Abstract: A connector receiving member and a test area are provided in a relatively shiftable manner from an engaged state in which a test area engages in a continuity testable manner to a separated state in which the test area separates from a connector housing. In addition, a drive mechanism is provided for relatively shifting the connector receiving member and the test area in relation to an engaged state and a separated state. The drive mechanism is controlled by a control mechanism. With this mechanism, a connector receiving member and a test area relatively shift to the engaged state upon insertion of the connector housing into the connector receiving member while the connector receiving member and the test area relatively shift to the separated state after a predetermined time period.

Abstract: In a connector continuity checking device comprising continuity checking pins 38 corresponding to terminals 41 in a connector 32, and lance displacement detecting pins 34 corresponding to lances 44 having elasticity and adapted to lock the terminals, the continuity checking pins 38 are respectively provided at their distal ends with concave terminal receiving portions 55 to receive distal ends of the terminals 41, and the lance displacement detecting pins 34 are respectively provided at their distal ends with concave lance receiving portions 56 to receive distal ends of the lances 44. The concave terminal receiving portions 55 and the concave lance receiving portions 56 are formed in a U-shape or a V-shape in cross section.

Abstract: In order to provide a method for reliably detecting that an operation device, such as a sensor or an actuator, is connected to a proper connector of a control device, a connection detecting method includes the steps of reading an identification signal of the operation device, comparing the identification signal with a predetermined signal assigned to the operation device at the control device, and determining if the identification signal matches the predetermined signal. The system also includes a step of sending a connection failure warning after the determining step is repeated for predetermined times.

Abstract: Methods and apparatus are presented for determining the adequacy of a shielding and an electrical connection of a male BNC to a coaxial cable. A dial indicator gauge includes a calibration member for calibrating the limits of a properly connected male BNC. A simulated female BNC is included with the gauge. The calibrated gauge is attached to the male BNC connection which then indicates whether the connection is within the allowable limits.

Abstract: The invention concerns a device (1) for measuring and/or testing of components of optical and/or electrical networks, with a casing (2) and an optical and/or electrical connection jack (5) attached to the casing (2), to which an optical and/or electrical lead (8) can be connected directly or indirectly via an adapter (9), wherein a lift device (11) is provided, with which the connection jack (5) can be moved relative to the casing (2) between a lifted position and a lowered position.

Abstract: In a terminal crimped state testing method, in step S1, a reference waveform is created on the basis of a load when a terminal in a good crimped state is obtained, and the reference waveform is divided into plural reference waveform segments to set singular points. In step S2, the reference waveform segments containing singular points of the segments are integrated. In step S3, a characteristic waveform is created on the basis of the load when a crimping terminal to be tested is obtained. The characteristic waveform thus created is divided into plural sample waveform segments and the waveform segments corresponding to the reference waveform segments are integrated. In step S4, the integrated values of the reference waveform segments are compared with those of the sample waveform segments, thereby deciding whether the crimped state of the crimping terminal is good or not.

Abstract: An electronic device comprising a processor 4 and a connector 2 for connecting an external device to the electronic device. The connector has a plurality of electrical contacts 23-27 at least one of which 23 is connected to the processor 4. The processor 4 is arranged to monitor the status of a first electrical contact 23 and to determine the type of external device connected to the connector 2 in dependence on the status of the first electrical contact 23.

Abstract: An electronic device comprising a processor 4 and a connector 2 for connecting an external device to the electronic device. The connector has a plurality of electrical contacts 23-27 at least one of which 23 is connected to the processor 4. The processor 4 is arranged to monitor the status of a first electrical contact 23 and to determine the type of external device connected to the connector 2 in dependence on the status of the first electrical contact 23.

Abstract: A testing device is disclosed that provides pin height, continuity, and concentricity testing for coaxial connectors and cables. The testing device provides connector jacks with support shafts that properly align and stabilize the connectors during testing. Circuitry is provided to indicate if the pin height is sufficient, if the cable is an open circuit, a short circuit, or has an adequate continuity, and if the center pin of the connector is sufficiently concentric with the outer sleeve. The jacks may have an outer surface with slots providing a slip fit configuration that allows the coaxial connector to be easily inserted and removed.

