Abstract: Described embodiments include a system and an apparatus. A described system includes a stationary device configured to be electrically coupled to a transmission line of a power transmission system and remain at a fixed location during a test measurement of the power transmission system. The system includes a mobile device configured to travel on the transmission line. The stationary device and the mobile device are further configured to cooperatively measure properties of the power transmission system.

Abstract: A grouping unit groups closely arranged wirings to be protected from among a plurality of wirings to be protected by means of a shield and arranged on a circuit board. A division unit divides, for each of the grouped groups, a region around the group on the circuit board into a plurality of divided regions. A determination unit determines the existence of a shield for each of the divided regions.

Abstract: The present disclosure provides a method for testing a semiconductor device. The method includes providing a testing unit and an electronic circuit coupled to the testing unit and applying a first electrical signal to the testing unit. The method includes sweeping a second electrical signal across a range of values, the second electrical signal supplying power to the electronic circuit, wherein the sweeping is performed while a value of the first electrical signal remains the same. The method includes measuring a third electrical signal during the sweeping, the measured third electrical signal having a range of values that each correspond to one of the values of the second electrical signal. The method includes adopting an optimum value of the second electrical signal that yields a minimum value of the third electrical signal. The method includes testing the testing unit while the second electrical signal is set to the optimum value.

Abstract: A modulating determination apparatus, a modulating determination method, and a power supply circuit thereof are provided. The modulating determination apparatus is electrically connected to an examined circuit and includes a driver circuit and a comparison circuit. The driver circuit provides an impulse signal to a first end of the examined circuit. The comparison circuit is coupled to the first end of the examined circuit to obtain a first detected electric value of the first end. The comparison circuit calculates a difference value between the first detected electric value and a second detected electric value. The comparison circuit produces a comparison result by comparing the difference value with a threshold value. The comparison result indicates whether the examined circuit comprises a passive component, which is used to decide either a first modulating scheme or a second modulating scheme for modulating the power supply circuit to supply an output power.

Abstract: A solar panel system includes a plurality of the panels connected together in one or more panel strings. An embodiment includes a signal generator module connected to the photovoltaic panel strings injecting a multiple radio frequency signal onto each of the strings and a detector module analyzing a frequency response echo from the panel strings. The signal generator may include a string coupling module communicating with a controller. The detector module analyzes the echo to obtain an analog fingerprint for each panel string and determine whether the fingerprint for each panel string is within an acceptable range. The detector module initiates an alarm when one of the fingerprints is outside the acceptable range. During night time, when no current is being produced by the photovoltaic cells, a DC or AC source may be connected to the panel strings to inject a signal onto the strings for the same purpose.

Abstract: Disclosed are a jig for measuring EMC of a semiconductor chip and a method for measuring EMC that can accurately measure the EMC at a semiconductor chip level. The jig for measuring EMC of a semiconductor chip according to the exemplary embodiment of the present disclosure includes: a chip mount unit on which the semiconductor chip for which the EMC is to be measured is mounted; a memory unit configured to store EMC information of components in a system in which the semiconductor chip is used; and a measurement control unit configured to extract the EMC information stored in the memory unit and provide the extracted EMC information to the chip mount unit at the time of measuring the EMC of the semiconductor chip.

Abstract: An electrostatic field interference testing apparatus and a method using the same are disclosed. The electrostatic field interference testing apparatus includes an electrostatic discharge generator and a conducting element placed in the neighborhood of an output end of the electrostatic discharge generator where an electrostatic discharge takes place and electrically coupled to a ground end. When the electrostatic discharge generator performs an air discharge on the conducting element, a testing electromagnetic field may be generated as the result of a transient current spike. The testing electromagnetic field is thereafter utilized to determine whether the protection of a DUT against electric/magnetic field strength is suitable.

