Abstract: The present invention is directed for a comparator circuit used in an analog-to-digital converter, and more particularly, for a low power consumption low kick-back noise comparator circuit for an analog-to-digital converter, which can significantly reduce kick-back noise generated in a signal input stage due to a signal regeneration method employed in a signal comparing operation and can efficiently reduce power consumption.

Abstract: An apparatus for monitoring at least supply voltage in an IC includes a plurality of monitor circuits distributed throughout the integrated circuit. Each of the monitor circuits is operative to receive the supply voltage, or a signal representative thereof, and to generate an output signal indicative of a comparison between the supply voltage and a reference voltage. The apparatus further includes a control circuit coupled to the plurality of monitor circuits. The control circuit is operative to receive the respective output signals from the plurality of monitor circuits and to generate an output of the apparatus which is a function of information conveyed in the respective output signals from the plurality of monitor circuits.

Abstract: A compare cycle of a comparator includes a precharge phase and a compare phase. During the precharge phase, a node of the comparator is precharged to a defined voltage. In addition, during the precharge phase an input transistor of the comparator is decoupled from the node. During the compare phase, an input voltage is coupled to the node via the input transistor. The input transistor is maintained in saturation during both the precharge phase and the compare phase, reducing switching noise.

Abstract: The present invention relates to a quadrature divider which may be used in a phase locked loop or frequency synthesizer or with a single side band mixer. According to a preferred embodiment the divider takes a quadrature input and has a quadrature output. The divider has four analog mixers 1, 2, 3 and 4. The first two mixers 1, 2 take the in-phase quadrature input, while the second mixers 3, 4 take the quadrature-phase quadrature input. The outputs and feedback loops of the mixers are properly arranged such that the in-phase and quadrature-phase outputs of the divider have a determinisitic phase sequence relationship based on the phase sequence relationship of the corresponding quadrature inputs. Third order harmonics may be minimized or reduced by addition or subtraction of the mixer outputs. As the divider is able to take a quadrature input, there is no need for a dummy divider in the phase locked loop, thus saving space and power.

Abstract: The present disclosure relates to reduction in the effect of kickback in comparators by means of charge injection implemented by means of voltage controlled switches with attributes similar to those of an input differential pair. The voltage controlled switches produce charge to neutralize the charge loss during latching of inputs in the comparator.

Abstract: A comparator apparatus for comparing a first and a second voltage input includes a pair of cross-coupled inverter devices, including a pull up device and a pull down device, with output nodes defined between the pull up and pull down devices. A first switching device is coupled to the first input and a second switching device is coupled to the second input, with control circuitry configured for selective switching between a reset mode and a compare mode. In the reset mode, the first and second voltage inputs are coupled to respective output nodes so as to develop a differential signal thereacross, and the pull down devices in each inverter are isolated from the pull up devices. In the compare mode, the voltage inputs are isolated from the output nodes, and the pull down devices in each inverter are coupled to the pull up devices to latch the output nodes.

Abstract: A method and a circuit for current mode data sensing and propagation by using voltage amplifier are provided. Example embodiments may include providing an output signal from a voltage amplifier in response to the voltage amplifier receiving an input signal. The method may include providing a current output signal from a voltage-to-current converter in response to the voltage-to-current converter receiving the output signal. The output signal may be used to drive a current sense amplifier.

Abstract: The present invention relates to a current sensing amplifier and a method thereof. The current sensing amplifier comprises a first current path, a second current path, a first capacitor, a second capacitor and a latch circuit. When a first current and a second current flow in the first current path and the second current path respectively, the first and second capacitor may be charged by the first current and the second current. The first capacitor and the second capacitor may couple the charged voltage to the transistors in the first current path and the second current path when the first and second current path are cut off so as to cancel the effect of offset voltage of the transistors generated during the manufacturing process.

Abstract: In one embodiment, the present invention includes a receiver having two complementary input sense amplifiers to receive, amplify and latch a differential signal and to output complementary stage differential output signals to a latch coupled to receive and combine the n? them into a latched differential output signal. Other embodiments are described and claimed.