Abstract: A continuity checking device for a connector which comprises a connector holding part 3, a checking part 11 including continuity checking pins 5 capable of contacting with terminals 4, and insertion checking pins 8 which can be inserted into spaces where flexible locking lances 7 of the connector are deflected, the checking part being movable back and forth with respect to the connector holding part, and links 12 which are connected to the checking part at its one end and connected to an operating lever 13 at the other end, wherein the insertion checking pins 8 are immovably fixed inside the checking part, whereby a gap 14 is created between the checking part 11 and the connector holding part 3, when the insertion checking pins are abutted against the flexible locking lances 72. Each of the links 12 includes a displacement absorbing mechanisms.

Abstract: An inspecting jig 1 for a wire harness for inspecting electric continuity of terminals 5 in a connector 8, comprising a jig body 10 having an opening 24 into which the connector is adapted to be inserted, a continuity checking part 11 adapted to be electrically connected to the terminals of the connector when the connector has entered into the opening, a lever member 12 swingably fitted to the jig body and including a locking portion 32 at its one end 12b which is adapted to be locked with an end face 8a of the connector 8 when the connector has entered into the opening 24, thereby to keep the terminals 5 and the continuity checking part 11 in an electrically connected state, and biasing means 13 for biasing the lever member 12 in a direction in which the locking portion 32 is locked with the end face 8a.

Abstract: A system and a method for direct connection testing of wireless communication devices. The system includes a test connector mechanically and electrically connected to a testing device for insertion into a test port of a wireless communication device. An operator or automatic operation moves the wireless communication device to be tested into a position over the test connector such that the test connector is inserted into the test port of the device. Once inserted, the system can test the performance and operation of the wireless communication device. The leading edge and the outer surface of tip of the connector form a beveled shoulder so that during insertion of the connector into the test port, misalignment of the wireless communication device with the test connector will not prevent proper insertion of the test connector into the test port.

Abstract: A method for testing semiconductor chips, in accordance with the present invention, includes connecting semiconductor chips to a plurality of sockets for testing the semiconductor chips. The sockets are contacted to perform testing on the semiconductor chips. The performance of the sockets are checked after a predetermined number of contacting steps by calculating a level of confidence for each socket. Sockets with the level of confidence exceeding a threshold level are masked to prevent further testing with those sockets.

Abstract: A mechanism for attaching a device interface board (DIB) to a surface of a test head or peripheral includes first and second pulldown mechanisms attached to the surface and a substantially U-shaped actuator. Each of the pulldown mechanisms includes a rotating member coupled to a connecting member via a translation interface. The translation interface converts rotation of the rotating member into vertical movement of the connecting member. The U-shaped actuator has first and second ends respectively coupled to the rotating members of the first and second pulldown mechanisms. Swinging the U-shaped actuator through an arc rotates the rotating members and causes the connecting members to move vertically. A DIB that latches with the connecting members can thus be pulled down against the surface quickly and conveniently, with sufficient mechanical leverage for compressing large numbers of spring-loaded pins.

Abstract: A connector testing system includes a connector having a top section and a housing having a test channel formed therein, an electrically conductive terminal strip disposed within the connector, a portion of the terminal strip disposed within the test channel, and a bridge clip having a body and a test probe connected thereto. The test probe can include an outer surface having a projection and a probe section that is guided by the test channel to the terminal strip when the test probe is inserted into the test channel. The top section of the connector has a shoulder sized and shaped to accept the projection and the connector including a side wall having a guiding portion sized and shaped to contact the probe section when the test probe is inserted into the test channel.

Abstract: With DC constant current applied to an end of one of transparent electrodes by a constant current application terminal, a voltage is measured at an end of a transparent electrode adjacent to the foregoing electrode by a voltage detection terminal, while a common electrode is earthed by applying a brush earth terminal thereto in the vicinity of the foregoing transparent electrode. If the transparent electrode is broken, the DC constant current application circuit detects a voltage saturation state, whereas if the transparent electrode is short-circuited, the DC voltage detection circuit detects variation in the foregoing voltage. A short-circuiting/wire breakage memory circuit stores the detected irregularity of the voltage as defect information, and either wire breakage or short-circuiting is detected on the basis of the defect information.

