Electron microscope

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Description

FIG. 1 is a front, top and right side perspective view of an electron microscope according to the design;

FIG. 2 is a front view thereof;

FIG. 3 is a right side view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a rear view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof;

FIG. 8 is an enlarged view of the portion shown in BOX 8 in FIG. 1;

FIG. 9 is cross-sectional view taken along line 9-9 of FIG. 2; and,

FIG. 10 is an enlarged view of the portion shown in BOX 10 in FIG. 9.

The dashed broken lines in the drawings show portions of the electron microscope that form no part of the claimed design. The dot-dash broken lines in the drawings indicate boundaries of the claimed subject matter that form no part of the claimed design. The dot-dot-dash broken lines in the drawings indicate boundaries of the view indicators that form no part of the claimed design.

Claims

The ornamental design for an electron microscope, as shown and described.

Referenced Cited
U.S. Patent Documents
D591864 May 5, 2009 Schmidt
D636005 April 12, 2011 Oonuma
D657407 April 10, 2012 Okamoto
D715843 October 21, 2014 Kawai
D723079 February 24, 2015 Nauli
D750989 March 8, 2016 Shimizu
D766762 September 20, 2016 Kawai
D841069 February 19, 2019 Ihara
D872789 January 14, 2020 Haavisto
D886653 June 9, 2020 Sugie
D887295 June 16, 2020 Carney
D895462 September 8, 2020 Kimura
D933730 October 19, 2021 Kang
Patent History
Patent number: D958215
Type: Grant
Filed: Jul 24, 2019
Date of Patent: Jul 19, 2022
Assignee: Hitachi High-Tech Corporation (Tokyo)
Inventors: Akira Kojima (Tokyo), Junpei Hokari (Tokyo), Ai Masuda (Tokyo), Takashi Yamamoto (Tokyo), Tatsuya Hirato (Tokyo), Noriyasu Chinone (Tokyo)
Primary Examiner: Richard Kearney
Assistant Examiner: Benjamin M Weeks
Application Number: 29/699,268
Classifications
Current U.S. Class: Microscope (D16/131)