Sample holder for ionized sample analysis

- HAMAMATSU PHOTONICS K.K.
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Description

FIG. 1 is a front view of a sample holder for ionized sample analysis of the present invention;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a perspective view thereof;

FIG. 8 is an enlarged view showing a portion of FIG. 1 defined by lines 8-8 and 8′-8′;

FIG. 9 is an enlarged view showing a portion of FIG. 7 defined by lines 9-9 and 9′-9′;

FIG. 10 is an enlarged view showing a portion of FIG. 9 defined by lines 10-10 and 10′-10′;

FIG. 11 is an enlarged cross-sectional view along the line 11-11 in FIG. 8, in the area designated by 11′-11′ in FIG. 8;

FIG. 12 is an enlarged cross-sectional view along the line 12-12 in FIG. 8, in the area designated by 12′-12′ in FIG. 8;

FIG. 13 is an enlarged cross-sectional view along the line 13-13 in FIG. 8, in the area designated by 13′-13′ in FIG. 8;

FIG. 14 is an enlarged cross-sectional view along the line 14-14 in FIG. 8, in the area designated by 14′-14′ in FIG. 8;

FIG. 15 is an enlarged cross-sectional view along the line 15-15 in FIG. 8, in the area designated by 15′-15′ in FIG. 8;

FIG. 16 is an enlarged cross-sectional view along the line 16-16 in FIG. 8, in the area designated by 16′-16′ in FIG. 8; and,

FIG. 17 is an enlarged cross-sectional view along the line 17-17 in FIG. 8.

The features shown in evenly-dashed broken lines depict portions of the sample holder for ionized sample analysis that form no part of the claimed design. The dot-dash-dot broken lines in the drawings represent the bounds of the claimed subject matter, the det-dash-breken-lines depict the boundaries of the claim and form no part thereof. The dash-dot-dot-dash broken lines depict indicators for sectional views and enlarged views and depict boundaries in the enlarged sectional views and enlarged views, the dash-dot-dot-dash broken lines form no part of the claimed design.

Claims

The ornamental design for a sample holder for ionized sample analysis, as shown and described.

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Patent History
Patent number: D895833
Type: Grant
Filed: Jul 18, 2018
Date of Patent: Sep 8, 2020
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka)
Inventors: Takayuki Ohmura (Hamamatsu), Masahiro Kotani (Hamamatsu)
Primary Examiner: Susan Bennett Hattan
Assistant Examiner: Omeed Agilee
Application Number: 29/656,989