Patents Issued in November 1, 2007
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Publication number: 20070252577Abstract: A current sensor comprises a magnetic module, whereby a primary conductor, a compensating winding and a magnetic field probe are magnetically coupled to each other. The primary conductor carries a current to be measured, with a driving circuit, for producing a triangular current, injected into the compensating winding. An evaluation circuit switches the output signal thereof from a first to a second output level and vice versa by a zero crossing of a signal, provided by the magnetic field probe, whereby the output signal is pulse-width modulated, depending on the intensity of the current to be measured.Type: ApplicationFiled: October 30, 2006Publication date: November 1, 2007Inventor: Norbert Preusse
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Publication number: 20070252578Abstract: A current clamp meter having a current meter body and a detachable current clamp. The current meter body and the current clamp are configured so that the current clamp is detachable from the current meter body and the meter is operable with the current clamp either attached to the current meter body or detached from the current meter body.Type: ApplicationFiled: May 25, 2007Publication date: November 1, 2007Inventors: Shounan Luo, Wang Yong
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Publication number: 20070252579Abstract: A current clamp meter having a current meter body and a detachable current clamp. The current meter body and the current clamp are configured so that the current clamp is detachable from the current meter body and the meter is operable with the current clamp either attached to the current meter body or detached from the current meter body.Type: ApplicationFiled: April 27, 2006Publication date: November 1, 2007Inventors: Shounan Luo, Wang Yong
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Publication number: 20070252580Abstract: A probe for measuring electrical characteristics of an excitation current of a plasma is provided. The probe is mounted on a conductive line that includes an inner conductor and an outer conductor. The probe includes a current sensor and a voltage sensor. The current sensor includes a grove formed in the ground of one of the conductors in order to form a detour for the current flowing through the conductor, and a point for measuring electric voltage between a ground connected to the conductor and a point of the groove. The current sensor thus is able to measure a voltage proportional to the first time derivative of intensity (Iplasma) of the excitation current. The voltage sensor is a shunt sensor capable of measuring a voltage proportional to the first time derivative of the voltage (Vplasma) of the excitation current. A plasma reactor including a probe of the aforementioned type is also provided.Type: ApplicationFiled: September 15, 2005Publication date: November 1, 2007Applicant: Ecole PolytechniqueInventors: Sebastien Dine, Jacques Jolly, Jean Larour
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Publication number: 20070252581Abstract: A method for testing power switches using a logic gate tree, the method comprises providing a logic gate tree electrically connected to a plurality of power switches, each output node of the plurality of power switches being electrically connected to a corresponding input node of a logic gate of the logic gate tree; applying a pattern of control signals to the plurality of power switches for controlling on-off states of the plurality of power switches; and determining whether an output voltage signal of an output node of the logic gate tree matches a predetermined value corresponding to the pattern of control signals.Type: ApplicationFiled: April 26, 2006Publication date: November 1, 2007Inventor: Yu-Wen Tsai
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Publication number: 20070252582Abstract: A test probe. The test probe includes an interconnect module configured to connect to a modular, replaceable wireless module, a connect module configured to communicate with a communication network and the wireless module, an identification module configured to receive and transmit an identification of the test probe, an audio module configured to enable transfer of audio data from/for communication with the communication network from/to the wireless module and to translate audio data to/from audio signals, and a computer configured to enable transfer of audio signals from/to the audio module, transfer of digital data from/to the wireless module, and transfer of test data to/from a remote controller. Test data from the remote controller comprises instructions to control the wireless module and data for the wireless module to transfer to the connect module, and test data transmitted to the remote controller comprises digital data and audio data received from the wireless module.Type: ApplicationFiled: April 28, 2006Publication date: November 1, 2007Inventors: Dion Heisler, Nimal Gamage
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Publication number: 20070252583Abstract: Disclosed is an AC characteristics measurement system that includes a flip-flop arranged in a loop of a ring oscillator; a clock generating circuit that receives a signal propagated in said loop of said ring oscillator and generates a clock signal to be supplied to said flip-flop; a delay adjustment circuit that receives a signal propagated in said loop of said ring oscillator and generates a data signal to be supplied to said flip-flop and that receives a control signal and variably controls the time difference between a transition edge of said data signal to be supplied to said flip-flop and an effective edge of said clock signal to be supplied to said flip-flop, based on said control signal; and a setup-hold changeover circuit that is provided at a preceding stage of said flip-flop and that switches the temporal before and after relation between a transition edge of said data signal supplied to said flip-flop and an effective edge of said clock signal, responsive to a control signal for performing changeovType: ApplicationFiled: April 2, 2007Publication date: November 1, 2007Applicant: NEC Electronics CorporationInventors: Naho Hokoiwa, Yasutaka Uenishi
