Optical Beam Patents (Class 324/754.23)
  • Patent number: 10818030
    Abstract: A three-dimensional measurement apparatus includes: projecting means for projecting, onto a measurement target, patterned light having a two-dimensionally coded pattern in which a plurality of types of words each having a different two-dimensional structure and being distinguishable from each other are two-dimensionally arranged; capturing means for capturing the measurement target onto which the patterned light is projected; and calculating means for calculating a three-dimensional position of a target pixel of the image from an image captured by the capturing means, and the two-dimensionally coded pattern is two-fold symmetrical. The two-dimensionally coded pattern is a pattern in which a predetermined word is repeated in the column direction for each column.
    Type: Grant
    Filed: March 19, 2019
    Date of Patent: October 27, 2020
    Assignee: OMRON Corporation
    Inventors: Xingdou Fu, Masaki Suwa, Yuki Hasegawa
  • Patent number: 10797640
    Abstract: A system and method for assessing performance of a plurality of perovskite optoelectronic devices are disclosed. The system comprises a chamber, a light source, a switch board for allowing selection of a device among a plurality of devices in the chamber for measurement; a DC voltage supply for applying voltage to the device, a source/measure unit (SMU) for measuring current of the device; and a computer implemented with a software program including computer executable instructions to control at least the SMU, the DC voltage supply, the switch board, and the light source. The computer-implemented method for the performance assessment by using the system includes obtaining at least one of first current-versus-voltage (I-V) data according to a first procedure and second I-V data according to a second procedure for analyzing hysteresis behavior of the device.
    Type: Grant
    Filed: May 29, 2017
    Date of Patent: October 6, 2020
    Assignee: OKINAWA INSTITUTE OF SCIENCE AND TECHNOLOGY SCHOOL CORPORATION
    Inventors: Yabing Qi, Luis Katsuya Ono, Mikas Remeika, Sonia Ruiz Raga
  • Patent number: 10797421
    Abstract: A reader suitable for reading data from a printed memory device attached to a curved surface includes a flexible wiring assembly that can be repositioned from a first position having a first profile into a second position having a second profile. In the first position, electrical contacts of the reader do not electrically couple with contact pads of the printed memory device, while in the second position the electrical contacts of the reader electrically couple to the contact pads of the printed memory. In one implementation, the flexible wiring assembly includes a flexible underlayer that supports the plurality of electrical contacts. In another implementation, the flexible wiring assembly includes a rigid first portion and a rigid second portion that pivot about a pivot point.
    Type: Grant
    Filed: May 23, 2018
    Date of Patent: October 6, 2020
    Assignee: XEROX CORPORATION
    Inventors: Michael A. Doody, Jeffrey M. Fowler
  • Patent number: 10712380
    Abstract: A method for fabricating a semiconductor structure includes when a chip under test releases an ESD current, detecting position information of photons emitted from the chip under test due to releasing of the ESD current; acquiring an image of an ESD path based on the detected position information of the photons; and determining whether the ESD path corresponding to the chip under test is normal based on the image of the ESD path and a layout image of the chip under test.
    Type: Grant
    Filed: June 5, 2018
    Date of Patent: July 14, 2020
    Assignees: Semiconductor Manufacturing International (Shanghai) Corporation, Semiconductor Manufacturing International (Beijing) Corporation
    Inventors: Jun Wang, Gang Ning Wang, Mi Tang, Xian Yong Pu, Chengyu Zhu
  • Patent number: 10613131
    Abstract: Various approaches to can be used to interrogate a surface such as a surface of a layered semiconductor structure on a semiconductor wafer. Certain approaches employ Second Harmonic Generation and in some cases may utilize pump and probe radiation. Other approaches involve determining current flow from a sample illuminated with radiation.
    Type: Grant
    Filed: January 29, 2018
    Date of Patent: April 7, 2020
    Assignee: FemtoMetrix, Inc.
    Inventors: Viktor Koldiaev, Marc Kryger, John Changala
  • Patent number: 10613152
    Abstract: Provided is a battery monitoring device for a battery including a plurality of battery stacks. The battery monitoring device includes a plurality of monitoring modules, a power supply device, and a determination module. The power supply device includes a plurality of first power lines, a first switch, a first capacitor, a second power line, a plurality of second switches, and a plurality of second capacitors. The determination module is configured to determine a state of power supply from the power supply device to the monitoring modules. Each of the first power lines includes a first positive electrode line and a first negative electrode line, and is connected to the monitoring modules so as to supply power to the monitoring modules. The second power line includes a second positive electrode line and a second negative electrode line, and is configured to receive a predetermined amount of power.