Abstract: The present invention provides a pinch detection device at an opening/closing section having a very simple structure that can surely detect pinch without a faulty operation also in a vehicle whose power supply voltage greatly fluctuates, a vehicle having this device, and a method for detecting pinch at an opening/closing section. This invention is a pinch detection device at an opening/closing section includes a sensor for detecting displacement of a opening/closing section of a vehicle to be opened/closed by a motor, a time counter for counting a relative time adjusted according to a fluctuation in a power supply voltage, and a pinch detector for detecting pinch of a foreign matter at the opening/closing section according to a change in a relative speed obtained based on a change in the displacement on a basis of the relative time.

Abstract: The disclosed invention provides a semiconductor device that enables early discovery of a sign of aged deterioration that occurs locally. An LSI has a plurality of modules and a delay monitor cluster including a plurality of delay monitors. Each delay monitor includes a ring oscillator having a plurality of gate elements. Each delay monitor measures a delay time of the gate elements. A CPU #0 determines if a module proximate to a delay monitor suffers from aged deterioration, based on the delay time measured by the delay monitor.

Abstract: Apparatuses and methods for analyzing at least one characteristic of a test signal coupled out from one of a plurality of cable lines by a coupling unit to determine whether that test signal has propagated directly to the coupling unit via a single cable line or has propagated indirectly to the coupling unit via one or more coupling paths between different cable lines. The determination of whether the test signal has propagated directly to the coupling unit via a single cable line or has propagated indirectly to the coupling unit via one or more coupling paths between different cable lines, may advantageously be used for operational or diagnostic purposes, e.g. to identify interconnections between ports in a network.

Abstract: The application methods in the related art cannot apply a sufficient voltage with a rectangular wave having a short rise time to an electronic circuit. Furthermore, electrostatic discharge test can apply a sufficient voltage but can only apply an oscillating waveform. A TLP generator is used as a rectangular wave generator. The sum of an injection resistance and a matching resistance is set so as to match the characteristic impedance of a transmission line for transmitting a rectangular wave to a test target. A capacitor is connected to a return line of the applied rectangular wave. With this configuration, stable application can be achieved. An error observation function of an electronic circuit gradually increases a peak value of the rectangular wave and determines the immunity based on an application voltage to cause an error for the first time.

Abstract: An energy distribution of soft error-inducing radiation likely to be encountered by an electronic circuit during operation is determined. A tuned radiation source having a source energy distribution similar to the determined energy distribution is prepared. The electronic circuit is tested using the tuned radiation source.

Abstract: The invention relates to an operating device (1) with an adjustable lever (2) and a sensor mechanism (8), comprising a transmitter coil (5), which may be energized with an alternating current by means of an alternating current supply (7) and a receiver coil arrangement (9). According to the invention, such an operating device may be designed such as to be reliably useful even with intense interference with a construction as technically simple as possible without complex screening measures, wherein the frequency of the alternating current energizing the transmitter coil (5) and the pass frequency of a receiver filter (13) in the receiver coil arrangement (9) are synchronously changed according to a preset program by means of a control unit (14), such that, by means of the operating device (1) and the method carried out therewith, a change to a frequency which is interference or interference signal free can be continuously carried out.

Abstract: A method and system for an infrastructure for performance-based chip-to-chip stacking are provided in the illustrative embodiments. A critical path monitor circuit (infrastructure) is configured to launch a signal from a launch point in a first layer, the first layer being a first circuit. The infrastructure is further configured to create an electrical path to a capture point. The signal is launched from the launch point in the first layer. A performance characteristic of the electrical path is measured, resulting in a measurement, wherein the measurement is indicative of a performance of the first layer when stacked with a second layer in a 3D stack without actually stacking the first and the second layers in the 3D stack, the second layer being a second circuit.

