Abstract: A detecting system for detecting the connection of two connectors includes a number of first and second linking lines. The detecting system includes a number of first detection switches, a number of pull-down resistors, a number of second detection switches, a number of pull-up resistors, and a detection module. Each first linking line is grounded via each first detection switch and each pull-down resistor in series. The terminals of the pull-down resistors connected to the first detection switches are defined as first detecting ends. Each second linking line is electrically coupled to a high potential via each second detection switch and each pull-up resistors in series. The detection module with a threshold value preset is configured for comparing the voltage value at the first detecting ends with the threshold value, and outputting a result to determine whether the first linking lines are electrically connected to the second linking lines respectively.

Abstract: A compensation tool and process is provided for calibrating each test position located at a plurality of test modules of an electronic testing machine to a standardized value. Each test module is located on an angularly spaced radial line extending from an associated central axis and has a plurality of contacts for testing electronic components. The compensation tool can include a body having an axis of rotation coaxially alignable with the central axis for rotation to different angular positions and a component-support member operably associated with the body for indexing movement to selectively align a pocket with different contacts associated with each test position located at each of the plurality of test modules. The pocket of the component-support member receives an electronic component with terminated ends extending outwardly to allow electrical contact and testing of each test position located at each the plurality of test modules.

Abstract: A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby reducing the soak chamber length and the pre-heating/pre-cooling time.

Abstract: A method and apparatus is provided to facilitate testing of integrated circuits using an interposer to be utilized in conjunction with an automated test equipment (ATE) system that includes a device handler and a device tester. The interposer may be utilized to convert overall device under test (DUT) board pitches to accommodate various device handler pitch orientations, or conversely, the interposer may be utilized in conjunction with a single DUT board to convert the footprint of the DUT board to accommodate multiple device package footprints. The interposer may also be used to convert a DUT board exhibiting a first single/multi-site orientation to a converted DUT board that exhibits a second single/multi-site orientation. The interposer may be composed of an elastomeric material having multiple conductive columns distributed throughout the elastomeric material or may be composed of a more rigid material such as a Pogo® pin array or printed circuit board.

Abstract: The invention relates to a device for checking the operability of a sensor element (100) for determining the concentration of gas components in a gas mixture, particularly of the concentration of gas components in the exhaust gas of internal combustion engine, having an external pump electrode (APE) and an internal pump and Nernst electrode (IPE), a measurement resistor (Rm) and a balancing resistor (Rtrim) connected parallel thereto being provided upstream of the external pump electrode (APE), and a pump current (Ip) being impressible into the external pump electrode by means of a pump current source, and a measuring voltage (Um) incident across the measuring resistor (Rm) via a measuring and analysis device (200) being detectable, characterized in that an activatable switch means (S) is disposed in series to the measuring resistor (Rm), which can be switched at a high impedance for a predetermined amount of time, during which the voltage across the measuring resistor is detected and analyzed in the measurin

Abstract: A testing device including: a first terminal configured to be connected to an equipment under test; a common-mode detector configured to detect a common-mode part of a signal emitted from the equipment under test; and a first impedance unit connected in series between the first terminal and the common-mode detector. The first impedance unit is configured to adjust a longitudinal conversion loss of the testing device to a predetermined value. A corresponding method determines a common mode signal of an electrical telecommunication.