    Type: Grant
    Filed: September 28, 2018
    Date of Patent: April 7, 2020
    Assignee: Toyota Jidosha Kabushiki Kaisha
    Inventor: Hidenori Matsutou
  • Patent number: 10591859
    Abstract: The invention achieves uniform image quality for every transfer regardless of a moisture content on a surface of a paper sheet when a plurality of transfer processes is to be made on a single paper. A copier (1A) is provided with a optical sensor (20) which includes at least one light source, illuminates a paper sheet (P) with light, receives the light reflected from the paper sheet (P), and measures the received light intensity. Before each of a plurality of transfer processes, the copier (1A) calculates a moisture content on a surface of the paper sheet (P) from the light intensity measured by the optical sensor (20), and sets a transfer condition of a transfer device (15) based on the calculated moisture content on the surface of the paper sheet (P).
    Type: Grant
    Filed: December 28, 2016
    Date of Patent: March 17, 2020
    Assignee: SHARP KABUSHIKI KAISHA
    Inventor: Kyohko Matsuda
  • Patent number: 10589860
    Abstract: An infrared (IR) emitter projects a spherical IR pattern. The IR emitter may include one or more IR lasers to produce two IR laser beams, two beam expanders, two diffraction screens to each produce diffracted radiation, a top wide angle lens, and a bottom wide angle lens. The wide angle lenses may each receive diffracted radiation from a respective one of the diffractions screens and may emit a spherical IR pattern including a plurality of longitudinal lines, each longitudinal line including a first portion of the spherical IR pattern emitted from the top wide angle lens and a second portion of the spherical IR pattern from the bottom wide angle lens. The IR emitter may be part of an object detection system in an aerial vehicle.
    Type: Grant
    Filed: May 23, 2017
    Date of Patent: March 17, 2020
    Assignee: GoPro, Inc.
    Inventors: Scott Patrick Campbell, Gary Fong
  • Patent number: 10564215
    Abstract: A system for characterizing a semiconductor sample is disclosed. The system comprises a measurement subsystem, a data analysis subsystem, and a statistical analysis subsystem coupled to each other via an interconnection. The measurement subsystem excites a semiconductor sample by shining light on one or more points in the semiconductor sample to generate electron hole pairs, which creates a change in conductivity of the semiconductor sample. The measurement subsystem measures one or more voltage decay curves corresponding to the one or more points in the semiconductor sample based on the changes in conductivity, and transmits the measured voltage decay curves to the data analysis subsystem. The data analysis subsystem extracts one or more normalized decay curves from the transmitted measured voltage decay curves, which the data analysis subsystem then transmits to the statistical analysis subsystem. The statistical analysis subsystem analyzes the transmitted normalized decay curves.
    Type: Grant
    Filed: July 5, 2019
    Date of Patent: February 18, 2020
    Assignee: RAJA TECHNOLOGIES INC.
    Inventor: Ramesh Rajaduray
  • Patent number: 10551325
    Abstract: Semiconductor metrology systems based on directing radiation on a wafer, detecting second harmonic generated (SHG) radiation from the wafer and correlating the second harmonic generated (SHG) signal to one or more electrical properties of the wafer are disclosed. The disclosure also includes parsing the SHG signal to remove contribution to the SHG signal from one or more material properties of the sample such as thickness. Systems and methods described herein include machine learning methodologies to automatically classify obtained SHG signal data from the wafer based on an electrical property of the wafer.
    Type: Grant
    Filed: November 12, 2015
    Date of Patent: February 4, 2020
    Assignee: FemtoMetrix, Inc.
    Inventors: Viktor Koldiaev, Marc Christopher Kryger, John Paul Changala, Jianing Shi
  • Patent number: 10473694
    Abstract: A system for atomic force microscopy in which a sharp electrode tip of an flexing probe cantilever is positioned closely adjacent a sample being probed for its electrical characteristics. An optical beam irradiates a portion of the sample surrounding the probe tips and is modulated at a radio or lower modulation frequency. In one embodiment, a reference microwave signal is incident to the electrode tip. Microwave circuitry receives a microwave signal from the probe tip, which may be the reflection of the incident signal. Electronic circuitry processes the received signal with reference to the modulation frequency to produce one or more demodulated signals indicative of the electronic or atomic properties of the sample. Alternatively, the optical beam is pulsed and the demodulated signal is analyzed for its temporal characteristics. The beam may non-linearly produce the microwave signal. Two source lasers may have optical frequencies differing by the microwave frequency.
    Type: Grant
    Filed: April 12, 2019
    Date of Patent: November 12, 2019
    Assignee: Primenano, Inc.
    Inventors: Stuart L. Friedman, Michael M. Kelly
  • Patent number: 10347872
    Abstract: This disclosure provides techniques for assessing quality of a deposited film layer of an organic light emitting diode (“OLED”) device. An image is captured and filtered to identify a deposited layer that is to be analyzed. Image data representing this layer can be optionally converted to brightness (grayscale) data. A gradient function is then applied to emphasize discontinuities in the deposited layer. Discontinuities are then compared to one or more thresholds and used to ascertain quality of the deposited layer, with optional remedial measures then being applied. The disclosed techniques can be applied in situ, to quickly identify potential defects such as delamination before ensuing manufacturing steps are applied. In optional embodiments, remedial measures can be taken dependent on whether defects are determined to exist.