Abstract: A terminator plug is connected to one coaxial cable connector and a coaxial cable connection tester is connected to the other cable connector. A voltage is applied to the cable's center conductor and a ground to the cable's shield. The center conductor voltage is monitored for open and short faults while the cable adjacent first one and then the other connector are wiggled. The voltage on the center conductor changes if a continuous short or open is present or if such faults intermittently occur. The voltage on the center conductor is monitored by two comparators with one detecting short faults and the other detecting open faults. The outputs of the comparators are combined to generate an OK signal if no faults are detected. If open faults are detected, the signals from the open comparator are clocked into a flip-flop; if short faults are detected, the signals from the short comparator are clocked into a flip-flop.

Abstract: Apparatus and methods for inspecting electrical connections so as to determine the presence of fault connections between magnet wires and power leads are described. The apparatus includes a processing unit, a power supply unit, and a temperature sensing unit. The processing unit includes a programmable logic controller (PLC) having a central processing unit (CPU) and a plurality of input and output slots. The power supply unit includes a power lead connector configured to couple to the motor power leads and a power relay coupled to the PLC. The temperature sensing unit includes infrared thermometers to determine the temperature at the electrical connections between the stator magnet wires forming the motor windings and the power leads. The outputs of the thermometers are coupled to the programmable logic controller (PLC).

Abstract: An improvement to contacts for automatic test apparatus used in the testing of semiconductors. At least two contacts with first and second ends for engaging test points of a device under test (DUT) extend the first end different distances toward the DUT. The test apparatus is arranged to support and carry a DUT at a predetermined rate toward the two contacts. The contact with the greatest first end extension, which contacts the DUT first, has the second end connected to ground and the other contact has the second end connected to a test voltage. Each first and second end of said contacts have support means arranged to permit the ends to deflect a predetermined distance under a predetermined force. This permits the apparatus to engage both ends of both contacts at predetermined contact forces. A plurality of sets of contacts with a given extension and/or a plurality of different extensions for sets of contacts can also be used.

Abstract: A method and apparatus for contact testing a plurality of devices under test, either sequentially or simultaneously. In a first test phase it is determined whether the test probe to each contact is shorted to the most negative rail. In a second phase it is determined whether the test probe has made proper contact, and whether ESD diodes on the devices under test are functional. In both test phases a negative pulse is generated on a tester bus and applied to the contact by the test probe. In the first test phase the positive rail of the device under test is grounded; in the second test phase the positive rail of the device under test is made positive. The negative rail of the device under test is connected to the negative rail of the tester. In both test phases, upon termination of the negative pulse, the bus is restored to a positive voltage which is dependent upon the condition of the contact and the condition of expected input devices at the contact.

Abstract: A continuity sensing pin movable forward and backward has one end for contacting a terminal of a connector. An insertion inspecting pin has one end insertable into a deflection space of a flexible locking arm that locks the terminal in a housing of the connector. An electrically conductive slide is resiliently urged toward the terminal of the connector. The continuity sensing pin has an opposing end contacting a circuit conductor via a resilient member. The circuit conductor can contact the slide. The insertion inspecting pin has an opposing end that can abut against the slide. When the slide is energized by an external power source and the one end of the insertion inspecting pin abuts against the flexible locking arm, the opposing end of the insertion inspecting pin pushes the slide to disengage the slide from the circuit conductor. The circuit conductor is arranged on a circuit board. The circuit board has a through hole passing the opposing end of the insertion inspecting pin.

Abstract: A method and apparatus for contact testing a plurality of devices under test, either sequentially or simultaneously. In a first test phase it is determined whether the test probe to each contact is shorted to the most negative rail. In a second phase it is determined whether the test probe has made proper contact, and whether ESD diodes on the devices under test are functional. In both test phases a negative pulse is generated on a tester bus and applied to the contact by the test probe. In the first test phase the positive rail of the device under test is grounded; in the second test phase the positive rail of the device under test is made positive. The negative rail of the device under test is connected to the negative rail of the tester. In both test phases, upon termination of the negative pulse, the bus is restored to a positive voltage which is dependent upon the condition of the contact and the condition of expected input devises at the contact.

