Microscope

- SYSMEX CORPORATION
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Description

FIG. 1 is a perspective view of a microscope of the present invention;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a right side view thereof;

FIG. 5 is a left side view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The broken lines in the drawings depict portions of the microscope that form no part of the claimed design.

Claims

We claim the ornamental design for a microscope, as shown and described.

Referenced Cited
U.S. Patent Documents
D381857 August 5, 1997 Swaim
D577053 September 16, 2008 Watanabe
D584306 January 6, 2009 Maiers
D587707 March 3, 2009 Maiers
D600726 September 22, 2009 Claassen
D602935 October 27, 2009 Kettula
D656978 April 3, 2012 Stoiakine
D663338 July 10, 2012 Okamoto
8279374 October 2, 2012 Park et al.
D715843 October 21, 2014 Kawai
D719991 December 23, 2014 Ko
D741314 October 20, 2015 Kwak
D782466 March 28, 2017 Yepez
D785690 May 2, 2017 Klein
D794816 August 15, 2017 Koyama
D806698 January 2, 2018 Thompson
Foreign Patent Documents
201730076159 March 2017 CN
2011-085888 April 2011 JP
2015-084060 April 2015 JP
2016-164540 September 2016 JP
Other references
  • Sysmex Super-Resolution Fluorescence Microscope Wins Good Design Gold Award 2017. Online, published date: Nov. 2, 2017. Retrieved on Feb. 26, 2018 from URL: http://www.sysmex.co.jp/en/corporate/news/2017/171102.html.
Patent History
Patent number: D827008
Type: Grant
Filed: Mar 10, 2017
Date of Patent: Aug 28, 2018
Assignee: SYSMEX CORPORATION (Hyogo)
Inventors: Masaya Okada (Kobe), Fumie Shibata (Kobe), Shigeki Iwanaga (Kobe), Masayuki Seki (Kobe)
Primary Examiner: Garth Rademaker
Assistant Examiner: Omeed Agilee
Application Number: 29/596,818
Classifications
Current U.S. Class: Microscope (D16/131)