Electrical Connectors Patents (Class 324/538)
  • Patent number: 5512833
    Abstract: A connector checking apparatus includes a connector checking device having a main body operable by a lever to move toward a connector. The connector checking device also has a connector support. Detection pins are slideably disposed within the main body and are connected to checking terminals. The detection pins have a conductive contact face and detection fingers on a detection piece. Upon insertion of the detection pins into the connector, complete insertion of the terminals within the terminal receiving cavities of the connector permits contact between the conductive face and an end of the terminal C. The connector has cantilever resilient supporting pieces which include a locking projection 14a. The device can detect whether or not the connector checking device A is completely engaged with the connector.
    Type: Grant
    Filed: August 23, 1994
    Date of Patent: April 30, 1996
    Assignee: Yazaki Corporation
    Inventors: Masaru Fukuda, Eiji Fukuda
  • Patent number: 5504432
    Abstract: An automatic circuit board tester for testing for shorts, opens, and interconnected pins or nodes on a circuit board. The tester first classifies the nodes as being in one of three categories based upon the design of the board and the intended interconnection of the nodes. The categories of nodes are: (1) connected to ground; (2) interconnected to all other nodes in the test group; or (3) isolated from all other nodes. The circuit board tester has a testhead containing a plurality of test channels, each configured to be coupled to a node on the circuit board. The testhead utilizes a digital signal from a digital driver to drive the node at a predetermined voltage and a digital receiver to read the node voltage to determine if it is coupled to ground. Each test channel also includes a switch to connect the digital driver and receiver to the test node as well as a ground switch to selectively couple the node to ground.
    Type: Grant
    Filed: August 31, 1993
    Date of Patent: April 2, 1996
    Assignee: Hewlett-Packard Company
    Inventors: Kevin G. Chandler, Barry A. Alcorn, Bryan D. Boswell, John M. Heumann, Ed O. Schlotzhauer
  • Patent number: 5498966
    Abstract: An inspection device comprises a body having a connector insertion opening for inserting a connector into the device. The body holds a continuity inspector for inspecting the continuity of the terminals in contact relation therewith when the connector is inserted into the connector insertion opening. An arm member is supported by the body in turn free state. The arm member comprises an engaging portion for engaging and holding the connector inserted into the connector insertion opening. The inspection device further comprises a spring for forcing the arm member in the direction to engage the engaging portion with the connector and a solenoid for moving the arm member against the spring force of the spring in the direction to release the engagement of the engaging portion with the connector.
    Type: Grant
    Filed: April 6, 1993
    Date of Patent: March 12, 1996
    Assignee: Yazaki Corporation
    Inventor: Yoshikazu Yamamoto
  • Patent number: 5497097
    Abstract: An apparatus for detecting a connection between adjacent vertical panels having a first contact element positioned adjacent a bottom of one of the panels, a second contact element positioned adjacent a bottom of an adjacent panel, a first conductive line extending from the first contact element, a second conductive line extending from the second contact element, an electrical source for passing a current to at least one of the first and second conductive lines, and a detector connected to one of the first and second conductive lines for ascertaining the existence of a connection between the first contact element and the second contact element. The second contact element is positioned in proximity to the first contact element when the panels are connected together. The first contact element is affixed to a connector member of the panel. The second contact element is affixed in a channel of an adjacent panel. The connector member is a T-shaped member.
    Type: Grant
    Filed: May 2, 1994
    Date of Patent: March 5, 1996
    Assignee: GSE Lining Technology, Inc.
    Inventors: Walter W. Walling, Patrick T. Brunette
  • Patent number: 5491424
    Abstract: A test fixture is provided for testing the resistance associated with contamination material on the surface of electrical contacts mounted to a printed circuit board. A probe used to engage the contacts consists of first and second conductive probe segments which form a sandwich about a layer of insulating material. A current source provides a constant alternating current which is applied across the first and second probe segments. Circuitry is provided for amplifying the alternating current voltage developed across the first and second probe segments in response to the constant current. Circuitry is provided for rectifying the amplified alternating current voltage to provide a direct current voltage which is proportional to the measured resistance of the contact engaged by the probe. Data corresponding to the bulk and contact resistance associated with the clean contact is stored in memory of a computer.
    Type: Grant
    Filed: August 12, 1994
    Date of Patent: February 13, 1996
    Assignee: AT&T Corp.
    Inventors: Madhu P. Asar, Harry L. Maddox
  • Patent number: 5486766
    Abstract: A testing method for connecting a first group of input conductors to output conductors in which the number of switching devices connected to each output conductor at connections with the group of input conductors are summed individually, the output conductor having the least number of switching devices at these intersections is chosen, and the switching devices are summed for each of the group of input conductors having a switching device at an intersection with the chosen output conductor and the input conductor having the least number of switching devices is selected. A switching device at the intersection of this first selected input conductor and the first selected output conductor is chosen for closure to provide the first connection in the output combination desired. The process is repeated until all of the connections are chosen or one fails.
