Abstract: A pipeline type analog-digital converter includes a first to an N-th (N is an integer of not less than 2) stages (101 to 10N) brought into cascade connection and converting an analog signal input from a preceding stage to a digital signal of a predetermined bit and outputting the digital signal. Each of the first to the (N?1)-th stages (101 to 10N?1) includes an analog-digital converter circuit including comparators comparing an analog signal with reference potential being determined in advance and mutually different in parallel. The first to the (N?1)-th stages are in redundant configuration with the comparators of the stage including an auxiliary comparator.

Abstract: A full-flash A/D converter, including a differential amplifier circuit row and a voltage comparison circuit row, has an adjusting circuit 107 for making the output dynamic range of differential amplifier circuits accurately fall within the input dynamic range of voltage comparison circuits. The adjusting circuit 107 includes a reference voltage generation circuit 119, which has therein voltage generation circuits 122 whose resistors are connected in series. By this series connection, the area of the voltage generation circuits 122 is reduced, while the output dynamic range of the differential amplifier circuits A1 to Am+1 in the differential amplifier circuit row 102 accurately falls within the input dynamic range of the voltage comparison circuits Cr1 to Crm+1 in the voltage comparison circuit row 103. Furthermore, half-circuits in the voltage generation circuits 122 are used to generate reference voltages, whereby the area of the voltage generation circuits is reduced further.

Abstract: An analog signal processing device including a voltage selector selecting a given comparison reference voltage from plural comparison reference voltages, an arithmetic unit arithmetically processing the given comparison reference voltage and an analog input signal, a comparator which has at least one or more judgment points for the plural comparison reference voltages and to which an output of the arithmetic unit is inputted, and a coupling controller controlling connections between the arithmetic unit and the comparator, wherein the arithmetic unit comprises correctable first signal processors, and the number of the first signal processors is more than is necessary for the plural comparison reference voltages by M or larger, and when a set of N of first signal processors are in a correction operation, the coupling controller connects first signal processors which are not in the correction operation in the arithmetic unit to the comparator.

Abstract: An A/D converter includes: a plurality of A/D conversion circuits (10 a, 10b); an input selection section (20) for selecting the A/D conversion circuit that is not executing A/D conversion to supply analog amounts obtained by sample-holding an input signal; and an output selection section (30) for selecting the A/D conversion circuit that is not executing A/D conversion to output digital amounts obtained from the selected one. Each A/D conversion circuit includes: an input memory portion (11) for sequentially storing the supplied analog amounts in a plurality of analog memory elements (111); an A/D conversion portion (12) having a plurality of A/D conversion elements (121) for converting the analog amounts stored in the analog memory elements to digital amounts; and a shift output portion (13), having a plurality of registers (131) receiving the digital amounts from the A/D conversion elements to hold the digital amounts, for shifting and outputting the digital amounts held in the registers.

Abstract: The invention relates to a digital microphone comprising an integral analog-to-digital converter based on a multi-level quantizer in cascade with a digital signal converter which is adapted to provide a single-bit output signal. Digital microphones in accordance with the invention are particularly well adapted for use in mobile terminals and compact portable communication equipment such as mobile or cellular phones, headsets, hearing prostheses etc.

Abstract: An analog-to-digital converter (ADC) is provided to determine a digital output value according to whether electric current flows between a plurality of probes, to which an input voltage is applied, and a plurality of electrodes. Therefore, high resolution and high speed operation is possible, but with lower power consumption.

Abstract: Reference network embodiments are provided for use in pipelined signal converter systems. The network embodiments are fast and power efficient and they generate low-impedance reference signals through the use of a complimentary common-drain output stage, an output current valve inserted between transistors of the output stage, and a controller. The controller is configured to provide gate voltages to the output current valve to thereby establish a substantially-constant output current. The controller is further configured to provide gate voltages to the output stage to establish top and bottom reference voltages about the output current valve that are spaced from a common-mode voltage. This reference structure maintains a constant output current as the span between the top and bottom reference voltages is selectively altered. In different embodiments, transistors of the output current valve are arranged in a drain-to-source-coupled configuration and in a source-coupled configuration.

Abstract: An ADC circuit includes multiple comparators and a controller coupled to the comparators. Each of the comparators is operative to generate an output indicative of a difference between a first signal representative of an input signal applied to the ADC circuit and a corresponding reference signal. The controller is operative to perform at least one of: (i) activating a subset of the comparators during a given sample period being; and (ii) controlling levels of the corresponding reference signals of the comparators as a function of a level of the input signal. A number of active comparators during the given sample period is no greater than one less than a number of regions into which the input signal is quantized.