    Type: Grant
    Filed: September 19, 2017
    Date of Patent: July 9, 2019
    Assignee: Kateeva, Inc.
    Inventor: Christopher Cocca
  • Patent number: 10330614
    Abstract: Methods and systems using low temperature thermo-luminescence to measure donor ionization energies in luminescence semiconductors are described.
    Type: Grant
    Filed: April 28, 2016
    Date of Patent: June 25, 2019
    Assignee: Bowling Green State University
    Inventor: Farida Selim
  • Patent number: 10161993
    Abstract: Automated test equipment capable of performing a high-speed test of semiconductor devices is presented. The automated test equipment apparatus comprises a computer system comprising a tester processor, wherein the tester processor is communicatively coupled to a plurality of FPGA components. Each of the plurality of FPGA components is coupled to a memory module and comprises: an upstream port operable to receive commands and data from the tester processor; a downstream port operable to communicate with a respective DUT from a plurality of DUTs; and a plurality of hardware accelerator circuits, wherein each of the accelerator circuits is configured to communicate with one of the plurality of DUTs. Each of the plurality of hardware accelerator circuits comprises a pattern generator circuit configurable to automatically generate test pattern data and a comparator circuit configured to compare data.
    Type: Grant
    Filed: February 21, 2013
    Date of Patent: December 25, 2018
    Assignee: Advantest Corporation
    Inventors: John Frediani, Andrew Niemic
  • Patent number: 10139447
    Abstract: An image generation apparatus is an image generation apparatus that generates an image based on measurement light from the semiconductor device, and the image generation apparatus includes an optical sensor that detects the measurement light, an optical sensor power supply that applies a constant voltage to the optical sensor to supply a current to the optical sensor, a current detector that generates a pattern signal according to magnitude of the current supplied to the optical sensor by the optical sensor power supply, and a control device that generates a pattern image based on the pattern signal.
    Type: Grant
    Filed: April 21, 2015
    Date of Patent: November 27, 2018
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Tomonori Nakamura, Mitsunori Nishizawa
  • Patent number: 10006960
    Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from said pulsed source; a second photoconductive element configured to receive a pulse; a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element; and a termination resistance provided for said transmission line configured to match the impedance of the transmission line.
    Type: Grant
    Filed: February 13, 2012
    Date of Patent: June 26, 2018
    Assignee: TeraView Limited
    Inventor: Bryan Edward Cole
  • Patent number: 10001441
    Abstract: There is provided a technique for easily inspecting the modification state of a film in a semiconductor substrate. A modification processing device modifies a film by irradiating a semiconductor substrate with pulsed light emitted from a light irradiation part. The modification processing device includes an electromagnetic wave detection part for detecting an electromagnetic wave pulse including a millimeter wave or a terahertz wave radiated from the semiconductor substrate in response to the irradiation with the pulsed light. The modification processing device further includes a modification determination part for determining the modification state, based on the intensity of the electromagnetic wave pulse.
    Type: Grant
    Filed: September 25, 2015
    Date of Patent: June 19, 2018
    Assignees: SCREEN HOLDINGS CO., LTD., OSAKA UNIVERSITY
    Inventors: Hidetoshi Nakanishi, Akira Ito, Iwao Kawayama, Masayoshi Tonouchi, Yuji Sakai
  • Patent number: 9893131
    Abstract: The present application discloses an array substrate having a plurality of semiconductor elements and a plurality of test electrodes. Each of the plurality of semiconductor elements comprises a plurality of terminals, each of which is electrically connected to a different test electrode. At least one of the plurality of test electrodes is electrically connected to at least two different semiconductor elements.
    Type: Grant
    Filed: October 13, 2016
    Date of Patent: February 13, 2018
    Assignee: BOE TECHNOLOGY GROUP CO., LTD.
    Inventors: Yucheng Chan, Shuai Zhang
  • Patent number: 9774810
    Abstract: An image sensor includes a readout unit having a plurality of circuit blocks. At least a part of each of the plurality of circuit blocks is arranged in each of a plurality of regions electrically isolated from each other. When latchup has occurred in a circuit block of the plurality of circuit blocks, the voltage supply unit shuts off supply of a power supply voltage to the region in which the part is arranged, and then performs the supply of the power supply voltage to the region in which the part is arranged, and the voltage supply unit supplies the power supply voltage to the region in which the circuit block without latchup is arranged, while shutting off the supply of the power supply voltage to the region in which the part is arranged.
    Type: Grant
    Filed: March 9, 2016
    Date of Patent: September 26, 2017
    Assignee: Canon Kabushiki Kaisha
    Inventors: Kazuaki Tashiro, Takashi Moriyama, Tatsuhito Goden, Toshiaki Ono
  • Patent number: 9739831
    Abstract: A test system and method for testing integrated circuits with improved defect localization is disclosed. A laser is used to perturb a device under test (DUT) at a test location. A tester tests the DUT with a test pattern and compares test results with compare vectors in a prior failure log. When a failure signature is matched, a failure signal is generated, indicating that the test location is a failed location. Comparing the test results with the compare vectors in the prior failure log and generating the failure signal when the failure signature is detected reduces artifacts from testing, shortening debug turnaround time.
