Self-assembled mono-layer liner for cu/porous low-k interconnections
An interconnect structure of an integrated circuit includes a low-k dielectric layer over a semiconductor substrate, a conductor in the low-k dielectric layer, and a dielectric transition layer between the low-k dielectric layer and the conductor, wherein the dielectric transition layer has a thickness of less than about 50 Å.
This application claims the benefit of U.S. Provisional Patent Application Ser. No. 60/809,754, filed on May 31, 2006, and entitled “Self-Assembled Mono-Layer Liner for Cu/Porous Low-k Interconnections,” which application is hereby incorporated herein by reference.
TECHNICAL FIELDThis invention relates generally to integrated circuits, and more particularly to the design and formation methods of interconnect structures of the integrated circuits.
BACKGROUNDAs the semiconductor industry introduces new generations of integrated circuits (IC's) having higher performance and greater functionality, the density of the elements that form the integrated circuits is increased, and the dimensions, sizes and spacings between the individual components or elements are reduced. While in the past such reductions were limited only by the ability to define the structures photo-lithographically, device geometries having even smaller dimensions created new limiting factors. For example, for any two adjacent conductive paths, as the distance between the conductors decreases, the resulting capacitance (a function of the dielectric constant (k) of the insulating material divided by the distance between conductive paths) increases. This increased capacitance results in increased capacitive coupling between the conductors, increased power consumption, and an increase in the resistive-capacitive (RC) time constant. Therefore, continual improvement in semiconductor IC performance and functionality is dependent upon developing materials that form a dielectric film with a lower dielectric constant (k) than that of the most commonly used material, silicon oxide, in order to reduce capacitance. As the dimensions of these devices get smaller and smaller, significant reduction in capacitance into the so-called “ultra low-k” regime is required.
New materials with low dielectric constants (known in the art as “low-k dielectrics”) are being investigated for use as insulators in semiconductor chip designs. A low dielectric constant material helps to enable further reductions in the integrated circuit feature dimensions. In conventional IC processing, SiO2 was used as a basis for the dielectric material, resulting in a dielectric constant of about 3.9. Advanced low-k dielectric materials have dielectric constants below about 2.7. The substance with the lowest dielectric constant is air (k=1.0). Therefore, porous dielectrics are very promising candidates, since they have the potential to provide very low dielectric constants.
However, porous films have shortcomings. Poor time-dependent dielectric breakdown (TDDB) performance has become a severe problem as a result of the seriously deteriorated barrier integrity.
Accordingly, a method that maximizes the benefit of low-k dielectrics while reducing the effects of their porous properties is needed.
SUMMARY OF THE INVENTIONIn accordance with one aspect of the present invention, an interconnect structure of an integrated circuit includes a low-k dielectric layer over a semiconductor substrate, a conductor in the low-k dielectric layer, and a dielectric transition layer between the low-k dielectric layer and the conductor, wherein the dielectric transition layer has a thickness of less than about 50 Å.
In accordance with another aspect of the present invention, an interconnect structure of an integrated circuit includes a porous dielectric layer over a semiconductor substrate, a conductor in the porous dielectric layer, and a mono-layer between and adjoining the porous dielectric layer and the conductor, wherein the mono-layer comprises terminals selected from the group consisting essentially of methyl, ethyl, propyl, and combinations thereof.
In accordance with yet another aspect of the present invention, an interconnect structure of an integrated circuit includes a porous dielectric layer over a semiconductor substrate, an opening in the low-k dielectric layer, a dielectric transition layer on at least sidewalls of the low-k dielectric layer in the opening, wherein the dielectric transition layer has a thickness of less than about 50 Å, and wherein a first carbon concentration in the dielectric transition layer is greater than a second carbon concentration in the low-k dielectric layer. The interconnect structure further includes a diffusion barrier layer on the dielectric transition layer.
