Sample holder for ionized sample analysis

- HAMAMATSU PHOTONICS K.K.
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Description

FIG. 1 is a front view of a sample holder for ionized sample analysis of the first embodiment of the present invention;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a front perspective view thereof;

FIG. 8 is a rear perspective view thereof;

FIG. 9 is an enlarged cross-sectional view along the line 9-9 in FIG. 1, in the area designated by 9′-9′ in FIG. 1;

FIG. 10 is an enlarged cross-sectional view along the line 10-10 in FIG. 1, in the area designated by 10′-10′ in FIG. 1;

FIG. 11 is an enlarged cross-sectional view along the line 11-11 in FIG. 1, in the area designated by 11′-11′ in FIG. 1;

FIG. 12 is an enlarged cross-sectional view along the line 12-12 in FIG. 1, in the area designated by 12′-12′ in FIG. 1;

FIG. 13 is an enlarged cross-sectional view along the line 13-13 in FIG. 1, in the area designated by 13′-13′ in FIG. 1;

FIG. 14 is a front view of a sample holder for ionized sample analysis of the second embodiment of the present invention;

FIG. 15 is a rear view thereof;

FIG. 16 is a top plan view thereof;

FIG. 17 is a bottom plan view thereof;

FIG. 18 is a right side view thereof;

FIG. 19 is a left side view thereof;

FIG. 20 is a front perspective view thereof;

FIG. 21 is a rear perspective view thereof;

FIG. 22 is an enlarged cross-sectional view along the line 22-22 in FIG. 14, in the area designated by 22′-22′ in FIG. 14;

FIG. 23 is an enlarged cross-sectional view along the line 23-23 in FIG. 14, in the area designated by 23′-23′ in FIG. 14;

FIG. 24 is an enlarged cross-sectional view along the line 24-24 in FIG. 14, in the area designated by 24′-24′ in FIG. 14;

FIG. 25 is an enlarged cross-sectional view along the line 25-25 in FIG. 14, in the area designated by 25′-25′ in FIG. 14; and,

FIG. 26 is an enlarged cross-sectional view along the line 26-26 in FIG. 14, in the area designated by 26′-26′ in FIG. 14.

The dash-dot-dash broken lines depict indicators for sectional views and enlarged views and depict boundaries in the enlarged sectional views and enlarged views, the dash-dot-dash broken lines form no part of the claimed design.

Claims

The ornamental design for a sample holder for ionized sample analysis, as shown and described.

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Patent History
Patent number: D891635
Type: Grant
Filed: Jul 18, 2018
Date of Patent: Jul 28, 2020
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka)
Inventors: Takayuki Ohmura (Hamamatsu), Masahiro Kotani (Hamamatsu)
Primary Examiner: Susan Bennett Hattan
Assistant Examiner: Omeed Agilee
Application Number: 29/656,965