Electrical Connectors Patents (Class 324/538)
  • Patent number: 6710607
    Abstract: The present invention provides an inspection apparatus and method capable of intuitively obtaining inspection results of circuit wirings. An inspection system 20 comprises a sensor chip 1 including plural sensor elements, a computer 21, probes 22 for supplying an inspection signal to circuit wirings 101, and a selector 23 for switching the supply of the inspection signal to the probes 22. The computer 21 receives the detected signals from the sensor chip 1, and generates an image data to display an image of the circuit wirings as an inspection subject on a display 21a. This make it possible to check the shape of the specific circuit wiring and to detect defects such as disconnection, short-circuit, and chipping in the circuit wiring 101 based on the generated image data and the design image data representing the design circuit wiring.
    Type: Grant
    Filed: November 26, 2001
    Date of Patent: March 23, 2004
    Assignee: OHT, Inc.
    Inventors: Tatuhisa Fujii, Shogo Ishioka, Shuji Yamaoka
  • Publication number: 20040051536
    Abstract: A coaxial radio frequency adapter and method are disclosed. An adapter has a tapered signal pin and a tapered ground sleeve to maintain a consistent impedance and minimize reflections while connecting two elements having different dimensions. A method employs an adapter to characterize losses in a system for evaluating a device under test.
    Type: Application
    Filed: August 20, 2003
    Publication date: March 18, 2004
    Inventors: Doug Kreager, Perla Redmond, Kevin B. Redmond
  • Publication number: 20040046569
    Abstract: A testing device for testing resistors of a telecommunications component, the testing device having a control system and an automatic test mechanism. The control system controls a test sequence performed by the automatic test mechanism. The testing device is programmed with a variety of selectable test sequences to automatically test and determine the resistive value and each individual resistor in a variety of telecommunication component arrangements.
    Type: Application
    Filed: August 23, 2002
    Publication date: March 11, 2004
    Inventors: Raul Zubia, Javier Reyna, Delfino Hernandez, Genaro Neri
  • Patent number: 6703849
    Abstract: The present invention provides an inspection apparatus, an inspection method and an inspection unit therefor capable of inspecting a conductive pattern in a complete non-contact manner. In the method for inspecting a conductive pattern of a circuit board in a complete non-contact manner, a plurality of electrically conductive cells 11 are arranged along the conductive pattern of the circuit board 100 with leaving a space therebetween. An inspection signal having temporal variations is supplied to at least one of the cells 11 in the conductive pattern without using any pin. An output signal appearing at another at least one of the cells through the conductive pattern in response to the applied inspection signal is detected. The conductive pattern is inspected based on the detected output signal.
    Type: Grant
    Filed: October 9, 2001
    Date of Patent: March 9, 2004
    Assignee: OHT Inc.
    Inventors: Shogo Ishioka, Shuji Yamaoka
  • Patent number: 6683460
    Abstract: A test device for internet and telephone lines is provided. The test device includes: a main test set having a stretched casing in which a first circuit board is installed, wherein an internet plug and an internet receiving socket are soldered on the first circuit board and a connecting portion is located on one end of the main test set, the internet plug being formed on the connecting portion; and a secondary test tool having a stretched casing in which a second circuit board is installed, wherein an internet plug and an internet receiving socket are soldered on the second circuit board and a recessed connecting portion is located on one end of the secondary test tool, the internet receiving socket being formed on the recessed connecting portion.
    Type: Grant
    Filed: April 26, 2002
    Date of Patent: January 27, 2004
    Inventor: Hobbes Huang
  • Publication number: 20040008034
    Abstract: A testing device for testing a backplane preferably includes an impulse board with a connector for connection to the backplane, where the impulse board sends test signals to the backplane; a receiver board with a connector for connection to the backplane, where the receiver board receives the test signals; and a communication channel between the receiver board and the impulse board through which the receiver board signals to the impulse board results of the test signals.
    Type: Application
    Filed: July 9, 2002
    Publication date: January 15, 2004
    Inventors: Steven F. Mastoris, Rex M. Schrader, Glen H. Garland
  • Patent number: 6667624
    Abstract: A method and apparatus for testing a battery connection is provided. The apparatus includes a clamp attached to a conductor for attaching the conductor to an object, a first sensor configured to detect a voltage associated with the clamp, and a second sensor configured to detect a voltage associated with the conductor at a point located distally from the clamp, the voltage detected by the first sensor and the voltage detected by the second sensor are compared. A method for testing a connection includes sensing a first voltage in a cable carrying current to at least one of two and from a connection, sensing a second voltage associated with the connection, comparing the first and second voltages, determining whether the connection is acceptable or not acceptable based on the compared voltages.
