Patents Issued in July 1, 2004
  • Publication number: 20040124816
    Abstract: A circuit for conditioning a power supply whose graph of the power supplied as a function of the voltage at the terminals of the supply features a maximum comprises a DC/DC converter with an input to which power is supplied by the power supply and an output from which power is supplied to a load. A control circuit controls the converter in accordance with a power set point applied to the converter. The set point is a rising set point when the time derivative of the converter input voltage is higher than a negative first threshold value and a falling set point when the time derivative of the converter input voltage is lower than a positive second threshold voltage. The rate of variation of the average power when the set point is a rising set point is lower than the opposite of the rate of variation of the average power when the set point is a falling set point. The conditioning circuit enables the supply to deliver power at the maximum power point and is simple to implement.
    Type: Application
    Filed: July 29, 2003
    Publication date: July 1, 2004
    Applicant: ALCATEL
    Inventor: Christophe DeLepaut
  • Publication number: 20040124817
    Abstract: A power supply system prevents the output voltage from dropping during the changeover of the power source from a series regulator to a DC-DC converter. The power supply system has two types of power sources, a DC-DC converter and a series regulator that are connected parallel to each other. The first switching element of the DC-DC converter transfers the input voltage to the load. The second switching element connects the load to the ground. The control circuit turns ON and OFF the first and second switching elements on receipt of a first selection signal so that the number of turn-ONs of the second switching element gradually increases. This suppresses the current from flowing backward through the second switching element SW2 to the ground while the power source is changing over, preventing drop in the output voltage.
    Type: Application
    Filed: September 9, 2003
    Publication date: July 1, 2004
    Inventor: Yasushi Katayama
  • Publication number: 20040124818
    Abstract: An over-voltage protection circuit prevents an anomaly, such as a short circuit in the upper-switched electronic device of a DC-DC power supply, from propagating to downstream circuitry. The over-voltage protection circuit, which includes an overvoltage sense resistor coupled between an output of the upper or high side FET and the gate of the lower FET, is operative to sense a short circuit fault condition in the circuit path through the upper FET during initial power up of the system. In response to this condition, the lower NFET device is turned on so as to provide an immediate by-pass of the overvoltage condition to ground, and thereby prevent excessive voltage from being applied by the output terminal to downstream powered circuitry.
    Type: Application
    Filed: October 14, 2003
    Publication date: July 1, 2004
    Applicants: Intersil Americas Inc.,, State of Corporation : Delaware
    Inventors: Noel B. Dequina, Donald R. Preslar, Paul K. Sferrazza
  • Publication number: 20040124819
    Abstract: A direct current voltage converter comprises a unit (BGR) for preparing a reference voltage (Vref), a regulator (OP), a pulse width modulator (Comp, Vsw), a voltage-controlled pole-changing switch (T, D), a storage choke (L) and a smoothing capacitor (C). An insulated line connects a reference potential, to which the input voltages of the regulator drop, with a ground terminal of the smoothing capacitor (C). In this way the noise signals of the direct current voltage converter are considerably reduced.
    Type: Application
    Filed: November 21, 2003
    Publication date: July 1, 2004
    Inventor: Derek Bernardon
  • Publication number: 20040124820
    Abstract: Active power factor correction (PFC) circuits are used to minimize unwanted harmonic distortion in applications where AC electrical power is rectified to produce DC power needed for operating electrical equipment. A variable amplitude regulator (VAR) is a PFC control interface which is simpler to implement than conventional circuits, and offers a wider dynamic operating range. The VAR functions as a resistor scaling network using a two-stage RC filter to maintain the DC output voltage constant for various load conditions and to maintain the rectified current in phase with the sinusoidal circuit flow in an AC power line, through both slow and rapid changes in the load coupled to the direct current output. This control interface offers excellent performance characteristics and requires only a few components for a useful implementation.
    Type: Application
    Filed: December 12, 2003
    Publication date: July 1, 2004
    Inventor: Richard Haas
  • Publication number: 20040124821
    Abstract: A power holdup circuit including a monitoring circuit and a power holdup circuit. The monitoring circuit includes an average voltage comparator and an absolute voltage comparator which cooperate to detect a voltage drop in the voltage supplied by the power supply. The monitoring circuit also includes a timer to determine the time period of the voltage dropout. If a predetermined voltage dropout event occurs, the monitoring circuit generates a control signal to a switching component which activates a holdup power source. The holdup power source includes an energy storage device that stores energy to maintain the supply voltage during dropout periods.