Abstract: A high frequency characteristic measuring device for measuring high frequency characteristics of a high frequency device to be measured by contacting probe needles with the high frequency device to be measured, before mounting of the high frequency device to be measured. The high frequency characteristic measuring device includes an input matching circuit substrate with an input matching circuit thereon, a first coaxial connector electrically connected to the input matching circuit substrate, and first probe needles electrically connected to the input matching circuit substrate. The high frequency characteristic measuring device further includes an output matching circuit substrate with an output matching circuit thereon, a second coaxial connector electrically connected to the output matching circuit substrate, and second probe needles electrically connected to the output matching circuit substrate.

Abstract: An actuator is manufactured that includes piezoelectric film that does not suffer physical damage. Provided is a manufacturing method comprising first insulating layer deposition of depositing a first insulating layer on a substrate using an insulating material; first annealing of annealing the first insulating layer; first electrode layer deposition of depositing a first electrode layer on the first insulating layer using a conductive material; first piezoelectric film deposition of depositing a first piezoelectric film on the first electrode layer by applying a sol-gel material on the first electrode layer and annealing the sol-gel material; second electrode layer deposition of depositing a second electrode layer on the first piezoelectric film using a conductive material; second insulating layer deposition of depositing a second insulating layer on the second electrode layer using an insulating material; and second annealing of annealing the second insulating layer.

Abstract: An operating device comprises a transmitter arrangement (1) and a receiver arrangement (2), which may be moved longitudinally, transversally and vertically with relation to the transmitter arrangement (1) and by means of which different signals can be generated depending on the position of the transmitter arrangement (1). According to the invention, said operating device may be provided with additional functionality with a construction of the minimum technical complexity, wherein the transmitter arrangement (1) may be rotated in relation to the receiver arrangement (2) and is designed such that, at differing rotational angles, signals corresponding to the given rotational angle may be generated in the receiver device (2).

Abstract: It is disclosed that, as an embodiment, a test circuit includes a test signal supply unit configured to supply a test signal via a signal line to signal receiving units provided in a plurality of columns, wherein the test signal supply unit is a voltage buffer or a current buffer, and the test circuit has a plurality of test signal supply units and a plurality of signal lines, and wherein at least one test signal supply unit is electrically connected to one signal line different from a signal line to which another test signal supply unit is electrically connected.

Abstract: An electromagnetic generating device is used for testing an electromagnetic interference of electronic elements of an electronic device. The electromagnetic generating device includes a power source and a detector. The power source includes a power output. The detector includes a first magnetic guiding portion, a second guiding portion, and an electronic coil. The first magnetic guiding portion is connected to the second magnetic guiding portion. The electronic coil surrounds the second magnetic guiding portion. The electronic coil includes an input coupled to the power output of the power source, and an output being grounded.

Abstract: A test structure for testing electrical properties of a material comprises a first loop and a second loop, which are connected to form a closed test loop. A signal generator, for generating a test signal, is coupled to the first loop and the second loop. A signal propagation switching logic is coupled to the first loop and to the second loop for alternatingly flipping the test signal between the first and second loops, such that the test signal moves uninterrupted through the closed test loop. A probe logic detects any degradation of the test signal as the test signal travels along the closed test loop.

Abstract: The present invention provides a test device and a method for carrying out a function test on a communication system. The test device contains a transmission path having at least one leaky line antenna arranged in the aircraft cabin, a control device coupled to the transmission path for feeding an HF signal at a predetermined power level into the leaky line antenna, and at least one measuring mechanism coupled at a predetermined coupling point to the transmission path to measure the power level of the HF signal at the coupling point and to transmit a result signal which depends on the measured power level via the leaky line antenna to the control device.

Abstract: Provided for in some embodiments is, a method of electromagnetic compatibility multi-carrier immunity testing. The method includes generating a first carrier frequency set including a first plurality of carrier frequencies simultaneously such that a device under test is subjected to the first plurality of carrier frequencies simultaneously. One or more of the first plurality of carrier frequencies is substantially different from other ones of the first plurality of carrier frequencies such that the first plurality of carrier frequencies do not interfere with one another when they are generated simultaneously, and intermodulation products of the first plurality of carrier frequencies are not significant relative to the first plurality of carrier frequencies when the first plurality of carrier frequencies are generated simultaneously.

