Semiconductor device
Latest Mitsubishi Electric Corporation Patents:
- Inspection method for semiconductor laser device and inspection device for semiconductor laser device
- Heat pump device and hot water supply device
- Electromagnetic wave detector, electromagnetic wave detector array, and manufacturing method of electromagnetic wave detector
- Infrared optical system
- Load control device, central device, load control system, load control method, and storage medium
Description
The broken line in the figure drawings is included for the purpose of illustrating environment and forms no part of the claimed design.
Claims
The ornamental design for a semiconductor device, as shown and described.
Referenced Cited
Patent History
Patent number: D783549
Type: Grant
Filed: Jun 18, 2015
Date of Patent: Apr 11, 2017
Assignee: Mitsubishi Electric Corporation (Tokyo)
Inventors: Rei Yoneyama (Tokyo), Takehiro Araki (Fukuoka), Yoshitaka Kimura (Tokyo), Akira Goto (Fukuoka), Akihiko Yamashita (Hyogo), Mariko Ono (Fukuoka), Ryo Goto (Tokyo)
Primary Examiner: Daniel Bui
Application Number: 29/530,661
Type: Grant
Filed: Jun 18, 2015
Date of Patent: Apr 11, 2017
Assignee: Mitsubishi Electric Corporation (Tokyo)
Inventors: Rei Yoneyama (Tokyo), Takehiro Araki (Fukuoka), Yoshitaka Kimura (Tokyo), Akira Goto (Fukuoka), Akihiko Yamashita (Hyogo), Mariko Ono (Fukuoka), Ryo Goto (Tokyo)
Primary Examiner: Daniel Bui
Application Number: 29/530,661
Classifications
Current U.S. Class:
Semiconductor, Transistor Or Integrated Circuit (24) (D13/182)