    Type: Grant
    Filed: September 6, 2002
    Date of Patent: December 23, 2003
    Assignee: SPX Corporation
    Inventors: Kurt Raichle, Garret Miller
  • Patent number: 6657438
    Abstract: A testing apparatus (10) is provided to securely detect a mounting error of a fittable member (5) on a connector (1). The testing apparatus (10) has a testing unit (20) for detecting an ajar state of the fittable member (5) on a housing (2) of a connector (1). The testing unit (20) is provided with an elastic contact (22) for elastically contacting the housing (2) of the connector I1) along locking direction (Y) in which the fittable member (5) is locked with the housing (2). This elastic contact (22) is provided with a switch (23) for detecting the ajar state of the fittable member (5) at a contact position of the elastic contact (22) with the housing (2).
    Type: Grant
    Filed: October 15, 2001
    Date of Patent: December 2, 2003
    Assignee: Sumitomo Wiring Systems, Ltd.
    Inventor: Nobuhiro Suzuki
  • Patent number: 6653845
    Abstract: An open circuit detection apparatus is provided for detecting whether a connection is closed between a local node and a remote node having a known impedance. A ping source is connected to the local node. The ping source has an output for transmitting an address unique to the remote node and an input for sensing the impedance of the remote node. A test circuit is connected to the remote node. The test circuit has an address decoder for receiving the address from the output. The address decoder has a unique address and asserts a control signal upon the address matching the unique address of said address decoder. An impedance-varying device is responsive to the control signal and effects a change in the impedance of the remote node. The change in the impedance of the remote node is sensed by the input of the ping source.
    Type: Grant
    Filed: February 25, 2002
    Date of Patent: November 25, 2003
    Assignee: DaimlerChrysler Corporation
    Inventor: Frederick O Miesterfeld
  • Patent number: 6650956
    Abstract: A checking method is described for a wiring harness having first sub-harnesses and second sub-harnesses in which the first sub-harness has a first press-fit terminal joined to each end of a first electrical cable, and the first sub-harness has a first isolator holding the first press-fit terminal and the second sub-harness has a second press-fit terminal, a crimp terminal, a connector housing for accommodating the crimp terminal, a second isolator supporting the second press-fit terminal and wherein a second electrical cable connects the second press fit terminal and the crimp terminal at opposite ends. The checking method, which is effective upon layering of the first and second isolators includes the conduct of decision steps for determining acceptance or rejection of the individual sub-harnesses after assembly thereof and a final decision step for determining acceptance or rejection of the completed wiring harness layering following of the isolators of the first and second sub-harness.
    Type: Grant
    Filed: February 27, 2001
    Date of Patent: November 18, 2003
    Assignee: Yazaki Corporation
    Inventors: Kazuhiko Takada, Yutaka Matsuoka, Katsuhiro Suzuki, Hidehiko Yabuuchi, Toshiyuki Ueki, Wataru Tanizawa
  • Publication number: 20030201782
    Abstract: A test device for internet and telephone lines is provided. The test device includes: a main test set having a stretched casing in which a first circuit board is installed, wherein an internet plug and an internet receiving socket are soldered on the first circuit board and a connecting portion is located on one end of the main test set, the internet plug being formed on the connecting portion; and a secondary test tool having a stretched casing in which a second circuit board is installed, wherein an internet plug and an internet receiving socket are soldered on the second circuit board and a recessed connecting portion is located on one end of the secondary test tool, the internet receiving socket being formed on the recessed connecting portion.
    Type: Application
    Filed: April 26, 2002
    Publication date: October 30, 2003
    Inventor: Hobbes Huang
  • Patent number: 6639412
    Abstract: The present invention has a coaxial cable connection electrically connected to a voltage monitor circuit for discriminating between multiple voltage levels. A visual display is electrically connected to the voltage monitor circuit and which displays the measured voltage level. The entire circuit is powered from the input on the coaxial cable connection.
    Type: Grant
    Filed: January 14, 2002
    Date of Patent: October 28, 2003
    Inventor: Michael Lane Truett
  • Publication number: 20030197515
    Abstract: A semiconductor system includes a plurality of semiconductor chips, a first group of wirings, a second group of wirings and a connection rearrange wiring section. The first group of wirings interconnect the plurality of semiconductor chips. The second group of wirings are used for redundancy and interconnect the plurality of semiconductor chips. The connection rearrange wiring section includes a connection test circuit and connection rearrange circuit. The connection test circuit makes a test for connection between the plurality of semiconductor chips by means of the first group of wirings. The connection rearrange circuit makes unusable a wiring of the first group in which poor connection occurs and rearranges the connection between the semiconductor chips by use of the wiring of the second group when the poor connection is detected in the wiring of the first group by the connection test circuit.
