Including Spectrometer Or Spectrophotometer Patents (Class 250/339.07)
  • Patent number: 6400787
    Abstract: Described are a process and an apparatus for the remote measurement of uranium or plutonium in radioactive materials. in which the sample of the material to be analyzed is to be handled as little as possible. To attain that object it is proposed that the laser beam of a laser is focussed by means of a focussing unit onto the sample to be analyzed, so that a light-emitting plasma is generated, an image of the emission spectrum of the plasma is formed in a spectrograph by means of an imaging unit, and finally it is analyzed by means of an analyzing unit.
    Type: Grant
    Filed: May 21, 2001
    Date of Patent: June 4, 2002
    Assignee: Euratom
    Inventors: Kay Niemax, Lars Hiddemann, Lothar Koch, Jean-Francois Babelot
  • Patent number: 6391354
    Abstract: An apparatus of the present invention for selecting and separating out sprouted kernel comprises: a light source for emitting light in a predetermined wavelength region to an object kernel; an image-capturing device for capturing an image of the object kernel which is formed by a part of the emitted light, which part is transmitted through the object kernel, and generating a signal corresponding to the captured image of the object kernel; a comparator for comparing the signal corresponding to the captured image with a predetermined reference signal, to thereby determine whether or not the object kernel is sprouted, and generating a signal indicative of detection of sprouting when the object kernel is sprouted; and a separating device for separating out the object kernel when the object kernel is sprouted, in response to the signal generated by the comparator. Below the object kernel, there is provided a background member having a brightness close to that of the object kernel.
    Type: Grant
    Filed: November 28, 2001
    Date of Patent: May 21, 2002
    Assignee: Anzai Universal Laboratory Co., Ltd.
    Inventors: Akira Shibayama, Tomoko Koshiro
  • Patent number: 6350988
    Abstract: An optical spectrometer for combustion flame temperature determination includes at least two photodetectors positioned for receiving light from a combustion flame and having different overlapping optical bandwidths for producing respective output signals; and a computer for obtaining a difference between a first respective output signal of a first one of the at least two photodetectors with and a second respective output signal of a second one of the at least two photodetectors, dividing the difference by one of the first and second respective output signals to obtain a normalized output signal, and using the normalized output signal to determine the combustion flame temperature.
    Type: Grant
    Filed: May 1, 2000
    Date of Patent: February 26, 2002
    Assignee: General Electric Company
    Inventor: Dale Marius Brown
  • Patent number: 6344647
    Abstract: A miniaturized photoacoustic spectrometer made from a series of stacked substrates. An infrared source is formed in a first substrate. A filter is formed in a second substrate. A micro-trough is machined in a third substrate and a microphone is formed in a fourth substrate. A fifth substrate has a metallic deposit for reflecting light emitted by the infrared source. Resin sealing is provided between the substrates.
    Type: Grant
    Filed: May 17, 1999
    Date of Patent: February 5, 2002
    Assignee: Commissariat a l' Energie Atomique
    Inventors: Anne Jourdain, Claude Bieth, Hubert Bono, Olivier Constantin
  • Publication number: 20020001078
    Abstract: An optical measuring arrangement, particularly for quality control in continuous material flow processes, comprising a measuring head which is arranged immediately adjacent to a measurement object, a measurement light source which is held at the measuring head for illuminating a measurement spot on the measurement object, a measurement light reception device, at least one spectrometer which is optically coupled with the measurement light reception device via a light-conducting device, wherein the spectrometer and the light-conducting device are received in the measuring head, and a signal processing device which is likewise received in the measuring head. This results in a compact arrangement for reflection measurement which is easy to assemble and which, beyond this, supplies very accurate measurement results. Further, a measuring arrangement operating on the principle of spectroscopy is suggested for transmission measurement.
    Type: Application
    Filed: March 1, 2001
    Publication date: January 3, 2002
    Inventors: Juergen Gobel, Werner Hoyme, Martin Goetz, Wilhelm Schebesta
  • Patent number: 6335527
    Abstract: Device for monitoring the quality of latex in a reactor during emulsion polymerization, including essentially a measuring probe placed in the reactor, an optical coupling of the said probe with a near-infrared spectrophotometer provided with means for emitting light and for capturing the scattered light which is reflected and a computer which has the correlation equations in its memory.
