Electron microscope

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Description

FIG. 1 is a front, left, and top perspective view of an electron microscope, showing my new design;

FIG. 2 is a rear, right, and bottom perspective view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a right side elevational view thereof;

FIG. 7 is a top plan view thereof;

FIG. 8 is a bottom plan view thereof; and,

FIG. 9 is a front, left, and top perspective view thereof shown in a state of use.

The broken lines in the drawings depict portions of the electron microscope that form no part of the claimed design.

Claims

The ornamental design for an electron microscope, as shown and described.

Referenced Cited
U.S. Patent Documents
D264856 June 8, 1982 Nottingham
D381031 July 15, 1997 Miyata
D429831 August 22, 2000 Ting
D482710 November 25, 2003 Ho
D576194 September 2, 2008 Yoshida
D585927 February 3, 2009 Sheard
D618717 June 29, 2010 Frank
D644258 August 30, 2011 Noda
D663337 July 10, 2012 Chan
D687475 August 6, 2013 Oonuma
D708244 July 1, 2014 Matoba
D870177 December 17, 2019 Mai
D874544 February 4, 2020 Marzette, Jr.
D934939 November 2, 2021 Ge
D958215 July 19, 2022 Kojima
D972619 December 13, 2022 Laurent
D1052636 November 26, 2024 Gong
Foreign Patent Documents
307370563 May 2022 CN
307671202 November 2022 CN
Other references
  • “Elikliv Coin Microscope” from Amazon.com, first available Sep. 10, 2024 from the internet <https://www.amazon.com/dp/B0DGL2RH8N/> (Year: 2024).
  • “500X/1000X 5-Inch Screen Wifi HD 2 Million Pixel Maintenance Electron Microscope” from Sunsky-online.com, first retrieved Feb. 3, 2025 from the internet <https://www.sunsky-online.com/p/TBD0603478102/500X-1000X-5-Inch-Screen-WIFI-HD-2-Million-Pixel-Maintenance-Electron-Microscope-Specification-MS2.htm> (Year: 2025).
Patent History
Patent number: D1085195
Type: Grant
Filed: Nov 30, 2024
Date of Patent: Jul 22, 2025
Inventor: Wenjiao Chen (Guangdong)
Primary Examiner: George D. Kirschbaum
Assistant Examiner: Lacey Chey Bowman
Application Number: 29/975,697
Classifications
Current U.S. Class: Microscope (D16/131)