarily goes down, enables hot-air humidification by supplying moisture in winter, enables a four-season use by using an additional humidification function in spring and fall, controls room temperature and room humidity by providing an indoor temperature/humidity sensor and a water temperature sensor, saves energy by intelligently operating and stopping all the functions, provides warning signs through lamps for indicating supply or discharge or lack of water with a high/low water level gauge of a water tank and a high water level gauge of a water tank for dehumidification, prevents safety accidents such as damage or conflagration and the like of components related to a fan driving motor by providing a fan driving motor overheating prevention sensor, prevents the leakage of water when a main body falls down.

Abstract: A three-dimensional semiconductor memory device including a substrate including a first connection region, a second connection region, and a cell array region disposed between the first and second connection regions. The memory device further includes an electrode structure including a plurality of electrodes vertically stacked on the substrate, wherein each of the electrodes has a pad exposed on the first connection region, and a dummy electrode structure disposed adjacent to the electrode structure and including a plurality of dummy electrodes vertically stacked on the substrate. Each dummy electrode has a dummy pad exposed on the second connection region. The electrode structure includes a first stair structure and a second stair structure which each includes the pads of the electrodes exposed on the first connection region. The first stair structure extends along a first direction, and the second stair structure extends along a second direction that crosses the first direction.

Abstract: Disclosed is a substrate inspection system. The substrate inspection system comprises a substrate inspection apparatus that inspects a substrate by irradiating light thereto. The substrate inspection apparatus comprises a light source to irradiate light onto the substrate, a detector to receive light from the substrate, and a controller to control an inspection mode of the substrate inspection apparatus by controlling the light source and the detector. The inspection mode comprises a first inspection mode to inspect whether a particle is present on the substrate and a second inspection mode to inspect a thickness of the substrate.

Abstract: Disclosed is a semiconductor memory device may include a substrate including a cell array region and a contact region and a stacking structure including a plurality of insulating layers and a plurality of gate electrodes alternately stacked on the substrate. The stacking structure may include a stepwise structure in the contact region. Ones of the plurality of gate electrodes may include a respective pad unit that comprises a step of the stepwise structure. At least one of the pad units may include a base pad and a protrusion pad on the base pad. The protrusion pad may be between and spaced apart from two edges of a surface of the base pad that are perpendicular to an extension direction of the respective gate electrode.

Abstract: Disclosed are an inspection apparatus and a method of manufacturing a semiconductor device using the same. The inspection apparatus includes a stage configured to receive a substrate, an objective lens on the stage and configured to enlarge the substrate optically, an ocular lens on the objective lens and configured to form at its image plane an image of the substrate, and a plurality of sensors above the ocular lens and in the image plane of the ocular lens.

Abstract: Processing methods may be performed to form recesses in a semiconductor substrate. The methods may include oxidizing an exposed silicon nitride surface on a semiconductor substrate within a processing region of a semiconductor processing chamber. The methods may include forming an inert plasma within the processing region of the processing chamber. Effluents of the inert plasma may be utilized to modify the oxidized silicon nitride. A remote plasma may be formed from a fluorine-containing precursor to produce plasma effluents. The methods may include flowing the plasma effluents to the processing region of the semiconductor processing chamber. The methods may also include removing the modified oxidized silicon nitride from the semiconductor substrate.

Abstract: A lighting module may be provided that includes: a bottom plate having thermally a heat radiating characteristic; a light emitter comprising a substrate disposed on the bottom plate and a plurality of light emitting devices disposed on the substrate; an optical structure covering the light emitter, the optical structure comprising an outer frame surrounding the substrate and a plurality of lenses corresponding to the plurality of the light emitting devices; an upper case covering the optical structure and coupled to the bottom plate and having an opening for allowing lights which have passed through the plurality of lenses of the optical structure; and a gasket disposed between the outer frame of the optical structure and the upper case.

Abstract: An integrated circuit (IC) device includes: a channel region that extends on the substrate to penetrate a plurality of word lines; a bit line contact pad that contacts an upper surface of the channel region; a bit line that contacts the bit line contact pad and extends on the bit line contact pad in a direction parallel to the main surface of the substrate; a common source line that partially fills a word line cut region and has a height lower than that of the channel region; and a common source via contact that contacts an upper surface of the common source line in the word line cut region.

Abstract: A memory card includes first and second groups of terminals, at least one controller, and first and second nonvolatile memories. The first group of terminals are adjacent to an edge at an insertion side of a substrate and include a first power terminal to provide a first voltage. The second group of terminals is spaced farther apart from the edge at the insertion side than the first group of terminals and includes a second power terminal to provide a second voltage. The at least one memory controller is connected to the first and second groups of terminals, and the first and second nonvolatile memories are independently connected to the at least one controller. The at least one controller simultaneously accesses the first nonvolatile memory and the second nonvolatile memory when the first group of terminals and the second group of terminals are connected to an external host.