Abstract: The present invention relates to a measurement system and method for analysing, and characterising, the behaviour of a high frequency device, commonly referred to in the art as a device under test (or DUT) at relatively high power levels. Such devices may for example need to be analysed when designing devices or designing circuits utilising such devices, for use in high power (large signal) high frequency amplifiers, such as an amplifier for use in a mobile telephone network or other telecommunications-related base-station. The measurement apparatus for measuring the response of an electronic device to a high frequency input signal includes an active load-pull circuit connectable in use to an electronic device to be measured. The active load-pull circuit includes a passive load-pull device.

Abstract: A method and structure for designing near-field probes with high sensitivity used in detecting a wide variety of materials and objects such as biological anomalies in tissues, cracks on metallic surfaces, location of buried objects, or composition of material such as permittivity and permeability . . . etc., is disclosed. The present invention includes using single or multiple metamaterial unit cells or metamaterial particles as near-field sensors. Metamaterial unit cells are defined as the building blocks used for fabricating metamaterials that provide electrical or magnetic properties not found in naturally occurring media. Metamaterial unit cells or particles include split-ring resonators, complementary split-ring resonators, or a variety of other electrically-small resonators made of conducting wires or conducting flat surfaces. Metamaterial unit cells are excited by appropriate excitations such as small loops, microstriplines, etc.

Abstract: Delay circuits apply a delay to set and reset pulses, respectively. An RS flip-flop is set according to the set pulse that has passed through the set delay circuit, and is reset according to the reset pulse received from the reset delay circuit. A demultiplexer receives the reset pulse that has passed through the reset delay circuit. In a first state, the demultiplexer outputs the reset pulse to the reset terminal of the RS flip-flop. In a second state, the demultiplexer outputs the reset pulse signal to the reset delay circuit again, thereby forming a closed loop. A loop control unit counts the number of times a pulse is passed through the loop. When the number of passes through the closed loop reaches a predetermined value, the demultiplexer is set to the first state.

Abstract: An array of sensors arranged in matched pairs of transistors with an output formed on a first transistor and a sensor formed on the second transistor of the matched pair. The matched pairs are arranged such that the second transistor in the matched pair is read through the output of the first transistor in the matched pair. The first transistor in the matched pair is forced into the saturation (active) region to prevent interference from the second transistor on the output of the first transistor. A sample is taken of the output. The first transistor is then placed into the linear region allowing the sensor formed on the second transistor to be read through the output of the first transistor. A sample is taken from the output of the sensor reading of the second transistor. A difference is formed of the two samples.

Abstract: A method for monitoring transmissivity of an energy transmission element for a protective earth conductor and an electrical machine with such transmissivity monitoring are provided. For a cost-effective solution for transmissivity monitoring, the protective earth conductor of a first circuit is connected on a first side of the energy transmission element via a connecting line to a ground of a second circuit wherein a potential-free voltage supply is connected between the protective earth conductor and ground on a second side of the energy transmission element. A current flows through the energy transmission element and the connecting line that is produced by the potential-free voltage supply. The transmissivity of the energy transmission element is monitored using the current flow by a monitoring element which is arranged between the protective earth conductor and ground on the second side of the energy transmission element.

Abstract: A detection apparatus having means for evaluating generation and disappearance of a carrier is provided. A detection apparatus detects, on the basis of high-order harmonics, an electric field distribution or a carrier distribution between electrodes arranged on an object to be observed.