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Publication number: 20070252584Abstract: In an electric power controller for vehicle mounting, an input voltage supplied through a harness and a threshold value are compared, and the input voltage applied to load is interrupted when the input voltage is smaller than the threshold value. The electric power controller for vehicle mounting includes a voltage drop detector for detecting a voltage drop amount of the harness; and a threshold value setting device in which a voltage provided by subtracting the voltage drop amount of the harness from a predetermined protecting voltage is set as the threshold value.Type: ApplicationFiled: April 24, 2007Publication date: November 1, 2007Applicant: OMRON CorporationInventors: Kimihiko Imamura, Masakazu Okaniwa
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Publication number: 20070252585Abstract: A rotary position sensor apparatus includes a magnet having a surface and a plurality of Hall components placed within the surface of the magnet. The Hall components are located on a neutral axis of the magnet thereby forming a rotary position sensor apparatus having an enhanced linearity, a reduced calibration time and a compact size. A printed circuit board (PCB) can also be provided and the Hall components mounted to the PCB. The magnet preferably possesses a rectangular shape, but other shapes may be implemented depending upon design considerations.Type: ApplicationFiled: April 26, 2006Publication date: November 1, 2007Inventors: Kumaran Narasimhan, Vivek Salunke, Swapnil Patil
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Publication number: 20070252586Abstract: An instrument (10) for measuring three-dimensional motion in a living body comprises a plurality of magnetism generators (12i) fixed to one of at least two objects (44, 46) moving relatively in the living body, a plurality of magnetic field sensors (14j) fixed to the other object in order to perform noncontact detection of the magnetic field of each magnetism generator (12i), and a signal processing means (26) for calculating relative position and direction between each magnetism generator (12i) and each magnetic field sensor (14j) according to a magnetic field detected by each magnetic field sensor (14j). The number of magnetism generators (12i) and magnetic field sensors (14j) is at least five, respectively.Type: ApplicationFiled: March 31, 2005Publication date: November 1, 2007Applicant: JAPAN SCIENCE AND TECHNOLOGY AGENCYInventors: Kenichi Arai, Shin Yabukami, Hiroyasu Kanetaka
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Publication number: 20070252587Abstract: The invention relates to a method for determining the rotor position of a stationary or slowly rotating synchronous machine by evaluating electrical test pulses that are obtained by applying voltage pulses to the individual phase windings of the stator, wherein changes in the inductance of the phase windings which are caused by saturation of the stator iron depending on the rotor position, are determined in opposite directions or current by calculating differences in the amount of current of two test pulses, and angle values being predetermined by the number of the phase windings are associated with the differences in the amount of current.Type: ApplicationFiled: October 28, 2004Publication date: November 1, 2007Inventors: Peter Stauder, Tom Kaufmann
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Publication number: 20070252588Abstract: A magnetic sensing element with improved magnetic detection output and a method for making the same are provided. In the magnetic sensing element, the length of an upper pinned magnetic layer an upper antiferromagnetic layer in a track width direction is larger than the length of a free magnetic layer in the track width direction. In making the magnetic sensing element, there is no need to remove side portions of the upper pinned magnetic layer and the upper antiferromagnetic layer. The materials of the upper pinned magnetic layer and the upper antiferromagnetic layer are thus prevented from redepositing on two side faces of the free magnetic layer during milling.Type: ApplicationFiled: November 8, 2005Publication date: November 1, 2007Inventor: Yoshihiro Nishiyama
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Publication number: 20070252589Abstract: The invention relates to a measuring device for detecting a body moving in relation to an, in particular, tubular container. Said device comprises at least one magnet unit which generates a magnetic field, measures this magnetic field and which is assigned to the container and/or to the magnetic body. The device also comprises at least one evaluation device connected to the magnet units and provided for receiving measurement signals of the magnet units. The aim of the invention is to improve a measuring device of this type in order to be able to easily determine, in addition to the position of the body in relation to the container in a longitudinal direction, the position of the body in relation to the container in the transverse direction with a relatively high level of accuracy. To this end, the magnet units comprise a maximum magnetic flux that is essentially perpendicular to the direction of the relative motion of the body and container.Type: ApplicationFiled: May 23, 2007Publication date: November 1, 2007Applicant: CAMERON INTERNATIONAL CORP.Inventors: Klaus Biester, Peter Kunow