    Type: Application
    Filed: June 6, 2002
    Publication date: October 23, 2003
    Inventor: Takeshi Ishigaki
  • Patent number: 6636051
    Abstract: For the adjustment of planar broad-band lambda probes, direct access is obtained to an adjustment element made of a resistor layer applied to a ceramic substrate. For this purpose a corresponding cover element is removed from the probe, or rather, from the probe developed as a wiring harness plug. A cover element is formed directly with the remaining part of wiring harness plug, preferably connected as one piece, and the cover element is made transparent in such a way that a laser beam can penetrate cover element, and processing can occur at adjustment element, even when cover element has already been mounted on wiring harness plug.
    Type: Grant
    Filed: December 3, 2001
    Date of Patent: October 21, 2003
    Assignee: Robert Bosch GmbH
    Inventor: Wolfgang Pade
  • Patent number: 6632099
    Abstract: A connector for testing shunted electrical terminal assemblies includes a selectively actuatable shunt displacement member for moving a terminal shunt between a shunted and unshunted position in response to a control signal. The connector allows for the testing of shunted circuits and connectors in a shunted and unshunted position. The connector is readily adaptable to systems for automated testing of airbag actuators and the like.
    Type: Grant
    Filed: November 20, 2001
    Date of Patent: October 14, 2003
    Assignee: ATI Systems, Inc.
    Inventors: Richard Ernest Rygwelski, Jr., Kenneth Alan York, Ron R. Sexton, Igor Tolkachier, Dean Grider, Berlinda Qingxi Bai
  • Patent number: 6630832
    Abstract: This invention discloses an apparatus for electrical testing of an electrical circuit (12) having first and second side surfaces and including a plurality of conductors, the apparatus including at least one stimulation electrode (14, 16, 20) disposed adjacent at least one of the first and second side surfaces of the electrical circuit and being operative to apply thereto a stimulation electromagnetic field in a non-contact manner, at least one sensing electrode (25) disposed adjacent at least one of the first and second side surfaces of the electrical circuit and being operative to sense a resulting electromagnetic field produced by application of the stimulation electromagnetic field at various locations thereon in a non-contact manner wherein at least one of the at least one stimulation electrode and the at least one sensing electrode includes at least two electrodes at least one of which is disposed adjacent each of the first and second side surfaces of the electrical circuit.
    Type: Grant
    Filed: February 27, 2001
    Date of Patent: October 7, 2003
    Assignee: Orbotech Limited
    Inventors: Benyamin Harzanu, Raviv Weber, Hanan Golan
  • Publication number: 20030184311
    Abstract: A bypass capacitor having a given capacitance is arranged on the power/ground line adjacently to a driver circuit in a chip to reduce an effect of transient phenomenon at switching. The capacitance of the bypass capacitor is preset so as to be larger than a parasitic capacitance of the driver circuit to prevent the characteristic impedance of the power/ground line from being higher than the characteristic impedance of internal wiring.
    Type: Application
    Filed: January 23, 2003
    Publication date: October 2, 2003
    Inventors: Kanji Otsuka, Tadatomo Suga, Tamotsu Usami
  • Patent number: 6624639
    Abstract: A molded plastic coaxial connector. The coaxial connector is fabricated within a stacking connector system of a mini PCI card. A plastic protuberance having a cavity and a corresponding depression having a center conductor pin are molded to the dimensions corresponding to a desired characteristic impedance. The plastic is then coated with a conductive material. When the protuberance is mated to the depression, the coated surfaces of each form the ground shield of a coaxial connection and the center conducting pin is mated to the cavity to form the drive point of the coaxial connection. Fabricating the coaxial connection from plastic reduces the number of processes and eliminates the need for individually machined parts, thereby reducing the production costs. In one embodiment multiple coaxial connectors may be implemented along a single piece of plastic. This allows for reduction in size as the tolerance buildup of conventional coaxial connectors is avoided.
    Type: Grant
    Filed: November 5, 2001
    Date of Patent: September 23, 2003
    Assignee: Intel Corporation
    Inventor: Jeffrey L. Schiffer
  • Patent number: 6617972
    Abstract: An object of the invention is to provide a monitor system for detecting occurrence of abnormal situation on the elderly living alone and the like, by using an inexpensive table tap alone, without modifying an electric appliance and a plug which are currently used. A table tap (100) contains an ammeter (103), a judgement unit (104), and a communication unit (105). After connecting an electric appliance which is currently used to the table tap, when the judgement unit (104) decides that the power consumption detected by the ammeter (103) is unusual, the communication unit (105) notifies a base station (109) that an abnormal situation occurs.