Abstract: Estimating impedance of energy storage devices includes generating input signals at various frequencies with a frequency step factor therebetween. An excitation time record (ETR) is generated to include a summation of the input signals and a deviation matrix of coefficients is generated relative to the excitation time record to determine crosstalk between the input signals. An energy storage device is stimulated with the ETR and simultaneously a response time record (RTR) is captured that is indicative of a response of the energy storage device to the ETR. The deviation matrix is applied to the RTR to determine an in-phase component and a quadrature component of an impedance of the energy storage device at each of the different frequencies with the crosstalk between the input signals substantially removed. This approach enables rapid impedance spectra measurements that can be completed within one period of the lowest frequency or less.

Abstract: A method and system for measuring a time constant RC of an integrated electronic circuit is provided. This integrated circuit may be made up of a first hardware component and of a second hardware component wherein one of the hardware components is a resistive element and the other is a capacitive element. The first and the second hardware components are connected to an inverting input of an operational amplifier of an integrator of a delta-sigma modulator. A DC voltage is applied to the modulator input. The output signal Qs of the modulator is measured with the air of an analog/digital converter, and the value of the time constant RC is determined on the basis of at least one measurement of the level of the DC component of the output signal Qs of the modulator carried out with the air of a measurement counter circuit.

Abstract: The invention concerns a high frequency non-linear measurement system for analysing the behaviour of a high frequency device, for example a device for use in a high power, high frequency amplifier, such as an amplifier for use in a mobile telephone network or other telecommunications-related base-station. An embodiment of the invention provides a high frequency non-linear measurement system including one or more multiplexer circuits. Each multiplexer circuit comprises a first signal-combining circuit and a second signal-combining circuit. Each signal-combining circuit comprises a pair of directional couplers connected via a pair of signal filters arranged in parallel.

Abstract: A method and analyzer device are provided for testing a power distribution system of a power supply network. A first electrical signal is transmitted into the power distribution system to be tested, the first electrical signal is propagated along the power distribution system to be tested, and a second electrical signal, which is a portion of the first electrical signal reflected within the power distribution system, is received. A signal variation parameter is measured between the first electrical signal and the second electrical signal, and a location of a critical conducting section within the power supply network is obtained from the measured signal variation parameter. A maximum load rating of the critical conducting section is determined, and a control signal for controlling the power supply network such that the power transferred on the critical conducting section does not exceed the maximum load rating.

Abstract: Method and device for monitoring the status of a sheath voltage arrester of a cable system, a verification signal being supplied to a measuring loop which comprises the sheath voltage arrester and a measurement signal which is subsequently produced in accordance with the frequency-dependent impedance of the sheath voltage arrester being measured at the measuring loop in order to establish the status of the sheath voltage arrester by evaluating the measurement signal.

Abstract: A low noise differential charge amplifier circuit for measuring discrete (e.g., pico coulomb) charges in noisy, elevated temperature and corrosive environments. An input stage of a differential charge amplifier circuit includes a twisted and or untwisted two pair cable with a grounded shield. One twisted and or untwisted pair can be connected to a sensor and a first charge amplifier and a second twisted and or/untwisted pair can be connected to a sensor electrical equivalent impedance circuit and or kept open and a second charge amplifier. The output from the charge amplifiers can be directed to a differential amplifier in order to provide an amplified sensor signal without external noise signal mainly from power supply mains. The differential amplifier and the charge amplifiers can include an auto offset correction circuit to reduce errors due to offsets.

Abstract: A portable test apparatus for conducting a plurality of tests on a communications device is provided. The unit can include a control panel, which can include at least one display for displaying test information from the device under test. The apparatus can also include a frequency mixing assembly, an amplifier module, a voltage regulator module, and a frequency module. The apparatus can allow a user to measure a number of parameters including, but not limited to, power, return loss and passive intermodulation products.

Abstract: A module to test electromagnetic compatibility of at least one high speed Ethernet interface onboard an aircraft. The module includes a cable less than 1 meter long, the ends of which are fitted with two aircraft contacts, two standard connectors compatible with standard test equipment, and a mechanism simulating attenuation of a test cable.