Abstract: An optical inspection apparatus includes an inspection target unit on which an inspection target is loaded, an illumination optical unit configured to irradiate incident light to the inspection target, an objective lens unit disposed between the illumination optical unit and the inspection target unit, a detection optical unit configured to receive reflective light reflected from the inspection target to thereby detect a presence or absence of a defect on the inspection target, and a control unit configured to control the illumination optical unit and the detection optical unit. The illumination optical unit includes a light source part configured to irradiate the incident light, and a spatial filter array configured to modify a transmission region of the incident light irradiated from the light source part. The spatial filter array includes a spatial filter part, and a filter movement part configured to move the spatial filter part.

Abstract: An automatic focus control apparatus includes a light detector, which receives light reflected by a surface of a wafer and generates a light reception signal based on the received signal, a controller, which generates a driving signal, the driving signal being one of a first signal and a second signal, the driving signal indicating whether to perform automatic focus control based on the light reception signal, a focus error corrector, which generates a focus error correction signal based on the driving signal, and a stage driver, which displaces a wafer stage supporting the wafer by adjusting the z-axis position of the wafer stage based on the focus error correcting signal if the driving signal is the first signal, and maintains the z-axis position of the wafer stage based on the focus error correction signal if the driving signal is the second signal.

Abstract: Provided is a touch chip including a touch input detector and a compensator, wherein an input terminal of the touch input detector and an output terminal of the compensator are together connected to a touch input sensing electrode, and a direction change of a first current flowing through the input terminal of the touch input detector and a direction change of a second current flowing through the output terminal of the compensator are performed through synchronization.

Abstract: An optical transformation module includes a light generator generating a parallel light beam to be incident onto a surface of an inspection object and changing a wavelength of the parallel light beam, and a rotating grating positioned on a path of the parallel light beam and rotatable by a predetermined rotation angle such that the parallel light beam is transformed according to the wavelength of the parallel light beam and the rotation angle of the rotating grating to have a desired incidence angle and a desired incidence position onto the surface of the inspection object.

Abstract: An integrated circuit (IC) device includes: a channel region that extends on the substrate to penetrate a plurality of word lines; a bit line contact pad that contacts an upper surface of the channel region; a bit line that contacts the bit line contact pad and extends on the bit line contact pad in a direction parallel to the main surface of the substrate; a common source line that partially fills a word line cut region and has a height lower than that of the channel region; and a common source via contact that contacts an upper surface of the common source line in the word line cut region.

Abstract: A memory device includes a plurality of gate electrode layers stacked on a substrate, a plurality of channel layers penetrating the plurality of gate electrode layers, a gate insulating layer between the plurality of gate electrode layers and the plurality of channel layers, and a common source line on the substrate adjacent to the gate electrode layers. The common source line includes a first part and a second part that are alternately arranged in a first direction and have different heights in a direction vertical to a top surface of the substrate. The gate insulating layer includes a plurality of vertical parts and a horizontal part. The plurality of vertical parts surrounds corresponding ones of the plurality of channel layers. The horizontal part extends parallel to a top surface of the substrate.

Abstract: A memory device includes a gate structure including a plurality of gate electrode layers stacked on an upper surface of a substrate, a plurality of channel areas passing through the gate structure and extending in a direction perpendicular to the upper surface of the substrate, a source area disposed on the substrate to extend in a first direction and including impurities, and a common source line extending in the direction perpendicular to the upper surface of the substrate to be connected to the source area, and including a plurality of layers containing different materials.

Abstract: A vertical non-volatile memory device includes a substrate including a cell region; a lower insulating layer on the substrate; a lower wiring pattern in the cell region having a predetermined pattern and connected to the substrate through the lower insulating layer; and a plurality of vertical channel layers extending in a vertical direction with respect to a top surface of the substrate in the cell region, spaced apart from one another in a horizontal direction with respect to the top surface of the substrate, and electrically connected to the lower wiring pattern. The memory device also includes a plurality of gate electrodes stacked alternately with interlayer insulating layers in the cell region in the vertical direction along a side wall of a vertical channel layer and formed to extend in a first direction along the horizontal direction.

Abstract: A memory device includes a gate structure including a plurality of gate electrode layers stacked on an upper surface of a substrate, a plurality of channel areas passing through the gate structure and extending in a direction perpendicular to the upper surface of the substrate, a source area disposed on the substrate to extend in a first direction and including impurities, and a common source line extending in the direction perpendicular to the upper surface of the substrate to be connected to the source area, and including a plurality of layers containing different materials.

Abstract: A high energy efficiency sensor node and an operating method thereof are provided. The high energy efficiency sensor node may include a sensing unit to generate sensed information and to store the sensed information in a database when a set period commences, and a control unit to obtain n pieces of sensed information corresponding to n periods from the database, and to transmit the n pieces of sensed information obtained to a first neighbor node when the n periods elapse.