    Type: Grant
    Filed: May 20, 1994
    Date of Patent: January 23, 1996
    Assignee: Intel Corporation
    Inventors: Gregory B. Hibdon, John M. Ingram
  • Patent number: 5481204
    Abstract: A connector terminal checking device includes a base, a conduction checking part rotatably supported by the base to check the conductive condition of a connector to be checked, an abutting part attached to the base to come into contact with a rear end of the connector mounted on the conduction checking part arranged in a conduction check position, a compression spring for urging the conduction checking part against a stand-by position and a solenoid for holding the conduction checking part in the conduction check position when checking the connector. In an initial state of the device, the solenoid is not energized, so that the conduction checking part is moved in the stand-by position by the compression spring. After the connector is inserted into the conduction checking part, it is pressed to the conduction check position by an operator. During checking, the solenoid is energized to maintain the conduction checking part in the conduction checking position.
    Type: Grant
    Filed: August 22, 1994
    Date of Patent: January 2, 1996
    Assignee: Yazaki Corporation
    Inventor: Jiro Aikawa
  • Patent number: 5457441
    Abstract: An inductive amplifier for identifying and tracing wires is provided with a pair of threaded post terminals for being engaged by the electrical clips of a jumper wire or telecommunications butt set. The inductive amplifier includes a built-in speaker and a depressible power switch for applying power from a battery to a tone amplifier. A switching transistor couples the battery to the tone amplifier whenever a low impedance path is formed between the pair of threaded post terminals, even if the power switch is not depressed. The built-in speaker is connected in series with the threaded post terminals and is a.c. coupled to the tone amplifier for sounding the tone through either the built-in speaker or through a butt set engaged with the threaded post terminals. The impedance of the built-in speaker is selected to be less than that of the butt set for silencing the built-in speaker when the butt set is connected.
    Type: Grant
    Filed: June 4, 1993
    Date of Patent: October 10, 1995
    Assignee: Progressive Electronics, Inc.
    Inventor: Douglas S. Clement
  • Patent number: 5455515
    Abstract: A connector inspecting device that positively determines whether a metal terminal has been correctly inserted into the housing of the connector includes a slider provided in a checker housing in such a manner that it is movable and urged toward a connector by a compression spring. The slider includes a lance check pin protruded toward the connector and an electrical contactor that is integral with the lance check pin. When the connector is at a "normal position," the lance check pin goes in a lance bending space provided for a lance, so that the electrical contactor is electrically connected to the metal terminal. In the case where the metal terminal is set at a "half insertion position," the lance check pin abuts against the lance, which prevents the contact of the electrical contactor with the metal terminal.
    Type: Grant
    Filed: August 29, 1994
    Date of Patent: October 3, 1995
    Assignee: Sumitomo Wiring Systems, Ltd.
    Inventors: Eiji Saijo, Masahiko Aoyama, Keigo Atsumi
  • Patent number: 5451885
    Abstract: This disclosure describes an Interconnect Stress Testing (IST) system and a printed wiring board test coupon which is used with the IST system. The system includes a computer device and a cabinet which is used for mounting the test coupon as well as housing a number of the other components that make up the system. During a pre-cycling phase, the system determines the correct current that should be passed through the coupon in order to heat it to a predetermined temperature. After that test current value is determined the system actually stress tests the coupon by passing the determined test current through the coupon. It does so for a selected number of cycles, and monitors resistance changes in the coupon during testing while recording test data. This disclosure also describes the test coupon, which is designed to uniformly dissipate the heat created during stress cycling.
    Type: Grant
    Filed: January 17, 1995
    Date of Patent: September 19, 1995
    Assignee: Digital Equipment Corporation
    Inventors: Stephen M. Birch, Gerard M. Gavrel, Zaffar I. Memon
  • Patent number: 5440235
    Abstract: A plug for insulating electrical contacts of a male connector has a connector engaging portion for snugly coupling the plug to the connector and a head portion extending from the connector engaging portion. Bores extend axially through the connector engaging portion and only partially through the head portion, and snugly receive the contacts.
    Type: Grant
    Filed: March 3, 1994
    Date of Patent: August 8, 1995
    Assignee: Hubbell Incorporated
    Inventor: Frederick J. Oko
  • Patent number: 5432456
    Abstract: A pin protrusion test fixture includes an element having a void therethrough, structure for biasing the aforementioned element in a first direction to a first position, and structure for directing a pin toward that element so that the pin causes the element to move in a second direction to a second position. The test fixture also includes a light source and a light sensor disposed so that when the element is in the second position, light from the light source passes through the void through the element having a void therethrough and is then detected by the light sensor.