Abstract: Method of generating a scenario of electromagnetic noise for monitoring the reliability of a sensitive apparatus, characterized in that it includes the steps consisting in: defining environmental electromagnetic conditions relating to the environment of the sensitive apparatus, determining a positioning of the sensitive apparatus in the environment, and generating, on the basis of the environmental electromagnetic conditions and of the positioning of the sensitive apparatus, a scenario of electromagnetic noise including a set of permanent noises and a set of transient noises.

Abstract: The present invention is to provide a method and device of dynamically adjusting the operating voltage of a network integrated circuit including the steps of detecting and ranking the signal-to-noise ratio of N ports to single out a port for arbitration, dynamically controlling the operating voltage according to the signal-to-noise ratio of the port for arbitration, decreasing the operating voltage by a voltage unit when the signal-to-noise ratio of the port for arbitration is greater than a first threshold, increasing the operating voltage to a default operating voltage when the signal-to-noise ratio of the port for arbitration is smaller than the first threshold, decreasing the operating voltage by a voltage unit when the signal-to-noise ratio of the port for arbitration is greater than a second threshold, and increasing the operating voltage by a voltage unit when the signal-to-noise ratio of the port for arbitration is smaller than the second threshold.

Abstract: To accurately measure power source noise generated inside an integrated circuit, the power source noise measuring device comprises: a mutual inductor pair placed inside an integrated circuit, the mutual inductor pair including (i) a first inductor connected to between power source voltages of the integrated circuit and (ii) a second inductor arranged opposite the first inductor, the both ends of which second inductor are connected to external output terminals; and a power source noise measuring unit which measures power source noise of the integrated circuit on the basis of a voltage waveform output from the second inductor of said mutual inductor pair via the external output terminals.

Abstract: A system for testing radio frequency (RF) communications of a device capable of such communications is provided. The system includes a chamber for isolating the device from RF interference, an antenna that is suitable for RF communications with the device wherein the antenna is capable of communications over a range of frequencies, the antenna being located within the chamber, and a digital communication link for providing non-RF communications with the device.

Abstract: The present invention is to provide a method and device of dynamically adjusting the operating voltage of a network integrated circuit including the steps of detecting and ranking the signal-to-noise ratio of N ports to single out a port for arbitration, dynamically controlling the operating voltage according to the signal-to-noise ratio of the port for arbitration, decreasing the operating voltage by a voltage unit when the signal-to-noise ratio of the port for arbitration is greater than a first threshold, increasing the operating voltage to a default operating voltage when the signal-to-noise ratio of the port for arbitration is smaller than the first threshold, decreasing the operating voltage by a voltage unit when the signal-to-noise ratio of the port for arbitration is greater than a second threshold, and increasing the operating voltage by a voltage unit when the signal-to-noise ratio of the port for arbitration is smaller than the second threshold.

Abstract: Provided for in some embodiments is, a method of electromagnetic compatibility multi-carrier immunity testing. The method includes generating a first carrier frequency set including a first plurality of carrier frequencies simultaneously such that a device under test is subjected to the first plurality of carrier frequencies simultaneously. One or more of the first plurality of carrier frequencies is substantially different from other ones of the first plurality of carrier frequencies such that the first plurality of carrier frequencies do not interfere with one another when they are generated simultaneously, and intermodulation products of the first plurality of carrier frequencies are not significant relative to the first plurality of carrier frequencies when the first plurality of carrier frequencies are generated simultaneously.

Abstract: A capacitive sensor device and method is configured to respond a stimulus provided in a sensing region with an output signal. A signal generator is configured to apply a carrier signal to the capacitive sensor device. The carrier signal is switched between a plurality of phases at a switching rate, where the switching rate is less than a demodulation filter bandwidth. The result of the carrier phase shifting is that effects of interference in the output signal are frequency shifted away from the effects of user applied stimulus. An interference detection filter is configured to filter from the sensor outputs at least one effect produced by the stimulus. An interference measuring device is configured to determine a level of interference in the at least one interference output. Thus, the system can detect interference in the output of the capacitive sensor device.