In accordance with yet another aspect of the present invention, a method for forming an interconnect structure of an integrated circuit includes forming a low-k dielectric layer over a semiconductor substrate, etching the low-k dielectric layer to form an opening, selectively forming a mono-layer on exposed surfaces of the low-k dielectric layer, wherein the mono-layer comprises terminals selected from the group consisting essentially of methyl, ethyl, propyl, and combinations thereof, and filling the opening with a conductive material.
In accordance with yet another aspect of the present invention, a method for forming an interconnect structure of an integrated circuit includes forming a porous dielectric layer over a semiconductor substrate, forming an opening in the porous dielectric layer, and treating the porous dielectric layer with an organic chemical to cause a reaction between the porous dielectric layer and the organic chemical, wherein the organic chemical is free from silicon.
In accordance with yet another aspect of the present invention, a method for forming an interconnect structure of an integrated circuit includes forming a low-k dielectric layer over a semiconductor substrate, etching the low-k dielectric layer to form an opening, treating the low-k dielectric layer with an organic chemical free from silicon, wherein a molecular weight of the organic chemical is greater than about 60 g/mole.
The advantageous features of the present invention include a reduced effect of RC delay, improved adhesion between the pore sealing layer and the diffusion barrier layer, and a saved liner removal step.
For a more complete understanding of the present invention, and the advantages thereof, reference is now made to the following descriptions taken in conjunction with the accompanying drawings, in which:
The making and using of the presently preferred embodiments are discussed in detail below. It should be appreciated, however, that the present invention provides many applicable inventive concepts that can be embodied in a wide variety of specific contexts. The specific embodiments discussed are merely illustrative of specific ways to make and use the invention, and do not limit the scope of the invention.
A novel method for forming a low-k dielectric layer and a corresponding interconnect structure is provided. The intermediate stages for manufacturing the preferred embodiment of the present invention are illustrated. Variations of the preferred embodiments are then discussed. Throughout the various views and illustrative embodiments of the present invention, like reference numbers are used to designate like elements.
An etch stop layer (ESL) 24 is formed on dielectric layer 20 and conductive line 22. Preferably, ESL 24 comprises nitrides, silicon-carbon based materials, carbon-doped oxides, and combinations thereof. The preferred formation method is plasma enhanced chemical vapor deposition (PECVD). However, other commonly used methods such as high-density plasma CVD (HDPCVD), atomic layer CVD (ALCVD), and the like can also be used. In an exemplary embodiment wherein ESL 24 comprises silicon nitride or silicon carbide, the formation is preferably performed in a chamber, in which gaseous precursors such as silane (SiH4) and ammonia (NH3) are introduced and a chemical reaction occurs.
In alternative embodiments, dielectric layer 24 is a diffusion barrier layer preventing undesirable elements, such as copper, from diffusing into the subsequently formed low-k dielectric layer. In a more preferred embodiment, dielectric layer 24 acts as both an etch stop layer and a diffusion barrier layer.
Low-k dielectric layer 28 preferably has a dielectric constant (k) value of lower than about 3.5, and more preferably lower than about 2.5. The preferred materials include carbon-containing materials, organo-silicate glass, porogen-containing materials, and combinations thereof. Low-k dielectric layer 28 may be deposited using a chemical vapor deposition (CVD) method, preferably plasma enhanced CVD (PECVD), although other commonly used deposition methods, such as low pressure CVD (LPCVD), atomic layer chemical vapor deposition (ALCVD), and spin-on, can also be used.
A first treatment, which preferably includes a curing process, is then performed. The curing process can be performed using commonly used curing methods, such as ultraviolet (UV) curing, eBeam curing, thermal curing, and the like, and may be performed in a production tool that is also used for PECVD, atomic layer deposition (ALD), LPCVD, etc. In an exemplary UV curing process, an ultraviolet radiator tool is utilized. The exemplary process conditions include a temperature of between about 250° C. and about 450° C., a curing power of between about 3000 W and about 6000 W, and a curing time of between about 300 seconds and about 1500 seconds. The curing may be performed in a vacuum environment or in an environment containing process gases such as H2, N2, inert gases (including He, Ne, Ar, Kr, Xe, Rn), and combinations thereof. The wavelength of the UV curing is preferably between about 200 nm and about 400 nm.
