Height gauge
Latest MITUTOYO CORPORATION Patents:
- Coordinate measuring machine and in-line measurement system
- Three-dimensional geometry measurement apparatus, three-dimensional geometry measurement method, and storage medium
- MEASUREMENT INFORMATION MANAGEMENT DEVICE, MEASUREMENT METHOD, AND MEASUREMENT INSTRUMENT
- Optical encoder
- Measuring device and method for measuring workpiece using the measuring device
Description
The broken lines depict parts of the height gauge that form no part of the claimed design. The dot-dash chain lines depict an enlargment area that forms no part of the claimed design.
Claims
The ornamental design for a height gauge, as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
| 6446351 | September 10, 2002 | Zhang |
| 7434331 | October 14, 2008 | Zanier |
| 8096061 | January 17, 2012 | Biselx |
| D727760 | April 28, 2015 | Matsumiya |
| D746164 | December 29, 2015 | Matsumiya et al. |
| D764324 | August 23, 2016 | Zhang |
| D807211 | January 9, 2018 | Nikayin |
| D826074 | August 21, 2018 | Mariller et al. |
| D888591 | June 30, 2020 | Destraz et al. |
- May 24, 2022 Decision to Grant issued in Japanese Design Application No. 2021-022343.
Patent History
Patent number: D1012740
Type: Grant
Filed: Apr 14, 2022
Date of Patent: Jan 30, 2024
Assignee: MITUTOYO CORPORATION (Kawasaki)
Inventors: Keiji Yamada (Hiroshima), Kazuki Fujita (Hiroshima), Takayuki Yonezawa (Tokyo), Shigemitsu Aoki (Tokyo)
Primary Examiner: Antoine Duval Davis
Application Number: 29/834,861
Type: Grant
Filed: Apr 14, 2022
Date of Patent: Jan 30, 2024
Assignee: MITUTOYO CORPORATION (Kawasaki)
Inventors: Keiji Yamada (Hiroshima), Kazuki Fujita (Hiroshima), Takayuki Yonezawa (Tokyo), Shigemitsu Aoki (Tokyo)
Primary Examiner: Antoine Duval Davis
Application Number: 29/834,861
Classifications
Current U.S. Class:
Linear Or Distance (9) (D10/70)