    Type: Grant
    Filed: November 24, 1993
    Date of Patent: July 11, 1995
    Assignee: Compaq Computer Corporation
    Inventor: Randall J. Kelley
  • Patent number: 5428294
    Abstract: A tester for individually testing diode packages, double pole relays and single pole relays includes a circuit contained within a housing, which circuit connects the diode package or relay being tested to a source of 12-volt direct current and transmits the direct current through the diode package, or relay, to an array of indicator lamps under the control of one normally open and two normally closed switches. A forward and reverse bias switch controls the direction of current through the diodes of the diode package and the internal diode of the relays to determine if the diodes and internal diode are oriented properly and conduct current properly.
    Type: Grant
    Filed: August 11, 1993
    Date of Patent: June 27, 1995
    Assignee: Chrysler Corporation
    Inventor: Curtis R. Teel, Jr.
  • Patent number: 5426372
    Abstract: In a capacitive-probe assembly used in an automatic circuit tester (10) to sense varying electric fields that result adjacent to integrated-circuit packages (32) during tests of circuit boards (16), a spacer comprising resilient cellular material has a double-sided printed-board attached to it that provides the probe plate (52) to which the device signals are capacitively coupled. The spacer (44) is in turn mounted on a chip-probe mounting surface (30) provided by the tester's fixture (14). The result is a robust fixture assembly that is easy to manufacture.
    Type: Grant
    Filed: July 30, 1993
    Date of Patent: June 20, 1995
    Assignee: GenRad, Inc.
    Inventor: Paul R. Freve
  • Patent number: 5424633
    Abstract: This application describes a method of testing for manufacturing faults and quality of unpopulated or inactive populated electronic printed circuit boards (PCB). This method can be used to develop a new contactless test system (CTS). An electromagnetic field is generated by an energizing plate connected to an AC signal. When a board under test (BUT) is placed within the electromagnetic field, perturbation of the original field by conducting elements on the BUT is solely a function of the geometrical layout of the conducting elements on the BUT. Therefore, measurement of the perturbed electromagnetic field produces a characteristic pattern for the BUT. Such a pattern can then be compared to a known pattern for the same type of board to determine whether the BUT is faulty (shorts or opens) or not faulty. The most distinctive feature of this method is that testing PCBs by this method requires no electrical contact with the BUT due to the use of the energizing plate.
    Type: Grant
    Filed: September 30, 1992
    Date of Patent: June 13, 1995
    Assignee: Advanced Test Technologies Inc.
    Inventor: Jacob Soiferman
  • Patent number: 5422630
    Abstract: A monitoring system is shown to include a connector, having an input path and a current return path, for connecting a two section wrist strap to said connector, said two section wrist strap, when affixed to an operator's wrist, would complete an electrical path between the input path and the current return path of the connector across the wrist skin surface. The monitoring system further includes a current source for providing an electrical current to the input path and a comparator for comparing a voltage at the input path to a high limit value and a low limit value and for providing an alarm signal whenever the voltage at the input path is not between the high limit value and the low limit value. With such an arrangement, an operator is ensured that a proper connection between the operator and ground is maintained thus significantly reducing the possibility of an electrostatic discharge harming an electronic component handled by the operator.
    Type: Grant
    Filed: September 6, 1994
    Date of Patent: June 6, 1995
    Assignee: Raytheon Company
    Inventors: James A. Quinn, George D. Deneault, Carl H. Bridge, John R. Dempsey
  • Patent number: 5400204
    Abstract: System For Detecting A Breakage Of A Power Cable For An Elevator System Which can accurately detect the breakage of at least one copper wire in the respective power cables present between the inverter of the elevator system and a linear motor moving element and which is difficult to visually inspect.
    Type: Grant
    Filed: October 25, 1993
    Date of Patent: March 21, 1995
    Assignee: Otis Elevator Company
    Inventors: Kenji Oshima, Manabu Suganuma
  • Patent number: 5387872
    Abstract: An apparatus for directly positioning a hand-held electrical test probe onto leads of a surface mounted integrated circuit, IC, device has a housing with a central bore therethrough for receiving the probing tip of the test probe, which is coupled to compensation circuitry in the probing head. One end of the housing which is normal to the central bore has at least four teeth extending therefrom defining slots for engaging the leads of the IC. The central bore is exposed in the central slot of the housing for exposing the probing tip therein for providing an electrical connection between one of the leads on the IC and the electrical circuitry of the probing head.
    Type: Grant
    Filed: July 2, 1993
    Date of Patent: February 7, 1995
    Assignee: Tektronix, Inc.