    Type: Grant
    Filed: January 29, 2002
    Date of Patent: September 9, 2003
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Shinichi Takarada, Hiromasa Mizuki
  • Patent number: 6612021
    Abstract: A wire control apparatus is provided for controlling the mounting of the ends of wires to connectors as part of a wiring harness assembling procedure. The apparatus includes supplies of wires and instructing indicators to identify which wire should be selected by an operator. The apparatus also include jigs for receiving the connectors. The apparatus then provides indicators for issuing instructions to identify the connectors to which the respective wires are to be connected and probes for testing that the wires have been connected pursuant to the instructions.
    Type: Grant
    Filed: July 28, 2000
    Date of Patent: September 2, 2003
    Assignee: Sumitomo Wiring Systems, Ltd.
    Inventors: Yoshikazu Taniguchi, Satoru Taniguchi, Kenji Chiyoda, Hajime Kato
  • Publication number: 20030160620
    Abstract: An open circuit detection apparatus is provided for detecting whether a connection is closed between a local node and a remote node having a known impedance. A ping source is connected to the local node. The ping source has an output for transmitting an address unique to the remote node and an input for sensing the impedance of the remote node. A test circuit is connected to the remote node. The test circuit has an address decoder for receiving the address from the output. The address decoder has a unique address and asserts a control signal upon the address matching the unique address of said address decoder. An impedance-varying device is responsive to the control signal and effects a change in the impedance of the remote node. The change in the impedance of the remote node is sensed by the input of the ping source.
    Type: Application
    Filed: February 25, 2002
    Publication date: August 28, 2003
    Inventor: Frederick O. Miesterfeld
  • Patent number: 6611147
    Abstract: A test apparatus for performing line testing of cable and networks. In one embodiment, the test apparatus includes a housing configured to electrically connect with an adapter module while minimizing bends in the electrical connection. The housing and adapter module include mating connectors configured to provide a direct connection between the adapter module and the housing. One embodiment includes a guide feature to ease the insertion of the adapter module into the housing. In another embodiment, the adapter module is configured to form a continuous surface with the housing upon its insertion.
    Type: Grant
    Filed: May 22, 2001
    Date of Patent: August 26, 2003
    Assignee: IDEAL Industries, Inc.
    Inventors: Charles Michael White, William L. Redman, S. Stanley Mintz, Kwok Lo, Jarek Kanikula, Mark William Borneman
  • Patent number: 6605948
    Abstract: A test system for testing the wiring configuration of a programming plug 10 for a gas turbine engine control unit 16 includes an array of multiplexers 28. The multiplexers concurrently acquiring one data bit from a prescribed data pin in each of several groups of data pins projecting from the plug. A computer operating under the authority of an executable computer program produces an incrementable selection signal to successively prescribe the individual data pins from which data is to be acquired. The system also includes standards against which the condition or validity of the wiring configuration is assessed. A display system, such as a video monitor reports the condition of the programming plug.
    Type: Grant
    Filed: July 27, 2001
    Date of Patent: August 12, 2003
    Assignee: United Technologies Corporation
    Inventor: Paul D. Russell
  • Publication number: 20030146764
    Abstract: A protecting system for protecting a blade module of an information-processing apparatus includes a detecting unit, a starting unit and a triggering unit. The detecting unit determines whether or not the connection between the blade module and the information processing apparatus is good. When the connection is good, the starting unit starts the triggering unit so that a working voltage is safely provided to the main circuit of the blade module.
    Type: Application
    Filed: February 5, 2002
    Publication date: August 7, 2003
    Inventor: Chun-Liang Lee
  • Publication number: 20030141877
    Abstract: A tester routine is proved that evaluates all test pins, on all devices under test, t the same time and only if a fail does any evaluation have to be made. In the case of a failing pin that device is retested until passed or if not passed after a specified time considered a fail.
    Type: Application
    Filed: January 10, 2003
    Publication date: July 31, 2003
    Inventors: Randy L. Williams, Glenn R. Fitzgerald, Michael K. Henson, Julian I. Gloria, Bruce D. Bishop
  • Publication number: 20030107382
    Abstract: A coaxial radio frequency adapter and method are disclosed. An adapter has a tapered signal pin and a tapered ground sleeve to maintain a consistent impedance and minimize reflections while connecting two elements having different dimensions. A method employs an adapter to characterize losses in a system for evaluating a device under test.
