Abstract: Simultaneous parallel charging of a first and second electrical energy storage devices coupled to a charge source is carried out by directly coupling the charge source to one of the first ESD and the second ESD and through a DC to DC converter to the other of the first ESD and the second ESD. The charge source provides a current that is allocated to the two ESDs by controlling the DC to DC converter. Priority of charging may be given to either ESD.

Abstract: A semiconductor device structure, along with methods of forming such, are described. The semiconductor device structure includes a gate electrode layer disposed over a substrate, a source/drain epitaxial feature disposed over the substrate, a first hard mask layer disposed over the gate electrode layer, and a contact etch stop layer (CESL) disposed over the source/drain epitaxial feature. The structure further includes a first interlayer dielectric (ILD) layer disposed on the CESL and a first treated portion of a second hard mask layer disposed on the CESL and the first ILD layer. A top surface of the first hard mask layer and a top surface of the first treated portion of the second mask layer are substantially coplanar. The structure further includes an etch stop layer disposed on the first hard mask layer and the first treated portion of the second mask layer.

Abstract: A method includes forming a gate stack, growing a source/drain region on a side of the gate stack through epitaxy, depositing a contact etch stop layer (CESL) over the source/drain region, depositing an inter-layer dielectric over the CESL, etching the inter-layer dielectric and the CESL to form a contact opening, and etching the source/drain region so that the contact opening extends into the source/drain region. The method further includes depositing a metal layer extending into the contact opening. Horizontal portions, vertical portions, and corner portions of the metal layer have a substantially uniform thickness. An annealing process is performed to react the metal layer with the source/drain region to form a source/drain silicide region. The contact opening is filled to form a source/drain contact plug.

Abstract: An exemplary device includes a frontside power rail disposed over a frontside of a substrate, a backside power rail disposed over a backside of the substrate, an epitaxial source/drain structure disposed between the frontside power rail and the backside power rail. The epitaxial source/drain structure is connected to the frontside power rail by a frontside source/drain contact. The epitaxial source/drain structure is connected to the backside power rail by a backside source/drain via. The backside source/drain via is disposed in a substrate, and a dielectric layer is disposed between the substrate and the backside power rail. The backside source/drain via extends through the dielectric layer and the substrate.

Abstract: Some embodiments disclosed herein are directed to constraint handling for parameters of electric motors. In particular, embodiments of the present disclosure relate to handling constraints for parameters such as current, voltage, and torque associated with an electric motor. Other embodiments may be disclosed or claimed.

Abstract: A method for forming a FinFET device structure is provided. The method includes forming a gate dielectric layer over a fin structure. The method also includes forming a gate electrode layer over the gate dielectric layer. The method further includes forming a first dielectric layer formed over the gate dielectric layer. In addition, the method includes forming a first conductive layer on the gate dielectric layer. A bottom surface of the first conductive layer is in direct contact a top surface of the gate electrode layer, a sidewall of the first conductive layer is in direct contact the first dielectric layer and spaced apart from the gate dielectric layer.

Abstract: A vehicle includes at least one electric motor configured to convert electric power to rotational motion, a battery system electrically connected to the at least one electric motor, and a controller coupled to the battery system. The controller includes a non-transitory computer readable memory and a processor. The memory stores a charging control software module configured to cause the processor to perform the method of: determining an optimum charging profile based at least partially on an available received charging power, an ambient temperature of the battery system, charging system constraints, and at least one driver preference.

Abstract: Techniques are provided for battery imbalance diagnosis and mitigation. In one embodiment, the techniques involve isolating, via a first isolation unit, a first battery cell from a plurality of battery cells, determining, via a complex impedance measurement unit, a state of health of the first battery cell, and controlling, via a controller, the first battery cell based on the state of health of the first battery cell.

Abstract: Provided herein are antibodies that bind to the alpha subunit of an IL-7 receptor (IL-7R?). Also provided are uses of these antibodies in therapeutic applications, such as treatment of inflammatory diseases. Further provided are cells that produce the antibodies, polynucleotides encoding the heavy and/or light chain regions of the antibodies, and vectors comprising the polynucleotides.

Abstract: A method according to the present disclosure includes receiving a workpiece that includes a gate structure, a first gate spacer feature, a second gate spacer feature, a gate-top dielectric feature over the gate structure, the first gate spacer feature and the second gate spacer feature, a first source/drain feature over a first source/drain region, a second source/drain feature over a second source/drain region, a first dielectric layer over the first source/drain feature, and a second dielectric layer over the second source/drain feature. The method further includes replacing a top portion of the first dielectric layer with a first hard mask layer, forming a second hard mask layer over the first hard mask layer while the second dielectric layer is exposed, etching the second dielectric layer to form a source/drain contact opening and to expose the second source/drain feature, and forming a source/drain contact over the second source/drain feature.

Abstract: In an embodiment, a device includes: a semiconductor substrate; a first fin extending from the semiconductor substrate; a second fin extending from the semiconductor substrate; an epitaxial source/drain region including: a main layer in the first fin and the second fin, the main layer including a first semiconductor material, the main layer having an upper faceted surface and a lower faceted surface, the upper faceted surface and the lower faceted surface each being raised from respective surfaces of the first fin and the second fin; and a semiconductor contact etch stop layer (CESL) contacting the upper faceted surface and the lower faceted surface of the main layer, the semiconductor CESL including a second semiconductor material, the second semiconductor material being different from the first semiconductor material.

