Abstract: A method for detecting a trouble location in wire harnesses can easily detect a position of trouble such as breakage, short circuit, or the like in the wire harnesses without bringing enlargement and complication into the wire harnesses. This method includes the steps of: setting each of electric wires (2) in a main line part (4) and a branch line part (5) of a wire harness (1) as a sensing line, the wires (2) being juxtaposed to each other in the respective parts (4, 5); transmitting a pulse wave in a measuring line of a trouble electric wire in the wire harness and the sensing line corresponding to the measuring line at their ends by a pulse generating unit (11); receiving a pulse wave reflected at a trouble point and measuring a difference in time between the transmitted pulse wave and the reflected pulse wave by a synchroscope (12); and computing a distance from a measuring point to the trouble point in accordance with the difference in time and a pulse propagation velocity by a computing unit (13).

Abstract: A test method and apparatus for use with a plurality of magnetically sensitive elements having a fixed relative physical sequence, and with a plurality of electrical lead sets through each of which the magnetic field being experienced by a respective one of said magnetically sensitive elements can be sensed. The method includes the steps of placing the magnetically sensitive elements in a variable magnetic field and determining a respective magnetic field setting at which each given one of the lead sets indicates the presence of a magnetic null. The results of such a test can be used to determine which lead sets are connected to which magnetic elements, and/or to determine whether at least one lead set is mis-connected.

Abstract: A contact resistance check circuit and method for verifying that a sufficient electrical connection is established between a source and a sense lead of a Kelvin connection. The circuit includes a microprocessor for driving a transformer that is connected to the source/sense probe (i.e., contact resistance) with an input pulse. The input pulse is altered in relation to the magnitude of the contact resistance to produce a check pulse. A comparator is used to compare the check pulse with a threshold voltage and for generating a fault indication signal. A flip flop then stores the fault indication signal so that the fault indication signal may be monitored by the microprocessor.

Abstract: A connector examining system includes a mechanism to move a terminal into a proper insertion position and to determine if the terminal is in the proper insertion position. The system includes a probe holder, a connector holder, and terminal pushing member. Resilient members assure that the connector is moved to a position where the terminal is properly positioned. A connector has its orientation corrected by a tapered surface of the probe holder. The connector housing includes a lance which projects into a cavity and is elastically deformable toward a lance flexure space by the metal terminal inserted into the cavity. A lance of the connector assures that the terminal is retained in the connector. The metal terminal optionally has stabilizers positioned on opposite sides of the lance. A check pin of the probe holder, which is insertable into the lance flexure space, optionally has a front end check portion pivotally movable toward the stabilizers.

Abstract: To judge with certainty whether the condition of attachment of each metal terminal is proper, a method and apparatus are provided in which a thinned distal end portion of a lance check pin having guide portions contacts an inner surface of a lance flexing space. The lance check pin, when inserted into the lance flexing space, is kept in a proper posture by the guide portions. Therefore, misjudgment of the terminal position is avoided.

Abstract: A wire connector (2) comprising a cover (8) and a body (4) for carrying a wires (84) therebetween. A U-shaped connection element (6) includes a first leg (48) for engaging a wire (84) positioned within the body (4) and a second leg (52) sharpened to sever the end of the wire (84), wherein the body (4) and the cover (8) include co-operating latch structure (30,32), to define an open position, where the wire (84) may be inserted into the connector (2) and a crimped closed position where the body (4) and the cover (8) are fully telescoped together whereby the excess end of the wire (84) is severed and the connector element (6) engages at the wire at the end connection slots (50). In the closed position, the connection element (6) is accessible in a manner that enables a test probe (78) to engage the connection element (6) through cover means (72) which is provided in a normally biased closed position and that is retained in the closed position without the need for latch means.

Abstract: One or more detection circuits are provided for determining the operation of a motherboard prior to placing a microprocessor upon that motherboard. The detection circuit determines a particular way in which the motherboard is configured by ascertaining, for example, a power supply voltage and a clocking frequency output from the motherboard. A probe is used, in combination with the detector circuits, to determine motherboard operation at a socket to which, for example, a microprocessor can be coupled. Jumpers or switches upon the motherboard can be readily found by activating a switch and looking for a response upon the detection circuit output. If a response is not found, the jumper or switch is returned, and another jumper or switch is activated. Once the jumper or switch used for changing system clock speed and/or processor voltage is located, then a display is read as to those parameters to ensure the parameters match the processor specification.