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Publication number: 20070252590Abstract: A rotational angle detector for detecting the absolute value of a rotational angle of a rotor. The rotational angle detector includes a drive gear integrally rotatable with the rotor and first and second driven gears mated with the drive gear. First and second magnetic sensors detect the rotational angles of the first and second driven gears and output detection signals corresponding to the detected rotational angles. A controller calculates the absolute value of the rotational angle of the rotor based on the rotational angles of the first and second driven gears. Further, the controller detects an abnormality in the first or second magnetic sensor from the detection signals output by the first and second magnetic sensors.Type: ApplicationFiled: April 11, 2007Publication date: November 1, 2007Applicant: KABUSHIKI KAISHA TOKAI RIKA DENKI SEISAKUSHOInventor: Seiji Kondo
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Publication number: 20070252591Abstract: A through the hole rotary position sensor which incorporates a single ring magnet with a central aperture is disclosed. The rotating shaft whose angular position is to be sensed is adapted to be received in the central aperture. The through the hole rotary position sensor in accordance with the present invention also includes a pair of pole pieces which extend at least partially around the circular magnet. One or more magnetic flux responsive elements are disposed adjacent the pole pieces. In order to shield the sensor from undesirable magnetic flux influences through the rotatable shaft, an optional internal shunt ring may be provided around the exterior of the rotatable shaft. In order to shield the sensor from undesirable external magnetic flux influences, an optional external shunt ring and top and bottom shunt discs may also be provided. The circular magnet, pole pieces, magnetic flux responsive element, optional shunt rings and shunt discs are carried by a non-magnetic housing.Type: ApplicationFiled: July 11, 2007Publication date: November 1, 2007Applicant: SIEMENS VDO AUTOMOTIVE CORPORATINInventor: Brian Babin
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Publication number: 20070252592Abstract: A measuring device and method are disclosed for parameter distribution measurement over the entire surface of sheet-like objects. The parameters of primary interest are thickness and permeability profiles. The device includes a parameter measuring unit a coordinate measuring unit and a synchronization unit to control operation of the parameter measuring unit and the coordinate measuring unit. The coordinate measuring unit determines the measuring device position on two-dimensional surface using image correlation analysis. The measuring device further comprises a platform for its movement in the plane of the sheet-like object.Type: ApplicationFiled: April 24, 2007Publication date: November 1, 2007Inventors: Sergey Kholchanskiy, Victor Preobrazhenskiy, Igor Zelenyak, Victor Milovidov, Nadejda Reingand
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Publication number: 20070252593Abstract: An ultrasensitive room temperature magnetoelectric thin film magnetometer is fabricated on a cantilever beam and includes an active magnetoelectric multilayer structure having a plurality of thin films formed at a region defined on the cantilever beam. Upon application of a magnetic field, the active magnetoelectric structure generates a corresponding response of an electrical nature which is a measure of a value of the applied magnetic field. The material of the cantilever beam may be removed beneath the active magnetoelectric multilayer structure to form a freestanding modification of the magnetometer with superior sensitivity. The active magnetoelectric multilayer structure is either a bi-layer structure which includes a piezoactive (piezoelectric and/or piezoresistive) thin film deposited in contact with a magnetostrictive thin film or a tri-layer active structure (in the free-standing implementation) including a piezoactive thin film sandwiched between a pair of magnetostrictive thin films.Type: ApplicationFiled: March 16, 2007Publication date: November 1, 2007Applicant: UNIVERSITY OF MARYLANDInventors: ICHIRO TAKEUCHI, MANFRED WUTTIG
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Publication number: 20070252594Abstract: A magnetic sensor has a needle-shaped detecting part. The needle-shaped detecting part includes a substrate cut to have a needle shape, at least one MR element formed on the substrate, at least two lead conductors formed on the substrate, one end of the conductor being electrically connected to at least one MR element, and a protection film covering the at least one MR element and the at least two lead conductors.Type: ApplicationFiled: April 19, 2007Publication date: November 1, 2007Applicant: TDK CORPORATIONInventor: Shigeru SHOJI
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Publication number: 20070252595Abstract: Using resonant interactions to directly and tomographically image neural activity in the human brain using magnetic resonance imaging (MRI) techniques at ultra-low field (ULF), the present inventors have established an approach that is sensitive to magnetic field distributions local to the spin population in cortex at the Larmor frequency of the measurement field. Because the Larmor frequency can be readily manipulated (through varying Bm), one can also envision using ULF-DNI to image the frequency distribution of the local fields in cortex. Such information, taken together with simultaneous acquisition of MEG and ULF-NMR signals, enables non-invasive exploration of the correlation between local fields induced by neural activity in cortex and more ‘distant’ measures of brain activity such as MEG and EEG.Type: ApplicationFiled: February 22, 2007Publication date: November 1, 2007Inventors: Petr Volegov, Andrei Matlachov, John Mosher, Michelle Espy, Robert Kraus