Abstract: An analog-to-digital converter includes a first logic unit and a second logic unit. The first logic unit is configured to receive a plurality of thermometer codes and inverse thermometer codes generated based on an analog signal received by the analog-to-digital converter and to generate a plurality of first digital codes that periodically repeat the same pattern based on a transition position of a logic value in each of the thermometer codes and the inverse thermometer codes. The second logic unit is configured to receive the plurality of first digital codes and to generate a plurality of second digital codes based on logic values of a plurality of bits among all bits of each of the first digital codes.

Abstract: In an embodiment related to a sense amplifier, the sense amplifier includes a cross latch includes a pair of nodes, a first pair of transistors, a second pair of transistors, a third node, and a circuit. The pair of nodes includes a first node and a second node configured to store data for the sense amplifier. The second pair of transistors includes a first NMOS transistor and a second NMOS transistor. A first gate of the first NMOS transistor is coupled to the first node, and a second gate of the second NMOS transistor is coupled to the second node. The third node is coupled to a first source of the first NMOS transistor and a second source of the second NMOS transistor. When appropriate, the circuit is configured to provide a voltage level to the third node.

Abstract: Techniques and corresponding circuits for achieving programmable delay of a current mode logic delay buffer are provided. The techniques provide for incremental delay with substantially equal increments. Delay may be achieved through the use of a circuit arrangement that allows biasing current to be controlled effect the response time of the circuit by digital control.

Abstract: A multiphase receiver to compensate for intersymbol interference in the sampling of an input signal includes a first integrating receiver to integrate and sample data of the input signal on a first phase of a clock and a second integrating receiver to integrate and sample data of the input signal on a second phase of the clock. The multiphase receiver also includes an equalization circuit to adjust integration by the first integrating receiver dependent on a result of integration of data previously received by an integrating receiver distinct from the first integrating receiver, and to adjust integration by the second integrating receiver dependent on a result of integration of data previously received by an integrating receiver distinct from the second integrating receiver.

Abstract: An improved interface circuit is provided herein for translating a relatively high input voltage into a relatively low output voltage using only low voltage transistors and a single, low voltage power supply. According to one embodiment, the interface circuit includes a power supply, a pair of input transistors with source terminals coupled together for receiving a relatively low voltage from the power supply, and a current sense amplifier with a pair of input terminals, each coupled to a drain terminal of a different one of the pair of input transistors for receiving a pair of differential currents and for generating a pair of differential voltages therefrom.

Abstract: A layout structure of bit line sense amplifiers for use in a semiconductor memory device includes first and second bit line sense amplifiers arranged to share and be electrically controlled by a first column selection line signal, and each including a plurality of transistors. In this layout structure, each of the plurality of transistors forming the first bit line sense amplifier is arranged so as not to share an active region with any transistors forming the second bit line sense amplifier.

Abstract: In a latch circuit having a bistable pair of cross connected transistors of a first polarity and a third transistor of a second polarity, a current signal greater than a bias current is received at a latch circuit port, amplified with the third transistor, and applied to the latch circuit port. This decreases the time in which the latch circuit port receiving the current signal greater than the bias current reaches a steady state voltage.

Abstract: An inverter driver integrated circuit (IC) includes a control signal generator generating a first control signal and a second control signal by use of a pulse width modulation oscillator signal, a comparator comparing a half-wave rectified signal of a lamp feedback signal fed back from a lamp with a preset reference signal to output a lamp state signal, a first sensor receiving the lamp state signal and the second control signal to output a first sensing signal, and a second sensor receiving the first sensing signal and the first control signal to output a second sensing signal.

Abstract: A dynamic flip-flop includes first and second input stages forming a differential input stage adapted to receive differential data. The flip-flop is reset in response to a reset signal. To ensure proper operation, a transistor disposed between the first and second input stages is always maintained active to provide a conduction path between the ground terminal and the nodes that may be charged from the supply voltage. To improve the setup and hold time of the flip-flop, the clock signal is applied to a first transistor disposed in the first input stage and a second transistor disposed in the second input stage.