Abstract: An electrical connection testing device is provided with a connector holder (12), first and second probe holders (13, 14) which are successively arranged such that the connector holder (12) and the second probe holder are movable toward and away from the connector holder (12). A pushing mechanism (18) for pushing a receiving surface (14d) of the second probe holder (14) at the opposite side from the connector holder (12) is so coupled with the second probe holder (14) as to be movable toward and away from the second probe holder (14). The second probe holder (14) and the connector holder (12) are moved according to the movement of the pushing mechanism (18), thereby being positioned at testing positions (P1) where probes (16, 17) are inserted into testing holes (1a) of a connector (C) from opposite sides or at retracted positions (P2) where the connector can be taken out of a connector holder (12).

Abstract: An IC card system has, at least, an IC card having a first set of terminals and an external unit having a second set of terminals. The IC card has a detector for detecting a contact condition between the first and second sets of terminals, a controller, and an internal circuit such as an EEPROM. If the detector determines that the contact condition is faulty, the controller completes a given process, and then, stops the operation of the internal circuit. If an access operation to the internal circuit is in progress when the detector finds contact fault, the controller does not stop immediately and continues to complete the access operation, to prevent the writing or reading of erroneous data. The present invention also provides an IC card for the IC card system and a semiconductor IC incorporated in the IC card.

Abstract: In a connector continuity checking device comprising continuity checking pins 38 corresponding to terminals 41 in a connector 32, and lance displacement detecting pins 34 corresponding to lances 44 having elasticity and adapted to lock the terminals, the continuity checking pins 38 are respectively provided at their distal ends with concave terminal receiving portions 55 to receive distal ends of the terminals 41, and the lance displacement detecting pins 34 are respectively provided at their distal ends with concave lance receiving portions 56 to receive distal ends of the lances 44. The concave terminal receiving portions 55 and the concave lance receiving portions 56 are formed in a U-shape or a V-shape in cross section.

Abstract: A method and a testing system for measuring contact resistance of a pin on an integrated circuit. An RC circuit is coupled to the integrated circuit, and a response signal of a testing signal input to the integrated circuit is monitored. The response signal has a time dependent voltage V′. Another time dependent voltage V1 for the testing signal through the RC circuit and a voltage drop across an internal circuit of the integrated circuit is illustrated. Comparing V′ with V1, whether the contact resistance of the pin being tested is allowable can be determined according to the ratings or specification of the integrated circuit.

Abstract: The inspection unit has an engagement structure of a resilient locking finger and a finger deflection inspecting pin. The locking finger is provided in a terminal accommodation chamber defined in a connector housing for locking a terminal received in the terminal accommodation chamber. The finger deflection inspecting pin is provided in the inspection unit for inspecting an incomplete insertion state of the terminal. The finger deflection inspecting pin has a forward end portion formed with a concave surface. The locking finger has an extended forward end with a round head. When the extended forward end portion is received in and abuts against the concave surface, the extended forward end portion is guided by the concave surface due to the engagement structure. The concave surface may have a U-shaped section.

Abstract: A unified test system for testing the performance of a printed circuit board assembly, and a test method using the same. A masking board and a printed circuit board assembly are loaded onto a pin board from which test process connection pins having different height project. The test process connection pins, a power input connector and a signal interface connector are connected with the printed circuit board assembly and pins installed on the printed circuit board assembly. Thereafter, in-circuit-test signals are generated to test the printed circuit board assembly. Only function-circuit-test connection pins among the test process connection pins are connected with the printed circuit board assembly, and functions between the printed circuit board assembly and a head disk assembly are tested. Finally, results of the in-circuit-test process and the function-circuit-test process are displayed.

Abstract: The connector checker has a main body with a block accommodating a plurality of detection pins movable forward and backward in the block each for detecting an incorrect insertion state of a terminals which is inserted in a terminal accommodation chamber of a connector by inserting the detection pin into the terminal accommodation chamber. The checker main body has a plurality of through holes vertically elongated in section and a plurality of through holes horizontally elongated in section, and the vertically elongated through holes are disposed to partially overlap with the horizontally elongated through holes to define a plurality of rectangular openings. Through one of the rectangular openings, the detection pin is inserted so as to adequately limit vertical and horizontal movements of the detection pin within the terminal accommodation chamber.