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Publication number: 20070252596Abstract: The nuclear magnetic resonance spectrum of a sample, which is a target material analyzed, and changes in relaxation times of nuclear magnetic resonance signals are measured while the sample is irradiated with terahertz waves containing frequency components corresponding to peak portions of absorption or reflectance spectrum of the sample. On the basis of the changes in relaxation times, the relationship between peak portions and information about a three-dimensional structure, conformational alteration, molecular relaxation, and the like is observed, the peak portions being in the absorption or reflectance spectrum in the terahertz range of the sample.Type: ApplicationFiled: April 20, 2007Publication date: November 1, 2007Applicant: CANON KABUSHIKI KAISHAInventor: Katsuaki Kuge
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Publication number: 20070252597Abstract: The present invention relates to a magnetic resonance spectroscopic imaging (MRSI) method, specifically to a magnetic resonance spectroscopic imaging method with up to three spatial dimensions and one spectral dimension. Interleaving dynamically switched magnetic field gradients into the spectroscopic encoding scheme enables multi-region shimming in a single shot to compensate the spatially varying spectral line broadening resulting from local magnetic field gradients. The method also employs sparse spectral sampling with controlled spectral aliasing and nonlinear sampling density to maximize encoding speed, data sampling efficiency and sensitivity.Type: ApplicationFiled: April 24, 2007Publication date: November 1, 2007Inventor: Stefan Posse
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Publication number: 20070252598Abstract: A MRI shim element includes a plurality of thin wires extending substantially parallel to each other wherein each wire has cross sectional dimensions less than ?sk, wherein ?sk is the wire's skin depth.Type: ApplicationFiled: April 28, 2006Publication date: November 1, 2007Inventor: Yuri Lvovsky
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Publication number: 20070252599Abstract: A circuit breaker includes a plurality of independent poles. Each of the independent poles includes separable contacts, sensors structured to sense a current and a voltage operatively associated with the separable contacts, and a magnetically actuated actuator structured to open and close the separable contacts. A manual selector, such as a rotary switch, is structured to select a point-on-wave switching characteristic from a plurality of different switching characteristics. A point-on-wave controller cooperates with the manual selector and with the sensors and the actuators of the independent poles to independently and synchronously open and close the separable contacts of the independent poles as a function of the point-on-wave switching characteristic selected by the manual selector.Type: ApplicationFiled: May 1, 2006Publication date: November 1, 2007Inventors: Xin Zhou, Brad Leccia, Lian Zou
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Publication number: 20070252600Abstract: A diagnosis method for SOH of batteries includes the steps of: providing data of discharge voltages and currents of a battery unit; setting an acceptable value of a predetermined period of time and an acceptable range of variation rate of discharge current for the battery unit; calculating variation rates of discharge voltages and currents of the battery unit within the predetermined period of time by using the data of discharge voltages and currents; recording the data of discharge voltages and currents of the batteries and variation rates thereof; comparing the data of discharge voltages of the batteries and the variation rates thereof if the variation rates of discharge current are fallen within the acceptable range of current variation with selected reference data; and converting results of compared data of discharge voltages of the battery unit and the variation rates thereof into a SOH index.Type: ApplicationFiled: January 22, 2007Publication date: November 1, 2007Applicant: ABLEREX ELECTRONICS CO., LTD.Inventors: Hung-Liang Chou, Yu-Hua Sun, Kuen-Der Wu, Chin-Chang Wu, Ming-Hsun Hsieh, Ya-Tsung Feng
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Publication number: 20070252601Abstract: A method for determining the deterioration of an accumulator battery, hooked up with loads in a system, based on the result of measuring internal resistances of an accumulator battery, the method including predetermining a temperature at which the deterioration of the accumulator battery is determined, calculating temperature correction coefficients, predetermining resistance-voltage conversion factors, measuring the internal resistances and temperature of the accumulator battery, converting the measured internal resistance values into the internal resistance values, converting the internal resistance values at the specified temperature into the terminal discharge voltage values and determining whether the accumulator battery is deteriorated or not by means of comparison of the terminal discharge voltage values.Type: ApplicationFiled: June 28, 2007Publication date: November 1, 2007Applicant: THE FURUKAWA ELECTRIC CO., LTD.Inventors: Toshiyuki SATOH, Atsushi KIMURA, Fumikazu IWAHANA, Tetsuya KANOU, Katsumi INANIWA