    Type: Application
    Filed: June 25, 2003
    Publication date: July 1, 2004
    Applicant: MKS Instruments, Inc.
    Inventors: Igor Elkin, Ilya Bystryak, Jack Schuss, Tung M. Huynh, Vadim Lubomirsky
  • Publication number: 20040124822
    Abstract: A voltage reference circuit is provided which includes PTAT and CTAT generating components. The CTAT components are provided in a feedback configuration about an operational amplifier and are combined with PTAT generating components which are coupled to the inputs of the amplifier. The combination of the CTAT and PTAT components is effected in a manner which provides for a temperature curvature correction of the output voltage of the circuit.
    Type: Application
    Filed: December 27, 2002
    Publication date: July 1, 2004
    Inventor: Stefan Marinca
  • Publication number: 20040124823
    Abstract: Start-up circuit for current mirror circuits to facilitate transition from a zero-current state to an operation state. The start-up circuit includes two sets of current control devices. A set is coupled to each leg of the current mirrored circuit to provide a bias on start-up. The current control devices are coupled together to mirror the current that continues during the operational state such that the start-up circuit in combination with the operating circuit do not draw more current in the operational state than the operating circuit would normally draw in the operational state.
    Type: Application
    Filed: December 30, 2002
    Publication date: July 1, 2004
    Inventors: Robert Fulton, Andrew Volk, Chinnugounder Senthilkumar
  • Publication number: 20040124824
    Abstract: A voltage generator arrangement supplies a largely constant output voltage with a high current driver capability. A bandgap reference circuit is downstream from an impedance converter and downstream a voltage generator. The bandgap reference circuit and the impedance converter on the one hand and the voltage generator on the other hand are connected to different reference ground potential line. The impedance converter contains a charge pump circuit to provide increased control potential, which drives the voltage generator. The voltage generator in contrast produces a reduced output potential. The influence of any voltage drop on that reference ground potential line to which the voltage generator is connected in the output potential is thus likewise reduced.
    Type: Application
    Filed: December 17, 2003
    Publication date: July 1, 2004
    Inventors: Manfred Proll, Ralf Schneider, Stephan Schroder, Joerg Vollrath
  • Publication number: 20040124825
    Abstract: A voltage bandgap reference voltage circuit is provided. The circuit includes an amplifier having a first and second transistor coupled to the inputs of the amplifier. The circuit is adapted to operate with lower headroom by effecting a subtraction of a voltage substantially equivalent to Delta Vbe of the first and second transistors from the voltage applied to the common input of the amplifier.
    Type: Application
    Filed: December 27, 2002
    Publication date: July 1, 2004
    Inventor: Stefan Marinca
  • Publication number: 20040124826
    Abstract: Embodiments of the present invention relate to independently switched inductors in a voltage converter. Each voltage transforming inductor of a voltage converter may be designated a switch or bridge at each opposing terminal. The function of these switches is to periodically reverse the polarity of voltage across the inductors. By configuring independently switched inductors in series, the frustration of voltage tolerance limitations of the switches is mitigated.
    Type: Application
    Filed: December 30, 2002
    Publication date: July 1, 2004
    Applicant: Intel Corporation
    Inventors: Peter Hazucha, Gerhard Schrom, Tanay Karnik, Volkan Kursun, Siva Narendra
  • Publication number: 20040124827
    Abstract: The present invention is a method, system, and product for testing operating characteristics of a continuous-time or discrete-time device under test, which is included within a circuit. The operating characteristics of the continuous-time or discrete-time device are tested utilizing electronic components that already exist within the circuit such that a test circuit is not utilized to test the device. The circuit includes a variable gain amplifier and an automatic gain correction (AGC) circuit. The operating characteristics of the device are tested utilizing the variable gain amplifier and said AGC circuit.
    Type: Application
    Filed: December 31, 2002
    Publication date: July 1, 2004
    Inventor: Gregory Scott Winn
  • Publication number: 20040124828
    Abstract: A device for monitoring power usage comprising a first affixed to the power inlet of a facility for reading the amount of energy received at a facility; means for transmitting the amount of energy received at the facility to a control box; means associated with the control box for calculating the amount of the energy usage in a monetary unit; and display means for displaying the results.