Abstract: A test fixture including a fixture body and a self-centering or floating connector body positioned adjacent to a first side of the fixture body. The connector body is made of a polymeric material. Spaced apart sleeves extending through the fixture body. A first end of each one of the sleeves includes a threaded portion engaged with a corresponding threaded portion in the connector body. Each one of the sleeves defines a respective longitudinal axis. A head is attached to a second end of each one of the sleeves. Each head includes a tapered portion engaging a tapered seat provided on a second side of the fixture body. An alignment pin extends axially through each one of the sleeves along the respective longitudinal axis. Each pin includes a shaft, a flange attached to the shaft and an end protruding from the connector body. A first spring member is axially carried by each pin. Each first spring is compressed between the flange of the respective pin and the fixture body.

Abstract: A method and apparatus for diagnosing excessive resistance in an electrical harness of an internal combustion engine. Voltage is applied from a power source (24) through contacts (30a, 30b, 32a, 32b, 34a, 34b, 36a, 36b) and harness leads (26 and 28) to an electrical assembly (20). Electrical assembly (20) includes the load of a first electrical component (23), and by switching means (25) includes the electrical load of a second electrical component (21). An electronic control module (22 or 38) controls switching means (25) and compares the voltage drop across electrical assembly (20) when the second electrical component (21) is switched in or out. By comparing the voltage drops ECM (22 or 38) can determine if there is excessive resistance in the contacts (30a, 30b, 32a, 32b, 34a, 34b, 36a, 36b) or leads (26 and 28).

Abstract: A connector contact fingers of a testing rig which overcomes the co-planarity, contact and alignment difficulties in the testing procedure of integrated circuit packages. The connector comprises a tongue extension to the ends of the fingers to increase the surface area from which contact can be made with the device lead, a lever extension to the retainer along one side of the fingers to prevent deflection of the fingers, and a shoulder structure in the connector which acts as an adaptor to secure a flexible printed circuit board to the legs.

Abstract: An apparatus is provided to facilitate connection inspections for a high tension cord 1. The apparatus includes a contact element that can be brought into contact with a distributor terminal T2. The contact element includes elastic elements 31b to 34b that are constructed to be displaceable between an enclosed state where they enclose the distributor terminal T2 to establish an electrical connection therewith and an open state where a high tension cord 1 can be mounted and detached. Since the distributor terminal T2 can be connected electrically without precisely positioning it, connection inspections for the high tension cord 1 can be made easier and, consequently, automation and labor-saving can be made possible.

Abstract: A detector and a variable signal generator are coupled so that one or more specific changes in the output of the detector will cause a change in the characteristics of the generated signal. This change in signal characteristics is non-transient, the change remaining in effect until such time that another change in the detector output causes another change in the signal characteristic. The system can provide remote-end positive wire identification with no additional instrumentation at the remote end. When this invention is embodied in an already existing piece of test equipment, such as a multimeter or time domain reflectometer, there need be no additional hardware instrumentation at either end.

Abstract: A connector receiving member and a test area are provided in a relatively shiftable manner from an engaged state in which a test area engages in a continuity testable manner to a separated state in which the test area separates from a connector housing. In addition, a drive mechanism is provided for relatively shifting the connector receiving member and the test area in relation to an engaged state and a separated state. The drive mechanism is controlled by a control mechanism. With this mechanism, a connector receiving member and a test area relatively shift to the engaged state upon insertion of the connector housing into the connector receiving member while the connector receiving member and the test area relatively shift to the separated state after a predetermined time period.

Abstract: Apparatus and method for testing the components and interconnections of a circuit board while the circuit board is, normally, operatively connected in a system. The circuit board contains a plurality of integrated circuits with at least one of the integrated circuits including interface circuitry for interfacing the circuitry on the circuit board to the rest of the system. The circuit board includes testing circuitry for: (a) selectively testing the circuits contained on the circuit board, other than its interface circuits; and (b) selectively testing the interface circuits and their interconnections. The method of the invention includes placing the interface circuitry in a first state for isolating the circuitry on the circuit board from the rest of the system and testing the circuitry on the circuit board, other than the interface circuitry; and placing the interface circuitry in a second state and testing the interface circuitry and its interconnections.

Abstract: An electrical junction block as used in an automobile electrical system has a pair of ports for removably receiving two separate connectors into connection with circuit traces of a printed circuit board contained within the junction block. The first port is configured to receive a wiring harness connector associated with one or more electrical devices into normal operating connection with the junction block. The second port is configured to removably receive a connector from a continuity tester such that terminals of the connector contact the circuit traces so as to be in electrical contact with the wiring harness connector. Accordingly, inserting the tester connector into the second port after the wiring harness connector is operatively installed in the first port puts the tester in connection with the electrical system via the circuit traces and allows the tester to perform a continuity check of the device without disconnecting the wiring harness connector.

