Electron microscope
Latest Hitachi High-Technologies Corporation Patents:
Description
The broken lines of
Claims
We claim the ornamental design for an electron microscope, as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
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- Hitachi High-Technologies Corporation, News Release, Hitachi High-Tech Launches the SU8000, A New Type of Scanning Electron Microscope, Jul. 23, 2008 in English.
- Hitachi High-Technologies Corporation, General Catalog for Semiconductor Manufacturing Equipments, Electron Microscope, Feb. 24, 2006 with partial translation.
- Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new S-5500, Scanning Electron Microscope, Recorded World-Leading Resolution in 30 kV, Oct. 19, 2004 with partial translation.
- Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new SU3500 Scanning Electron Microscope, Enables Fast, High-Resolution Observations During Low Acceleration Voltages, May 11, 2012 in English.
- Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new SU9000 Scanning Electron Microscope, Field Emission Scanning Electron Microscope Featuring Ultra-High Resolution Imaging, Apr. 19, 2011 in English.
- JP Office of Appln. No. 2012-029392 dated May 7, 2013 with English translation.
Patent History
Patent number: D708244
Type: Grant
Filed: May 30, 2013
Date of Patent: Jul 1, 2014
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Kosuke Matoba (Tokyo), Hiroyuki Suzuki (Hitachinaka), Hirofumi Sato (Hitachinaka), Naoki Sakamoto (Naka), Toshiyuki Moriya (Tokorozawa)
Primary Examiner: Paula Greene
Application Number: 29/456,320
Type: Grant
Filed: May 30, 2013
Date of Patent: Jul 1, 2014
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Kosuke Matoba (Tokyo), Hiroyuki Suzuki (Hitachinaka), Hirofumi Sato (Hitachinaka), Naoki Sakamoto (Naka), Toshiyuki Moriya (Tokorozawa)
Primary Examiner: Paula Greene
Application Number: 29/456,320
Classifications
Current U.S. Class:
Microscope (D16/131)