Abstract: A device for testing a connector which has a plurality of terminals, each in a terminal chamber. There is a flexing space adjacent each chamber and a resilient tongue, biased into the chamber, is moved into the space as the terminals are inserted and springs out of the space when they are fully within the chambers. The device has a plurality of testing units attached within a body which is movable toward and away from the connector. If at least one of the terminals is not fully inserted into its chamber, the body is moved backward away from the connector so that contact between the units and the terminals is not made.

Abstract: The invention relates to switching apparatus having a pair of input terminals (102, 104) and 2.sup.P pairs of output terminals (106a, 106b). The switch comprises p rows of switches K.sub.i,j with the ith row having 2.sup.i unit switches. It also comprises a control circuit (108) which enables the state of all the switches in a given row to be controlled together, thereby enabling the pair of input terminals to be connected to any pair of output terminals.

Abstract: A new structure of a test apparatus (tester) for detecting shorts and opens of a printed wiring board and an associated automatic test method. The tester has means for injecting signals into conductors of a printed wiring board under test (BUT) and a large number of integrated solenoid-actuated probes which are arranged in a two-dimensional array for sampling signals from the conductors of the BUT. The signals are sampled from the conductors by the integrated solenoid-actuated probes in a row by row scanning sequence following a grid pattern of the BUT. Each of the probes needs only to sample signals from the conductors in a small portion of the BUT.

Abstract: Apparatus and method for testing the connection (i.e. solder joint) between an input/output (I/O) pin of an integrated circuit and a conductive trace of a printed circuit board (PCB). The internal circuitry of the integrated circuit is isolated from each I/O pin, and a first voltage source is coupled to each I/O pin via a respective pull-up load resistor. A tester circuit is coupled to each conductive trace of the PCB and compares the voltage V.sub.T thereon with a high threshold level (HTVL) and a low threshold level (LTVL) to test for a proper connection. Voltage V.sub.T is derived for an I/O pin under test when a resistive element, which is part of the tester circuit, is operatively coupled between the corresponding conductive trace and a second voltage source. If V.sub.T is below the LTVL or above the HTVL, the I/O pin is improperly coupled to the conductive trace. If V.sub.T is between the LTVL and HTVL, then the voltage on each of the other traces is compared to the HTVL.

Abstract: The invention relates to apparatus for electrically testing an electrical connection harness (10). The apparatus comprises an electrical signal generator (24) and a measuring device (22) which are connected by two switches (26, 28) to branch lines (16) of the harness via "subscriber" cards (30) which simulate the states of the components that are to be connected to the branch lines. A control unit (32, 38) enables the switches (26, 28) and the "subscriber" cards (30) to be controlled to simulate different configurations of the components (sending, receiving, normal load, short circuit, open circuit).

Abstract: A method for estimating current or detecting defects in an interconnection by monitoring current change of the interconnection. A radiation beam such as a laser, electron or ion beam is irradiated to a subject region to be observed while scanning points of the subject region. Decrease of the supply current during the scanning is detected in the power supply line. The amount of decrease is approximately proportional to the current flowing originally. The value of the current in the interconnection or a defect existing in the interconnection can be estimated or found from the decreased amount. One of or the combination of selective scanning, threshold selection and thin film deposition makes it possible to apply this method to an actual device.

Abstract: One of two connector housings adapted to be fitted with each other has a slider with a cam section. The second connector housing is formed with a slider pressure protrusion. When the connector housings are fitted with each other, the slider is moved against the force of a spring as the slider pressure protrusion applies a sliding pressure to the cam section. The slider is in the original position thereof when the connectors are not fitted, comes away from the original position in the process of the connector housings being fitted with each other, and returns to the original position upon complete fitting of the connector housings. The first connector housing and the slider each include a fitting detection terminal adapted to fit each other when the slider is in the original position and come out of contact from each other when the slider leaves the original position.