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Publication number: 20070252602Abstract: The test circuit according to the present invention includes: a plurality of light-receiving elements; a plurality of amplifiers, each of which converts, into a voltage, a photoelectric current supplied from one of the light-receiving elements; and an electric current supplying unit which supplies an electric current to each of the light-receiving elements and each of the amplifiers.Type: ApplicationFiled: February 21, 2007Publication date: November 1, 2007Applicant: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.Inventors: Yousuke KUROIWA, Hideo FUKUDA, Hiroshi YAMAGUCHI, Tetsuo CHATO, Yuzo SHIMIZU, Masaki TANIGUCHI
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Publication number: 20070252603Abstract: Certain exemplary embodiments can comprise an arc fault detection circuit. The arc fault detection circuit can comprise a zero crossing analysis sub-system comprising a counter configured to determine, for a first waveform, a count of dips that occur between a pair of predetermined zero crossings of a second waveform. The second waveform can be obtained from an electrical circuit.Type: ApplicationFiled: April 27, 2006Publication date: November 1, 2007Inventors: Carlos Restrepo, Peter Staley
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Publication number: 20070252604Abstract: An inspection apparatus including a transmission line for propagating an electromagnetic wave; an electromagnetic wave supply unit for supplying a terahertz wave to the transmission line; an electromagnetic wave detection unit for detecting the terahertz wave from the transmission line; a conductive region; an inspection object supply unit; and a deposition unit. The conductive region is arranged at a site including at least a part of the range to which an electric field distribution of the electromagnetic wave propagating through the transmission line extends. The inspection object supply unit holds and supplies the inspection object to the outside, and the deposition unit deposits the inspection object selectively on the conductive region by electrostatic force. The electromagnetic wave supplied from the electromagnetic wave supply unit and propagated through the transmission line is detected by the electromagnetic wave detection unit to obtain information on the inspection object.Type: ApplicationFiled: March 27, 2007Publication date: November 1, 2007Applicant: CANON KABUSHIKI KAISHAInventors: Toshihiko Ouchi, Shintaro Kasai
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Publication number: 20070252605Abstract: An interface module. The interface module includes a probe identification module configured for connection to an identification bus, a probe detect module configured for connection to a detect-control bus, a power control module configured for connection to the detect-control bus, a control and data module configured for connection to a control-data bus, and multiple connectors. Each connector has an associated hot swap circuit. For each connector, if the probe detect module detects connection of that connector to a test probe via connection of that connector to the probe detect module, the probe identification module is configured to enable transfer of an identification label identifying that test probe to that test probe via that connector and the control and data module is configured to enable transfer of control instructions and data between the control-data bus and the test probe via connection of the control and data module to that connector.Type: ApplicationFiled: April 28, 2006Publication date: November 1, 2007Inventors: Dion Heisler, Nimal Gamage
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Publication number: 20070252606Abstract: A shielded probe apparatus is provided with a shielded probe and a tri-axial cable that are electrically connected within a shielded chassis. The shielded probe apparatus is capable of electrically testing a semiconductor device at a sub 100 fA operating current and an operating temperature up to 300° C.Type: ApplicationFiled: July 18, 2007Publication date: November 1, 2007Inventors: Bryan Root, William Funk
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Publication number: 20070252607Abstract: A method of manufacturing a circuit module having a low price and good productivity, a collective board for the circuit module, and a circuit module manufactured by the method are provided. In the method of manufacturing the circuit module of the invention, when performing a burn-in test, a collective board 1 having a circuit board 2 can be used as a test board. Accordingly, since it is not necessary to have an additional test board, it is possible to obtain a low price product. In addition, since a test is performed in a state where the bare chip 8 is attached (e.g., soldering) to the circuit board 2, the number of the process of the bare chip 8. Accordingly, it is possible to obtain good productivity.Type: ApplicationFiled: April 23, 2007Publication date: November 1, 2007Inventor: Hidekatsu Muroi
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Publication number: 20070252608Abstract: A contact terminal formed of an electrically conductive material is arranged in each of a plurality of holed of a contactor substrate. An electrically conductive part is formed on an inner surface of each hole. The contact terminal has a first contact part that contacts a terminal of an electronic part and a second contact part that contacts the electrically conductive part in a middle portion. When the contact terminal bends by the first contact part being pressed, the second contact part contacts the electrically conductive part of the contactor substrate and an appropriate degree of contact pressure is obtained.Type: ApplicationFiled: May 10, 2007Publication date: November 1, 2007Applicant: FUJITSU LIMITEDInventors: Daisuke Koizumi, Naohito Kohashi, Kazuhiro Tashiro, Takumi Kumatabara