Abstract: A flash analog-to-digital converter comprises a resistive string powered by a reference voltage source for providing a set of equidistant reference voltages and a set of comparators for comparing the analog input signal with the reference voltages. A set of switches are arranged and controlled to perform an algorithm for mitigating the influence of mismatches between the components. The switches are arranged between the reference voltage source and the resistive string so that switches in the reference inputs to the comparators are avoided. The resistive string is preferably circular. The converter can handle differential signals.

Abstract: There is provided an A/D converter that outputs a digital output signal obtained by digitalizing an analog input signal. The A/D converter includes a bit selecting section that selects a conversion object bit from a high-order bit to a low-order bit of the digital output signal in order, a threshold-value controlling section that determines a threshold data expressing a boundary value between zero and one of the conversion object bit, a D/A converting section that digital-to-analog converts the threshold data and generates an analog threshold value, a comparing section that compares, at a plurality of different timings in a conversion time interval determining a value of the conversion object bit, the analog input signal and the analog threshold value and outputs a plurality of comparison results at the timings, and a bit determining section that determines the value of the conversion object bit.

Abstract: A differential analog to digital converter (ADC) comprises a first resistance ladder leg including two resistances having first ends that communicate with a middle node. A second resistance ladder leg includes two resistances having first ends that communicate with a middle node. A first amplifier applies a voltage based upon a first phase of an input signal to said middle node of said first resistance ladder leg. A second amplifier applies a voltage based upon a second phase of the input signal to said middle node of said second resistance ladder leg.

Abstract: An analog to digital converter (ADC) includes a resistance ladder including N resistances arranged in series. Connection nodes are arranged between adjacent ones of the N resistances and at each end of the resistance ladder. An input signal is received at a selected connection node of the connection nodes. N is an integer greater than one. A plurality of delay elements receive signals from corresponding ones of the connection nodes and apply predetermined delays to the signals to produce delayed signals. The predetermined delays are based on an electrical distance between the corresponding ones of the connection nodes and the selected connection node, respectively. A plurality of comparators include corresponding first input terminals that receive the delayed signals from respective ones of the plurality of delay elements.

Abstract: Disclosed is a flash analog to digital converter (ADC) capable of reducing area requirements and using successive approximation. The ADC includes a reference voltage generating unit receiving an external voltage and outputting M reference voltages. A reference voltage selecting unit outputs N reference voltages less than the number of the voltages outputted by the reference voltage generating unit according to a supplied control signal. A digital signal output unit compares the N reference voltages outputted by the reference voltage selecting unit with an external analog input signal and outputs the comparison result as an N-bit digital signal.

Abstract: An analog-to-digital (AD) converter and a voltage detecting device thereof are provided. The AD converter includes at least one voltage detecting device which outputs a signal of a frequency determined based on a magnitude of an input voltage using a resonance frequency of a resonator. The AD converter determines a digital output value depending on the output signal from the voltage detecting device. Therefore, the AD converter can achieve a high resolution and a high speed with far less power consumption.

Abstract: ADC accuracy is increased by 1 bit by interpolation of comparator outputs in a comparator array, thereby increasing accuracy without significantly increasing power consumption and size. Specifically, an analog-to-digital converter includes a binary converter and a comparator array, which comprises a plurality of comparator blocks, each block having a primary comparator and an interpolating comparator. The interpolating comparator compares an output signal from the primary comparator with a negative output signal from a primary comparator of another block of the plurality of blocks to generate a least significant bit. The binary converter, which is coupled to the array, converts array output to binary code.

Abstract: An amplifier array circuit is provided. An amplifier array includes a main amplifier array comprising a plurality of first amplifiers and a plurality of reference voltages, wherein the first amplifier is coupled to an input signal and the reference voltage corresponding to the first amplifier. A first reversed reference voltage amplifier array is located on one side of the main amplifier array and has a plurality of second amplifiers coupled to the input signal and the reference voltages, respectively. A second reversed reference voltage amplifier array is located on the other side of the main amplifier array and has a plurality of third amplifiers coupled to the input signal and the reference voltages respectively. The averaging network is coupled to a first output terminal and a second output terminal of the first, second and third amplifiers.

Abstract: The present invention provides an A/D converter includes: a plurality of comparators for comparing a plurality of respective standard voltages with an analog input value for a magnitude thereof, the comparators being arranged depending on magnitudes of the standard voltages; a logic boundary detector for detecting a logic boundary point where output signals from the comparators change from one level to another level; and a plurality of majority circuits for being supplied with the output signals from the comparators and determining output signals based on a majority vote on the output signals from the comparators, the majority circuits having logic threshold values adjusted for respective input terminals thereof which are supplied with the output signals from the comparators.