Abstract: A connector conduction tester includes a conduction testing section and a connector holding section which are arranged on a stand frame and an operating section for moving the conducting testing section towards the connector holding section, in which a conduction testing operation is carried out with testing pins of the conduction testing section abutted against terminals in a connector. In the tester, the stand frame has a spacer supplying hole which is confronted with a spacer inserting hole formed in a connector set in the connector holding section, and spacer pushing device located below the spacer supplying hole.

Abstract: An electronic scale including a fault-detecting electronic display module which can detect a crack in a display, a separation in a cable connected to the display, and a separation between the cable and a connector on a printed circuit board. The fault-detecting electronic display module includes the display, which displays a weight of an object, the cable, and a fault-detecting line extending around at least a portion of the perimeter of the electronic display and through the cable. The electronic scale also includes a load cell for sensing the weight of the object, and a controller coupled to the load cell and to the fault-detecting display module.

Abstract: A system for locating corresponding ends of a patch cord used to conduct a signal between a first receptacle and a second receptacle. The system includes a cable having a main signal transmission means and a pair of electrically conductive members extending along the length of the cable. A first connector is attached to one end of the cable and a second connector is attached to the other end of the cable. The first and second connectors are adapted to removably mate with the first and second receptacles, respectively. The first connector has a pair of leads associated therewith. Each of the leads is connected to and corresponds to one of the conductive members. An electrical indicator is attached to the first receptacle. The indicator is electrically connected to the pair of leads when the first connector is mated to the first receptacle. A power supply is used to apply current through the conductive members so that upon application of the current, the indicator is activated.

Abstract: A connector housing (22) before insertion of a terminal lug thereinto is set in an inspection chamber (7) on a connector inspection device (A), so that a movable pin (9) of an inspection pin (8) is located inside a front end portion of the terminal-accommodating chamber in the connector housing. With the terminal lug thereafter inserted into the accommodating chamber, the movable pin is moved back against a spring (11) so that, when the terminal lug has been fully inserted, the movable pin comes into contact with a stationary pin to energize an inspection electric circuit (18). Thus, the full insertion of the terminal lug (C) can be known. Hold on the terminal lug is then released to allow the terminal lug to retract by a distance corresponding to a clearance (D) present between an edge of a locking portion (28) of the terminal lug and a locking projection (24a) of a resilient locking piece (24), so that the movable pin is now separated from the stationary pin to shut off the inspection electric circuit.

Abstract: A test socket is provided as part of a high temperature electromigration test system to allow the prediction of median time to failure to temperatures in excess of 450.degree. C. of VSLI interconnects.

Abstract: A method for detecting an electrical connection between an antenna system and a receiver for a motor vehicle, the receiver having an automatic gain control with a variable impedance and a PIN diode connected therebetween, includes the steps of increasing the variable impedance of the automatic gain control, measuring signal strength of a signal received from the antenna system, decreasing the variable impedance of the automatic gain control, measuring the signal strength of the signal receiving from the antenna system, correlating the signal strength to the variable impedance to generate a correlation, and determining whether the antenna system is electrically connected to the receiver based on the correlation of the signal strength to the variable impedance.

Abstract: An inspection apparatus is designed for screening electric connectors, each having a housing, terminal chambers arranged in the connector housing for containing and holding respective metal terminals and accessories including a clip and a terminal holder. The apparatus comprises a connector support and an inspection apparatus main body releasably connectable to the connector support. The inspection apparatus main body is provided with a plurality of test pins urged forward by respective springs for electric connection with an electric test circuit. The connector support is provided with an accessory detection mechanism designed to allow the connector support to approach the inspection apparatus main body in the presence of an accessory to be detected and prevent the connector support from approaching the inspection apparatus main body in the absence of the accessory.

Abstract: A system for monitoring the integrity of electrical connections includes a transformer with its primary coupled across a dual split contact arrangement and the secondary coupled to both an energy source and a monitoring circuit. When the contact condition is made the secondary impedance reaches a given value which results in a low output indicated by the monitoring circuit. The energy source is preferably a radio frequency oscillator driving the transformer secondary, which is also connected to a monitoring circuit. Preferably, the output from a current reference circuit, coupled to the secondary of the transformer, is coupled to the energy source circuit and the monitoring circuit so as to produce a given output in the monitoring circuit when the contact condition is made.