    Type: Application
    Filed: December 10, 2001
    Publication date: June 12, 2003
    Inventors: Doug Kreager, Perla Redmond, Kevin B. Redmond
  • Patent number: 6577131
    Abstract: A motor test fixture for connection to motor terminal lugs. The fixture includes a housing including a plurality of external apertures positioned and formed to enclose the motor terminal lugs; an aperture in the housing; a chamber within the housing having a first end open to the aperture; and a slide bar moveably located in the chamber and moveable between at least a first position and a second position. The fixture also includes a plurality of plates moveably mounted in the housing to move between a motor lug engagement position and a motor lug disengagement position; and a plurality of plate motivators. Each plate motivator is arranged on the slide bar to engage a respective one of the plates and, when the slide bar is in the first position, to motivate the respective plate to the lug disengagement position and, when the bar is in the second position, to motivate the respective plate to the lug engagement position. The motor test fixture also preferably includes a polarity bar.
    Type: Grant
    Filed: October 5, 2001
    Date of Patent: June 10, 2003
    Assignee: American Standard International Inc.
    Inventors: Matthew A. Shepeck, Brenda K. Bricco, Brady J. Moroney
  • Patent number: 6570393
    Abstract: An improvement to contacts for automatic test apparatus used in the testing of semiconductors. At least two contacts with first and second ends for engaging test points of a device under test (DUT) extend the first end different distances toward the DUT. The test apparatus is arranged to support and carry a DUT at a predetermined rate toward the two contacts. The contact with the greatest first end extension, which contacts the DUT first, has the second end connected to ground and the other contact has the second end connected to a test voltage. Each first and second end of said contacts have support means arranged to permit the ends to deflect a predetermined distance under a predetermined force. This permits the apparatus to engage both ends of both contacts at predetermined contact forces. A plurality of sets of contacts with a given extension and/or a plurality of different extensions for sets of contacts can also be used.
    Type: Grant
    Filed: September 17, 1998
    Date of Patent: May 27, 2003
    Assignee: JohnsTech International Corporation
    Inventor: David A. Johnson
  • Patent number: 6563325
    Abstract: A test connector for the direct connection of electronic devices. The test connector may be mechanically and electrically connected to a testing device for insertion into a test port of an electronic device. The leading edge and the outer surface of the tip of the connector form a beveled shoulder so that insertion of the connector into a test port, misalignment of the wireless communication device with the test connector will not prevent proper insertion of the test connector into the test port. In addition, a wire encircles helically the outer surface of the tip of the test connector and functions as both a spring mechanism during the insertion of the test connector into the test port and as a grounding mechanism.
    Type: Grant
    Filed: December 18, 2000
    Date of Patent: May 13, 2003
    Assignee: Qualcomm Incorporated
    Inventors: Rodney W. Streed, Dale A. Arkwright, Dung T. Tran
  • Publication number: 20030085716
    Abstract: A molded plastic coaxial connector. The coaxial connector is fabricated within a stacking connector system of a mini PCI card. A plastic protuberance having a cavity and a corresponding depression having a center conductor pin are molded to the dimensions corresponding to a desired characteristic impedance. The plastic is then coated with a conductive material. When the protuberance is mated to the depression, the coated surfaces of each form the ground shield of a coaxial connection and the center conducting pin is mated to the cavity to form the drive point of the coaxial connection. Fabricating the coaxial connection from plastic reduces the number of processes and eliminates the need for individually machined parts, thereby reducing the production costs. In one embodiment multiple coaxial connectors may be implemented along a single piece of plastic. This allows for reduction in size as the tolerance buildup of conventional coaxial connectors is avoided.
    Type: Application
    Filed: November 5, 2001
    Publication date: May 8, 2003
    Inventor: Jeffrey L. Schiffer
  • Patent number: 6559649
    Abstract: A connector assembly for removing static electricity generated in high-speed communication cable as a result of tribocharging is described. The invention is realized with a typical high-speed cable having a connector provided with a dissipative medium and at least one conductive pad. Static electricity on the jacket material of the cable induces a charge in the cable wires, which is bled to the pads via the dissipative medium. The charge on the pad is then grounded prior to or as the cable is connected to a cable jack.
    Type: Grant
    Filed: July 16, 2001
    Date of Patent: May 6, 2003
    Assignee: Avaya Technology Corp.
    Inventors: Edward W. Deleu, Min-Chung Jon, Vito Palazzo
  • Patent number: 6560735
    Abstract: The specification describes an IC test apparatus having a test bed with sockets adapted to engage arrays of I/O solder balls/bumps on the IC chip. In one embodiment the sockets are provided with through holes to interconnect the solder bumps to the next board level with minimum electrical path length thereby reducing parasitic capacitive coupling. In another embodiment the sockets in the test bed are formed by intersecting V-grooves. If pairs of intersecting V-grooves are used, pyramid shaped features are produced at the bottom of each socket. Both the sharp edges formed by the intersecting V-grooves and the pyramid provide contact enhancement between the solder bumps and the test bed. The test bed can be made as a universal blank for a given solder bump pitch. The desired test circuit is formed at the next board level.