Abstract: A compare cycle of a comparator includes a precharge phase and a compare phase. During the precharge phase, a node of the comparator is precharged to a defined voltage. In addition, during the precharge phase an input transistor of the comparator is decoupled from the node. During the compare phase, an input voltage is coupled to the node via the input transistor. The input transistor is maintained in saturation during both the precharge phase and the compare phase, reducing switching noise.

Abstract: An apparatus and method for testing sense amplifier threshold voltages on an integrated circuit includes one or more sense amplifier modules each including a number of sense amplifier circuits, a voltage generator unit, and detection logic. The voltage generator unit may select a differential voltage to supply to at least some of the sense amplifier circuits, and each sense amplifier circuit may be configured to generate an output value that is dependent upon the applied differential voltage in response to receiving an enable signal. The detection logic may detect and capture an output value of each of the sense amplifier circuits. In one implementation, the voltage generator unit may iteratively select a different differential voltage in response to a control input. Accordingly, the detection logic may capture the output value of the sense amplifiers after each change in differential voltage.

Abstract: In an integrated decision feedback equalizer and clock and data recovery circuit one or more flip-flops and/or latches may be shared. One or more flip-flops and/or latches may be used in retiming operations in a decision feedback equalizer and in phase detection operations in a clock recovery circuit. Outputs of the flip-flops and/or latches may be used to generate feedback signals for the decision feedback equalizer. The output of a flip-flop and/or latches may be used to generate signals that drive a charge pump in the clock recovery circuit.

Abstract: A memory device comprising a memory cell and an evaluation circuit, the memory cell being coupled with the evaluation circuit via a bit line. The memory device further comprises a reference line coupled with the evaluation circuit, the evaluation circuit being designed for amplifying a difference between electric potentials of the bit line and the reference line. Inputs of the evaluation circuit are directly connected to the bit line. Outputs of the evaluation circuit are coupled to the bit line via a switch.

Abstract: A comparator used in a parallel-type A/D converter, wherein a comparator 100 includes reset transistors mra and mrb. When the comparator 100 is in the Reset state, the inverted signal /CLK of the clock signal is given to the PMOS reset transistors mra and mrb so as to forcibly reset both of the voltages at two internal nodes Va and Vb being a differential pair to a predetermined reset voltage by the reset transistors mra and mrb. The inverted signal /CLK of the clock signal is produced with a predetermined delay. Thus, when the comparator 100 is in the Reset state, the point in time at which to cancel the reset of the internal nodes Va and Vb is delayed from that at which the comparator performs a comparison operation. Therefore, even if the frequency of the clock signal and the frequency of the analog input signal are high, the voltages at the internal nodes forming a differential pair are well-balanced when the comparator is in the Reset state, thus improving the voltage comparison precision.

Abstract: In some examples, a differential comparator includes a differential amplifier configured to output differential output signals, a first switch portion configured to input the differential output signals from the differential amplifier and output the differential output signals from output terminals while alternatively changing over the output terminals, a latch portion configured to update and latch the differential output signals from the output terminals of the first switch portion, and a second switch portion configured to input output signals from the latch portion and output the latched output signals. The first switch portion and the second switch portion are changed over complementarily so that the differential output signals from the differential amplifier are always outputted from the same first and second output terminals of the second switch portion respectively.

Abstract: A sense amplifier circuit includes a current sense amplifier, a voltage sense amplifier, and an output stabilizing circuit. The current sense amplifier amplifies differential input currents to generate differential output voltages and provides the differential output voltages to a sense amplifier output line pair. The voltage sense amplifier is coupled to the sense amplifier output line pair to amplify the differential output voltages on the sense amplifier output line pair. The voltage sense amplifier is activated at the time later than a time of activation of the current sense amplifier. The output stabilizing circuit is coupled to the sense amplifier output line pair to stabilize the differential output voltages on the sense amplifier output line pair. The output stabilizing circuit has a positive input resistance. Accordingly, the sense amplifier circuit reduces power consumption and an occupied area on a semiconductor chip.