Abstract: Embodiments include balancing modules during charging of a mixed chemistry battery pack having a first battery module connected in series to a second battery module. Aspects include monitoring a first state-of-charge (SOC) of the first battery module having a first battery chemistry and monitoring a second SOC of the second battery module having a second battery chemistry. Aspects also include selectively activating one of a first bypass switch and a first activation switch of the first battery module based on the first SOC and the second SOC and selectively activating one of a second bypass switch and a second activation switch of the second battery module based on the first SOC and the second SOC. The activation of the first bypass switch prevents the first battery module from charging and activation of the second bypass switch prevents the second battery module from charging.

Abstract: A mixed chemistry battery having a first battery cell having a first chemistry and a second battery cell having a second chemistry that is different than the first chemistry is provided. The first battery cell is connected to the second battery cell in series. The mixed chemistry battery includes a battery monitoring system configured to obtain a first SOC of the first battery cell and a second SOC of the second battery cell and based on a determination that an absolute value of a difference between the first SOC and the second SOC is greater than a threshold value, obtain a first capacity retention rate for the first battery cell and a second capacity retention rate for the second battery cell; and update the second SOC based on the first SOC, the first capacity retention rate, and the second capacity retention rate.

Abstract: A trip energy estimation system for a vehicle includes a traffic speed module configured to determine an average traffic speed along a projected route, a path information module configured to output path information indicating route features along the projected route, a perceived speed module configured to output a perceived vehicle speed along the projected route based on the average traffic speed and the path information, and a dynamic driving module configured to calculate and output a predicted driver speed based on the perceived vehicle speed and a feedback input indicative of the predicted driver speed. The dynamic driving module is configured to execute a machine learning algorithm to calculate the predicted driver speed.

Abstract: A semiconductor device includes a layer having a semiconductive material. The layer includes an outwardly-protruding fin structure. An isolation structure is disposed over the layer but not over the fin structure. A first spacer and a second spacer are each disposed over the isolation structure and on sidewalls of the fin structure. The first spacer is disposed on a first sidewall of the fin structure. The second spacer is disposed on a second sidewall of the fin structure opposite the first sidewall. The second spacer is substantially taller than the first spacer. An epi-layer is grown on the fin structure. The epi-layer protrudes laterally. A lateral protrusion of the epi-layer is asymmetrical with respect to the first side and the second side.

Abstract: An interconnect fabrication method is disclosed herein that utilizes a disposable etch stop hard mask over a gate structure during source/drain contact formation and replaces the disposable etch stop hard mask with a dielectric feature (in some embodiments, dielectric layers having a lower dielectric constant than a dielectric constant of dielectric layers of the disposable etch stop hard mask) before gate contact formation. An exemplary device includes a contact etch stop layer (CESL) having a first sidewall CESL portion and a second sidewall CESL portion separated by a spacing and a dielectric feature disposed over a gate structure, where the dielectric feature and the gate structure fill the spacing between the first sidewall CESL portion and the second sidewall CESL portion. The dielectric feature includes a bulk dielectric over a dielectric liner. The dielectric liner separates the bulk dielectric from the gate structure and the CESL.

Abstract: A semiconductor device structure includes nanostructures formed over a substrate. The structure also includes a gate structure formed over and around the nanostructures. The structure also includes a spacer layer formed over a sidewall of the gate structure over the nanostructures. The structure also includes a source/drain epitaxial structure formed adjacent to the spacer layer. The structure also includes a contact structure formed over the source/drain epitaxial structure with an air spacer formed between the spacer layer and the contact structure.

Abstract: A semiconductor device structure, along with methods of forming such, are described. The semiconductor device structure includes a gate electrode layer disposed over a substrate, a source/drain epitaxial feature disposed over the substrate, a first hard mask layer disposed over the gate electrode layer, and a contact etch stop layer (CESL) disposed over the source/drain epitaxial feature. The structure further includes a first interlayer dielectric (ILD) layer disposed on the CESL and a first treated portion of a second hard mask layer disposed on the CESL and the first ILD layer. A top surface of the first hard mask layer and a top surface of the first treated portion of the second mask layer are substantially coplanar. The structure further includes an etch stop layer disposed on the first hard mask layer and the first treated portion of the second mask layer.

Abstract: A device includes a gate stack; a gate spacer on a sidewall of the gate stack; a source/drain region adjacent the gate stack; a silicide; and a source/drain contact electrically connected to the source/drain region through the silicide. The silicide includes a conformal first portion in the source/drain region, the conformal first portion comprising a metal and silicon; and a conformal second portion over the conformal first portion, the conformal second portion further disposed on a sidewall of the gate spacer, the conformal second portion comprising the metal, silicon, and nitrogen.

Abstract: A semiconductor device includes a source/drain component of a transistor. A source/drain contact is disposed over the source/drain component. A source/drain via is disposed over the source/drain contact. The source/drain via contains copper. A first liner at least partially surrounds the source/drain via. A second liner at least partially surrounds the first liner. The first liner and the second liner are disposed between the source/drain contact and the source/drain via. The first liner and the second liner have different material compositions.