    Type: Application
    Filed: December 27, 2002
    Publication date: July 1, 2004
    Inventor: Donald Craig Dunn
  • Publication number: 20040124829
    Abstract: A method and apparatus for making a probe head that has reduced voltage droop and improved transient response. One embodiment a cable providing a plurality of signal conductors and a plurality of power conductors including a first power conductor and a second power conductor, a probe head wired to the cable, a plurality of electrical contacts including a first electrical contact and a second electrical contact, wherein each one of the plurality of electrical contacts is fixed to the probe head and wherein the first power conductor is connected to the first electrical contact, and a first regulatory device physically residing in the probe head and wired between the second power conductor and the first electrical contact. In some embodiments, the first regulatory device includes an active transient control device that senses an output voltage and sources or sinks an appropriate supplemental amount of current to improve transient response.
    Type: Application
    Filed: December 31, 2002
    Publication date: July 1, 2004
    Inventors: Tim Swettlen, Jin Pan, Hua Zhu, Jun Ding
  • Publication number: 20040124830
    Abstract: The claimed invention method is for analyzing defect inspection parameters. The method includes searching for the defect inspection parameters of a plurality of lots of products from a database, classifying the plurality of lots of products into at least a qualified group and a failed group according to the defect inspection parameters, searching for a process step correlated to a defect inspection item from the database, searching for manufacturing equipment through which the qualified group has passed in the process step and the manufacturing equipment through which the failed group has passed in the process step, and determining the manufacturing equipment through which the probability that the failed group having passed which is greater than that of the qualified group.
    Type: Application
    Filed: August 11, 2003
    Publication date: July 1, 2004
    Inventors: Hung-En Tai, Haw-Jyue Luo
  • Publication number: 20040124831
    Abstract: A method and a device for measuring the speed of a pulse-activated electric motor are described. According to this method, the motor is fully activated at time intervals to be determined for a defined measuring time by the circuit element provided for timing and, in this time, the frequency of the current ripples, which is proportional to the motor speed, is measured. A current-proportional voltage measuring device is located on the circuit element, on whose load side are located an amplifier, filters, and an evaluation circuit in the form of a comparator for determining the frequency of the current ripples flowing in a measured phase during which the motor is fully activated.
    Type: Application
    Filed: September 12, 2003
    Publication date: July 1, 2004
    Inventors: Marc Micke, Holger Sievert, Juergen Hachtel, Guenther Hertlein
  • Publication number: 20040124832
    Abstract: A testing apparatus of a magnetic recording medium for conducting a test on the magnetic recording medium by using reproduced data obtained through reproduction of the magnetic medium, including a plurality of conversion means for converting the reproduced data into digital data, holding means for holding the digital data converted by the plurality of conversion means, data processing means for performing a calculation process on the digital data held by the holding means in relation to a magnetic characteristic of the magnetic recording medium, and analysis processing means for performing an analysis to determine whether or not information obtained by the data processing means satisfies a certain condition.
    Type: Application
    Filed: December 16, 2003
    Publication date: July 1, 2004
    Inventors: Masami Makuuchi, Ritsurou Orihashi, Norio Chujo, Masayoshi Takahashi, Yoshihiko Hayashi, Shinji Homma
  • Publication number: 20040124833
    Abstract: A differential probe is scanned along a stator core tooth portion to detect lamination faults. The probe utilizes two magnetic flux injection yokes arranged side-by-side in relatively close proximity, each yoke having two arm portions and two core-tooth flux-injection surfaces, each yoke being wound with an excitation coil winding and at least one yoke-arm of each yoke having a magnetic flux sensor. Current is supplied to the excitation coil windings on each yoke to inject magnetic flux into the stator core laminations while the probe is moved in a scanning process along the core teeth across the laminations. The magnetic flux differential detected at adjacent regions in the core by flux sensors on each of the two yokes is used to incrementally evaluate the core for laminations faults. The output produced by the differential probe may be converted to a digital signal and provided to a computer system for storage and future analysis.
    Type: Application
    Filed: December 30, 2002
    Publication date: July 1, 2004
    Inventors: Gerald Burt Kliman, Manoj Ramprasad Shah, Sang-Bin Lee
  • Publication number: 20040124834
    Abstract: Described are methods for pressurizing elastic support structures or balloons in sensor probes used for the inspection of components having areas of limited access. When inflated, the balloons press flexible sensors against the surface of the material under test. When deflated, the balloons permit easier insertion of the probes into the component and reduce the mechanical stresses on the sensors, thereby extending the sensor lifetime. By sequentially partially inserting the sensor into a limited access area from either side of the limited access area and scanning in opposite directions, the entire surface of the test material can be inspected.