    Inventor: Mark W. Nightingale
  • Patent number: 5382907
    Abstract: The invention relates to a data input module for inputting data, by means of electrical contact, to a monitoring/control module, the module including a first voltage feed input (1) and a second voltage feed input (2), which inputs are intended to be subjected to a potential difference which is optionally variable, and a plurality of contacts (3) each of which has a first terminal (4) connected to the first input via a first resistor (14), and a second terminal (5) connected to the second input (2), each contact being designed to open or to close an electric current path between its terminals. The module further includes detection members (7) respectively associated with the contacts. Each detection member is organized to detect the presence or the absence of current flowing between the terminals of the contact with which the detection member is associated.
    Type: Grant
    Filed: March 25, 1993
    Date of Patent: January 17, 1995
    Assignee: Cegelac
    Inventors: Patrick Debussche, Thomas Fisch
  • Patent number: 5335413
    Abstract: A support for a connector to be inspected and an inspection device body are disposed to be freely movable with respect to a base, connector engaging pins which go into the connector to be inspected are fixed to the base side within the support, and a plurality of inspection pins are arranged in a row in the inspection device body with their respective leading ends projected. For inspection, the inspection pins are moved backward as contacted with the terminal fitting of the connector to be inspected to pass electricity through a circuit in the inspection device body and the connector engaging pins work to detect the terminal fitting in the incompletely inserted state and move the incompletely inserted terminal fitting into the completely inserted position as the connector is moved.
    Type: Grant
    Filed: July 27, 1993
    Date of Patent: August 9, 1994
    Assignee: Yazaki Corporation
    Inventors: Hiroshi Yamamoto, Hitoshi Sakai
  • Patent number: 5291142
    Abstract: A testing method and apparatus for conductive materials using electric current which makes it possible to rapidly evaluate the electromigration resistance of conductive materials. The apparatus includes a substrate support for supporting a substrate on which an interconnector pattern is formed, a cooling vessel for cooling the substrate, a first current supply for applying a first current to the interconnector, a resistance measurer for measuring the resistance of the interconnector pattern while the first electric current is being applied to the interconnector pattern, a second current supply for applying a second electric current larger than the first electric current to the interconnector pattern, and a controller which controls the repetition of the measurement of resistance of the interconnector pattern and the application of the second current to the interconnector pattern.
    Type: Grant
    Filed: May 8, 1992
    Date of Patent: March 1, 1994
    Inventor: Tadahiro Ohmi
  • Patent number: 5283605
    Abstract: A device for testing contacting and/or wiring of sockets connected to a circuit board includes a housing with oppositely arranged inner side walls. First guiding elements are connected to the inner side walls and are spaced at a certain grid distance from one another. At least one testing adaptor is connected to the housing for testing one of the sockets. The testing adaptor has a flat casing with a forward end and opposite longitudinal narrow sides. A testing head is connected to the forward end. The casing further has second guiding elements connected to the longitudinal narrow sides whereby the first and the second guiding elements are slidably connected such that the testing head is movable toward and attachable to the socket for establishing electrical contact. Between the first and the second guiding elements an intermediate member is inserted. The intermediate member has a third guiding element and a fourth guiding element oppositely oriented relative to one another.
    Type: Grant
    Filed: May 21, 1992
    Date of Patent: February 1, 1994
    Inventor: Helmut Lang-Dahlke
  • Patent number: 5275058
    Abstract: Provided is a method and apparatus for electrically detecting the location of bond failure and wire breakage occurring during tensile strength testing of a wire sample having first and second bond foots affixed to respective first and second support pads. The method and apparatus monitors the voltage levels of first and second electrically conductive probes. The first probe has a primary lead in electrical contact with the first support pad and a secondary lead in electrical contact with the first bond foot. Similarly, the second electrically conductive probe has a primary lead in electrical contact with the second support pad and a secondary lead in electrical contact with the second bond foot. Voltage detection circuitry is provided in electrical contact with the first and second probes for detecting the voltage level at each of the respective primary and secondary leads to generate the respective corresponding output signals.
    Type: Grant
    Filed: October 30, 1992
    Date of Patent: January 4, 1994
    Assignee: Ford Motor Company
    Inventors: Cuong V. Pham, Brian J. Hayden
  • Patent number: 5268644
    Abstract: An automotive electrical system including a wiring harness incorporates the dedicated test line passing through critical connectors and components for allowing detection and isolation of improperly connected connectors. The dedicated test line can feed through expansion connectors, termination connectors, and junction blocks. Connector fault detection and isolation is achieved using time-domain reflectometry after final assembly, during vehicle servicing, or on-board during vehicle usage. A large number of expensive and inconvenient vehicle quits and tow-in's are avoided that would otherwise occur.