Abstract: A system and method is disclosed for providing a strobed comparator with reduced offset and reduced charge kickback. The strobed comparator circuit comprises a differential pair of transistors coupled to a first switch circuit, a regenerative latch circuit, a first strobe signal line coupled to the switch circuit and a second strobe signal line coupled to the regenerative latch circuit. The first and second strobe signal lines provide separate strobe controls. The differential pair of transistors reduces the charge kickback effect by remaining in an “on” state. The differential pair of transistors is enabled when the regenerative latch circuit is in a reset condition and the regenerative latch circuit is enabled when the differential pair of transistors is in a saturation condition.

Abstract: A multi-mode PLL frequency synthesizer of a wireless multi-mode transceiver is provided which includes a reference frequency source providing an oscillator signal with a constant reference frequency, a first frequency synthesizer subunit for converting the signal into carrier signals with frequencies in the range of a first frequency band, a second frequency synthesizer subunit for transforming the oscillator signal into carrier signals having frequencies in the range of a second frequency band, and a third frequency synthesizer subunit for converting the oscillator signal into an auxiliary signal with a fixed frequency. The auxiliary signal is used together with the carrier signals of the second frequency band to generate carrier signals with frequencies in the range of a third and fourth frequency band.

Abstract: A dual reference input receiver, and a method of receiving, wherein the input receiver includes a first input buffer which is synchronized with and enabled by a clock signal, senses a difference between the input data signal and a first reference voltage, and amplifies the sensing result; a second input buffer which is synchronized with and enabled by the clock signal, senses a difference between a second reference voltage and the input data signal, and amplifies the sensing result; and a phase detector which detects a difference between a phase of output signals of the first and second input buffers, and outputs a signal corresponding to the detection result. The first and second reference voltages may respectively be higher and lower than a median voltage of the input data signal. Thus, a single input data signal is advantageously used and a wide input data eye is provided.

Abstract: A dynamic flip-flop includes a leakage compensation circuit enabling operation over a wide range of frequencies. Nodes of the dynamic flip-flop store the flip-flop's state. The leakage compensation circuit drains leakage currents from these nodes to prevent the node voltage from rising and triggering an erroneous state change when a data signal changes in the middle of the clock cycle. The leakage compensation circuit associated with a node is activated when the node is set to a low logic level voltage. The leakage compensation circuit is adapted to draw a current from a node that compensates for the leakage current supplied to the node. At the least, this current draw is sufficient to prevent the voltage at the node from rising above a state change threshold voltage during the time period between refresh operations.

Abstract: A flip-flop includes a sense amplifier stage and a latch stage. The sense amplifier includes a first P type transistor and generates a first sensed signal and a second sensed signal in a first node and a second node, respectively. When the first P type transistor is turned on, the first node is connected to the second node. The latch stage generates a first output signal and a second output signal according to the first and the second sensed signals.

Abstract: A high-speed multi-stage voltage comparator is provided. The multi-stage voltage comparator is configured to eliminate offset from outputs of preamplifiers through respective offset-cancellation switches, and to reset the outputs of the preamplifiers through respective reset switches to reduce an output recovery time. Thus, the multi-stage voltage comparator operates with high accuracy and at a high speed, so that it can be usefully applied to an analog-to-digital converter (ADC), and particularly, a high-speed successive approximation register ADC (SAR ADC).

Abstract: A frequency divider comprising, a first latch circuit and a second latch circuit, the second latch circuit being crossed-coupled to the first latch circuit. Each latch comprises a respective sense amplifier coupled to a respective latch. The sense amplifiers comprise a first clock input for receiving a first clock signal. The latches comprise a second clock input for receiving a second clock signal having a second frequency, the second frequency being substantially double the first frequency.

Abstract: A latch includes: an amplifying circuit, for receiving a first bias current in a first state for amplifying an input signal to generate an amplified signal; a latching unit, for latching the amplified signal and receiving a second bias current in a second state to output the amplified signal; and a biasing circuit, for providing a biasing current to the amplifying circuit, and providing the second biasing current to the latching unit. The biasing circuit includes: a first biasing module for providing a third biasing circuit to the amplifying circuit in the first state; and a second biasing module, for providing a fourth biasing current to the amplified circuit; wherein the first biasing circuit is equal to a sum of the third biasing current and the fourth biasing current.