    Type: Grant
    Filed: January 13, 1999
    Date of Patent: January 1, 2002
    Assignee: Solvay S.A. (Société Anonyme)
    Inventors: Claude Josephy, Pol Breyer
  • Publication number: 20010056237
    Abstract: Apparatus for monitoring the presence of one or more chromophores in a tissue sample, comprises a light source for projecting light to illuminate an area of such tissue sample, a photo-receptor for receiving light remitted by the illuminated area of tissue, and spectroscopic analyser means for monitoring the remitted light, a comparator having means for comparing variations in the intensity and spectral characteristics of the remitted light with respect to the intensity and spectral characteristics of the projected light at different wavelengths and with a record of the intensity and spectral characteristics of light remitted by a reference sample of such tissue and means for emitting a control signal in response to any such variations. Methods of analyzing tissue histology, especially skin histology, are discussed, and a mathematical model is proposed for the analysis and comparison of the remitted light with a reference sample.
    Type: Application
    Filed: January 12, 2001
    Publication date: December 27, 2001
    Inventors: Michael Roger Cane, Michael Andrew Beadman, Symon D?apos;Oyly Cotton
  • Publication number: 20010050339
    Abstract: An on-the-go sensor for determining the sugar content of an agricultural product, such as a sugar beet, during harvesting or at other times. The sensor is coupled to a harvester/defoliator and uses a knife to slice a cross-section from the crown of the sugar beet during harvesting. An illumination chamber radiates the exposed crown, and a sensor head receives the reflected radiation. A spectrometer converts the reflected radiation to a spectral signal. A computer digitizes and processes the spectral signal to produce data points relating to the sugar content of the sugar beet. The processing of the data points includes normalization, linearization, and other techniques. One of the techniques eliminates the conventional need to use the spectral signature of a separate physical standard as a reference.
    Type: Application
    Filed: January 12, 2001
    Publication date: December 13, 2001
    Inventors: Suranjan Panigrahi, Vernon Hofman
  • Patent number: 6320190
    Abstract: A shield for a detector or prism of a particle detection system has a body mountable on the detector or prism, divided into first and second compartments by an intermediate wall with a hole therethrough. Air diffuser units In the first compartment (adjacent the detector or prism) generate a stable column of air which prevents the particles contacting the beam window of the detector or prism.
    Type: Grant
    Filed: May 14, 1999
    Date of Patent: November 20, 2001
    Inventor: Trevor Richard Voevodin
  • Patent number: 6310347
    Abstract: An optical spectrometer system has a central axis, a detector having a detector surface disposed at one end of the system and located at a focal plane of the optical spectrometer system. A cold stop is associated with the detector for permitting entrance of target source radiation onto the detector surface while blocking background radiation from surroundings. A cooling device is coupled to the detector for cooling it and the cold stop to a predetermined low temperature. A flat plate is provided and has an spectrometer slit formed in it, the plate having a flat surface facing the detector, the flat surface being coated with a highly reflective, low emissivity material. Fore-optic focusing lenses or mirrors are located in front of the flat plate for focusing radiation onto the slit on the flat plate between the fore-optic focusing and the collimating lenses. The collimating lenses between the flat plate and the cold stop collimate the light from the slit and form a pupil at the cold stop.
    Type: Grant
    Filed: June 29, 1999
    Date of Patent: October 30, 2001
    Assignee: Goodrich Corporation
    Inventors: Ker-Li Shu, Peter R. Silverglate
  • Publication number: 20010030288
    Abstract: An apparatus for analyzing a spectrum includes an elongated source of light, a device for producing a spectrum of the light, a sample stage, and an array of photosensitive elements for detecting the spectrum and providing an output representative of an intensity of the spectrum as a function of wavelength. The sample stage is interposed between the elongated source and the spectrum-producing device. The light propagates along a length of the sample stage from the elongated source to the spectrum-producing device. The elongated source has a length greater than or equal to a length of the array.