    Type: Application
    Filed: August 28, 2003
    Publication date: July 1, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Vladimir Tsukernik, Ian C. Shay, David C. Grundy, Andrew P. Washabaugh
  • Publication number: 20040124835
    Abstract: An MI sensor is miniaturized while maintaining high sensitivity. At least one MI element detects an external magnetic field and outputs a sense signal. The sense signal is supplied to a rectangular IC chip. The IC chip is provided with an MI element connection electrode connected to the MI element and a switching circuit controlled by a pulse signal so as to supply a pulsed magnetizing current to the MI element through the MI element connection electrode. The MI element connection electrode is located near a side of the rectangular IC chip.
    Type: Application
    Filed: September 15, 2003
    Publication date: July 1, 2004
    Inventor: Takeshi Kimura
  • Publication number: 20040124836
    Abstract: The present invention relates generally to a weak-magnetic field sensor using printed circuit board technology and method of manufacturing the same, in which a rectangular ring-shaped magnetic core is wound by exciting circuit patterns and detecting circuit patterns, and weak-magnetic field sensors are implemented in x-axis and y-axis directions, respectively, to precisely calculate azimuth, thereby sensing a weak-magnetic field having a strength similar to that of earth's magnetic field. The sensor includes a magnetic core having first and second cores connected in parallel to each other; exciting coils wound around the first and second cores, respectively, to supply alternating excitation current to the magnetic core; and a detecting coil alternately arranged together with the exciting coils on the same surfaces on which the exciting coils are formed, and wound around the first and second cores, in order to detect variation of magnetic fluxes generated in the magnetic core.
    Type: Application
    Filed: August 12, 2003
    Publication date: July 1, 2004
    Inventors: Myung-Sam Kang, Sang-On Choi, Won-Youl Choi, Jang-Kyu Kang
  • Publication number: 20040124837
    Abstract: A method for manufacturing NMR measurement-while-drilling tool having the mechanical strength and measurement sensitivity to perform NMR measurements of an earth formation while drilling a borehole, and a method and apparatus for monitoring the motion of the measuring tool in order to take this motion into account when processing NMR signals from the borehole. The tool has a permanent magnet with a magnetic field direction substantially perpendicular to the axis of the borehole, a steel collar of a non-magnetic material surrounding the magnet, antenna positioned outside the collar, and a soft magnetic material positioned in a predetermined relationship with the collar and the magnet that helps to shape the magnetic field of the tool. Due to the non-magnetic collar, the tool can withstand the extreme conditions in the borehole environment while the borehole is being drilled.
    Type: Application
    Filed: June 24, 2003
    Publication date: July 1, 2004
    Applicant: NUMAR
    Inventors: Manfred G. Prammer, James H. Dudley, Peter Masak, George D. Goodman, Marian Morys, Dale A. Jones, Roger P. Bartel, Chen-Kang David Chen, Michael L. Larronde, Paul F. Rodney, John E. Smaardyk
  • Publication number: 20040124838
    Abstract: An device for use with an MR imaging system emits radio-frequency signals within a first range when acquiring data. A resonant circuit within the device includes a plurality of electrical components. An opto-electronic component within the device electrically communicates with the resonant circuit. The opto-electronic component is controlled to operate in a plurality of modes. The electrical components are not sensitive to the radio-frequency signals within the first range when the opto-electronic component is operating in one of the modes.
    Type: Application
    Filed: May 30, 2003
    Publication date: July 1, 2004
    Inventors: Jeffrey L Duerk, Michael Wendt, Eddy Y Wong, Jonathan Lewin
  • Publication number: 20040124839
    Abstract: The present invention is intended to provide a magnetic pole, a magnet apparatus, and a magnetic resonance imaging apparatus that the magnetic structure of the magnet apparatus for generating a uniform magnetic field is formed in a lower burst mode, and the profitability is increased, and at the same time, the uniformity of the magnetic field is improved.