    Type: Grant
    Filed: August 12, 2015
    Date of Patent: August 22, 2017
    Assignee: GLOBALFOUNDRIES SINGAPORE PTE. LTD.
    Inventors: Szu Huat Goh, Yin Hong Chan, Boon Lian Yeoh, Jeffrey Chor Keung Lam
  • Patent number: 9699035
    Abstract: Techniques are described for determining the topology of an optical network. A computing device receives a message on a data communication network after a first device in an optical network receives an optical pulse pattern on an optical fiber in the optical network. The computing device generates topology data using the message. The topology data indicates that a second device is physically connected in the optical network to the first device when the received optical pulse pattern matches an optical pulse pattern sent by the second device.
    Type: Grant
    Filed: February 2, 2015
    Date of Patent: July 4, 2017
    Assignee: Juniper Networks, Inc.
    Inventor: Gert Grammel
  • Patent number: 9647283
    Abstract: A measurement device for measuring voltages along a linear array of voltage sources, such as a fuel cell stack, includes at least one movable contact or non-contact voltage probe that measures a voltage of an array element.
    Type: Grant
    Filed: February 20, 2015
    Date of Patent: May 9, 2017
    Assignee: BLOOM ENERGY CORPORATION
    Inventors: John Matthew Fisher, Ian Russell, Chad Pearson, Robert Hintz, Nathan Ben Erlin, David Edmonston, Stephen Couse, Michael Dubuk
  • Patent number: 9618550
    Abstract: A semiconductor device testing apparatus 1A includes a tester unit 16 that generates an operational pulse signal, an optical sensor 10 that outputs a detection signal as a response to the operational pulse signal, a pulse generator 17 that generates a reference signal containing a plurality of harmonics for the operational pulse signal in synchronization with the operational pulse signal, a spectrum analyzer 13 that receives the detection signal and acquires a phase and amplitude of the detection signal at a detection frequency, a spectrum analyzer 14 that receives the reference signal and acquires a phase of the reference signal at a detection frequency, and an analysis control unit 18 that acquires a time waveform of the detection signal based on the phase and the amplitude of the detection signal acquired by the spectrum analyzer 13 and the phase of the reference signal acquired by the spectrum analyzer 14.
    Type: Grant
    Filed: November 7, 2014
    Date of Patent: April 11, 2017
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Tomonori Nakamura, Akihiro Otaka, Mitsunori Nishizawa
  • Patent number: 9568530
    Abstract: Embodiments of the present disclosure provide configurations for testing arrangements for testing multi-lane active cables. In one embodiment, a testing arrangement may comprise a testing module comprising a pattern generator to be coupled with an active cable having a plurality of lanes to generate a test pattern to be transmitted over the active cable, wherein the test pattern is to be transmitted at least over two or more lanes of the active cable that are concatenated, and a processing unit to be coupled with the active cable to process a result of the transmission of the test pattern over the active cable. The arrangement may further include a plurality of testing cables to concatenate two or more of the lanes of the active cable, to enable the transmission of the test pattern over the concatenated lanes of the active cable. Other embodiments may be described and/or claimed.
    Type: Grant
    Filed: October 29, 2014
    Date of Patent: February 14, 2017
    Assignee: INTEL CORPORATION
    Inventors: Ehud Udi Shoor, Dror Lazar, Adee O. Ran
  • Patent number: 9431133
    Abstract: A highly flexible, compact, lightweight, and portable testing system for use with radiation testing activities. The testing system is coupled to a device under test (DUT), which can be positioned in such a way that the top of the die package is exposed to the direct ion beam during radiation testing. A variety of sensors, onboard memory systems, programmable interfaces, onboard control systems, data output devices, and different types of interfaces are also provided which provide an ability to perform testing procedures while having a maximum ability to orient the DUT and perform a wide variety of testing currently unavailable.
    Type: Grant
    Filed: June 3, 2013
    Date of Patent: August 30, 2016
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventors: Matthew Gadlage, Adam Duncan
  • Patent number: 9404874
    Abstract: An inspection apparatus according to an aspect of the present invention inspects a solar cell that is of a photo device. The inspection apparatus includes: an irradiation part that irradiates the solar cell with pulse light emitted from a femtosecond laser that is of a light source; an electromagnetic wave detection part that detects an electromagnetic wave pulse emitted from the solar cell in response to the irradiation of the solar cell with the pulse light; and a PL light detection part that detects photoluminescence light generated in the solar cell in response to the irradiation of the solar cell with the pulse light.
    Type: Grant
    Filed: March 24, 2015
    Date of Patent: August 2, 2016
    Assignee: SCREEN HOLDINGS, CO., LTD.
