Electron microscope

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Description

FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof; and,

FIG. 8 is an enlarged view of the portion indicated by lines 8 in FIG. 2.

The broken lines of FIG. 8 are for illustrative purposes of the boundaries of the enlarged view and form no part of the claimed design.

Claims

We claim the ornamental design for an electron microscope, as shown and described.

Referenced Cited
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Other references
  • Hitachi High-Technologies Corporation, News Release, Hitachi High-Tech Launches the SU8000, A New Type of Scanning Electron Microscope, Jul. 23, 2008 in English.
  • Hitachi High-Technologies Corporation, General Catalog for Semiconductor Manufacturing Equipments, Electron Microscope, Feb. 24, 2006 with partial translation.
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  • Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new SU3500 Scanning Electron Microscope, Enables Fast, High-Resolution Observations During Low Acceleration Voltages, May 11, 2012 in English.
  • Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new SU9000 Scanning Electron Microscope, Field Emission Scanning Electron Microscope Featuring Ultra-High Resolution Imaging, Apr. 19, 2011 in English.
  • JP Office of Appln. No. 2012-029392 dated May 7, 2013 with English translation.
Patent History
Patent number: D708244
Type: Grant
Filed: May 30, 2013
Date of Patent: Jul 1, 2014
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Kosuke Matoba (Tokyo), Hiroyuki Suzuki (Hitachinaka), Hirofumi Sato (Hitachinaka), Naoki Sakamoto (Naka), Toshiyuki Moriya (Tokorozawa)
Primary Examiner: Paula Greene
Application Number: 29/456,320
Classifications
Current U.S. Class: Microscope (D16/131)