Abstract: A differential reference ladder with an auto zero circuit that can be used as part of a flash analog to digital converter. The auto zero operation is performed relative to a common mode voltage of the ladder. The resistive ladder is disconnected from the rest of the circuit during auto zero mode. As a result, the auto zero adjustment is more accurate, since the offsets are stored under the same common mode connection as when the circuit is in a compare mode. This permits auto zeroing to proceed quickly unencumbered by the parasitic capacitance of the ladder or other components.

Abstract: An adjustment circuit for use with a resistive reference ladder that establishes nominal reference steps and a common mode voltage for a plurality of comparators, such as used in a flash converter. An “H” arrangement of current sources injects current at a first node, VH, and sinks at a second node, VL, with VH, and VL, being coupled to ends of the ladder. The voltage difference between these two nodes thus controls the scale applied to the reference ladder, without affecting a common mode voltage reference Vcm. Alternatively, the current source may inject current at VL and sink current at VH to decrease the reference for each comparator.

Abstract: The present invention discloses a time-interleaved analog-to-digital converter (ADC), which includes a first and a second sub-ADC and a calibration module. The calibration module includes a switch module and a calibration engine. The switch module selectively provides one of a set of reference voltage levels, which are provided by a resistor series of the first sub-ADC, onto an input signal line, which is shared by the first and the second sub-ADCs. The calibration engine calibrates pre-amplifying units of the first and the second sub-ADCs according to digital signals generated by the first and the second sub-ADCs.

Abstract: An analog voltage latch for use in a controller for controlling a motor equipped electric bicycle, includes a window comparator for comparing an analog voltage latch output and an analog input voltage to produce a comparison result, an S-R latch for producing HIGH or LOW according to the comparison result, a selector for selecting an operation, an up/down counter for counting up or down according to the HIGH or LOW from the S-R latch, and holding the counted result according to the selector result, and a DA converter for converting the counted result to analog signal.

Abstract: A network for generating a set of intermediate voltages comprising two input ports for feeding two reference voltages. The intermediate voltages are generated by a number of self calibration units that correspond to the number of intermediate voltages to be generated. Each self calibration unit receives the voltages of the neighboring calibration units or the voltage of one neighboring calibration unit and one of the reference voltages.

Abstract: A plurality of reference voltages are generated by a reference voltage generation circuit. A plurality of comparators is supplied respectively with an analog input voltage and any two reference voltages out of the plurality of reference voltages. A threshold voltage of each of the comparators is adjusted according to the two reference voltages. Each of the comparators compares the analog input voltage with the threshold voltage. A plurality of comparison output signals of the plurality of comparators are supplied to an encoder circuit, and digital signals which correspond to the plurality of comparison output signals are output.

Abstract: The first stage of a plurality of stages in a pipelined analog to digital converter couples its input analog signal to both a first and second sample and hold (S/H). The first S/H output is coupled to the input of a multiplying digital to analog converter (MDAC) of the first stage, and the second S/H output is coupled to a flash ADC of the first stage. The delay of the second S/H is longer than the delay of the first S/H, and the clock edge of the second S/H is delayed an adjustable amount with respect to the clock edge of the first S/H, so as to minimize the difference in held voltages at the outputs of the two S/Hs in the presence of an input signal having high slew rate. The residue voltage of the first stage is amplified in the MDAC by 2?(n?2) where n is the number of bits in the stage.

Abstract: A novel analog-to-digital converter (ADC) architecture using subranging successive approximation approach is disclosed. The ADC architecture is capable of achieving high sampling rate, low power consumption and low complexity. It is also able to advance the chip production yield and area utilization ratio. The new proposed ADC is formed by combining a flash converter having high sampling rate and low resolution with a successive approximation converter having low power consumption and low sampling rate.

Abstract: The invention relates to integrated circuits comprising a set of identical differential pairs of two transistors each (T1, T2; T3, T4) one receiving a variable voltage (Vinp, Vinn) at its base and the other receiving a fixed reference voltage (Vrefp, Vrefn). In order to reduce the dispersion of the offset voltages of said differential pairs, it is provided that the transistor (T2, T4) that receives a fixed reference voltage has an emitter surface at least twice as large as the transistor (T1, T3) that receives a variable voltage at its base. Application to signal folding circuits and to analog-to-digital converters using differential pairs of transistors.

Abstract: A parallel type analog-to-digital conversion circuit, including a reference signal generating portion and a comparison amplification portion, the comparison amplification portion including a plurality of amplifiers, input resetting switches, first sampling capacitors, second sampling capacitors, first sampling switches, and second sampling switches.