    Type: Grant
    Filed: August 3, 1999
    Date of Patent: May 6, 2003
    Assignee: Agere Systems Inc
    Inventors: Louis Nelson Ahlquist, Yinon Degani, Jericho J. Jacala, Dean Paul Kossives, King Lien Tai
  • Publication number: 20030076114
    Abstract: A test system for testing the wiring configuration of a programming plug 10 for a gas turbine engine control unit 16 includes an array of multiplexers 28. The multiplexers concurrently acquiring one data bit from a prescribed data pin in each of several groups of data pins projecting from the plug. A computer operating under the authority of an executable computer program produces an incrementable selection signal to successively prescribe the individual data pins from which data is to be acquired. The system also includes standards against which the condition or validity of the wiring configuration is assessed. A display system, such as a video monitor reports the condition of the programming plug.
    Type: Application
    Filed: July 27, 2001
    Publication date: April 24, 2003
    Inventor: Paul D. Russell
  • Publication number: 20030067305
    Abstract: A motor test fixture for connection to motor terminal lugs. The fixture includes a housing including a plurality of external apertures positioned and formed to enclose the motor terminal lugs; an aperture in the housing; a chamber within the housing having a first end open to the aperture; and a slide bar moveably located in the chamber and moveable between at least a first position and a second position. The fixture also includes a plurality of plates moveably mounted in the housing to move between a motor lug engagement position and a motor lug disengagement position; and a plurality of plate motivators. Each plate motivator is arranged on the slide bar to engage a respective one of the plates and, when the slide bar is in the first position, to motivate the respective plate to the lug disengagement position and, when the bar is in the second position, to motivate the respective plate to the lug engagement position. The motor test fixture also preferably includes a polarity bar.
    Type: Application
    Filed: October 5, 2001
    Publication date: April 10, 2003
    Inventors: Matthew A. Shepeck, Brenda K. Bricco, Brady J. Moroney
  • Publication number: 20030057958
    Abstract: In a lever fitting-type manual disconnector 1A, first and second connector housing 1 and 3 are provided with terminals 9 and 35, respectively. A lever 2 is provided in rotatable and linearly movable manners on the first connector housing 1. A cam groove 21 is provided on the lever 2 and a cam pin 36 is provided on the second connector housing 3. When the lever 2 is rotated, the lever fitting-type manual disconnector 1A is set in a rotation completive position where the terminals 9 and 35 on the both connector housings 1 and 3 connect to one another. When the lever 2 is moved linearly from the rotation completive position, the lever fitting-type manual disconnector 1A is set in a fitting completive position where a fitting-state detective switch is turned on.
    Type: Application
    Filed: September 20, 2002
    Publication date: March 27, 2003
    Applicant: YAZAKI CORPORATION
    Inventors: Hirotaka Fukushima, Satoru Ohshita, Yutaka Masuda, Hidehiko Kuboshima, Yasuyoshi Fukao, Shigemi Hashizawa
  • Patent number: 6538452
    Abstract: A testing device provides pin height, continuity, and concentricity testing for coaxial connectors and cables. The testing device provides connector jacks with support shafts that properly align and stabilize the connectors during testing. Circuitry is provided to indicate if the pin height is sufficient, if the cable is an open circuit, a short circuit, or has an adequate continuity, and if the center pin of the connector is sufficiently concentric with the outer sleeve. The jacks may have an outer surface with slots providing a slip fit configuration that allows the coaxial connector to be easily inserted and removed.
    Type: Grant
    Filed: March 9, 2001
    Date of Patent: March 25, 2003
    Assignee: ADC Telecommunications, Inc.
    Inventors: Dale Madsen, Amy Witty
  • Publication number: 20030042912
    Abstract: A router for funneling a plurality of conductors is disclosed. The router includes a routing unit and a plurality of conductor paths. The conductor paths are directed through the routing unit and are adapted to receive the conductors. The routing unit and the plurality of conductor paths are formed by a three-dimensional fabrication process.
    Type: Application
    Filed: August 30, 2001
    Publication date: March 6, 2003
    Inventor: Keith Breinlinger
  • Patent number: 6522151
    Abstract: A circuit and method for connecting data lines in a digital communication system are disclosed. The circuit allows either a balanced data line or an unbalanced data line to be connected to a single input port with no internal reconfiguration of the system. Connection to a balanced data line isolation transformer is provided at the port. A separate connection to ground is provided at the same port. A user connects the system to a balanced data line using a jack wired for connecting the balanced data line pair across the isolation transformer. A user connects the system to an unbalanced data line using a similar jack; however, the jack in this case is wired to short one transformer connection to the ground connection provided at the port, thereby unbalancing the transformer. In one embodiment, this second jack is part of a patch cable that accepts a coaxial connector on. one end, appropriately wired to the shorted jack on the second end.
