Semiconductor test fixture

Description

FIG. 1 is a top perspective view of a semiconductor test fixture showing my new design;

FIG. 2 is a bottom perspective view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a front elevational view thereof;

FIG. 6 is a rear elevational view thereof;

FIG. 7 is a left side elevational view thereof;

FIG. 8 is a right side elevational view thereof;

FIG. 9 is an exploded perspective view thereof;

FIG. 10 is a cross-sectional view taken along lines 10-10 of FIG. 3; and,

FIG. 11 is a cross-sectional view taken along lines 11-11 of FIG. 3.

The even dashed broken lines in the drawings are for the purpose of illustrating environmental structure and form no part of the claimed design.

Claims

The ornamental design for a semiconductor test fixture, as shown and described.