Electron microscope

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FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom plan view thereof;

FIG. 6 is a left side elevational view thereof; and,

FIG. 7 is a right side elevational view thereof.

The broken lines shown are for illustrative purpose and form no part of the claimed design.


We claim the ornamental design for an electron microscope, as shown and described.

Referenced Cited
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Patent History
Patent number: D636005
Type: Grant
Filed: Jun 9, 2010
Date of Patent: Apr 12, 2011
Assignee: Hitachi High-Technologies Corporation (Toyko)
Inventors: Mitsuru Oonuma (Tokyo), Akira Omachi (Komae), Yoshifumi Taniguchi (Hitachinaka), Isao Nagaoki (Hitachinaka), Hiroshi Aoyagi (Hitachinaka)
Primary Examiner: Paula Greene
Attorney: Antonelli, Terry, Stout & Kraus, LLP.
Application Number: 29/363,415
Current U.S. Class: Microscope (D16/131)