    Inventors: Hidetoshi Nakanishi, Akira Ito, Iwao Kawayama, Masayoshi Tonouchi
  • Patent number: 9383321
    Abstract: An inspection apparatus is an apparatus for inspecting a solar cell panel. The inspection apparatus includes: an excitation light irradiation part for irradiating the solar cell panel with pulsed light for causing the solar cell panel to radiate an electromagnetic wave pulse; a detection part for detecting the electromagnetic wave pulse radiated from the solar cell panel in response to irradiation with the pulsed light; and a temperature changing part for changing a temperature of the solar cell panel at a part irradiated with the pulsed light.
    Type: Grant
    Filed: August 21, 2014
    Date of Patent: July 5, 2016
    Assignees: SCREEN HOLDINGS CO., LTD., OSAKA UNIVERSITY
    Inventors: Hidetoshi Nakanishi, Akira Ito, Iwao Kawayama, Masayoshi Tonouchi
  • Patent number: 9221122
    Abstract: A method of controlling a laser beam annealing apparatus to manufacture a thin film transistor substrate, the method including: irradiating a laser beam emitted from a laser beam irradiator onto an amorphous silicon layer on a substrate supported by a substrate support; obtaining photographic data with respect to at least a part of the substrate by using a photographic unit; and adjusting a position of at least one of the substrate support or the laser beam irradiator by using a position adjuster based on the photographic data obtained by the photographic unit.
    Type: Grant
    Filed: June 20, 2013
    Date of Patent: December 29, 2015
    Assignee: Samsung Display Co., Ltd.
    Inventors: Byoung-Kwon Choo, Cheol-Ho Park, Hee-Geun Son, Do-Yeob Kim
  • Patent number: 9213614
    Abstract: To test a software application, a method submits an electronic board including a component implementing an application to a laser radiation generated in test equipment. The component is excited with laser pulses having very short durations distributed during complex operational phases of the component for running the application, and the reaction of the component and the application are observed.
    Type: Grant
    Filed: June 26, 2008
    Date of Patent: December 15, 2015
    Assignee: European Aernautic Defence And Space Company Eads France
    Inventors: Nadine Buard, Florent Miller, Antonin Bougerol, Patrick Heins, Thierry Carriere
  • Patent number: 9201096
    Abstract: A pulsed-laser LADA system is provided, which utilizes temporal resolution to enhance spatial resolution. The system is capable of resolving CMOS pairs within the illumination spot using synchronization of laser pulses with the DUT clock. The system can be implemented using laser wavelength having photon energy above the silicon bandgap so as to perform single-photon LADA or wavelength having photon energy below the silicon bandgap so as to generate two-photon LADA. The timing of the laser pulses can be adjusted using two feedback loops tied to the clock signal of an ATE, or by adjusting the ATE's clock signal with reference to a fixed-pulse laser source.
    Type: Grant
    Filed: May 16, 2013
    Date of Patent: December 1, 2015
    Assignee: DCG SYSTEMS, INC.
    Inventors: Praveen Vedagarbha, Derryck Reid, Keith Serrels, James S. Vickers
  • Patent number: 9190552
    Abstract: The present disclosure relates to a method for adjusting a bias voltage of a SPAD photodiode, comprising successive steps of: applying to the photodiode a first test bias voltage lower than a normal bias voltage applied to the photodiode in a normal operating mode, subjecting the photodiode to photons, reading a first avalanche triggering signal of the photodiode, applying to the photodiode a second test bias voltage, different from the first test bias voltage, subjecting the photodiode to photons, reading a second avalanche triggering signal of the photodiode, increasing the normal bias voltage if the first and second signals indicate that the photodiode did not avalanche trigger, and reducing the normal bias voltage if the first and second signals indicate that the photodiode did avalanche trigger.
    Type: Grant
    Filed: May 16, 2013
    Date of Patent: November 17, 2015
    Assignee: STMicroelectronics (Grenoble 2) SAS
    Inventors: John Brunel, Cedric Tubert
  • Patent number: 9176181
    Abstract: Measuring current-voltage (I-V) characteristics of a solar cell using a lamp that emits light, a substrate that includes a plurality of solar cells, a positive electrode attached to the solar cells, and a negative electrode peripherally deposited around each of the solar cells and connected to a common ground, an articulation platform coupled to the substrate, a multi-probe switching matrix or a Z-stage device, a programmable switch box coupled to the multi-probe switching matrix or Z-stage device and selectively articulating the probes by raising the probes until in contact with at least one of the positive electrode and the negative electrode and lowering the probes until contact is lost with at least one of the positive electrode and the negative electrode, a source meter coupled to the programmable switch box and measuring the I-V characteristics of the substrate.
    Type: Grant
    Filed: August 20, 2013
    Date of Patent: November 3, 2015
    Assignee: Intermolecular, Inc.