Abstract: A series of modular plugs insertable into a row of connector sockets mounted on a circuit board to be tested are secured to a specially designed support structure which enables the plugs to be simultaneously mated with the sockets to thereby substantially reduce the required test connection time and to enable the plugs to be coupled with and uncoupled from the sockets without subjecting the plug cables to appreciable handling stress. In one embodiment thereof the support structure may be manually moved toward the sockets to effect the coupling of the plugs with their sockets, and a movable latch plate member is carried by the support structure for use in simultaneously unlatching the inserted plugs from their sockets. In another embodiment thereof the support structure is stationarily secured to a specially designed test stand assembly which is operable to move the circuit board toward the stationary plugs to effect the desired plug/socket test interconnection.

Abstract: In a connector examination instrument, a connector support member and an examination instrument body are provided for movement toward and away from each other, and examination pins are slidably mounted within the examination instrument body, and are spring biased toward the connector support member. Each of the examination pins includes a conducting contact surface for contact with an associated metal terminal within a connector, and an incomplete insertion-detecting projection for insertion into a flexure space for an elastic retaining piece portion for retaining the metal terminal. Each of the examination pins comprises a shank, having an exposed distal end serving as the conducting contact surface, and an insulative shaped member which is fixedly secured to the distal end portion of the shank, and has the incomplete insertion-detecting projection.

Abstract: An apparatus and method for testing the integrity of an electrical connection (222) to a device (205) using an onboard controllable signal source (300). The onboard controllable signal source provides a test signal output (310) via an electrical signal path (305) without having to directly probe the signal path or the electrical connection. The test signal has a selectable frequency that can be selected to be harmonically unrelated to any other signal from the device. A capacitive sensor (215) positioned over the device (205) and the connector (225) detects the energy of the test signal coupled through the electrical connection. The sensor compares the detected amplitude of the test signal to a threshold value and the outcome of the comparison is indicative of the integrity of the electrical connection.

Abstract: The present invention provides an inexpensive and reliable circuit-board inspection apparatus and method applicable to a densely wired circuit board. A sensor module 50 is disposed on a pad section 38 on an inspected circuit board. The sensor module 50 is formed by integrating four sensor units 52, 54, 56, and 58 together. Each sensor unit is capacitively coupled to a plurality of corresponding pads so that a signal can be independently obtained from each sensor unit. By selecting a pad 36b of a pad section 36 and a sensor unit 54 and providing a predetermined signal between them to inspect the continuity, it can be determined whether a printed pattern 34x is open-circuited between a pad 38 b and a pad 38x. This invention enables the continuity of dense complicated and irregular printed patterns to be inspected accurately and inexpensively.

Abstract: An electromagnetic probe is integrated within an integrated circuit or mounted within an IC package to provide a capability for testing continuity between the integrated circuit and a substrate to which the integrated circuit is mounted. In a first embodiment, capacitive test probes are integrated within the integrated circuit, underneath bonding pads. In a second embodiment, Hall-effect devices are integrated within the integrated circuit underneath bonding pads. In a third embodiment, an inductive loop is integrated within the integrated circuit underneath bonding pads. In a fourth embodiment, an IC package assembly includes an internal capacitive test probe for electrical continuity testing. An internal shield may also be used as a capacitive test probe. In a fifth embodiment, an IC package assembly includes an inductive loop within the package for electrical continuity testing.

Abstract: A method and apparatus for contact testing a plurality of devices under test, either sequentially or simultaneously. In a first test phase it is determined whether the test probe to each contact is shorted to the most negative rail. In a second phase it is determined whether the test probe has made proper contact, and whether ESD diodes on the devices under test are functional. In both test phases a negative pulse is generated on a tester bus and applied to the contact by the test probe. In the first test phase the positive rail of the device under test is grounded; in the second test phase the positive rail of the device under test is made positive. The negative rail of the device under test is connected to the negative rail of the tester. In both test phases, upon termination of the negative pulse, the bus is restored to a positive voltage which is dependent upon the condition of the contact and the condition of expected input devices at the contact.

