Sample testing apparatus
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Description
The broken lines shown represent portions of the sample testing apparatus that form no part of the claimed design. In addition, the dot-dash lines shown in
Claims
The ornamental design for a sample testing apparatus, as shown and described.
Referenced Cited
U.S. Patent Documents
Foreign Patent Documents
Other references
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Patent History
Patent number: D1033673
Type: Grant
Filed: Aug 26, 2021
Date of Patent: Jul 2, 2024
Assignee: SYSMEX CORPORATION (Hyogo)
Inventors: Fumie Shibata (Tokyo), Masayuki Seki (Kobe), Noriyuki Nakanishi (Kobe)
Primary Examiner: Kendra Leslie Hamilton
Assistant Examiner: Elizabeth S Struble
Application Number: 29/805,373
Type: Grant
Filed: Aug 26, 2021
Date of Patent: Jul 2, 2024
Assignee: SYSMEX CORPORATION (Hyogo)
Inventors: Fumie Shibata (Tokyo), Masayuki Seki (Kobe), Noriyuki Nakanishi (Kobe)
Primary Examiner: Kendra Leslie Hamilton
Assistant Examiner: Elizabeth S Struble
Application Number: 29/805,373
Classifications
Current U.S. Class:
Specimen Handling, Preparation Or Testing (62) (D24/216)