    Type: Grant
    Filed: May 25, 2001
    Date of Patent: February 18, 2003
    Assignee: Cisco Technology, Inc.
    Inventors: R. Ashby Armistead, David W. Metcalf, Danyang Raymond Zheng
  • Patent number: 6512378
    Abstract: A network cable tester is connected to a multi-line test coupler, with a plurality of output cables connected in turn to a patch panel. The coupler includes an internal printed circuit board connecting the internal wire pair to an outlet jack for a maintenance free product. A terminator is also connected to the patch panel to selectively test lines by engaging wall outlets etc., with the terminator. With this system it is not necessary to connect the tester to each individual line thereby saving considerable time and expense.
    Type: Grant
    Filed: April 25, 2001
    Date of Patent: January 28, 2003
    Inventor: Javier Fernandez
  • Patent number: 6504378
    Abstract: An apparatus and method for evaluating the integrity of each contact pin of an electronic component having multiple contact pins. In one embodiment, the apparatus includes a test device and a measuring instrument. The test device comprises a component fixture configured to hold an electronic component under test and opposing contact plates for establishing electrical communication between the contact pins of the electronic component and the measuring instrument. The test device may include separate linear positioners associated with each opposing contact plate configured to move the contacts plates relative to the component fixture and electronic component under test. The measuring instrument measures at least one electrical characteristic of a pin contact. In another embodiment, the apparatus further includes a system controller in communication with the measuring instrument and configured to control functioning of the measuring instrument.
    Type: Grant
    Filed: November 24, 1999
    Date of Patent: January 7, 2003
    Assignee: Micron Technology, Inc.
    Inventor: Alan A. Renfrow
  • Patent number: 6501279
    Abstract: A testing device is provided to position connection parts easily and precisely with respect to probes. A box (1a) of an electrical connection box (1) is restrained from twisting by rods (15). Connecting parts T of the electrical connection box (1) then are engaged with probes of a testing device (10). Preferably, one holder (22) is provided for each block. The holder (22) holds the probe so that the probe is displaceable with respect to a retainer (11). The holder (22) is provided with projections used for the positioning.
    Type: Grant
    Filed: October 20, 1999
    Date of Patent: December 31, 2002
    Assignee: Sumitomo Wiring Systems, Ltd.
    Inventors: Takao Fujita, Hajime Kato
  • Patent number: 6498997
    Abstract: A method and an apparatus for producing a solid actuator employing measurement of the electric characteristic of the actuator and effecting polarization during the wire bonding process. After a wire has been bonded to pads formed on a substrate, the conduction of the wire is tested. Then, whether or not a capacitance between the pads has a preselected value is determined. Subsequently, whether or not a characteristic impedance between the pads has a preselected value is determined. Thereafter, whether or not any crack is present in the surfaces of electrodes electrically connected to the pads is determined. This is followed by the polarization of the substrate. Electrical characteristics are tested after each wire is bonded. There is also provided a storage medium storing a program for controlling the above apparatus.
    Type: Grant
    Filed: August 19, 1998
    Date of Patent: December 24, 2002
    Assignee: Fuji Xerox Co., Ltd.
    Inventor: Akihiko Takada
  • Patent number: 6498506
    Abstract: A spring probe assembly 10 which contains spring probes 50 and 60 used for mating to various planar devices, such as a printed circuit board, via spring contact with interface areas on their surfaces. The assembly 10 is comprised of a non-metallic, insulating material block 20 which has been crafted to secure multiple, impedance matched, coaxial spring probe assemblies 50 and ground spring pins 60. A metallic clip 70 is used to join the signal probe shield 54 with the ground spring pin 62 in the appropriate geometry, while isolating that signal probe shield 54 and ground spring pin 62 from all other signal probe shields 54 and ground pins 62. The pins 52 of the signal probes 50 make contact with the surfaces of various planar devices via back pressure applied to the pins 52.
    Type: Grant
    Filed: July 26, 2000
    Date of Patent: December 24, 2002
    Assignee: Gore Enterprise Holdings, Inc.
    Inventor: Frank R. Beckous
  • Patent number: 6496014
    Abstract: A probe for a cable tester having a first interface for connection to the cable tester; a second interface, connected to the first interface, for connection to a cable to be tested; and a memory, associated with the probe and accessible by the cable tester, storing configuration data associated with the probe.
    Type: Grant
    Filed: July 18, 2000
    Date of Patent: December 17, 2002
    Assignee: Agilent Technologies, Inc.
