Probe pin for integrated circuits testing

Description

FIG. 1.1 is a perspective view of a probe pin for integrated circuits testing, showing my new design;

FIG. 1.2 is a front view thereof;

FIG. 1.3 is a rear view thereof;

FIG. 1.4 is a left-side view thereof;

FIG. 1.5 is a right-side view thereof;

FIG. 1.6 is a top plan view thereof; and

FIG. 1.7 is a bottom plan thereof.

Claims

The ornamental design for a probe pin for integrated circuits testing as shown and described.