    Inventors: Yun Wang, Tony P. Chiang, Chi-I Lang
  • Patent number: 9075236
    Abstract: Provided is a laser sensor assembly and a method of controlling the laser sensor assembly. A laser sensor assembly includes a supporting unit; a rotary shaft unit formed onto the supporting unit, wherein the rotary shaft unit is rotatable, and has at least one bent portion to form a certain angle with respect to a rotational axis of the rotary shaft unit; and a laser sensor unit coupled with the bent part of the rotary shaft unit to form a certain angle with respect to the rotational axis of the rotary shaft unit.
    Type: Grant
    Filed: September 9, 2013
    Date of Patent: July 7, 2015
    Assignee: SAMSUNG TECHWIN CO., LTD.
    Inventors: Bae-Jin Kim, Minsu Kim
  • Patent number: 9070551
    Abstract: A library of cells for designing an integrated circuit, the library comprises continuous diffusion compatible (CDC) cells. A CDC cell includes a p-doped diffusion region electrically connected to a supply rail and continuous from the left edge to the right edge of the CDC cell; a first polysilicon gate disposed above the p-doped diffusion region and electrically connected to the p-doped diffusion region; an n-doped diffusion region electrically connected to a ground rail and continuous from the left edge to the right edge; a second polysilicon gate disposed above the n-doped diffusion region and electrically connected to the n-doped diffusion region; a left floating polysilicon gate disposed over the p-doped and n-doped diffusion regions and proximal to the left edge; and a right floating polysilicon gate disposed over the p-doped and n-doped diffusion regions and proximal to the right edge.
    Type: Grant
    Filed: August 23, 2013
    Date of Patent: June 30, 2015
    Assignee: Qualcomm Incorporated
    Inventors: Benjamin John Bowers, James W. Hayward, Charanya Gopal, Gregory Christopher Burda, Robert J. Bucki, Chock H. Gan, Giridhar Nallapati, Matthew D. Youngblood, William R. Flederbach
  • Patent number: 9066028
    Abstract: Methods and systems for converting an image contrast evolution of an object to a temperature contrast evolution and vice versa are disclosed, including methods for assessing an emissivity of the object; calculating an afterglow heat flux evolution; calculating a measurement region of interest temperature change; calculating a reference region of interest temperature change; calculating a reflection temperature change; calculating the image contrast evolution or the temperature contrast evolution; and converting the image contrast evolution to the temperature contrast evolution or vice versa, respectively.
    Type: Grant
    Filed: December 17, 2010
    Date of Patent: June 23, 2015
    Assignee: The United States of America as represented by the Administator of the National Aeronautics and Space Administration
    Inventor: Ajay M. Koshti
  • Publication number: 20150104886
    Abstract: A semiconductor device arrangement comprising a functional circuit comprising a plurality of timing components and a reference module comprising a plurality of reference components is described. Each reference component comprises a reference timing component corresponding to a timing component of the plurality of timing components and a controllable timing component. The controllable timing component is arranged to provide a delay in dependence on an applied light stimulus. A method of analysing a performance of a functional circuit on a semiconductor device is also described. A device analysis system for analysing a functional circuit comprising a plurality of timing components is also described.
    Type: Application
    Filed: April 23, 2012
    Publication date: April 16, 2015
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Yoav Weizman, Jacob Fridburg, Shai Shperber
  • Patent number: 9000790
    Abstract: A method can be used for detecting defects in an electronic integrated circuit that includes a power input and a data input. The electronic integrated circuit is powered with a periodic power signal having a frequency and an input signal is applied to the data input. A surface of the electronic integrated circuit is swept with a laser beam. A first image is generated using a laser beam reflected from the surface and a second image is generated using a selected part of the laser beam reflected from the surface. The selected part of the reflected laser beam has a frequency that corresponds to the frequency of the power signal. Defects in the integrated circuit can be detected by superposing the first image and the second image.
    Type: Grant
    Filed: August 6, 2012
    Date of Patent: April 7, 2015
    Assignee: STMicroelectronics SA
    Inventors: Guillaume Celi, Thierry Parrassin, Sylvain Dudit
  • Publication number: 20150084661
    Abstract: The present disclosure relates to methods for determining recombination characteristics at metallized semiconductor surfaces and of metallized semiconductor junctions, based on photo-conductance decay measurements. Dedicated test structures are used comprising a plurality of metal features in contact with a semiconductor surface at predetermined locations, the metal features being provided in a plurality of zones, each of the plurality of zones having a different metal coverage. The method comprises performing a photo-conductance decay measurement in each of the plurality of zones, thereby determining effective lifetimes for different injection levels as a function of metal coverage; and extracting the recombination characteristics from the determined effective lifetimes.
    Type: Application
    Filed: September 24, 2014
    Publication date: March 26, 2015
    Applicants: KATHOLIEKE UNIVERSITEIT LEUVEN, KU LEUVEN R&D, IMEC VZW
    Inventor: Jan Deckers
  • Patent number: 8975907
    Abstract: A photodetector array includes a plurality of photodetector cells such as avalanche photodiodes and readout circuits. An array self-tester tests a dark count or other performance characteristic of the cells. The test is performed in connection with the manufacture of the array or following the installation of the array in a detection system.