Abstract: A testing unit is provided for mounting on a connector testing device for testing a connector which includes a plurality of metal terminals fastened to the connector by a lance system. A probe pin for testing conductivity is held by a molded resin slider having a pair of electrodes. The slider is integrally formed with a probe pin which holds a protrusion for testing, whether the fastening of the lance is complete. Positioning a lance testing member or protrusion relative to the lance can be achieved without providing a rotation-free stopper of the probe pin. In addition, individual failure testing can be achieved compared with the case which holds all of the probe pins. Furthermore, damage to the lance resulting from the material selection can also be avoided. Furthermore, a better connection between a probe pin and a lead wire is also provided when displacing probe pin of a connector testing device relative to the position of a lead wire.

Abstract: A hot docking system and method for managing and detecting hot docking of bus cards. The hot docking system detects the load impedance at the power pins of the bus connector to determine whether a card has been inserted. When insertion is detected, bus activity on the connector is ceased until the card is completely inserted which is indicated by signals present on card detect pins which are mechanically shorter that the bus signal pins and thereby provide this insertion signal after all other connections are complete. The power supply pins are mechanically longer than the bus signal pins thereby providing an early indication that a card has been inserted. On removal of the card, the card detect pins disconnect before the bus signal pins or the power supply pins, signaling the system to halt bus activity but maintain power on the connector until the card is completely removed.

Abstract: An apparatus for detecting a trouble location in a wire harness can easily detect a location of any trouble such as breakage or short circuit in electric wires in a wire harness and in particular can detect the trouble location by way of a simple structure utilizing a portion with a shield function. In the detecting apparatus, a pulse signal is transmitted in electric wires (2) in a wire harness (1), in which a trouble location is to be detected, and in a sensing line juxtaposed along the electric wires (2) at their ends. A measuring device (20) receives a reflected wave from a transmitted wave and measures a difference in time between the transmitted wave and the reflected wave. A distance from a transmitting end point to a trouble location point is determined in accordance with the difference in time and a signal propagation velocity. Each electric wire (2) in the wire harness (1) is a single wire having no splice portion and a shielded wire having a conductive shield sheath (10).

Abstract: A contact resistance check circuit and method for verifying that a sufficient electrical connection is established between a source and a sense lead of a Kelvin connection. The circuit includes a microprocessor for driving a transformer that is connected to the source/sense probe (i.e., contact resistance) with an input pulse. The input pulse is altered in relation to the magnitude of the contact resistance to produce a check pulse. A comparator is used to compare the check pulse with a threshold voltage and for generating a fault indication signal. A flip flop then stores the fault indication signal so that the fault indication signal may be monitored by the microprocessor.

Abstract: Apparatus for electrically testing a connector includes a plurality of contact posts (i.e., connector pins) partially surrounded by a sidewall defining an opening adjacent ends of the posts. In one embodiment a translator fixture is interfaced with a plurality of test probes. The translator fixture has a plurality of spaced apart translator plates and holes aligned in the plates for containing and supporting translator pins extending through the plates for positioning the translator pins for direct contact with and engagement by conductive pins of a guide block assembly mounted on the outermost one of the translator plates. The conductive pins are slidably mounted in the guide block assembly. The conductive pins extend from the guide block assembly so as to directly contact, be substantially coaxial with, and engage the distal ends of the contact posts.

Abstract: A male terminal inspecting tool of a connector (11) has a connector holder (2), a pin receiver (3) which is movably arranged at a position opposite to the connector holder (2) and has a conductive pin (4) inside it, and an operation lever (6), characterized in that a hole or slit (15) having the smallest dimension into which the front end portion of the male terminal (19) of the connector (11) can inserted is provided in the vicinity of the conductive pin (4) in the pin receiver (3).

Abstract: A sensor is provided for automatically detecting the presence or absence of an electronic device which interfaces with other devices via an information signal. The sensor comprises a receiving connector which receives a mating connector associated with the electronic device to electrically and physically connect the device to the sensor and to another device. The receiving connector includes a terminal to which the information signal is applied. The sensor also comprises a sensing circuit connected to the terminal of the receiving connector for detecting whether the information signal is present at the terminal. The sensing circuit generates an output signal which indicates when a mating connector is received within the receiving connector, and thus whether the electronic device is present, in dependence upon whether the information signal is detected at the terminal.