    Type: Application
    Filed: January 15, 2004
    Publication date: July 1, 2004
    Inventors: Shigeru Kakugawa, Yoshihide Wadayama, Hirotaka Takeshima, Takeshi Yatsuo, Kenji Sakakiba
  • Publication number: 20040124840
    Abstract: In an antenna arrangement for an magnetic resonance device and a method for acquiring magnetic resonance signals, at least two adjacent individual antennas are provided and a galvanically contact-free decoupling coil is fashioned and/or arranged such that it inductively couples with both adjacent individual antennas so that the inductive coupling is minimal between the two adjacent individual antennas.
    Type: Application
    Filed: September 23, 2003
    Publication date: July 1, 2004
    Inventor: Arne Reykowski
  • Publication number: 20040124841
    Abstract: The invention relates to techniques for locating and determining the orientation of a fracture in an earth formation. Systems and methods for detecting a fracture in an earth formation using a propagation tool include producing electromagnetic fields using a TMD transmitter in the tool; measuring corresponding voltage signals detected with one or more TMD receivers in the tool; determining harmonics from the measured signal responses by shifting the responses (e.g. by 90 degrees) and performing an addition or subtraction using the shifted response. In some embodiments, the second harmonic is processed to determine the fracture orientation.
    Type: Application
    Filed: December 31, 2002
    Publication date: July 1, 2004
    Inventor: Dzevat Omeragic
  • Publication number: 20040124842
    Abstract: A system for determining the nature of a subterranean reservoir whose position and geometry is known from previous seismic surveys. An electromagnetic field is applied by a transmitter 18 on the seabed 14 and detected by antennae also on the seabed. The nature of the detected reflected waves is used to determine whether the reservoir contains water or hydrocarbons.
    Type: Application
    Filed: July 22, 2003
    Publication date: July 1, 2004
    Applicant: Den Norske Stats Oljeselskap A.S.
    Inventors: Terje Eidesmo, Svein Ellingsrud, Fan-Nian Kong, Harald Westerdahl, Stale Johansen
  • Publication number: 20040124843
    Abstract: In a diagnostic method for a fuel cell battery, the amount of cross leak is determined by supplying the anode of the fuel cell battery with a hydrogen or hydrogen-containing gas, and supplying the cathode with an inert gas or vacuuming the cathode, and measuring the voltage of each cell.
    Type: Application
    Filed: December 16, 2003
    Publication date: July 1, 2004
    Inventors: Shigetaka Hamada, Masaaki Kondo
  • Publication number: 20040124844
    Abstract: The invention concerns a device for and a process for testing electric motors, in particular fan motors, for functionality, wherein electromagnetic alternating fields produced by an electric motor are received by an antenna, wherein the received signals are analyzed for signal components in the frequency range of the rotation value of electric motors or their harmonics via an analysis unit, and wherein upon determination of functionality the results are indicated by an indicator unit.
    Type: Application
    Filed: December 15, 2003
    Publication date: July 1, 2004
    Inventors: Andreas Gruhle, Horst Kibbel
  • Publication number: 20040124845
    Abstract: A device for compensating for heat generation in a modular IC test handler is provided which includes at least one supporting member positioned adjacent to a press unit of the handler, and having a cooling fluid flow passage formed therein for flow of cooling fluid, and a plurality of cooling fluid spraying units for spraying the cooling fluid supplied through the cooling fluid flow passage toward faces of modular ICs in an oblique direction from a position between adjacent push bars of the press unit, thereby spraying cooling fluid directly onto ICs attached to a surface of modular ICs during testing and enhancing an efficiency of heat compensation.
    Type: Application
    Filed: September 9, 2003
    Publication date: July 1, 2004
    Applicant: Mirae Corporation
    Inventors: Chan Ho Park, Hyun Joo Hwang, Jae Bong Seo, Young Geun Park, Ho Keun Song
  • Publication number: 20040124846
    Abstract: A handler 1 is provided with an inner chamber 104 containing inside thereof heat sinks 40 of pushers 30, a temperature adjusting unit 91 for controlling the atmosphere temperature inside the inner chamber 104, a test chamber 102 containing inside thereof sockets 40 located on the test head 5 and the inner chamber 104, and a temperature adjusting unit 90 for controlling the atmosphere temperature inside the test chamber 102.