Abstract: A terminal assembly tester comprises a contact probe module having electrical contact probes. The contact probes have a contact surface biasable against tips of electrical terminal mounted in cavities of a connector housing. The connector housing comprises integrally moulded resilient locking lances that are separated from housings walls by a slot. Extensions of the contact probes are insertable into the housing slots when contacting the terminal tips. If a terminal is not fully inserted into a cavity, the resilient locking lances are biased into the slot and prevent insertion of the contact probe tip thereinto thereby ensuring that the contact probe does not electrically contact the terminal. The latter thus ensures that even almost completely inserted terminals will not be electrically contacted and thus provides for a reliable testing mechanism.

Abstract: A method for checking wire bonding result of a ball grid array (BGA) package is disclosed. An electroconductive metal layer of gold or copper is grounded on a chip bonding portion of a printed circuit board (PCB) of the BGA package as well as on a passage extending between the chip bonding portion and the gate of the PCB. After a wire bonding step, a probe and a capillary of a wire bonding checking system contact with the gate and with a semiconductor chip respectively. Thereafter, an electric current is sent to the BGA package from the checking system so as to check whether the BGA package sends the electric current therethrough. When there is neither a lift bond nor a missing wire in the BGA package, the package will send the current. However, when there is either a lift bond or the missing wire in the BGA package, the package will not send the current.

Abstract: An IC socket for mounting an IC package on a printed wiring board includes a socket body and pin terminals. The socket body has a mount portion for the IC package. The mount portion has a flat bottom wall. The pin terminals are arranged in the bottom wall at predetermined intervals lengthwise and widthwise. Each pin terminal has a contact portion, on the upper surface of the mount portion, which is brought into contact with a corresponding terminal of the IC package mounted on the mount portion, and a connecting portion, on the lower surface of the mount portion, which is connected to a corresponding pattern on the printed wiring board. A press member having elasticity which makes the press member press an upper surface of the IC package mounted on the socket body to press each terminal of the IC package against the contact portion of a corresponding pin terminal of the socket body is arranged on the socket body.

Abstract: A connector terminal checking device of the present invention comprises a base plate, a checking body movably mounted on the base plate, and a connector holder fixed onto the base plate, wherein the checking body further comprises a plurality of check pins aligned facing toward the connector holder, and the connector holder is provided with a terminal holding wall formed with a plurality of terminal position regulating sections, each for receiving a corresponding one of a plurality of terminal accommodating chambers of a connector to be checked, and also provided with a pair of connector sustainers shiftably urged by way of a resilient stuff, wherein by shifting the checking body toward the connector installed in the connector holder to bring the terminals in the connector into contact with the check pins, the terminals improperly inserted in the accommodating chamber are abutted against the terminal position regulating section and shifted to the properly inserted position.

Abstract: The connector checking device of the present invention comprises: a connector holding member 6, and a checking device main body 3 detachably mounted from the connector holding member, wherein the main body is further provided with a plurality of check pins 11 connected with an electric circuit and urged toward the connector holding member by a coil spring 12, and a spacer removing piece 14 formed with a hook 14c which is also urged toward the connector holding member by another coil spring 15.

Abstract: A terminal-in-connector checking device consists of a mount (51), a connector holder (54) fixed on the mount for holding a connector in position, a continuity checking member (53) for terminals in the connector, provided on one side of the connector holder and movable to and from the connector holder, a terminal pressing member (1) provided on the side of the connector holder opposite the first-mentioned side, movable to and from the connector holder and including a pressing portion (2) for advancing into the connector and moving a terminal therein to fully-inserted position when the terminal pressing member (1) is moved to the connector holder, and an operating member for moving the checking member and the terminal pressing member to and from the connector holder. A terminal, if in incompletely-inserted position, is automatically moved to fully-inserted position to be checked for continuity.