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Publication number: 20070252609Abstract: An apparatus for supporting BGA packages for one or more testing processes is disclosed. The apparatus includes a substrate member. The substrate member has a plurality of contact pads, with each of the contact pads being spatially disposed around a peripheral region of the substrate. The apparatus further includes a plurality of contact regions spatially configured on a portion of the substrate member. Each of the plurality of contact regions is numbered from 1 through N being electrically connected to respective contact pads numbered from 1 through N. The plurality of contact regions is configured to provide electrical contact to respective plurality of balls provided on a BGA package. The apparatus additionally includes a holder device coupled to the substrate member. The holder device is adapted to mechanically hold the BGA package in place to provide mechanical contact between the plurality of balls and respective plurality of contact regions.Type: ApplicationFiled: June 9, 2006Publication date: November 1, 2007Applicant: Semiconductor Manufacturing International (Shanghai) CorporationInventors: Shan An Liang, Chung Kui Ji, Ping Lung Liao, Tian Qin
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Publication number: 20070252610Abstract: A method comprises circulating a heat transferring fluid in a substantially closed system including an interstice between a wafer and a chuck at a first pressure. The method further comprises pumping the fluid out of the interstice and increasing the pressure of the fluid to a second pressure. The method further comprises reducing the pressure of the fluid to the first pressure and returning the fluid to the interstice. In the system of the present invention, the fluid in the interstice transfers heat from the wafer to the chuck, or vice versa, by conduction. The presence of a conducting fluid in the interstice thereby decreases the resistivity of the interface, and enables more efficient heat transfer from the wafer to the chuck.Type: ApplicationFiled: April 28, 2006Publication date: November 1, 2007Inventors: David Audette, Philip Diesing, David Gardell
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Publication number: 20070252611Abstract: A semiconductor wafer includes a dielectric test structure including a voltage line, a control line, and a plurality of test devices connected in parallel to the voltage line and the control line. Each test device includes a voltage-controlled resistor connected to the control line and a dielectric device, the dielectric device being connected to the voltage line via the voltage-controlled resistor. A method for dielectric reliability testing and forming an integrated circuit product is also provided, as is a wafer with a control voltage pad and an integrated circuit product.Type: ApplicationFiled: April 27, 2006Publication date: November 1, 2007Applicant: Infineon Technologies AGInventor: Martin Kerber
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Publication number: 20070252612Abstract: A system for monitoring the connection on an integrated circuit ball grid array (BGA) comprises a connection indicator circuit coupled to at least one monitor pin of the BGA and configured to detect a pin connection failure of the BGA based on a signal change associated with the at least one monitor pin.Type: ApplicationFiled: April 26, 2006Publication date: November 1, 2007Inventor: Jeffry Sylvester
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Publication number: 20070252613Abstract: The invention provides a universal leakage monitoring system (ULMS) to measure a plurality of leakage macros during the development of a manufacturing process or a normal operation period. The ULMS characterizes the leakage of both n-type and p-type CMOS devices on the gate dielectric leakage, the sub-threshold leakage, and the reverse biased junction leakage, and the like. Testing is performed sequentially from the first test macro up to the last test macro using an on-chip algorithm. When the last test macro is tested, it scans the leakage data out.Type: ApplicationFiled: April 27, 2006Publication date: November 1, 2007Applicant: International Business Machines CorporationInventors: Louis Hsu, Edward Pillai, Joseph Natonio, James Rockrohr, David Hanson
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Publication number: 20070252614Abstract: A display device includes first and second display signal lines, pixels, first and second sensing signal lines, first through fourth test lines for transmitting first through fourth test signals, a first switching element connected to the first and second test lines, and the first sensing signal line, second switching elements connected to the first switching element, the second test line, and a subset of first display signal lines, a third switching element connected to the third and fourth test lines, and the second sensing signal line, and fourth switching elements connected to the third switching element, the fourth test line, and a subset of second display signal lines.Type: ApplicationFiled: December 27, 2006Publication date: November 1, 2007Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventor: Jin JEON