    Type: Grant
    Filed: April 3, 1990
    Date of Patent: December 7, 1993
    Assignee: Ford Motor Company
    Inventors: David J. Klassen, Edward G. Anderson
  • Patent number: 5264796
    Abstract: An automotive electrical system including a wiring harness incorporates a dedicated test line passing through critical connectors and components for allowing detection and isolation of improperly connected connectors. The dedicated test line can feed through expansion connectors, termination connectors, and junction blocks. Connector fault detection and isolation can be performed as a test after final assembly and during vehicle servicing. A large number of expensive and inconvenient vehicle quits and tow-in's are avoided that would otherwise occur.
    Type: Grant
    Filed: April 3, 1990
    Date of Patent: November 23, 1993
    Assignee: Ford Motor Company
    Inventors: David J. Klassen, Edward G. Anderson
  • Patent number: 5254953
    Abstract: Disclosed is a system that determines whether input and output pins of semiconductor components are present and properly soldered to a printed circuit board. The system uses an oscillator which supplies a signal, typically ten kiloHertz (10 kHz) at 0.2 volts, to the pin under test. A conductive electrode is placed on top of the component package. The electrode is connected to a current measuring device. Another pin of the component is connected to the common signal return. Typically the other pin is chosen to be a power or ground pin of the component.
    Type: Grant
    Filed: June 3, 1992
    Date of Patent: October 19, 1993
    Assignee: Hewlett-Packard Company
    Inventors: David T. Crook, Kevin W. Keirn, Ugur Cilingiroglu
  • Patent number: 5241277
    Abstract: An automated test system for testing a filter pin connector (320) uses an insulation resistance tester (102) for testing the filter pin connector insulation resistance, a capacitance meter (104) for measuring the capacitance of each filter pin connector pin contact pair (10), a signal generator (100), and a radio frequency (RF) microvoltmeter for measuring the pin contact pair attenuation of test signals provided by the signal generator. A test fixture includes a pair of RF multiplexers (112, 113) and a high voltage multiplexer (115) for providing a signal path between each pin contact pair and the test equipment. A microprocessor (120) controls the test equipment and multiplexers for measuring the insulation resistance, capacitance, and signal attenuation of each pin contact pair.
    Type: Grant
    Filed: February 28, 1992
    Date of Patent: August 31, 1993
    Assignee: United Technologies Corporation
    Inventor: Nicholas D. Kefalas
  • Patent number: 5231357
    Abstract: An automatic harness testing apparatus test a multiconductor single connector wire harness for continuity faults in each conductive path of the wire harness by capacitively inducing an oscillatory test signal through the insulation of the conductors, probing each of the terminals of the connector and sequentially testing each probe for the presence of a test signal having a predetermined amplitude.
    Type: Grant
    Filed: May 9, 1990
    Date of Patent: July 27, 1993
    Assignee: Panduit Corp.
    Inventors: Roy A. Moody, William C. Kearns, Robert F. Levin, Thomas C. Pienkowski, David W. West
  • Patent number: 5221905
    Abstract: An improved test system includes means for generating a contact wetting pulse and applying the contact wetting pulse to a network such that contact resistance at the interfaces between probes of the test system and terminals of the network is effectively lowered.
    Type: Grant
    Filed: February 28, 1992
    Date of Patent: June 22, 1993
    Assignee: International Business Machines Corporation
    Inventors: Labh S. Bhangu, Thomas Morrison, Klaus Probst
  • Patent number: 5216434
    Abstract: A diversity receiving apparatus having a plurality of antennas, antenna feeders each being associated with respective one of the antennas, and a single diversity receiving section to which the antennas are connected via the associated antenna feeders. A breakage detecting circuit is included in the apparatus for detecting the breakage of any one of the antenna feeders. The detecting circuit uses an antenna whose radiation element is connected to ground and, by applying a predetermined DC potential to the hot line of the antenna feeder via a resistor, constantly monitors the potential. On the breakage of the antenna feeder, the detecting circuit produces an alarm in response to the resultant change in the potential. The apparatus is capable of readily detecting that the diversity reception effect has been lost and the receiving ability has been degraded due to the breakage of the antenna feeder.
    Type: Grant
    Filed: April 14, 1992
    Date of Patent: June 1, 1993
    Assignee: NEC Corporation
    Inventor: Yukio Fukumura
  • Patent number: 5185580
    Abstract: A electrical transmission line termination device capable of performing various termination requirements including matching the line impedance of wires in a transmission line with load impedances, electrically connecting conductors in a transmission line for maintaining electrical continuity, detecting improper wiring of the various wires in a transmission line, and connecting a cable shielding conductor to a ground wire.