Abstract: A connector testing device of the handy type which is capable of easily examining the condition of insertion of connection terminals in a connector. This device includes detection pins each including a tip end portion extending forwardly from a body portion thereof, and a detection portion which extends rearwardly from the body portion, and is smaller in cross-sectional area than the body portion. The detection pin is movable forward and rearward, and is normally urged forward. The device also includes a spacer having insertion holes each allowing the body portion to pass therethrough, the spacer being movable upward and downward, and being normally urged upward. In an upwardly-urged position of the spacer, the insertion hole allows the associated body portion to pass therethrough.

Abstract: The invention comprises a device provided with a position-setting surface and relatively movable stopping member which together hold the housing 31 of a waterproof electrical connector in a predetermined inspecting position. Pressing pieces are integrally provided on the position-setting surface or the stopping member to push in any waterproof plug associated with a terminal in the direction in which the terminal is inserted into the terminal accommodation chamber.This arrangement ensures that a semi-fitted terminal is pushed into the correct position during an inspection process.

Abstract: An inspection device for determining the integrity of electrical circuits in a connector having one or more electrical terminals therein. The test device carries probes, corresponding in number and location to the terminals, and the probes and the terminals are at an angle to each other so that, when in test position, the tips of the probes contact a portion of the terminals other than that at which a mating connector would be inserted. This eliminates the possibility of distortion or wear on fragile connecting surfaces.

Abstract: Disclosed is a system that determines whether pins of electrical components such as connectors, switches, and sockets are present and properly soldered to a printed circuit board. The system uses an oscillator which supplies a signal, typically ten kilohertz (10 kHz) at 0.2 volts, to the pin under test. A conductive electrode is placed on top of the component. The electrode is connected to a current measuring device. Another pin of the component is connected to a common signal return.

Abstract: An inspecting device body (1) including an input terminal group (23), an output terminal group (24), a connection terminal group (25), a signal output portion (38), a signal input portion (39), first and second memory portions (40, 41), a comparing and determining portion (42), a lighting and flashing drive portion (44), and a control portion (48) is electrically connected to a work table (2) including an input connector (4), an output connector (5), LEDs (6), an earth plate (7) by one flexible printed wiring board (9), thereby reducing the rejection rate of wiring harnesses at assembly on an assembly line, allowing the final inspection of the wiring harnesses for acceptance or rejection, and improving assembly efficiency.

Abstract: A device for testing for disconnection of bus lines of a semiconductor device includes switches having current ratios formed in a geometric series connected to ends of a group of n of the bus lines. At least one testing electrode is connected to the switches and at least one power electrode is connected to the group of n of the bus lines. A disconnection of one or more of the bus lines can be determined according to a current flowing through the testing electrode.

Abstract: In a spacer detection structure of a connector having: an oval connector housing (2); a plurality of connector terminals (32) housed in the connector housing; and a terminal fixing spacer (4) engaged with the connector terminals when the connector terminals are fully inserted into the connector housing and formed with a curved base wall portion (5) along an oval shape of the connector housing, the curved base wall portion (5) of the terminal fixing spacer (4) is formed with a recessed portion (10) having a flat bottom surface (9) brought into contact with at least one detection plate (8) of a connector fixing jig (7) for inspecting whether the terminal fixing spacer is full inserted into the connector housing. Therefore, it is possible to securely inspect an imperfect insertion of the oval terminal fixing spacer (4) into the oval connector housing (2), without increasing the manufacturing cost of the connector fixing jig (7) of the inspection instrument.

Abstract: A method and structure for verifying interconnect structure of an FPGA device after programming. In a preferred embodiment, after programming, a single wire segment on each net of a layout is pulled down to a low reference voltage. Voltage levels on all wire segments of the device are then captured and shifted out of the device for comparison to the expected values. Low voltage levels on segments expected to remain high reveal short circuit flaws. High voltage levels on segments expected to remain low reveal open circuit flaws.