    Inventor: Ron D. Cook
  • Patent number: 6496013
    Abstract: An instrument to test electronic components, the instrument including a drive unit electrically connecting the component and electrically driving the component to generate a field in the nearby space. The instrument also includes a test device electrically insulated from the component and mounted in its vicinity in order to measure the field generated by the component. The drive unit is designed to apply a voltage to the component. The test device includes an instrument amplifier measuring the voltage differential of two electrodes positioned at two sites in the electric field generated by the component. One of the electrodes is positioned near the component.
    Type: Grant
    Filed: March 23, 2000
    Date of Patent: December 17, 2002
    Assignee: Scorpion Technologies AG
    Inventors: Manfred Buks, Karim Hosseini
  • Publication number: 20020186021
    Abstract: A connector inspection apparatus is provided for inspection of a connector having a terminal receiving portion provided with cavities in which terminals are inserted, and a retainer attached to the terminal receiving portion. The connector inspection apparatus includes a holder for holding the connector during inspection, an inspection unit, and a lever for moving the inspection unit forward and rearward with respect to the holder. When the inspection unit is moved forwardly by the lever, a retainer position inspection piece provided in the inspection unit assumes either a forward movable condition or a rearward movable condition dependent upon whether the retainer is in a proper locked condition within the connector. When the retainer position inspection piece is in the backward movable condition, an electrical detection device detects the condition of the retainer.
    Type: Application
    Filed: May 31, 2002
    Publication date: December 12, 2002
    Applicant: SUMITOMO WIRING SYSTEMS, LTD,.
    Inventors: Akira Nishino, Takao Fujita
  • Publication number: 20020186020
    Abstract: In an AC module, if an interconnection relay is provided in an inverter, the inverter increases in size, and disconnection status between the AC module and a system upon occurrence of abnormal condition cannot be easily checked by a user. Accordingly, a plug is connected to an outlet, thereby an output of the inverter is supplied to the system or a load via a coupler. If leakage of direct current, ground fault of a solar cell or the like, a fault or abnormal condition of the inverter, or an abnormal condition of the system is detected, the inverter outputs a signal to separate the plug from the coupler.
    Type: Application
    Filed: May 28, 2002
    Publication date: December 12, 2002
    Inventors: Hiroshi Kondo, Nobuyoshi Takehara
  • Publication number: 20020180457
    Abstract: A method and apparatus are provided to quickly electrically test an electrical wiring system that has a large number of contacts by maximally reducing the number of electrical tests. A plurality of contacts forming a network of an electrical wiring system is divided into a plurality of groups. The respective groups are insulated from each other. The insulated states of these groups are discriminated, and the insulated states of the respective contacts in the respective groups are discriminated if the insulated states of the respective groups are judged to be satisfactory.
    Type: Application
    Filed: May 30, 2002
    Publication date: December 5, 2002
    Applicant: Sumitomo Wiring Systems, Ltd.
    Inventors: Yoshikazu Taniguchi, Setsurou Mori
  • Patent number: 6489780
    Abstract: The inspection unit has an engagement structure of a resilient locking finger and a finger deflection inspecting pin. The locking finger is provided in a terminal accommodation chamber defined in a connector housing for locking a terminal received in the terminal accommodation chamber. The finger deflection inspecting pin is provided in the inspection unit for inspecting an incomplete insertion state of the terminal. The finger deflection inspecting pin has a forward end portion formed with a concave surface. The locking finger has an extended forward end with a round head. When the extended forward end portion is received in and abuts against the concave surface, the extended forward end portion is guided by the concave surface due to the engagement structure. The concave surface may have a U-shaped section.
    Type: Grant
    Filed: January 9, 2001
    Date of Patent: December 3, 2002
    Assignee: Yazaki Corporation
    Inventor: Haruki Yoshida
  • Patent number: 6480005
    Abstract: An electrical connection testing device is provided with a connector holder (12), first and second probe holders (13, 14) which are successively arranged such that the connector holder (12) and the second probe holder are movable toward and away from the connector holder (12). A pushing mechanism (18) for pushing a receiving surface (14d) of the second probe holder (14) at the opposite side from the connector holder (12) is so coupled with the second probe holder (14) as to be movable toward and away from the second probe holder (14). The second probe holder (14) and the connector holder (12) are moved according to the movement of the pushing mechanism (18), thereby being positioned at testing positions (P1) where probes (16, 17) are inserted into testing holes (1a) of a connector (C) from opposite sides or at retracted positions (P2) where the connector can be taken out of a connector holder (12).
    Type: Grant
    Filed: January 30, 2001
    Date of Patent: November 12, 2002
    Assignee: Sumitomo Wiring Systems, Ltd.
    Inventors: Yuji Nagano, Nobuhiro Suzuki, Akira Nishino