    Type: Application
    Filed: February 22, 2001
    Publication date: October 18, 2001
    Applicant: Wilks Enterprise, Inc.
    Inventors: Paul A. Wilks, Kenneth R. Mateer
  • Patent number: 6295859
    Abstract: An improved OBS based technique that monitors gas emissions from smoke stacks, tail pipes, and other sources, and that separates gas column density from thermal radiance contrast. The technique of the present invention utilizes a software generated digital filter (30) constructed to correlate with only the spectrum of gas (12) of interest, and have zero correlation with background components (22). Through using the improved OBS technique of the present invention, high performance and more positive cost effective gas monitoring systems and sensors may be built and implemented.
    Type: Grant
    Filed: September 7, 1999
    Date of Patent: October 2, 2001
    Assignee: The B. F. Goodrich Co.
    Inventors: Andreas F. Hayden, Robert J. Noll
  • Patent number: 6275292
    Abstract: Disclosed is a process for analyzing the surface characteristics of opaque materials. The method comprises in one embodiment the use of a UV reflectometer to build a calibration matrix of data from a set of control samples and correlating a desired surface characteristic such as roughness or surface area to the set of reflectances of the control samples. The UV reflectometer is then used to measure the reflectances of a test sample of unknown surface characteristics. Reflectances are taken at a variety of angles of reflection for a variety of wavelengths, preferably between about 250 nanometers to about 400 nanometers. These reflectances are then compared against the reflectances of the calibration matrix in order to correlate the closest data in the calibration matrix. By so doing, a variety of information is thereby concluded, due to the broad spectrum of wavelengths and angles of reflection used.
    Type: Grant
    Filed: March 2, 2000
    Date of Patent: August 14, 2001
    Assignee: Micron Technology, Inc.
    Inventors: Randhir P. S. Thakur, Michael Nuttall, J. Brett Rolfson, Robert James Burke
  • Patent number: 6271521
    Abstract: For optical determination of ingredients of a pourable product by NIR spectroscopy, to attain replicable measurement results, the device provides that the product flows in the direction of gravity; that a valve is disposed in the conduit downstream of the measurement window and a controller is embodied to move the valve to its closed position at least for the duration of measurement. The method is distinguished in that the product flows in the direction of gravity pas a measurement site; is dammed up downstream of the measurement site in such a way that the flow comes to rest at the measurement site; is dammed up in the direction of gravity past a measurement site; is dammed up downstream of the measurement site in such a way that the flow comes to rest at the measurement site; and after the measurement, the product is removed from the stagnant segment.
    Type: Grant
    Filed: November 24, 1998
    Date of Patent: August 7, 2001
    Assignee: Bran + Luebbe GmbH
    Inventors: Joerg Saathoff, Eckhard Nehring, Hartmut Hoyer
  • Patent number: 6259757
    Abstract: Described are a process and an apparatus for the remote measurement of uranium or plutonium in radioactive materials, in which the sample of the material to be analyzed is to be handled as little as possible. To attain that object it is proposed that the laser beam of a laser is focussed by means of a focussing unit onto the sample to be analyzed, so that a light-emitting plasma is generated, an image of the emission spectrum of the plasma is formed in a spectrograph by means of an imaging unit, and finally it is analyzed by means of an analyzing unit.
    Type: Grant
    Filed: July 6, 1998
    Date of Patent: July 10, 2001
    Assignee: Euratom
    Inventors: Kay Niemax, Lars Hiddemann, Lothar Koch, Jean-Francois Babelot
  • Patent number: 6252230
    Abstract: The refraction type non-destruction measuring apparatus of the present invention has a prism having a predetermined refractive index, projecting means for projecting near infrared light onto an object to be examined through the prism, a contact material filling the space between the object to be examined and the prism and having a refractive index set in conformity with the characteristic of the object to be examined, and light receiving means for receiving the internal reflected light of the light having entered the interior of the object to be examined through the contact material and the prism.