Abstract: A connector examining system includes a mechanism to move a terminal into a proper insertion position and to determine if the terminal is in the proper insertion position. The system includes a probe holder, a connector holder, and terminal pushing member. Resilient members assure that the connector is moved to a position where the terminal is properly positioned. A connector has its orientation corrected by a tapered surface of the probe holder. The connector housing includes a lance which projects into a cavity and is elastically deformable toward a lance flexure space by the metal terminal inserted into the cavity. A lance of the connector assures that the terminal is retained in the connector. The metal terminal optionally has stabilizers positioned on opposite sides of the lance. A check pin of the probe holder, which is insertable into the lance flexure space, optionally has a front end check portion pivotally movable toward the stabilizers.

Abstract: A method for measuring electrical characteristics of an electrical device having a conductive structure associated therewith involves the sequence of steps as follows: First, employ a low energy electron beam to charge all conductors on the surface of the device. Expose individual conductors to a focussed low energy electron beam serially. Make measurements of an induced current signal when individual conductors are exposed to the focussed electron beam. Analyze induced current measurements derived from the individual conductors. Then determine electrical characteristics of the device based on the analysis. A charge storage method and three capacitive test methods for defect detection and methods for shorts delineation are described.

Abstract: A connector formed with a first portion on the connector positioned differently according to a kind of the connector. The first portion is, for example, the forward end of a terminal or a cutout formed on the housing of the connector. At least one multicontact switch pin is fixedly arranged on a carriage base in a direction such that the probe pin of the multicontact pin extends towards the first portion. The switch pin has at least two contacts and a probe pin projecting outwardly of the multicontact switch pin. Each of the contacts is connected to a corresponding test circuit. The probe pin is adapted to move into and/or out of contact with the contacts when the probe pin is pushed inwardly into the multicontact switch pin. The carriage base is moved by a predetermined distance towards the connector to allow the probe pin to engage the first portion so that the probe pin moves into and/or out of contact with said contacts.

Abstract: The apparatus for testing electrical switch matrices includes a potential selector (30) for receiving and applying a voltage (28) to a predetermined input (101-106) of each of the plurality of electrical switches (12), a controller (15) for receiving and applying signals to the plurality of electrical switches (12), and a combiner (36) responsive to an output (22) of each of the plurality of electrical switches (12). The controller (15) selects electrical paths (16) associated with each of the switches (12) which are in communication with the predetermined inputs (101-106) of each of the switches. The output (38) of the combiner (36) indicates whether at least one of the selected electrical paths (16) failed.

Abstract: To prevent entry of contaminants into a craft unit, each of a telephone signal connector (RJ11 jack) and DIN-type digital signalling link connector is replaced with a sealed, multi-pin plug/receptacle type connector which integrates the routing of both telephone communication signals and digital communication signals between the craft unit and an external device. When stored in a storage and battery-charging station, the craft unit is maintained in a communication-ready state, by providing each of the battery-charging holder and the portable craft unit with an additional multi-pin interconnect arrangement, that contains a charging path for the craft unit's internal battery, and a multi-pin signalling path. This multi-pin interconnect arrangement contains both a set of communication signalling pins and a set of terminal pins through which the internal battery of the portable craft unit is charged.

Abstract: To inspect the conduction of terminals of a connector having a rear terminal holder (65) without damaging the rear terminal holder, the connector (49) to be tested is first fitted to a connector support member (39) of the terminal conduction test jig (33); and then a test body (41) of the terminal conduction test jig is moved toward the connector support member (39) to first engage the rear terminal holder (65) with the connector housing (55) normally and then inspect conduction of the terminals (35) of the connector (49). That is, a fitted contact projection (85) of the test body (41) is inserted into the connector housing (55) to engage the rear terminal holder with the connector housing normally; and after that the test body (41) is further moved toward the connector support member (39) to bring terminal conduction test pins (89) into contact with the terminals (35) for terminal conduction test.

Abstract: An inductive amplifier for identifying and tracing wires includes a comb filter for nulling out 60 Hz. power line "hum", as well as harmonics of 60 Hz. The inductive amplifier includes a probe for sensing an input signal. The comb filter includes a time delay circuit for providing a delayed output signal that is delayed by 16.67 milliseconds, or one 60 Hz. cycle, compared to the input signal. The comb filter also includes an inverter circuit for providing an inverted output signal that is 180 degrees out of phase with the input signal. The comb filter further includes a summer for summing together the delayed output signal and the inverted output signal to null out harmonic components of 60 Hz. while passing other signals to the output of the comb filter. The nulling method may also use digital processing techniques rather than discrete circuit components.