The treatment serves the function of driving porogen out of low-k dielectric layer 28, thus improving its mechanical property. Pores will then be generated in low-k dielectric layer 28. In the preferred embodiment, after the treatment, the porosity of low-k dielectric layer 28 is preferably greater than about 15%.
In alternative embodiments, the previously discussed low-k dielectric layer 28 may be replaced by a first low-k dielectric layer, an ESL on the first low-k dielectric layer, and a second low-k dielectric layer on the ESL. The ESL is used for etching trench opening 32. One skilled in the art will realize the appropriate process steps.
In the preferred embodiment, low-k dielectric layer 28 contains silicon, oxygen and carbon. Carbon may be present in the form of methyl, ethyl, propyl, and the like. The low-k dielectric material may be schematically represented as PLK-Si—O—CH3, wherein PLK represents a portion of the porous low-k dielectric material in low-k dielectric layer 28. The etching process, however, typically causes the depletion of carbon from low-k dielectric layer 28, particularly on the surface of openings 30 and 32. As a result, a surface portion of the respective low-k dielectric layer 28 may be represented by PLK-Si—O˜, wherein the symbol “˜” indicates dangling bonds. As such dangling bonds are not stable, they can easily form bonds with hydrogen to form OH terminals, and the resulting material on the surface of the low-k dielectric layer 28 is schematically represented by PLK-Si—OH.
Referring to
Due to the formation of carbon-containing terminal groups, there is a high carbon concentration in a surface layer of low-k dielectric layer 28. The concentration in the surface layer tends to be greater than in inner portions of low-k dielectric layer 28. In an exemplary embodiment, a surface layer with a thickness of 30 Å has a first average carbon concentration higher than a second average carbon concentration of an underlying portion with a thickness of 30 Å. In another exemplary embodiment, the first average carbon concentration is greater than the second average carbon concentration by about three to about 15 percent. This is contrary to the prior art interconnect structure, wherein the carbon concentration of the surface layer is typically lower than in inner portions due to carbon depletion. As methyl, ethyl, and propyl have greater volumes than hydrogen, the pores on the surface of low-k dielectric layer 28 are at least partially sealed.
An exemplary reaction equation is symbolically illustrated below. Please note that this equation is only an example, and should not be used to limit the scope of the present invention:
R1—Si—RH+PLK-Si—O—H→PLK-Si—O—Si—R1+RHx [Eq. 1]
wherein R1 may be (CH3)3, and R may be a functional group containing nitrogen, and/or a ring-type structure with benzene rings, and R1 is methyl, ethyl, and/or propyl groups. An example of the above-expression is:
(CH3)3—Si—RH+PLK-Si—O—H→PLK-Si—O—Si—(CH3)3+RHx. [Eq. 2]
An optional UV curing is then performed on the structure shown in
Referring to
The previously discussed embodiment illustrates the formation of a dual damascene structure. SAMs can also be formed for single damascene structures.
Due to the formation of SAM 34, the mechanical and electrical properties of interconnect structures are improved. SAM 34 has better adhesion to the diffusion barrier layer than the conventional pore-sealing layer had, and thus delamination is reduced. As SAM 34 will not be formed on copper line 22, the liner removal step used in conventional processes to remove the dielectric pore-sealing layer on the copper line is saved.
Furthermore, by using the preferred embodiment of the present invention, electrical properties of the interconnect structures are improved.