    Type: Application
    Filed: December 18, 2003
    Publication date: July 1, 2004
    Applicant: ADVANTEST CORPORATION
    Inventors: Tsuyoshi Yamashita, Noriyuki Igarashi
  • Publication number: 20040124847
    Abstract: A LAN tester has display and remote units each having a connector jack attached to an adapter board for connection to the plug of a patch cord. Both the display and remote units have circuits which are capable of measuring the phase between a drive signal voltage and the corresponding coupled or reflected signal due to the drive signal. Scattering parameters for the mated connector pairs and the patch cord itself are measured during a field calibration. A computer in one or both of the tester units stores the measured scattering parameters and uses the scattering parameters to move the reference plane to any desired location along the patch cord. The length of the patch cord can be determined through the use of phase by measuring the frequency difference between adjacent maxima of a plot of input impedance versus frequency.
    Type: Application
    Filed: December 12, 2003
    Publication date: July 1, 2004
    Inventor: Gerald W. Renken
  • Publication number: 20040124848
    Abstract: System and apparatus enabling the use of a single cable to communicate triggering information between each of a plurality of signal acquisition devices and, illustratively, an external trigger control unit.
    Type: Application
    Filed: December 12, 2003
    Publication date: July 1, 2004
    Inventors: Que Thuy Tran, Dennis Keldsen
  • Publication number: 20040124849
    Abstract: A wire testing method and apparatus tests wire (30) in-situ in a rigidly installed state, such as an aircraft (100). Stray currents are compensated by an apparatus for rapidly switching the excitation voltage and ground. The apparatus outputs a stray current signal (721), a detected current signal (731), and a difference signal (830) indicative of a measurement with the stray current signal removed.
    Type: Application
    Filed: February 11, 2003
    Publication date: July 1, 2004
    Inventor: William G. Linzey
  • Publication number: 20040124850
    Abstract: A current calibration operation is performed within a calibration port. Following the current calibration operation, a termination resistor calibration operation is performed, also within the calibration port. A resistor calibration signal and a bias voltage signal are transmitted from the calibration port to a plurality of transmitter ports. A single external precision resistor is coupled to the calibration port for use during the current calibration operation.
    Type: Application
    Filed: December 31, 2002
    Publication date: July 1, 2004
    Inventor: Surya N. Koneru
  • Publication number: 20040124851
    Abstract: A process allows the relative locating of a first electrical appliance and a second electrical appliance by the measurement of a first number of alternations or of electrical periods by the first electrical appliance from the energizing of the said first part and up to transmission of a signal by the first electrical appliance, the measurement of a second number of alternations or of electrical periods by the second electrical appliance from the energizing of the said second part and up to receipt of a signal from the first electrical appliance and the comparison of the first number with the second number.
    Type: Application
    Filed: September 11, 2003
    Publication date: July 1, 2004
    Inventor: Xavier Grobon
  • Publication number: 20040124852
    Abstract: A propagation delay time measuring method of measuring a propagation delay time of a test signal propagating along one of a first signal path and a second signal path serially connecting to the first signal path through which a semiconductor testing apparatus includes a driver and a comparator electrically connected to a device under test, the method includes: a first connecting step of connecting an end of the first path to the driver and the comparator; a first output step of outputting a test signal from the driver to the first path; a first reflect signal receiving step of receiving a test signal at the comparator, defined as a first reflect signal, reflected at another end of the first path; a first timing detecting step of detecting a timing, defined as a first timing; a second connecting step of connecting an end of the second path to another end of the first path; a second output step of outputting the test signal from the driver to the second path; a second reflect signal receiving step of receiving
    Type: Application
    Filed: August 22, 2003
    Publication date: July 1, 2004
    Inventors: Koichi Higashide, Yukio Ishigaki, Satoko Higashide
  • Publication number: 20040124853
    Abstract: A resonator device for testing a material quantity in the tobacco-processing industry for existence of at least one foreign substance and/or for detecting at least one of weight, density and humidity level of the material includes a resonator housing having a through opening for the material to pass through and a testing region located inside the resonator housing to which the material can be moved at least in part. The device has at least one element that increases energy density of electromagnetic waves for increasing the energy density in at least a portion of the testing region.
    Type: Application
    Filed: December 15, 2003
    Publication date: July 1, 2004
    Applicant: Hauni Maschinenbau AG
    Inventors: Henning Moller, Jorg Tobias, Wolfgang Taute, Reinhard Knochel
  • Publication number: 20040124854
    Abstract: A loop powered level measurement and time of flight ranging system with power management. The level measurement system comprises a controller, a transducer for distance ranging, a power supply, and a power management stage. The power management stage comprises a shunt current regulator and a circuit for charging a storage capacitor. The shunt current regulator shunts excess current from the current loop and the circuit charges the storage capacitor. The charging of the capacitor is monitored and stored energy is applied to the transducer to make a level measurement. During charging, the controller continues to operate a user interface and communication module.