    Type: Grant
    Filed: January 31, 2012
    Date of Patent: March 10, 2015
    Assignee: Koninklijke Philips N.V.
    Inventors: Gordian Prescher, Thomas Frach
  • Publication number: 20150061715
    Abstract: Non-contact measurement of one or more electrical response characteristics of a p-n junction includes illuminating a surface of the p-n junction with light of a first intensity having a modulation or pulsed characteristic sufficient to establish a steady-state condition in a junction photovoltage (JPV) of the p-n junction, measuring a first JPV from the p-n junction within the illumination area, illuminating the surface of the p-n junction with light of an additional intensity, measuring an additional photovoltage from the portion of the p-n junction within the illumination area, determining a photocurrent density of the p-n junction at the first intensity. The non-contact measurement further includes determining the forward voltage, the saturation current density, the ideality factor or one or more I-V curves with the measured first photovoltage, the measured additional photovoltage and/or the determined photocurrent density of the p-n junction.
    Type: Application
    Filed: September 2, 2014
    Publication date: March 5, 2015
    Inventors: Vladimir N. Faifer, Ian Sierra Gabriel Kelly-Morgan
  • Patent number: 8952717
    Abstract: The present invention provides an LED chip testing device that measures characteristics of an LED chip. The LED chip testing device includes: a rotation member that supports the LED chip and rotates the LED chip to a testing position where the characteristics of the LED chip are tested; and a tester installed next to the rotation member and serving to measure the characteristics of the LED chip at the testing position.
    Type: Grant
    Filed: December 24, 2009
    Date of Patent: February 10, 2015
    Assignee: QMC Co., Ltd.
    Inventor: Beng So Ryu
  • Patent number: 8912799
    Abstract: A method is described for accurate measuring of the excess carrier lifetime on a semiconductor sample from the carrier decay after termination of the excitation pulse imposed on the steady-state carrier excitation. The method includes determining a quality of decay parameter using progressing segments in each carrier decay; establishing an accurate lifetime measurement multiparameter domain for experimental variables whereby the quality of decay parameter falls within prescribed limits from the ideal exponential decay value of QD=1; and determining an excess carrier lifetime for the semiconductor sample based on experimental measurement conditions within the domain and the quality of decay value within the predetermined range indicative of an accurate excess carrier lifetime measurement.
    Type: Grant
    Filed: November 9, 2012
    Date of Patent: December 16, 2014
    Assignee: Semiconductor Physics Laboratory Co., Ltd.
    Inventors: Jacek Lagowski, Marshall D. Wilson
  • Patent number: 8907696
    Abstract: There is provided a test apparatus for testing a device under test, including a test signal generator that generates a test signal to test the device under test, an electric-photo converter that converts the test signal into an optical test signal, an optical interface that (i) transmits the optical test signal generated by the electric-photo converter to an optical receiver of the device under test and (ii) receives and outputs an optical response signal output from the device under test, a photo-electric converter that converts the optical response signal output from the optical interface into an electrical response signal and transmits the electrical response signal, and a signal receiver that receives the response signal transmitted from the photo-electric converter and a test method.
    Type: Grant
    Filed: March 1, 2011
    Date of Patent: December 9, 2014
    Assignee: Advantest Corporation
    Inventor: Shin Masuda
  • Patent number: 8907691
    Abstract: A system and method are provided for testing an integrated circuit (IC) using thermally induced noise analysis. The method provides an IC die and supplies electrical power to the IC die. The IC die surface is scanned with a laser, and the laser beam irradiated locations on the IC die surface are tracked. The laser scanning heats active electrical elements underlying the scanned IC die surface. A frequency response of an IC die electrical interface is measured and correlated to irradiated locations. IC die defect regions are determined in response to identifying location-correlated frequency measurements exceeding a noise threshold. For example, a frequency measurement may be correlated to a die surface location, and if frequency measurement exceeds the noise threshold, then circuitry underlying that surface area may be identified as defective. Typically, die defect regions are associated with measurements in the frequency range between about 1 Hertz and 10 kilohertz.
    Type: Grant
    Filed: June 24, 2009
    Date of Patent: December 9, 2014
    Assignee: Applied Micro Circuits Corporation
    Inventor: Joseph Martin Patterson
  • Patent number: 8872114
    Abstract: A technology of inspecting a photoexcited carrier generation area of a photo device in a non-contact manner is provided. An inspection apparatus inspects a photovoltaic cell panel in which the photo device is formed. The inspection apparatus includes an irradiation part that irradiates the photovoltaic cell panel with pulsed light from a light receiving surface side and a detecting part (detector) that detects electric field intensity of a terahertz wave pulse, which is generated according to the irradiation of the pulsed light.