Abstract: The present invention is to provide a method and device of dynamically adjusting the operating voltage of a network integrated circuit including the steps of detecting and ranking the signal-to-noise ratio of N ports to single out a port for arbitration, dynamically controlling the operating voltage according to the signal-to-noise ratio of the port for arbitration, decreasing the operating voltage by a voltage unit when the signal-to-noise ratio of the port for arbitration is greater than a first threshold, increasing the operating voltage to a default operating voltage when the signal-to-noise ratio of the port for arbitration is smaller than the first threshold, decreasing the operating voltage by a voltage unit when the signal-to-noise ratio of the port for arbitration is greater than a second threshold, and increasing the operating voltage by a voltage unit when the signal-to-noise ratio of the port for arbitration is smaller than the second threshold.

Abstract: Provided is a jitter injection circuit that generates a jittery signal including jitter, including a plurality of delay circuits that receive a supplied reference signal in parallel and that each delay the received reference signal by a preset delay amount and a signal generating section that generates each edge of the jittery signal according to a timing of the signal output by each delay circuit. In the jitter injection circuit the delay amount of at least one delay circuit is set to be a value different from an integer multiple of an average period of the jittery signal.

Abstract: The disclosed embodiments relates to a method and an apparatus for determining the interfering field strength in an aircraft and the impairment of an electric system in the aircraft including cables between the outer shell and the interior panelling of the fuselage for transmitting signals within the aircraft. In order to enable direct and reliable determination of interfering field strength in an aircraft and assessment of the electromagnetic vulnerability of the communications system in the aircraft depending on the results of the determination, either a predetermined transmission signal is fed in at least one leaky line between outer shell and panelling of the fuselage and the reception signal that is irradiated by the leaky line is received with a receiver, or a predetermined transmission signal is transmitted with a transmitter and the reception signal is extracted from the leaky line. Subsequently the amplitudes of the transmission and the reception signals are compared with each other.

Abstract: Systems and methods to stir an electromagnetic (EM) field of an EM reverberation chamber are disclosed. A particular system includes an EM reverberation chamber. The system also includes a transmit antenna and a receive antenna operable to generate an EM field within the EM reverberation chamber. The system further includes a variable charged particle source to stir the EM field by varying introduction of charged particles into the EM field.

Abstract: Cross-die connection structure and method for a die or chip includes buffer elements having a buffer driver and bypass, and control lines coupled to the buffer elements in order to select one of the buffer driver and bypass for each respective buffer element. A logic network is arranged with the buffer elements to form functional paths, a test unit is structured and arranged to test the functional paths and to be coupled to the control lines, and a configuration storage register to set the selected one of the buffer driver and bypass for each passing functional path.

Abstract: An internal circuit generates a digital signal according to an electric signal received from outside, and outputs the digital signal to an output signal line. An output circuit sets a voltage value of the digital signal to a prescribed value. A drive signal input circuit inputs a drive signal received from outside through a drive signal input terminal to the output circuit, and drives the output circuit independent of the digital signal according to the drive signal.

Abstract: The application methods in the related art cannot apply a sufficient voltage with a rectangular wave having a short rise time to an electronic circuit. Furthermore, electrostatic discharge test can apply a sufficient voltage but can only apply an oscillating waveform. A TLP generator is used as a rectangular wave generator. The sum of an injection resistance and a matching resistance is set so as to match the characteristic impedance of a transmission line for transmitting a rectangular wave to a test target. A capacitor is connected to a return line of the applied rectangular wave. With this configuration, stable application can be achieved. An error observation function of an electronic circuit gradually increases a peak value of the rectangular wave and determines the immunity based on an application voltage to cause an error for the first time.