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Publication number: 20070252615Abstract: A logic-keeping apparatus including a logic judgment unit and a noise-event detection unit is disclosed. When the level at the input terminal of the logic judgment unit is larger than a first level, the output terminal thereof outputs a first logic state; when the level at the input terminal is smaller than a second level, the output terminal thereof outputs a second logic state; when the level at the input terminal is between the first level and the second level, the output terminal thereof keeps the previous logic state. The noise-event detection unit is for detecting whether a noise-event occurs (for example, an ESD event). Wherein, when a noise-even occurs in the system, the noise-event detection unit keeps the level at the input terminal of the logic judgment unit between the first level and the second level.Type: ApplicationFiled: June 23, 2006Publication date: November 1, 2007Inventors: Chyh-Yih Chang, Ching-Hua Huang
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Publication number: 20070252616Abstract: A programmable system-on-a-chip integrated circuit device includes a programmable logic block, at least one user non-volatile memory block, and temperature sensing and control analog and digital circuits on a single semiconductor integrated circuit chip or a flip chip, face-to-face, or other multiple die configuration. The programmable system-on-a-chip integrated circuit with temperature measuring and control circuitry performs temperature measurement and control functions and can be used to create an on-chip temperature log.Type: ApplicationFiled: July 9, 2007Publication date: November 1, 2007Applicant: ACTEL CORPORATIONInventors: Rabindranath Balasubramanian, Limin Zhu, Gregory Bakker
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Publication number: 20070252617Abstract: An embodiment of this invention pertains to a versatile and flexible logic element and logic array block (“LAB”). Each logic element includes a programmable combinational logic function block such as a lookup table (“LUT”) and a flip-flop. Within the logic element, multiplexers are provided to allow the flip-flop and the LUT to be programmably connected such that either the output of the LUT may be connected to the input of the flip-flop or the output of the flip-flop may be connected to the input of the LUT. An additional multiplexer allows the output of the flip-flop in one logic element to be connected to the input of a flip-flop in a different logic element within the same LAB. Output multiplexers selects between the output of the LUT and the output of the flip-flop to generate signals that drive routing lines within the LAB and to routing lines external to the LAB.Type: ApplicationFiled: May 2, 2007Publication date: November 1, 2007Inventors: David Lewis, Paul Leventis, Andy Lee, Henry Kim, Bruce Pedersen, Chris Wysocki, Christopher Lane, ALexander Marquardt, Vikram Santurkar, Vaughn Betz
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Publication number: 20070252618Abstract: A signal converter circuit including an input circuit and an output circuit. The input circuit is configured to receive current mode logic signals and provide differential input signals based on the current mode logic signals. The output circuit is configured to receive the differential input signals and provide rail-to-rail output signals based on the differential input signals. The output circuit is configured to switch the rail-to-rail output signals in response to a common edge type in each of the differential input signals.Type: ApplicationFiled: April 28, 2006Publication date: November 1, 2007Inventors: Karthik Gopalakrishnan, Otto Schumacher, Luca Ravezzi, Andreas Blum, Hamid Partovi
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Publication number: 20070252619Abstract: A differential current-mode driver that meets the IEEE 1394 standard employs a wide output range in common-mode voltage, minimizes timing skew over this wide range, and has well-controlled rise/fall times in the edge rates of the digital signals transmitted, within the window specified by the IEEE 1394 standard, without having to resort to full-swing (VDD to VSS) gate drive signals. In a preferred embodiment PMOS and NPOS transistors are used to provide current for a current driver, in the form of a current steering switch switching a pair of current mirrors. The current mirrors output is input to a predriver waveform circuit which divides current between a data source A and data source B, forming the differential signal pair. Certain key transistors in the current driver are kept in saturation to improve performance.Type: ApplicationFiled: April 28, 2006Publication date: November 1, 2007Inventor: Rick Bitting
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Publication number: 20070252620Abstract: A phase-frequency detector (110) is provided. The phase-frequency detector can include a frequency counter delay (147) for counting cycles of an output signal to generate a divided variable frequency delayed signal (FVd 146) having a time shift. A control stage (200) coupled to the output stage generates a pump up control signal (222) and a pump down control signal (234) in response to receiving the FVd signal, a divided variable frequency signal (FV 136), and a reference frequency signal (FR 106). The time shift provides an overlap region that allows both source (350) and sink (360) currents to be provided in phase lock. In phase lock, the duration of the pump up control signal approximates the duration of the pump down control signal within a linear region of operation.Type: ApplicationFiled: April 28, 2006Publication date: November 1, 2007Applicant: MOTOROLA, INC.Inventors: Paul Gailus, Joseph Charaska