    Type: Application
    Filed: September 30, 2003
    Publication date: July 1, 2004
    Inventor: Marian Jozef Walter Slezak
  • Publication number: 20040124855
    Abstract: A generator (6) directs microwave signals to a waveguide (1) having a linear array of slots (2), and the signals are received by measuring means (5). The local permittivity or moisture content of material adjacent the waveguide (1), such as a stack of timber, may be determined at each slot (2) via regression analysis. The total permittivity or moisture may be determined by averaging measurements obtained for both transmission directions of the waveguide (1). The apparatus may be used for controlling drying parameters, such as drying time, for the material.
    Type: Application
    Filed: September 17, 2003
    Publication date: July 1, 2004
    Inventors: Wayne Stephen Holmes, Stephen Geoffrey Riley
  • Publication number: 20040124856
    Abstract: A wood drying installation for a wood drying kiln including a pair of electrodes adapted to be inserted into a wood stack contained in the kiln, a resistance connected in a series circuit with the electrodes, an AC voltage source connected to apply an AC voltage across the series circuit, a phase detecting circuit connected to the series circuit operable to generate a signal representing the phase angle between AC voltages applied to different parts of the series circuit, and a processor to receive the signal. The system is operable to determine a moisture value corresponding to a capacitive component of the reactive impedance between the electrodes in accordance with a predetermined arithmetic algorithm relating the value to the phase angle.
    Type: Application
    Filed: December 17, 2003
    Publication date: July 1, 2004
    Inventors: Liebrecht Venter, Jacob Viljoen
  • Publication number: 20040124857
    Abstract: The invention concerns a measurement device comprising at least a measuring probe (10), means (30) for sequentially applying a controlled supply voltage between the measuring probe (10) and a reference element (20) and means (50) for integrating the electric loads accumulated on the measuring probe (10). The invention is characterised in that it further comprises means (60) for correcting the integrating stage (50) input offset.
    Type: Application
    Filed: January 9, 2004
    Publication date: July 1, 2004
    Inventors: Pascal Jordana, Claude Launay, Daniel Le Reste, William Pancirolii, Joaquim Da Silva, Philippe Parbaud
  • Publication number: 20040124858
    Abstract: A long-life conductivity sensor system and method that is embeddable or immersible in a medium. The conductivity sensor system includes at least a housing with an enclosing wall that defines an interior volume and that has at least one aperture through the wall; a pair of electrodes protruding through the aperture into a medium surrounding the sensor housing; and conductivity sensing electronics contained within the sensor housing interior volume and connected to the pair of electrodes. The conductivity sensing electronics include a galvanostat connected to the electrodes for inducing discrete constant current pulses between the electrodes creating a transient voltage signal between the electrodes; and a high-speed voltmeter/A-D Converter connected to the electrodes for measuring the transient voltage signal between the electrodes, the transient voltage signal being a function of the conductivity of the medium surrounding the sensor housing.
    Type: Application
    Filed: February 6, 2003
    Publication date: July 1, 2004
    Inventors: Rengaswamy Srinivasan, Francis B. Weiskopf Jr, Kenneth R. Grossman, Russell P. Cain, Hassan Saffarian
  • Publication number: 20040124859
    Abstract: The disclosure relates to a semiconductor device testing apparatus, a semiconductor device testing system, and a semiconductor device testing method, in particular a method for measuring or trimming, respectively, the impedance of driver devices provided in a semiconductor device, wherein a device, in particular a driver device, comprising each a pull-up circuit and a pull-down circuit is used, and wherein the method includes: joint activating of both the pull-up circuit and the pull-down circuit; and determining a first current flowing through the pull-up circuit or the pull-down circuit, respectively, with jointly activated pull-up and pull-down circuits.
    Type: Application
    Filed: September 16, 2003
    Publication date: July 1, 2004
    Inventor: Georg Muller
  • Publication number: 20040124860
    Abstract: A system and method for creating, editing, and/or executing a test program for testing a transformer is provided. The system includes an input that allows the user to select the desired test instructions and pre-existing sequences of test instructions to create or edit a test program having a sequence of test instructions. The processor executes the test program by generating commands that are performed in a predetermined order.