Abstract: The invention is directed to data receivers such as those used in semiconductor devices. Embodiments of the invention provide a loop unrolling DFE receiver that uses analog control signals from each equalizer to avoid timing delays associated with the use of latched digital control signals in the conventional art. In addition, embodiments of the invention implement each equalizer with a single sense amplifier based flip flop (SAFF) to reduce circuit size and power consumption.

Abstract: A data receiver of a semiconductor integrated circuit is configured to detect received data using an equalization function, wherein the data receiver is configured to stop the equalization function during a period in which the data is not received.

Abstract: A semiconductor chip may include an internal circuit, at least one power gating transistor, a system manager, and/or at least one current regulator. The at least one power gating transistor may be configured to switch a supply of at least one drive voltage into the internal circuit. The system manager may be configured to generate a control signal corresponding to an activation state of the internal circuit. At least one current regulator may be configured to control an amount of a current flowing through the at least one power gating transistor in response to the control signal.

Abstract: In a comparator, a differential amplifier has a pair of transistors receiving a signal to be compared for differential amplification, and a current mirror load circuit for outputting a differential output signal in accordance with the relationship in magnitude of the signal to be compared. A latch circuit has inversion amplifiers for amplifying the differential output signal. One inversion amplifier has its input interconnected to an output of the other inversion amplifier and vice versa. The comparator still further includes a transistor for equalizing signals of the differential amplifier, a transistor for enabling the inversion amplifiers to be active, and a constant current source for reducing a current flowing from a supply voltage to the ground when the inversion amplifiers are active.

Abstract: A sense amplifier circuit for use in a semiconductor memory device has complemented logic states at opposite sides of the latch circuit in the sense amplifier circuit determinate all the time in operation. The sense amplifier circuit takes advantage of a current mirror circuit for ascending or descending a voltage level at the gate of a transistor by charge accumulation or charge dissipation, which turns on or off the transistor so as to control the logic states at opposite sides of the latch circuit in the sense amplifier circuit.

Abstract: A fast, accurate, low offset comparator may be configured with multiple gain stages. A low gain, low input impedance, and fully differential common-gate amplifier may be configured as a first stage in the multi-stage comparator, providing a wide bandwidth for small power consumption. The inputs of the comparator may comprise a pair of differential inputs at respective source terminals of gate-coupled metal oxide semiconductor (MOS) devices configured in the input stage of the common-gate amplifier. A pair of differential outputs of the first stage may be coupled to a pair of differential inputs of a second stage, which may be a differential input current-mirror amplifier that may perform differential to single-ended conversion.

Abstract: The present invention discloses an analogue-to-digital converter comprising at least two voltage comparator devices. Each of the voltage comparator devices comprises a differential structure of transistors and is arranged for being fed with a same input signal and for generating an own internal voltage reference by means of an imbalance in the differential structure, said two internal voltage references being different. Each voltage comparator is arranged for generating an output signal indicative of a bit position of a digital approximation of the input signal.

Abstract: A semiconductor device includes a first sense amplifier coupled to an input for generating a first output; a second sense amplifier couple to the input for generating a second output; and a third sense amplifier coupled to the input for generating a third output, wherein a fourth output amplifying the input is generated based on combinations of logic states of the first, second and third outputs.

Abstract: A data receiver of a semiconductor integrated circuit includes an amplifier that outputs an amplified signal by detecting and amplifying received data using equalization function according to feedback data, a detecting unit that detects a period when data is not received in the amplifier and outputs a detecting signal, and an equalization function control unit that stops the equalization function of the amplifier in response to the detecting signal.

Abstract: In particular embodiments, an apparatus includes a first transistor connected at the gate to a first input signal voltage and a second transistor connected at the gate to a second input signal voltage. The apparatus further includes a deactivation element coupled to the transistors, the deactivation element being operable to deactivate the first and second transistors by selectively transmitting a deactivation current to a first terminal of the first transistor and a second terminal of the second transistor thereby raising a voltage on the first and second terminals to a value large enough to deactivate the first and second transistors. In particular embodiments, activating the first or second transistor transmits a signal from the apparatus and deactivating the first and second transistors prevents the signal from being transmitted from the apparatus.