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Publication number: 20070252621Abstract: An integrated circuit comparator comprises a differential amplifier, a source follower circuit coupled to a gate terminal of a first transistor in the differential amplifier, and an output circuit. One or more source follower circuits may be utilized in connection with the differential amplifier, and one or more source follower circuits may be utilized in connection with the output circuit.Type: ApplicationFiled: May 23, 2007Publication date: November 1, 2007Inventor: Leonard Forbes
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Publication number: 20070252622Abstract: A feedback system is used to set the level of a reference voltage used to recover data signals in pseudo-differential signaling. A repetitive data signal is transmitted and received in two comparators, one generating a detected data signal and the other generating a complement of the detected data signal. These two detected data signals are used with two charge pumps that generate analog signals proportional to the duty cycle of the detected data signals. The two analog signals are compared in a differential comparator generating a digital signal indicating when the logic one duty cycle of the detected data signal is greater or less than 50%. The digital signal is used to program a reference voltage generator that sets the level of the reference voltage to keep the duty cycle at an average of 50% to optimize signal detection. The reference voltage is distributed to optimize data signal detection.Type: ApplicationFiled: April 13, 2006Publication date: November 1, 2007Inventors: Hector Saenz, Bao Truong, Samuel Ward
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Publication number: 20070252623Abstract: A method and system are provided for maintaining a virtual ground node of an SRAM memory array at a minimum level sufficient for maintaining data retention. A circuit can maintain the virtual ground node at a virtual ground reference voltage of Vdd?(1.5*Vth), or maintain 1.5*Vth across the memory cells, where Vth is a threshold voltage of an SRAM memory cell transistor and VDD is a positive supply voltage. By tracking the Vth of the memory cell transistors in the SRAM array, the circuit reduces leakage current while maintaining data integrity. A threshold voltage reference circuit can include one or more memory cell transistors (in parallel), or a specially wired memory cell to track the memory cell transistor threshold voltage. The value of the virtual ground reference voltage can be based on a ratio of feedback chain elements in a multiplier circuit.Type: ApplicationFiled: April 27, 2007Publication date: November 1, 2007Applicant: MOSAID TECHNOLOGIES CORPORATIONInventors: Michael Zampaglione, Michael Tooher
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Publication number: 20070252624Abstract: An output driver and an I/O apparatus including the output driver are disclosed. The output driver includes a driving unit having a first type transistor and a second type transistor connected in series, the driving unit amplifying an input signal applied to the gates of the first type transistor and the second type transistor and outputting the amplified signal to a node between the series connected first type transistor and second type transistor, a first source peaking unit connected between the first type transistor and a first voltage source and having a first impedance that varies in accordance with the frequency of the input signal, and a second source peaking unit connected between the second type transistor and a second voltage source and having a second impedance that varies in accordance with the frequency of the input signal.Type: ApplicationFiled: April 10, 2007Publication date: November 1, 2007Inventor: Young-soo Sohn
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Publication number: 20070252625Abstract: A controller and method changing a frequency of a control (or carrier) signal in accordance with a waveform that periodically changes within a first frequency range from a frequency fc1 to a frequency fc2, where the frequency fc1 is smaller than the frequency fc2, and a second frequency range from a frequency fc3 to a frequency fc4, where the frequency fc3 is smaller than the frequency fc4. The frequencies fc1 and fc4 satisfy the inequalities (n?1)·fc4?n·fc2 and n·fc3?(n+1)·fc1 and/or satisfy an approximate expression n·fc4?(n+1)·fc1 where n is an integer. The frequencies fc2 and fc3 satisfy the inequalities n·fc2?fs??fs and fs+?fs?n·fc3 where fs±?fs represents a predetermined frequency band.Type: ApplicationFiled: April 25, 2007Publication date: November 1, 2007Applicant: Nissan Motor Co., LtdInventors: Kentarou Shin, Yasuaki Hayami, Kraisorn Throngnumchai
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Publication number: 20070252626Abstract: A method and system is disclosed for creating a timing delay for power-on reset. A state machine is formed with three states. It resets a counter value to a predetermined number in an initial state, and increments the counter value for a predetermined number of reset cycles in a reset state until the counter value reaches a predetermined value for creating the time delay, and ends the reset state in a finish state if the counter reaches the predetermined value and if a randomly generated value matches a predetermined signature, wherein if in the reset state the randomly generated value does not match the signature or if in the finish state either the counter value does not reach the predetermined value or the randomly generated value does not match the signature, the initial state starts and subsequently enters the reset state after resetting the counter value.Type: ApplicationFiled: May 1, 2006Publication date: November 1, 2007Inventor: Chun-Yen Chou