    Type: Grant
    Filed: September 4, 1991
    Date of Patent: February 9, 1993
    Assignee: Smart House, L.P.
    Inventors: Edward L. Nichols, III, Gary L. Stirk
  • Patent number: 5179343
    Abstract: An apparatus, accommodated in a connector, for checking whether or not a pair of connector housings of the connector has been engagedly connected with each other comprising a conductive section, made of a conductive material, provided in one of the connector housings; and a pair of detecting terminals provided in the other connector housing. When the pair of the connector housings contact with each other, the pair of the detecting terminals contact the conductive section.
    Type: Grant
    Filed: August 28, 1991
    Date of Patent: January 12, 1993
    Assignee: Sumitomo Wiring Systems, Ltd.
    Inventors: Masamitsu Chishima, Taizou Hisada
  • Patent number: 5179253
    Abstract: A lighted wire nut made operable by connection of the ends of an energized wire conductor.
    Type: Grant
    Filed: June 14, 1991
    Date of Patent: January 12, 1993
    Inventors: Theodore Munniksma, Michael J. Codis
  • Patent number: 5172063
    Abstract: The reliability of conductive circuitry of a printed circuit board and particularly the integrity of the conductive barrels of the through-holes is tested by cyclically passing a current through a plurality of interconnected barrels. The current must be sufficient to resistively heat the conductive barrels to a temperature at which the glass epoxy substrate adjacent to each barrel reaches a transition temperature at which the glass epoxy changes state from a solid to a semi-solid. After sufficiently heating the glass epoxy, it is allowed to cool to ambient temperature. This cycle is repeated for a predetermined number of cycles and the resistance of the barrels is measured after each cycle. A measured resistance that exceeds a predetermined value indicates that one or more defects is present in the interconnected barrels.
    Type: Grant
    Filed: May 23, 1991
    Date of Patent: December 15, 1992
    Assignee: Northern Telecom Limited
    Inventors: Ramachandra Munikoti, Pulak Dhar
  • Patent number: 5165161
    Abstract: A cable making machine for making and electrically testing a cable assembly is disclosed. The machine includes a test circuit for effecting the electrical tests and probe members for electrically connecting the test circuit to the contacts of the connectors being terminated to the cable. Spring members bias the metal probe members toward the connector contacts. A latch is provided for releasably holding the connectors in position within the machine against the outwardly directed force of the spring biased probe members. A visual indicator is also provided that is indicative that the connector is fully seated within the machine prior to terminating the connector to the cable.
    Type: Grant
    Filed: August 27, 1991
    Date of Patent: November 24, 1992
    Assignee: AMP Incorporated
    Inventors: Stephen M. Cerquone, Michael Morris, Joseph F. Stachura
  • Patent number: 5159274
    Abstract: A device for measuring the quality of contact between two electrical conductors of an electrical circuit comprises a frame on which are mounted two electrically conductive elements and two electrically conductive pins. The frame is adapted to be inserted onto the electrical conductors, whereupon mechanical actuators displace the elements and pins such that each conductor is contacted by one of the elements and one of the pins to create an electric circuit. The elements are connected to a current generator to cause a current to flow within the circuit. A volt meter is provided to measure the drop in potential between the two pins. Knowledge of the resistance of each conductor enables the drop in potential to be used to measure the quality of the electrical contact between the conductors. The device is particularly useful to determine the quality of contact between conductors whose connections are not readily visible or accessible such as in an electrolysis apparatus in which an anode is immersed in a bath.
    Type: Grant
    Filed: February 22, 1991
    Date of Patent: October 27, 1992
    Assignee: Atochem
    Inventors: George Lieux, Jean Aubert
  • Patent number: 5142235
    Abstract: The detection system comprises a sensor and a controller which are connected by two wires. The sensor can take more than two states as opposed to conventional detection systems. According to this arrangement, for instance, a small leakage current exists even when the sensor is in normal off state, and, therefore, electric current in the range of I1 to I2 flows even in normal off state. On the other hand, electric current of I3 to I4 flows in normal on state. When there is a wire breakage, no electric current flows. Conversely, when there is a shortcircuiting, electric current exceeding I4 flows. Electric current in the range of I3 to I4 corresponds to an unstable state which is neither normal on state nor normal off state.
    Type: Grant
    Filed: January 22, 1991
    Date of Patent: August 25, 1992
    Assignee: Omron Tateisi Electronics Co.
    Inventors: Akio Matsumoto, Yasushi Matsuoka, Yoshimi Kanda, Satoshi Motouji, Tsutomu Ajioka
  • Patent number: 5124660
    Abstract: Disclosed is a system that determines whether input and output pins of semiconductor components are present and properly soldered to a printed circuit board. The system includes an oscillator which is connected to a metallic electrode placed on top of an integrated circuit package. A probe pin in a bed of nails tester is connected to a current measuring device and connected to a printed circuit board wiring trace that is soldered to the pin being tested. The oscillator signal is capacitively coupled through the integrated circuit package to the pin being tested, so if current is measured by the current measuring device, the pin is connected to the printed circuit board.