    Type: Grant
    Filed: October 28, 1998
    Date of Patent: June 26, 2001
    Assignee: Mitsui Mining & Smelting Co., Ltd.
    Inventors: Mikio Kimura, Akihiko Fujita
  • Patent number: 6222187
    Abstract: A multiwavelength imaging and spectroscopic photoemission microscope system (100) which simultaneously provides images in a broad range of the electromagnetic spectrum, such as between 200 nm-1000 nm (optical or visible light) and 1000 nm-500 nm (infrared light). The multiwavelength imaging and spectroscopic photoemission microscope system comprises a microscope (102), a spectrometer (106), a beam splitter (108), a first spectrum focal plane array (110) including an appropriate photodiode (114A), a second spectrum focal plane array (120) including an appropriate photodiode (114B), and a cryogenic vessel (160) to maintain relevant portions of the system at a very low temperature. The invention may be used in failure analysis of integrated circuits and in semiconductor and low temperature physics.
    Type: Grant
    Filed: July 2, 1998
    Date of Patent: April 24, 2001
    Assignee: Institute of Microelectronics
    Inventor: Kandiah Shivanandan
  • Patent number: 6208420
    Abstract: A method and an apparatus are provided for estimating a quality of grains to be harvested from a grain plant in the future, during a growth period prior to the harvesting. The method comprises the step for establishing a quality conversion coefficient for estimating a specific quality of grains after the harvesting based on absorbencies relating to the specific quality of the grains obtained by irradiating light having predetermined wavelength regions on a leaf of a grain plant in growth at a predetermined time during the growth period of the grain plant and the specific quality obtained from the same grains after the harvesting, and the step for estimating the quality of the grains to be harvested in the future based on said quality conversion coefficient and absorbencies relating to said specific quality obtained from a leaf of the grain plant presently growing at the predetermined time.
    Type: Grant
    Filed: February 9, 2000
    Date of Patent: March 27, 2001
    Assignee: Satake Corporation
    Inventors: Satoru Satake, Yukio Hosaka, Hideharu Maruyama, Nobuhiko Nakamura, Nobuharu Yagishita
  • Patent number: 6188705
    Abstract: Fiber Bragg grating coupled light sources can achieve tunable single-frequency (single axial and lateral spatial mode) operation by correcting for a quadratic phase variation in the lateral dimension using an aperture stop. The output of a quasi-monochromatic light source such as a Fabry Perot laser diode is astigmatic. As a consequence of the astigmatism, coupling geometries that accommodate the transverse numerical aperture of the laser are defocused in the lateral dimension, even for apsherical optics. The mismatch produces the quadratic phase variation in the feedback along the lateral axis at the facet of the laser that excites lateral modes of higher order than the TM00. Because the instability entails excitation of higher order lateral submodes, single frequency operation also is accomplished by using fiber Bragg gratings whose bandwidth is narrower than the submode spacing. This technique is particularly pertinent to the use of lensed fiber gratings in lieu of discrete coupling optics.
    Type: Grant
    Filed: May 15, 1998
    Date of Patent: February 13, 2001
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Michael A. Krainak, Gary L. Duerksen
  • Patent number: 6184528
    Abstract: In accordance with the present invention, there is provided a spectral nondestructive method for evaluating substrate surface characteristics of a sample substrate. The sample substrate has a sample substrate surface and a generally visually nontransmissive sample coating disposed on the sample substrate surface. The sample coating is transmissive within a first infrared spectral wavelength range and the sample substrate is reflective within the first infrared spectral wavelength range. The method begins with directing infrared radiation from an infrared radiation source towards the coated sample substrate. Specular and diffuse infrared radiation reflected from the coated sample substrate is collected. The reflected radiation is measured as a function of wavelength in the first infrared spectral wavelength range to obtain measured reflectance data representative of the reflectance of the coated sample substrate.
    Type: Grant
    Filed: August 27, 1998
    Date of Patent: February 6, 2001
    Assignee: Vought Aircraft Industries, Inc.
    Inventors: Don DiMarzio, Louis Gregory Casagrande, James A. Clarke, Robert P. Silberstein