    Type: Application
    Filed: December 20, 2001
    Publication date: July 1, 2004
    Inventor: Fadi Adel Hamdan
  • Publication number: 20040124861
    Abstract: A method and apparatus for making a probe head that is very short (in the direction vertical) and exerts low force on the contacts of the circuit being tested, and on its own pins. The probe head is moved in the vertical direction to contact the IC being tested. Each pin is in sliding contact with an electrical contact on a space-transformer substrate, such as a post that slides within a sleeve. Each pin is also held in a diaphragm, such as an elastic membrane, in order to provide gentle force of the pin against the contact point of the circuit being tested. One or more walls or supports around each pin hold portions of the diaphragm in place so a deflection of one pin will not lift neighboring pins off their contacts.
    Type: Application
    Filed: December 31, 2002
    Publication date: July 1, 2004
    Inventor: Koorosh Zaerpoor
  • Publication number: 20040124862
    Abstract: In the probe card of the semiconductor device measurement device, measurement is to be done in the stability without damage beyond the needle diameter on the pad of the wafer by the probe needle. The straight probe needle 5 is inserted in the upper guide plate 2, the rotary guide plate 3 and the bottom guide plate 4. The rotary guide plate 3 is a little displaced, and the center of the probe needle 5 is bent. Under this condition, the stage with the wafer thereon is raised, and then the tip of the probe needle 5 reaches the pad on the surface of the wafer. The rotary guide plate 3 has a guide slot 7. The rotary guide plate 3 is moved in the horizontal plane. The fixed guide pin 8 moves along the guide slot 7. The probe needle 5 rotates like swinging. The probe needle 5 breaks through the natural oxide film stuck on the pad. In this way, the dispersion of the pressure of the probe needle 5 is prevented. Measurement can be done without damage beyond the needle diameter on the pad of the wafer.
    Type: Application
    Filed: September 15, 2003
    Publication date: July 1, 2004
    Inventor: Shinichi Sugawara
  • Publication number: 20040124863
    Abstract: A test configuration for testing a plurality of integrated circuits, in particular fast semiconductor memory modules located on a wafer, in parallel. The test configuration includes a carrier board for bringing up electrical signal lines belonging to a test system, contact-making needles for producing electrical connections with contact areas on the circuits to be tested, and a plurality of active modules that are arranged on the carrier board. The active modules are each assigned to one of the circuits to be tested in parallel, and are each case inserted into the signal path between the test system and the associated circuit to be tested. In a preferred embodiment, the active modules are arranged at least partly overlapping, based on a direction at right angles to the plane of the carrier board.
    Type: Application
    Filed: December 15, 2003
    Publication date: July 1, 2004
    Applicant: Infineon Technologies AG
    Inventors: Michael Hubner, Gunnar Krause, Justus Kuhn, Jochen Muller, Peter Pochmuller, Jurgen Weidenhofer
  • Publication number: 20040124864
    Abstract: High port-to-port RF isolation for a test socket in a production RF test environment is achieved by establishing a coaxial-type connection between the test socket and the device under test (DUT). This coaxial-type connection results by at least partially surrounding each port of the DUT with a ground seal connected to RF ground connection. In one embodiment, the ground seal is a metallic base plate of the test socket which surrounds the RF connection to the DUT.
    Type: Application
    Filed: December 27, 2002
    Publication date: July 1, 2004
    Inventors: David A. Feld, Daniel S. Lam, Paul D. Bradley
  • Publication number: 20040124865
    Abstract: Due to the test current and the test temperature of the wafer-level reliability depend on each other in those conventional arts, the result of electromigration etc is not sure cause of the test current or the test temperature and debases the reliability of the test result. In the present invention, the electromigration test and the stress migration test of the wafer-level reliability are independently controlled, respectively. Therefore, the cause of electromigration and the stress migration can be sure resulting from the test current or the test temperature respectively. Furthermore, the isothermal heater of the present invention not only can keep a whole test wafer at a more uniform test temperature, but also can offset the electromagnetism resulted from the current of the isothermal heater by the arrangement of circuits thereof for reducing the effect of the electromagnetism.
    Type: Application
    Filed: December 26, 2002
    Publication date: July 1, 2004
    Inventors: Kun Fu Chuang, Fu-Chien Chiu, Rueyway Lin, Jenn-Chang Hwang