Substrate for spectroscopic analysis

- HAMAMATSU PHOTONICS K.K.
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Description

1. Substrate for spectroscopic analysis

1.1 : Perspective

1.2 : Front

1.3 : Back

1.4 : Top

1.5 : Bottom

1.6 : Left

1.7 : Right

1.8 : SECTIONAL VIEW

1.9 : SECTIONAL VIEW

The broken line showing the substrate for spectroscopic analysis is for the purpose of illustrating environmental structure and forms no part of the claimed design.

The dot-dash broken lines define the bounds of the claimed design and form no part thereof.

Claims

The ornamental design for a substrate for spectroscopic analysis, as shown and described.

Referenced Cited
U.S. Patent Documents
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4761381 August 2, 1988 Blatt et al.
D320269 September 24, 1991 Hammond
5784193 July 21, 1998 Ferguson
5812312 September 22, 1998 Lorincz
D500142 December 21, 2004 Crisanti et al.
D530826 October 24, 2006 Rich et al.
D531321 October 31, 2006 Godfrey et al.
D683045 May 21, 2013 Domack
D692578 October 29, 2013 Kikuhara et al.
D702364 April 8, 2014 Iqbal
D733911 July 7, 2015 Ito
D733912 July 7, 2015 Ito
D733913 July 7, 2015 Ito
D735877 August 4, 2015 Chang
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Patent History
Patent number: D835799
Type: Grant
Filed: Sep 30, 2016
Date of Patent: Dec 11, 2018
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka)
Inventors: Masashi Ito (Hamamatsu), Katsumi Shibayama (Hamamatsu), Kazuto Ofuji (Hamamatsu), Yoshihiro Maruyama (Hamamatsu), Mitsuhiro Ito (Hamamatsu)
Primary Examiner: Richard E Chilcot
Application Number: 35/502,702
Classifications
Current U.S. Class: Slide Or Reagent Sheet Type (D24/225)