Although the present invention and its advantages have been described in detail, it should be understood that various changes, substitutions and alterations can be made herein without departing from the spirit and scope of the invention as defined by the appended claims. Moreover, the scope of the present application is not intended to be limited to the particular embodiments of the process, machine, manufacture, and composition of matter, means, methods and steps described in the specification. As one of ordinary skill in the art will readily appreciate from the disclosure of the present invention, processes, machines, manufacture, compositions of matter, means, methods, or steps, presently existing or later to be developed, that perform substantially the same function or achieve substantially the same result as the corresponding embodiments described herein may be utilized according to the present invention. Accordingly, the appended claims are intended to include within their scope such processes, machines, manufacture, compositions of matter, means, methods, or steps.
Claims
1. An integrated circuit comprising:
- a low-k dielectric layer over a semiconductor substrate;
- a conductor in the low-k dielectric layer; and
- a dielectric transition layer between the low-k dielectric layer and the conductor, wherein the dielectric transition layer has a thickness of less than about 50 Å.
2. The integrated circuit of claim 1 further comprising a diffusion barrier layer on the dielectric transition layer, wherein an atomic percentage of atoms of the diffusion barrier layer in the dielectric transition layer is less than about 0.1%.
3. The integrated circuit of claim 2, wherein the diffusion barrier layer comprises a material selected from the group consisting essentially of titanium, titanium nitride, tantalum, tantalum nitride, and combinations thereof.
4. The integrated circuit of claim 2, wherein a bottom portion of the diffusion barrier layer is located on a metallic feature, and wherein the metallic feature is in an additional dielectric layer underlying the low-k dielectric layer, and wherein substantially no dielectric transition layer exists on the metallic feature.
5. The integrated circuit of claim 1, wherein the dielectric transition layer has a thickness of between about 10 Åand about 30 Å.
6. The integrated circuit of claim 1, wherein the dielectric transition layer comprises terminals selected from the group consisting essentially of methyl, ethyl, propyl, and combinations thereof.
7. The integrated circuit of claim 1, wherein the dielectric transition layer has a higher carbon concentration than the low-k dielectric layer has.
8. The integrated circuit of claim 1, wherein the low-k dielectric layer has a dielectric constant of less than about 2.5.
9. An integrated circuit comprising:
- a porous dielectric layer over a semiconductor substrate;
- a conductor in the porous dielectric layer; and
- a mono-layer between and adjoining the porous dielectric layer and the conductor, wherein the mono-layer comprises terminals selected from the group consisting essentially of methyl, ethyl, propyl, and combinations thereof.
10. The integrated circuit of claim 9, wherein the terminals comprise methyl.
11. The integrated circuit of claim 9, wherein the mono-layer has a carbon concentration higher than a carbon concentration in the low-k dielectric layer.
12. The integrated circuit of claim 11, wherein the carbon concentration in the mono-layer is higher than a carbon concentration in the low-k dielectric layer by about three to about 15 percent.
13. The integrated circuit of claim 9, wherein the mono-layer exists only at surfaces of the low-k dielectric layer.
14. The integrated circuit of claim 9, wherein the mono-layer comprises Si—(CH3)3 terminals.
15. An integrated circuit comprising:
- a porous dielectric layer over a semiconductor substrate;
- an opening in the porous dielectric layer;
- a dielectric transition layer on at least sidewalls of the porous dielectric layer in the opening, wherein the dielectric transition layer has a thickness of less than about 50 Å, and wherein a first carbon concentration in the dielectric transition layer is greater than a second carbon concentration in the porous dielectric layer; and
- a diffusion barrier layer on the dielectric transition layer.
16. The integrated circuit of claim 15, wherein the first carbon concentration is greater than the second carbon concentration by about three to about 15 percent.
Type: Application
Filed: Aug 24, 2006
Publication Date: Dec 6, 2007
Inventors: Chung-Chi Ko (Nautou), Chia-Cheng Chou (Keelung City), Keng-Chu Lin (Ping-Tung), Tien-I Bao (Hsin-Chu), Chen-Hua Yu (Hsin-Chu)
Application Number: 11/509,498
International Classification: H01L 23/52 (20060101); H01L 23/48 (20060101); H01L 29/40 (20060101);