Sample holder for ionized sample analysis
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The features shown in evenly-dashed broken lines depict portions of the sample holder for ionized sample analysis that form no part of the claimed design. The dot-dash-dot broken lines in the drawings represent the bounds of the claimed subject matter, the det-dash-breken-lines depict the boundaries of the claim and form no part thereof. The dash-dot-dot-dash broken lines depict indicators for sectional views and enlarged views and depict boundaries in the enlarged sectional views and enlarged views, the dash-dot-dot-dash broken lines form no part of the claimed design.
Claims
The ornamental design for a sample holder for ionized sample analysis, as shown and described.
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Type: Grant
Filed: Jul 18, 2018
Date of Patent: Sep 8, 2020
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka)
Inventors: Takayuki Ohmura (Hamamatsu), Masahiro Kotani (Hamamatsu)
Primary Examiner: Susan Bennett Hattan
Assistant Examiner: Omeed Agilee
Application Number: 29/656,989