    Type: Grant
    Filed: December 20, 1990
    Date of Patent: June 23, 1992
    Assignee: Hewlett-Packard Company
    Inventor: Ugur Cilingiroglu
  • Patent number: 5108305
    Abstract: Erroneous insertion of a press-connecting terminal is detected, either electrically or mechanically, by providing a piece either on a rear portion of a base plate of an electrical connector, or on a wire-press connecting portion disposed behind an electric contact portion which is provided at a front end of the base plate. The erroneous insertion-detecting piece is formed in accordance with a size of the press-connecting terminal.
    Type: Grant
    Filed: August 3, 1990
    Date of Patent: April 28, 1992
    Assignee: Yazaki Corporation
    Inventor: Tetsuaki Suzuki
  • Patent number: 5097213
    Abstract: An apparatus for automatically testing multipin connectors is disclosed. A carrier frame contains connector cells of different configurations. Multiple groups of pins of the connector are connected together and to a source of high voltage. The resulting leakage current between energized pins and a remaining unenergized pin may be measured and compared with various stored test parameters. When the on-board computer detects a current which does not meet the stored test parameters, an error message is posted and displayed and also passed to a host computer connected to the on-board computer for storage and display.
    Type: Grant
    Filed: May 24, 1990
    Date of Patent: March 17, 1992
    Inventors: Curtis J. Hunting, Donald L. Patts, Brian J. Hunting
  • Patent number: 5066919
    Abstract: An automotive electrical system including a wiring harness incorporates a dedicated test line passing through critical connectors and components for allowing detection and isolation of improperly connected connectors. The dedicated test line can feed through expansion connectors, termination connectors, and junction blocks. A respective impedance is connected between the dedicated test line and ground at each respective connector. Connector fault detection and isolation is achieved by measuring the total impedance presented at the beginning of the test line. The measured impedance uniquely identifies the locations of any improperly connected connectors.
    Type: Grant
    Filed: April 3, 1990
    Date of Patent: November 19, 1991
    Assignee: Ford Motor Company
    Inventors: David J. Klassen, Edward G. Anderson
  • Patent number: 5061895
    Abstract: A system for detecting whether the ends of leads of a semiconductor package are less than a small predetermined distance from a predetermined plane. The system uses a structure having a planar surface and an elevated portion on the surface where the portion is provided with a number of slots equal to or greater in number than the number of leads on one side of the package. The height of the slots above the surface is substantially equal to the predetermined distance. In order to test whether the end portions of the leads deviate from coplanarity by a distance greater than the predetermined distance, the package is placed with its leads in contact with the surface with the leads facing the slots. The package is then slid towards the slots to determine whether all of the leads will slide into the corresponding slots. The lateral distance between each pair of adjacent slots matches the distance between the corresponding pair of leads.
    Type: Grant
    Filed: January 19, 1990
    Date of Patent: October 29, 1991
    Assignee: VLSI Technology, Inc.
    Inventor: Carl H. Fong
  • Patent number: 5057965
    Abstract: A device for monitoring the grounding characteristics of both an electrically dissipative work surface and a conductive wrist strap having a grounding tether. The device includes a mat monitor and a strap monitor. The mat monitor checks the resistance of the mat ground path and alerts the user if this resistance exceeds a predetermined resistance. The strap monitor checks the resistance of the wrist strap and tether ground path, and employs a timer to send electrical pulses to the wrist strap rather than having a constant voltage output to the strap. The strap monitor establishes a resistance window for the strap ground path, and alerts the user if the strap ground path resistance falls outside of the resistance window.
    Type: Grant
    Filed: July 6, 1989
    Date of Patent: October 15, 1991
    Assignee: Minnesota Mining and Manufacturing Company
    Inventor: Robert W. Wilson
  • Patent number: 5045783
    Abstract: Modified scanning electron microscopes are usually employed for the implementation of methods for testing the electrical properties of printed circuit boards with the electron probe. As a consequence of the deflection, chromatic aberration and of the aberrations of the objective lens increasing greatly with the deflection angle, however, their scanning field is limited. In order to be able to test larger printed circuit boards without involved improvement of electron optics, it is proposed that the printed circuit board be subdivided into a plurality of adjoining regions, whereby the size of the regions respectively approximately corresponds to the size of the scanning field. Each of the networks lying only within one of the regions is then tested in a known manner. In order to detect shorts between networks of different regions as well as interruptions between contact points of networks extending beyond regions, the known testing method is followed by a further test cycle.