Abstract: An inductive amplifier for identifying and tracing wires includes an automatic gain control feature for sensing the connection of butt set leads to the inductive amplifier and reducing the gain of the inductive amplifier in such instances to reduce the likelihood of instability or oscillations. The inductive amplifier includes a probe for sensing an input signal which is filtered and amplified for driving either an internal speaker or a speaker in the earpiece of an external butt set. The inductive amplifier includes circuitry for sensing that the leads of the butt set have been connected to the inductive amplifier, and for reducing the gain of the inductive amplifier by a factor of ten under such circumstances.

Abstract: A pin protrusion test fixture includes an element having a void therethrough, structure for biasing the aforementioned element in a first direction to a first position, and structure for directing a pin toward that element so that the pin causes the element to move in a second direction to a second position. The test fixture also includes a light source and a light sensor disposed so that when the element is in the second position, light from the light source passes through the void through the element having a void therethrough and is then detected by the light sensor.

Abstract: An apparatus for detecting faults in a starter circuit adapted to connect a multi-phase electrical motor to a power supply. The motor has at least one winding per phase, each of which terminates in at least one terminal. The starter circuit includes a plurality of contactors which are energizable to connect the motor windings to the power source. The fault detection apparatus comprises a current sensor for sensing the current flowing through the windings of each phase and responsively producing respective winding current signals. A diagnostic module controllably energizes the contactors, samples for the presence and absence of the winding current signals while different ones of the contactors are energized to detect faults in the contactors, and responsively produces fault signals.

Abstract: Disclosed is a system that determines whether input and output pins of semiconductor components are present and properly soldered to a printed circuit board. The system uses an oscillator which supplies a signal, typically ten kilohertz (10 kHz) at 0.2 volts, to the pin under test. A conductive electrode is placed on top of the component package. The electrode is connected to a current measuring device. Another pin of the component is connected to the common signal return. Typically the other pin is chosen to be a power or ground pin of the component.

Abstract: A universal cable connector includes a plurality of different sized connectors adapted to mate with the proximal connectors of different sized implantable stimulation leads. The cable connector attaches to a system analyzer and enables the system analyzer to interface with whatever implantable stimulation leads are connected to the connector block, thereby allowing the system analyzer to perform desired tests, such as threshold-determining tests, using the implanted stimulation leads. An adapter cable and clamp is also provided that allows an electrical connection of the proper polarity to be established between an implantable stimulation device, e.g., an implantable cardioverter-defibrillator (ICD), and the connector block while the implantable stimulation device is connected to a patient and is operating, thereby permitting the system analyzer to monitor the performance of the implantable stimulation device.

Abstract: A tool for inserting an engagement member for a connector is designed so that the engagement member is inserted into a housing to engage a terminal in the housing. The tool has a tool body provided with a path in which the housing slides. Facing the path, a pusher is provided to push the engagement member into the housing. When the connector is pushed in the path in the tool, the connector slides therein, and, the pusher comes in contact with the engagement member. In this way, the engagement member is pushed into the housing. The operator does not directly push the engagement member with his or her hands and fingers, and alternatively he or she may push the housing in the path. Thus, the burden of the operation of inserting the engagement member is greatly lightened.

Abstract: A method and apparatus are disclosed for testing unpopulated and inactive populated printed circuit boards for manufacturing defects. The method and apparatus do not require electrical contact with the board under test. The method and apparatus include an AC source, which is connected to the stimulator(s). The stimulator(s) radiate an electromagnetic field onto the traces and components on the board under test and this interaction establishes a potential gradient along the traces and components. A sensor array is located adjacent to a stimulator (if only one is used) or between a pair of stimulators (if a dual arrangement is used) and detects the displacement currents flowing from the board under test. The sensors and stimulator(s) do not electrically connect to the board under test, which is positioned between a ground reference plane and a sensor/stimulator unit. By scanning across the entire surface of the board under test, a displacement current signature of the board under test is obtained.