    Type: Grant
    Filed: June 12, 2012
    Date of Patent: October 28, 2014
    Assignees: Dainippon Screen Mfg. Co., Ltd., Osaka University
    Inventors: Hidetoshi Nakanishi, Masayoshi Tonouchi, Iwao Kawayama
  • Publication number: 20140292363
    Abstract: An apparatus and method for laser probing of a DUT is disclosed. The system enables laser voltage imaging state mapping of devices within the DUT. A selected area of the DUT is illuminating a while the DUT is receiving test signals causing certain of the active devices to modulate. Light reflected from the DUT is collected and is converted into an electrical signal. Phase information is extracting from the electrical signal and a two-dimensional image is generated from the phase information, wherein the two-dimensional image spatially correlates to the selected area.
    Type: Application
    Filed: June 17, 2014
    Publication date: October 2, 2014
    Inventors: Yin Shyang Ng, Dmitry Skvortsov
  • Publication number: 20140285227
    Abstract: Method to extract timing diagrams from synchronized single- or two-photon pulsed LADA by spatially positioning the incident laser beam on circuit feature of interest, temporally scanning the arrival time of the laser pulse with respect to the tester clock or the loop length trigger signal, then recording the magnitude and sign of the resulting fail rate signature per laser pulse arrival time. A Single-Photon Laser-Assisted Device Alteration apparatus applies picosecond laser pulses of wavelength having photon energy equal to or greater than the silicon band-gap. A Two-Photon Laser-Assisted Device Alteration apparatus applies femtosecond laser pulses of wavelength having photon energy equal to or greater than half the silicon band-gap at the area of interest. The laser pulses are synchronized with test vectors so that pass/fail ratios can be altered using either the single-photon or the two-photon absorption effect. A sequence of synthetic images with error data illustrates timing sensitive locations.
    Type: Application
    Filed: March 21, 2014
    Publication date: September 25, 2014
    Applicants: Freescale Semiconductor, Inc., DCG Systems, Inc.
    Inventors: Keith Serrels, Praveen Vedagarbha, Ted Lundquist, Kent Erington, Dan Bodoh
  • Patent number: 8829938
    Abstract: A measuring method and device for characterizing a semiconductor component (1) having a pn junction and a measuring surface, which has a contacting subarea, covered by a metallization. The method including: A. Planar application of electromagnetic excitation radiation onto the measuring area of the semiconductor component (1) for separating charge carrier pairs in the semiconductor component (1), and B. spatially resolved measurement of electromagnetic radiation originating from the semiconductor component (1) using a detection unit. In one step A, a predetermined excitation subarea of the measuring surface has a predetermined intensity of the excitation radiation and at least one sink subarea of the measuring surface has an intensity of the excitation radiation which is less than the intensity applied to the excitation subarea. The excitation and sink subareas are disposed on opposite sides of said contacting subarea and adjoin it and/or entirely or partially overlap it.
    Type: Grant
    Filed: February 23, 2009
    Date of Patent: September 9, 2014
    Assignees: Fraunhofer-Gesellschaft zur Föderung der angewandten Forschung e.V., Christian-Albrechts-Universität zu Kiel, Albert-Ludwigs-Universität Frieburg
    Inventors: Jürgen Carstensen, Andreas Schütt, Helmut Föll, Wilhelm Warta, Martin Kasemann
  • Patent number: 8750061
    Abstract: A memory test system is disclosed. The memory system includes a memory device, a tester generating a clock signal and a test signal for testing the memory device, and an optical splitting module. The optical splitting module comprises an electrical-optical signal converting unit which converts each of the clock signal and the test signal into an optical signal to output the clock signal and the test signal as an optical clock signal and an optical test signal. The optical splitting unit further comprises an optical signal splitting unit which splits each of the optical clock signal and the optical test signal into n signals (n being at least two), and an optical-electrical signal converting unit which receives the split optical clock signal and the split optical test signal to convert the split optical clock signal and the split optical test signal into electrical signals used in the memory device.
    Type: Grant
    Filed: September 16, 2011
    Date of Patent: June 10, 2014
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Soo-Haeng Cho, Ki-jae Song, Sung-dong Suh, Kyoung-ho Ha, Seong-gu Kim, Yeoung-kum Kim, In-sung Joe
  • Patent number: 8750732
    Abstract: A moisture sensor for detecting moisture content of an object includes a light source to emit light having an infrared wavelength that is absorbed by water; an optical system to receive the light from the light source and output linearly polarized light having a first polarization direction in a direction toward the object, and to receive light scattered from the object and output linearly polarized light having a second polarization direction perpendicular to the first polarization direction in another direction other than the direction toward the object; and a photodetector to receive the linearly polarized light having the second polarization direction output from the optical system.
    Type: Grant
    Filed: September 6, 2012
    Date of Patent: June 10, 2014
    Assignee: Ricoh Company, Limited
    Inventors: Toshihiro Ishii, Yoshihiro Oba, Fumikazu Hoshi, Satoru Sugawara