    Type: Grant
    Filed: May 18, 1990
    Date of Patent: September 3, 1991
    Assignee: Siemens Aktiengesellschaft
    Inventors: Matthias Brunner, Hermann Wessely
  • Patent number: 5003249
    Abstract: An electrical power detection and indication device for quick and simple external attachment onto an insulated electric power cord, is linked to the conductors of the power cord by sharp probes which penetrate the insulation on the power cord conductors. The device can be configured to give a variety of audible or visible signals that indicate the presence or absence of electrical power and can also be used to detect and indicate polarity or grounding integrity. Modular construction allows flexibility with regard to power cord size, cord conductor number, and cord conductor arrangement, as well as with the type of indication desired.
    Type: Grant
    Filed: April 16, 1990
    Date of Patent: March 26, 1991
    Inventor: Bruce R. Bird
  • Patent number: 4999582
    Abstract: A circuit is described for applying a potential to an electrode of a biosensing test cell, which electrode, when properly inserted in a female connector, is contacted by a pair spaced apart contacts. The circuit includes a source of excitation potential and an operational amplifier having one input connected to the source of excitation potential. A switching circuit is coupled between the operational amplifier and a first one of the spaced apart contacts, with the switch means exhibiting an impedance. A feedback circuit is connected between the second of the spaced-apart contacts and another input to the operational amplifier, to feed back a potential appearing at the second contact. The feedback is for the purpose of maintaining the output of the operational amplifier at a level which compensates for impedance losses in the swtiching circuit.
    Type: Grant
    Filed: December 15, 1989
    Date of Patent: March 12, 1991
    Assignee: Boehringer Mannheim Corp.
    Inventors: Robert A. Parks, Bradley E. White
  • Patent number: 4985675
    Abstract: Multi-layer printed circuit boards are sometimes connected to transmission paths which may be susceptible to electrical discharges associated with transient electrical events occurring along the transmission path. A method is provided for assuring that two respective layers of the printed circuit board are aligned within predetermined tolerances. Aligning respective layers within acceptable tolerances provides a means of assuring that predetermined distances between a ground layer and a power layer will be maintained, thereby ensuring that electrical arcing will not occur between the power and ground layer in the event of voltage spikes or current surges.
    Type: Grant
    Filed: February 13, 1990
    Date of Patent: January 15, 1991
    Assignee: Northern Telecom Limited
    Inventor: Andy Turudic
  • Patent number: 4968929
    Abstract: A coding device for an electric cable plug connection having a plug connected to wires of a cable and insertable into a socket, both the plug and the socket being formed with a plurality of contacts, has a coding arrangement for assigning the plug to the socket in a correctly oriented position. The coding arrangement includes at least one jumper link connecting various of the contacts of the socket. The jumper link forms together with the cable connection an electrically interrogatable test loop.
    Type: Grant
    Filed: August 17, 1989
    Date of Patent: November 6, 1990
    Assignee: Heidelberger Druckmaschinen AG
    Inventors: Dieter Hauck, Karl-Heinz May
  • Patent number: 4954782
    Abstract: A four terminal ohmmeter apparatus includes circuitry for blanking the meter read-out in the event one or more connections to a device or structure under test have been improperly made. The voltage drop between current terminals is determined and compared with a threshold value. The voltage drop between potential terminals or between potential and current terminals, as caused by a separate a.c. source, is also determined and compared with a standard. Individual indicators inform the operator of the validity of each connection in order that corrective action can be taken if necessary. Voltage inputs are also utilized for ascertaining whether a correct meter range is being used and for changing the range if it is improper.
    Type: Grant
    Filed: June 29, 1989
    Date of Patent: September 4, 1990
    Assignee: The Boeing Company
    Inventor: Edward R. Ball
  • Patent number: 4918380
    Abstract: A system for measuring the amount and direction of misregistration of each layer of a panel from which multilayer printed circuit boards are separated. The system utilizes a conductor pattern having a conductive trace positioned on each layer of the panel. Each conductive trace includes two trace portions positioned in opposing relation with a plurality of conductive through-holes being positioned therebetween. Each trace portion includes a plurality of elongate conductor portions positioned incrementally varying distances from a common axis. The conductive through-holes are formed in the panel after the layers have been fabricated and joined. If the through-holes are in electrical contact with either trace portion, then the amount of misregistration can be determined. Further, by determining which trace portion the through-hole is in contact with, the direction of misregistration can be determined. By adding additional trace portions, the quantity of misregistration in other directions may be determined.
    Type: Grant
    Filed: October 3, 1988
    Date of Patent: April 17, 1990
    Inventor: Tom R. Paur