Patents by Inventor Yu Der Chih
Yu Der Chih has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11581027Abstract: A memory device, such as an MRAM memory, includes a memory array with a plurality of bit cells. The memory array is configured to store trimming information and store user data. A sense amplifier is configured to read the trimming information from the memory array, and a trimming register is configured to receive the trimming information from the sense amplifier. The sense amplifier is configured to receive the trimming information from the trimming register so as to operate in a trimmed mode for reading the user data from the memory array.Type: GrantFiled: December 6, 2021Date of Patent: February 14, 2023Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Yi-Chun Shih, Chia-Fu Lee, Yu-Der Chih
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Patent number: 11557344Abstract: A memory architecture includes: a plurality of cell arrays each of which comprises a plurality of bit cells, wherein each of bit cells of the plurality of cell arrays uses a respective variable resistance dielectric layer to transition between first and second logic states; and a control logic circuit, coupled to the plurality of cell arrays, and configured to cause a first information bit to be written into respective bit cells of a pair of cell arrays as an original logic state of the first information bit and a logically complementary logic state of the first information bit, wherein the respective variable resistance dielectric layers are formed by using a same recipe of deposition equipment and have different diameters.Type: GrantFiled: May 25, 2021Date of Patent: January 17, 2023Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Yu-Der Chih, Chung-Cheng Chou, Wen-Ting Chu
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Patent number: 11556414Abstract: A method includes: retrieving a first word comprising a plurality of data bits and a plurality of parity bits that correspond to the first word, wherein the plurality of data bits form N?1 groups and the plurality of parity bits form a first group different from the N?1 groups, and N is a positive integer greater than 2; receiving a request to update respective data bits of a first one of the N?1 groups; and providing a second word comprising updated data bits that form a second one of the N?1 groups and a plurality of updated parity bits that correspond to the second word, wherein the plurality of updated parity bits form a second group that has a same group index as the first one of the N?1 groups.Type: GrantFiled: April 5, 2021Date of Patent: January 17, 2023Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.Inventors: Chien-Yin Liu, Yu-Der Chih, Hsueh-Chih Yang, Jonathan Tehan Chen, Kuan-Chun Chen
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Publication number: 20220415373Abstract: Systems and methods are provided for a computing-in memory circuit that includes a bit line and a plurality of computing cells connected to the bit line. Each of the plurality of computing cells includes a memory element, having a data output terminal; a logic element, having a first input terminal, a second input terminal and an output terminal, wherein the first input terminal is coupled to the data output terminal of the memory element, the second input terminal receives a select signal; and a capacitor, having a first terminal and a second terminal, where the first terminal is coupled to the output terminal of the logic element, the second terminal is coupled to the bit line. A voltage of the bit line is driven by the plurality of computing cells.Type: ApplicationFiled: August 10, 2022Publication date: December 29, 2022Inventors: Yi-Chun Shih, Chia-Fu Lee, Yu-Der Chih, Jonathan Tsung-Yung Chang
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Publication number: 20220406386Abstract: A sense amplifier control system includes a precharge control switch configured to receive a precharge signal. A reference cell is configured to receive a reference word line signal. In a precharge phase, the control switch is controlled in response to the precharge signal to precharge the reference input node to a predetermined precharge level. In a sensing phase subsequent to the pre-charge phase, the trigger circuit is configured to output a triggering signal at the output terminal in response to the reference input node reaching a triggering level.Type: ApplicationFiled: January 26, 2022Publication date: December 22, 2022Inventors: Chung-Chieh Chen, Cheng-Hsiung Kuo, Yu-Der Chih
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Publication number: 20220398067Abstract: A multiply-accumulate (MAC) device for compute-in-memory (CIM) includes an input driver configured to provide a plurality of input signals including a first input signal and a second input signal. A lookup table (LUT) stores or accesses a plurality of CIM weight signals including a first CIM weight signal and a second CIM weight signal. The LUT is configured to receive the first input signal and the second input signal and provide a sum output based on the first and second input signals and the first and second CIM weight signals.Type: ApplicationFiled: December 23, 2021Publication date: December 15, 2022Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Chia-Fu Lee, Po-Hao Lee, Yi-Chun Shih, Yu-Der Chih
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Patent number: 11528135Abstract: Systems and methods of generating a security key for an integrated circuit device include generating a plurality of key bits with a physically unclonable function (PUF) device. The PUF can include a random number generator that can create random bits. The random bits may be stored in a nonvolatile memory. The number of random bits stored in the nonvolatile memory allows for a plurality of challenge and response interactions to obtain a plurality of security keys from the PUF.Type: GrantFiled: November 30, 2020Date of Patent: December 13, 2022Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Shih-Lien Linus Lu, Kun-hsi Li, Shih-Liang Wang, Jonathan Tsung-Yung Chang, Yu-Der Chih, Cheng-En Lee