Abstract: The embodiments of the invention provide an apparatus, method, etc. for an efficient circuit and method to measure resistance. A sense line driver for an integrated circuit memory is provided, including a sense node that receives an experiment signal from an experiment structure. An output device is connected to the sense node, wherein the output device amplifies the experiment signal. Further, a voltage divider is connected to the sense node, wherein the voltage divider includes a first device and a second device. A sensing range is controlled by an operating width/resistance range and/or an adjust signal of the second device. The adjust signal changes a gate to source voltage of the second device and holds a constant voltage over multiple sensing instances. The sensing range is different for each of the sensing instances due to a change in the operating width of the second device.

Abstract: A semiconductor integrated circuit device, has a first variable resistor element and a second variable resistor element whose resistances are changed complementarily depending on a current; and a current path switching circuit that supplies said current from a power supply by switching between current paths according to whether a normal operation mode or a read mode is input externally, wherein said power supply is turned off and then turned on again in said normal operation mode, and in this state, data corresponding to the relationship between the magnitudes of the resistances of said first variable resistor element and said second variable resistor element is read in said read mode.

Abstract: There is provided a voltage comparator circuit with even lower power consumption. It comprises an FET Q1, to the gate of which a signal input terminal IN1 is connected, an FET Q2, to the gate of which a signal input terminal IN2 is connected, a bistable circuit, an AND circuit G, and an FET Q11. A pulse signal ?, which becomes a strobe signal for the comparison, is supplied to the bistable circuit, and when the pulse signal ? is at a low level, the logic values of output terminals OUT1 and OUT2 go to a high level, and the output of the AND circuit G becomes high, turning the FET Q11 on. When the pulse signal ? changes to a high level from a low level, input voltages are compared, one of the output terminals OUT1 or OUT2 changes to a low level, corresponding to the value relationship between the drain currents of the FETs Q1 and Q2, and the output of the AND circuit G goes to a low level, turning the FET Q11 off.

Abstract: A method and apparatus for a structure of a flip-flop that is tolerant to the noise pulses occurring due to the presence of crosstalk faults by sampling the input data multiple times before and after the active clock edge. The final stored value at the flip-flop is determined by the resolution of a counter circuit residing in the flip-flop, which is activated at the change of the sampled input data. This counter based resolution mechanism allows for the detection and filtering of the noise pulse induced at the input of the flip-flop due to a crosstalk fault.

Abstract: There is described a method for increasing an availability and a redundancy of an analog current output as well as an analog current output with increased availability and redundancy. To improve the availability and also the redundancy behavior of an analog current output a first set of current sources is switched to active to generate an output current, one current source respectively of the first set is checked cyclically for serviceability and the other current sources respectively generate the output current in equal parts. Where unserviceability is determined, the corresponding current source is disconnected and removed from the first set. If a malfunction occurs, such as a failure of a current source for example, the output current advantageously does not drop out completely due to the allocation of generation to a number of current sources.

Abstract: A semiconductor memory device is capable of swiftly sensing data loaded on local I/O lines and transferring the sensed data to a global I/O line, thereby reducing an operating time of a sense amplifier by increasing the sensing and amplifying speed. The semiconductor memory device includes a sense amplifying unit, a precharging unit, a charge sharing unit, and a driving unit. The sense amplifying unit amplifies data applied to a first data line in response to an I/O strobe signal. The precharging unit precharges an output unit of the sense amplifying unit in response to a precharge signal. The charge sharing unit performs a charge sharing operation between the first data line and the output unit before a sense amplifying operation of the sense amplifying unit. The driving unit drives a second data line in response to an output signal of the sense amplifying unit.

Abstract: A data amplifying circuit for a semiconductor integrated circuit including a controller configured to generate a control signal for adjusting an amplification step in response to a test signal, and a data amplifier configured to amplify an input signal one time or two or more times in response to the control signal and to output an output signal.