With Wiring Channel Area Patents (Class 257/210)
  • Patent number: 5291043
    Abstract: A gate array semiconductor integrated circuit device allowing less clock skews is disclosed. The device includes a clock signal driver formed in the part under a power supply interconnection for input-output buffer in a power supply pin region or a ground pin region. The clock signal driver is formed in the power supply pin region and so on which, conventionally, was not utilized, so that the clock signal driver can be large enough to provide a clock signal to each basic cell column. Therefore, the input-output buffer region is not unduly occupied by the clock signal driver, and the connecting pads do not become useless.
    Type: Grant
    Filed: May 4, 1992
    Date of Patent: March 1, 1994
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventor: Takahiko Arakawa
  • Patent number: 5289021
    Abstract: A highly efficient CMOS cell structure for use in a metal mask programmable gate array, such as a sea-of-gates type gate array, is disclosed herein. In a basic cell, in accordance with one embodiment of the invention, three or more sizes of N-channel transistors and three or more sizes of P-channel transistors are used. The larger size transistors are incorporated in a drive section of a cell, while the smaller size transistors are incorporated in each compute section of a cell. The particular transistors in the compute and drive sections and the arrangements of the compute and drive sections provide a highly efficient use of silicon real estate while enabling the formation of a wide variety of macrocells to be formed.
    Type: Grant
    Filed: June 18, 1991
    Date of Patent: February 22, 1994
    Assignee: SiArc
    Inventor: Abbas El Gamal
  • Patent number: 5264390
    Abstract: A method of automatic wiring in a semiconductor integrated circuit device having four or more wiring layers, with the lowest layer being a terminal layer, is intended to overcome the prior art problem in which lower layers are mostly used for wiring and upper layers are not used efficiently. The method is designed to assign longer lines to upper layers distant from the terminal layer, and upper layers can have increased wiring densities with minimal numbers of lines, bends and through holes, thereby using upper layers efficiently.
    Type: Grant
    Filed: September 26, 1991
    Date of Patent: November 23, 1993
    Assignee: Hitachi, Ltd.
    Inventors: Hachidai Nagase, Tatsuki Ishii, Katsuyoshi Suzuki
  • Patent number: 5206529
    Abstract: A semiconductor integrated circuit device wherein a plurality of macros are formed on a master chip and wirings are provided striding across a specific macro and thereon through a thick insulating film, whereby parasitic capacitance is reduced and high speed operation of a circuit is attained.
    Type: Grant
    Filed: April 28, 1992
    Date of Patent: April 27, 1993
    Assignee: NEC Corporation
    Inventor: Hirotoshi Mine
  • Patent number: 5187555
    Abstract: Transistor elements which are not initially wired are previously arranged in no-cell regions created in part of cell array regions in a standard cell layout according to the layout design. When the circuit is changed in the standard cell layout, a desired circuit is formed in the no-cell region by using the transistor elements which are not initially wired. After the circuit change, an unnecessary circuit is made inoperative. Wiring inhibition regions for inhibiting the normal wiring in the standard cell layout are provided in order to extend the input and output terminals of the desired circuit from the no-cell region to the wiring region.
    Type: Grant
    Filed: September 26, 1991
    Date of Patent: February 16, 1993
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Tadahiro Kuroda, Hiroaki Suzuki
  • Patent number: 5172210
    Abstract: A gate array chip (33) has an array (41) of strip-shaped active areas (18) formed on a semiconductor substrate (40). Wiring-dedicated areas (34), each having capacity for two to four wires, are provided between respective adjacent pairs of the active areas (18). In a logic circuit region, one or more active areas (18) are employed as wiring areas. In memory blocks, wiring is performed by employing only the wiring-dedicated areas (34). A master slice integrated circuit manufactured from the gate array chip (33) has a high degree of integration and high operating speed.
    Type: Grant
    Filed: April 26, 1991
    Date of Patent: December 15, 1992
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventor: Ryou Yonezu
  • Patent number: 5168342
    Abstract: In a semiconductor integrated circuit device adopting a master slice system, a plurality of lattice points of an X-Y lattice-shaped channel region set by an automatic arrangement and routing system correspond to one input/output terminal of a prescribed basic cell (or logic circuit), thereby a plurality of signal wirings can be connected to the one input/output terminal.
    Type: Grant
    Filed: May 23, 1991
    Date of Patent: December 1, 1992
    Assignee: Hitachi, Ltd.
    Inventor: Manabu Shibata
  • Patent number: 5160995
    Abstract: A plurality of cells providing constituent elements for a semiconductor integrated circuit are provided in and on a major surface of a semiconductor substrate of a semiconductor integrated circuit chip. A plurality of wires are each provided between a cell and a cell to provide cell-to-cell wires. A plurality of dummy wires are connected to an internal power source terminal of a second power source potential which is different from a first power source terminal. A capacitance is created between the dummy wire and the semiconductor substrate to prevent a voltage fluctuation at the power source. The dummy wires are selectively cut off the internal power source terminal of the second potential to correct a wrong connection line or a signal delay time.
    Type: Grant
    Filed: July 25, 1991
    Date of Patent: November 3, 1992
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Satoshi Wada, Shinichi Wakabayashi, Masayo Fukuda