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Publication number: 20220383085Abstract: Disclosed is a methods and apparatus which can improve defect tolerability of a hardware-based neural network. In one embodiment, a method for performing a calculation of values on first neurons of a first layer in a neural network, includes: receiving a first pattern of a memory cell array; determining a second pattern of the memory cell array according to a third pattern; determining at least one pair of columns of the memory cell array according to the first pattern and the second pattern; switching input data of two columns of each of the at least one pair of columns of the memory cell array; and switching output data of the two columns in each of the at least one pair of columns of the memory cell array so as to determine the values on the first neurons of the first layer.Type: ApplicationFiled: August 8, 2022Publication date: December 1, 2022Inventors: Win-San Khwa, Yu-Der Chih, Yi-Chun Shih, Chien-Yin Liu
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Publication number: 20220383929Abstract: A memory circuit includes a bank of non-volatile memory (NVM) devices, a plurality of high-voltage (HV) drivers, a global HV power switch configured to generate a HV power signal, and a plurality of HV power switches coupled to the global HV switch. A first HV power switch of the plurality of HV power switches is coupled to each HV driver of the plurality of HV drivers, the first HV power switch of the plurality of HV power switches is configured to output a power signal responsive to the HV power signal, and each HV driver of the plurality of HV drivers is configured to output a HV activation signal to a corresponding column of the bank of NVM devices responsive to the power signal.Type: ApplicationFiled: July 29, 2022Publication date: December 1, 2022Inventors: Gu-Huan LI, Chen-Ming HUNG, Yu-Der CHIH
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Publication number: 20220366982Abstract: A memory device includes: a memory cell array comprising a plurality of memory cells; a temperature sensor configured to detect a temperature of the memory cell array; a write circuit configured to write data into the plurality of memory cells; and a controller coupled to the temperature sensor and the write circuit, wherein the controller is configured to determine a target write pulse width used by the write circuit based on the detected temperature of the memory device.Type: ApplicationFiled: July 26, 2022Publication date: November 17, 2022Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Hiroki Noguchi, Yu-Der Chih, Yih Wang
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Publication number: 20220360254Abstract: A circuit includes cross coupled invertors including a first invertor and a second inventor. The first invertor and the second invertor are cross coupled at a first data node and a second data node. An input unit is coupled between the cross-coupled invertors and a power node. The input unit controls the cross-coupled invertors in response to a first input signal received at a first input terminal of the input unit and a second input signal received at a second input terminal of the input unit. A first transistor is connected between the power node and a supply node. The first transistor connects the power node to the supply node in response to an enable signal changing to a first value. A second transistor is connected between the power node and ground. The second transistor connects the power node to the ground in response to the enable signal changing to a second value.Type: ApplicationFiled: July 27, 2022Publication date: November 10, 2022Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Chia-Fu Lee, Hon-Jarn Lin, Yu-Der Chih
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Publication number: 20220359010Abstract: A method of operating a memory circuit includes generating a first voltage by a first amplifier circuit of a first driver circuit coupled to a first column of memory cells, and generating a first current in response to the first voltage. The first current includes a first set of leakage currents and a first write current. The method further includes generating, by a tracking circuit, a second set of leakage currents configured to track the first set of leakage currents of the first column of memory cells, and mirroring the first current in a first path with a second current in a second path by a first current mirror. The second current includes the second set of leakage currents and a second write current. The first write current corresponds to the second write current. The first set of leakage currents corresponds to the second set of leakage currents.Type: ApplicationFiled: July 22, 2022Publication date: November 10, 2022Inventors: Chin-I SU, Chung-Cheng CHOU, Yu-Der CHIH, Zheng-Jun LIN
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Publication number: 20220358013Abstract: Systems and methods for correcting data errors in memory caused by high-temperature processing of the memory are provided. An integrated circuit (IC) die including a memory is formed. Addresses of memory locations that are susceptible to data loss when subjected to elevated temperatures are determined. Bits of data are written to the memory, where the bits of data include a set of bits written to the memory locations. The set of bits are written to a storage device of the IC die that is not susceptible to data loss when subjected to the elevated temperatures, the subset of bits comprise compressed code. At least one of the bits stored at the addresses is overwritten after subjecting the IC die to an elevated temperature. The at least one of the bits is overwritten based on the set of bits written to the storage device.Type: ApplicationFiled: July 26, 2022Publication date: November 10, 2022Inventors: Yu-Der Chih, Ching-Huang Wang, Yi-Chun Shih, Meng-Chun Shih, C. Y. Wang
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Patent number: 11495294Abstract: The disclosed invention presents a self-tracking reference circuit that compensates for IR drops and achieves the target resistance state at different temperatures after write operations. The disclosed self-tracking reference circuit includes a replica access path, a configurable resistor network, a replica selector mini-array and a step current generator that track PVT variations to provide a PVT tracking level for RRAM verify operation.Type: GrantFiled: November 30, 2020Date of Patent: November 8, 2022Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Zheng-Jun Lin, Chung-Cheng Chou, Yu-Der Chih, Pei-Ling Tseng
