Surveying instrument
Latest TOPCON CORPORATION Patents:
The broken line showing is for the purpose of illustrating environmental structure and forms no part of the claimed the design.
Claims
The ornamental design for a surveying instrument, as shown and described.
Type: Grant
Filed: Mar 14, 2016
Date of Patent: Aug 29, 2017
Assignee: TOPCON CORPORATION (Tokyo)
Inventors: Mitsuo Ishii (Tokyo), Kazuhiro Morita (Tokyo)
Primary Examiner: Antoine D Davis
Application Number: 29/557,953