Electron microscope
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The dashed broken lines in the drawings show portions of the electron microscope that form no part of the claimed design. The dot-dash broken lines in the drawings indicate boundaries of the claimed subject matter that form no part of the claimed design. The dot-dot-dash broken lines in the drawings indicate boundaries of the view indicators that form no part of the claimed design.
Claims
The ornamental design for an electron microscope, as shown and described.
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Type: Grant
Filed: Jul 24, 2019
Date of Patent: Jul 19, 2022
Assignee: Hitachi High-Tech Corporation (Tokyo)
Inventors: Akira Kojima (Tokyo), Junpei Hokari (Tokyo), Ai Masuda (Tokyo), Takashi Yamamoto (Tokyo), Tatsuya Hirato (Tokyo), Noriyasu Chinone (Tokyo)
Primary Examiner: Richard Kearney
Assistant Examiner: Benjamin M Weeks
Application Number: 29/699,268