Height gauge

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FIG. 1 is a front, left-side, top perspective view of a height gauge, showing the new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left-side elevational view thereof;

FIG. 5 is a right-side elevational view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof;

FIG. 8 is an enlargement of area 8 in FIG. 2;

FIG. 9 is an enlargement of area 9 in FIG. 4; and,

FIG. 10 is a front, right-side, top perspective view thereof.

The broken lines depict parts of the height gauge that form no part of the claimed design. The dot-dash chain lines depict enlargment areas that form no part of the claimed design.


The ornamental design for a height gauge, as shown and described.

Referenced Cited
U.S. Patent Documents
6446351 September 10, 2002 Zhang
7434331 October 14, 2008 Zanier
8096061 January 17, 2012 Biselx
D727760 April 28, 2015 Matsumiya
D746164 December 29, 2015 Matsumiya et al.
D764324 August 23, 2016 Zhang
D807211 January 9, 2018 Nikayin
D826074 August 21, 2018 Mariller et al.
D888591 June 30, 2020 Destraz et al.
Other references
  • Japanese Design Registration No. D1252410 S, registered Aug. 19, 2005.
  • Japanese Design Registration No. D1513921 S, registered Nov. 14, 2014.
  • May 24, 2022 Decision to Grant issued in Japanese Patent Application No. 2021-022346.
Patent History
Patent number: D1013539
Type: Grant
Filed: Apr 14, 2022
Date of Patent: Feb 6, 2024
Inventors: Keiji Yamada (Hiroshima), Kazuki Fujita (Hiroshima), Takayuki Yonezawa (Tokyo), Shigemitsu Aoki (Tokyo)
Primary Examiner: Antoine Duval Davis
Application Number: 29/834,865