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Publication number: 20220335996Abstract: A memory device is provided, the memory device includes multiple cells arranged in a matrix of multiple rows and multiple columns. The memory device further includes multiple bit lines each of which is connected to first cells of the multiple cells arranged in a row of the multiple rows. A voltage control circuit is connectable to a selected bit line of the multiple bit lines and includes a voltage detection circuit that detects an instantaneous supply voltage and a voltage source selection circuit connected to the voltage detection circuit. The voltage source selection circuit selects a voltage source from multiple voltage sources based on the detected instantaneous supply voltage. The voltage source selection circuit includes a switch that connects the selected voltage source to the selected bit line to provide a write voltage.Type: ApplicationFiled: June 30, 2022Publication date: October 20, 2022Inventors: CHIEN-AN LAI, CHUNG-CHENG CHOU, YU-DER CHIH
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Patent number: 11469745Abstract: A circuit includes cross coupled invertors including a first invertor and a second inventor. The first invertor and the second invertor are cross coupled at a first data node and a second data node. An input unit is coupled between the cross-coupled invertors and a power node. The input unit controls the cross-coupled invertors in response to a first input signal received at a first input terminal of the input unit and a second input signal received at a second input terminal of the input unit. A first transistor is connected between the power node and a supply node. The first transistor connects the power node to the supply node in response to an enable signal changing to a first value. A second transistor is connected between the power node and ground. The second transistor connects the power node to the ground in response to the enable signal changing to a second value.Type: GrantFiled: January 29, 2021Date of Patent: October 11, 2022Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Chia-Fu Lee, Hon-Jarn Lin, Yu-Der Chih
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Publication number: 20220319558Abstract: A sense amplifier is provided. A first terminal of a first invertor is connected to a power node and a second terminal of the first invertor is connected to a cell current source. A first terminal of a second invertor is connected to the power node and a second terminal of the second invertor is connected to a reference current source. The first invertor is cross coupled with the second invertor at a first node and a second node. A pre-charge circuit is connected to the first node and the second node. A first pull up transistor and a second pull up transistor are connected between a supply voltage node and the power node. A signal level detector circuit is connected to the second pull up transistor. The signal level detector circuit switches on the second pull up transistor when a remaining voltage on one of the first node and the second node is below a reference voltage.Type: ApplicationFiled: June 17, 2022Publication date: October 6, 2022Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Chia-Fu Lee, Hon-Jarn Lin, Yu-Der Chih
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Patent number: 11461623Abstract: Disclosed is a methods and apparatus which can improve defect tolerability of a hardware-based neural network. In one embodiment, a method for performing a calculation of values on first neurons of a first layer in a neural network, includes: receiving a first pattern of a memory cell array; determining a second pattern of the memory cell array according to a third pattern; determining at least one pair of columns of the memory cell array according to the first pattern and the second pattern; switching input data of two columns of each of the at least one pair of columns of the memory cell array; and switching output data of the two columns in each of the at least one pair of columns of the memory cell array so as to determine the values on the first neurons of the first layer.Type: GrantFiled: August 15, 2019Date of Patent: October 4, 2022Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Win-San Khwa, Yu-Der Chih, Yi-Chun Shih, Chien-Yin Liu
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Patent number: 11450364Abstract: Systems and methods are provided for a computing-in memory circuit that includes a bit line and a plurality of computing cells connected to the bit line. Each of the plurality of computing cells includes a memory element, having a data output terminal; a logic element, having a first input terminal, a second input terminal and an output terminal, wherein the first input terminal is coupled to the data output terminal of the memory element, the second input terminal receives a select signal; and a capacitor, having a first terminal and a second terminal, where the first terminal is coupled to the output terminal of the logic element, the second terminal is coupled to the bit line. A voltage of the bit line is driven by the plurality of computing cells.Type: GrantFiled: June 3, 2021Date of Patent: September 20, 2022Assignee: Taiwan Semiconductor Manufacturing Company Ltd.Inventors: Yi-Chun Shih, Chia-Fu Lee, Yu-Der Chih, Jonathan Tsung-Yung Chang
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Patent number: 11450395Abstract: A memory circuit includes a first bank of non-volatile memory (NVM) devices, a first plurality of decoders, a first plurality of high-voltage (HV) drivers corresponding to the first plurality of decoders, and a first plurality of HV power switches. A first HV power switch is coupled to each HV driver of the first plurality of HV drivers, and each decoder is configured to generate an enable signal corresponding to a column of the first bank of NVM devices. Each HV driver is configured to output a HV activation signal to the corresponding column of the first bank of NVM devices responsive to a power signal of the first HV power switch and to the enable signal of the corresponding decoder.Type: GrantFiled: April 22, 2021Date of Patent: September 20, 2022Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Gu-Huan Li, Chen-Ming Hung, Yu-Der Chih