Methods Patents (Class 250/340)
- Including probe (Class 250/341.2)
- Including polarizing means (Class 250/341.3)
- With semiconductor sample (Class 250/341.4)
- With calibration (Class 250/341.5)
- Heating of object or material (Class 250/341.6)
- With multiple sources (Class 250/341.7)
- Measuring infrared radiation reflected from sample (Class 250/341.8)