Substrate for spectroscopic analysis
Latest HAMAMATSU PHOTONICS K.K. Patents:
Description
1. Substrate for spectroscopic analysis
The broken line showing the substrate for spectroscopic analysis is for the purpose of illustrating environmental structure and forms no part of the claimed design.
The dot-dash broken lines define the bounds of the claimed design and form no part thereof.
Claims
The ornamental design for a substrate for spectroscopic analysis, as shown and described.
Referenced Cited
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Patent History
Patent number: D836211
Type: Grant
Filed: Sep 30, 2016
Date of Patent: Dec 18, 2018
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka)
Inventors: Masashi Ito (Hamamatsu), Katsumi Shibayama (Hamamatsu), Kazuto Ofuji (Hamamatsu), Yoshihiro Maruyama (Hamamatsu), Mitsuhiro Ito (Hamamatsu)
Primary Examiner: Richard E Chilcot
Application Number: 35/502,699
Type: Grant
Filed: Sep 30, 2016
Date of Patent: Dec 18, 2018
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka)
Inventors: Masashi Ito (Hamamatsu), Katsumi Shibayama (Hamamatsu), Kazuto Ofuji (Hamamatsu), Yoshihiro Maruyama (Hamamatsu), Mitsuhiro Ito (Hamamatsu)
Primary Examiner: Richard E Chilcot
Application Number: 35/502,699
Classifications
Current U.S. Class:
Slide Or Reagent Sheet Type (D24/225)