Abstract: An A-D converter includes a plurality of comparators, each of which compares an analog input signal to analog threshold values; an upper field determination section which, during an upper determination phase, supplies in parallel to each of the plurality of comparators the plurality of analog threshold values expressing boundaries of ranges corresponding to each data value acquired from the upper field of a number of bits previously designated in the digital output signal, detects whether the analog input signal is associated with one of the ranges based on comparison results by the plurality of comparators, and narrows data values of the upper field to data values corresponding to a range between the largest analog threshold value less than or equal to the analog input signal and the smallest analog threshold value greater than or equal to the analog input signal; and a lower field determination section which, during the lower determination phase, determines values of conversion target bits based on a plural

Abstract: A power-optimized analog-to-digital converter (ADC) input circuit provides for optimized power consumption versus performance. The first amplifier stage of the ADC is provided by a plurality of amplifiers that are selectably enabled to provide a particular bandwidth and noise performance level. The selection of the combination of enabled amplifiers may be made in conformity with the sample rate of the converter and the amplifiers may have evenly-weighted bias currents, or unevenly weighed bias currents and may be optimized for their particular use in combinations for bandwidth and 1/f noise corner performance. The outputs of the amplifiers are combined in a combiner circuit, which may be a discrete-time chopping amplifier that receives charges from a plurality of capacitors that sample each enabled amplifier output.

Abstract: An AD converter device is provided. In the AD converter device, a plurality of differential comparators operable to compare an analog signal with a slope like reference signal is arranged, and with reference to a comparison output of the plurality of the differential comparators, the analog signal is converted in direction of time base to measure time period, whereby a digital signal is obtained. The AD converter device includes a voltage applying module operable to apply a voltage signal in the same waveform as that of the reference signal alternately to a back gate terminal of differential pair transistors of the differential comparator.

Abstract: A flash analog-to-digital converter comprises a resistive string powered by a reference voltage source for providing a set of equidistant reference voltages and a set of comparators for comparing the analog input signal with the reference voltages. A set of switches are arranged and controlled to perform an algorithm for mitigating the influence of mismatches between the components. The switches are arranged between the reference voltage source and the resistive string so that switches in the reference inputs to the comparators are avoided. The resistive string is preferably circular. The converter can handle differential signals.

Abstract: A method and apparatus for converting an analog input signal to a digital output signal, provide for simultaneously comparing the input signal to a sequential multiplicity of reference values representing a range of values of the input signal, and asynchronously processing digital results from simultaneous comparison to produce a digital representation of level crossings of the input signal with respect to the multiplicity of reference values.

Abstract: According to one embodiment, a parallel-type A/D converter includes a reference voltage generating circuit which generates a plurality of reference voltages, a plurality of preamplifier circuits which amplify a potential difference between each of the reference voltages and an analog input voltage, a plurality of comparator circuits which compare sizes of the reference voltages and the analog input voltage for which a potential difference is amplified by each of the preamplifier circuits, an encoder circuit which converts a comparison result by the plurality of comparator circuits into a binary code, and a control circuit which controls gains of the plurality of preamplifier circuits and direct current offset voltages of the plurality of comparator circuits.

Abstract: An apparatus and method for providing an analog-to-digital converter (ADC) in programmable logic devices is disclosed. A plurality of multi-purpose input/output (I/O) blocks is configured to provide analog-to-digital conversion and other I/O functionality. The plurality of multi-purpose I/O blocks is also configured to save power when ADC mode is disabled.

Abstract: An amplifier array circuit is provided. An amplifier array includes a main amplifier array comprising a plurality of first amplifiers and a plurality of reference voltages, wherein the first amplifier is coupled to an input signal and the reference voltage corresponding to the first amplifier. A first reversed reference voltage amplifier array is located on one side of the main amplifier array and has a plurality of second amplifiers coupled to the input signal and the reference voltages, respectively. A second reversed reference voltage amplifier array is located on the other side of the main amplifier array and has a plurality of third amplifiers coupled to the input signal and the reference voltages respectively. The averaging network is coupled to a first output terminal and a second output terminal of the first, second and third amplifiers.

Abstract: The invention relates to integrated circuits comprising a set of identical differential pairs of two transistors each (T1, T2; T3, T4) one receiving a variable voltage (Vinp, Vinn) at its base and the other receiving a fixed reference voltage (Vrefp, Vrefn). In order to reduce the dispersion of the offset voltages of said differential pairs, it is provided that the transistor (T2, T4) that receives a fixed reference voltage has an emitter surface at least twice as large as the transistor (T1, T3) that receives a variable voltage at its base. Application to signal folding circuits and to analog-to-digital converters using differential pairs of transistors.

Abstract: An analog-to-digital converter includes a track-and-hold circuit, a constant-voltage source, a threshold voltage selection circuit, a first comparator to a seventh comparator, an encoder, and a reference voltage output circuit. In a correction mode where the offsets of the first to seventh comparators are to be corrected, a track-and-hold circuit shuts off the input of an analog voltage to the first to seventh comparators by turning off the track-hold switch.

Abstract: A system with signal converter devices, in particular, ADCs (analog-to-digital converters), a device for use in a signal converter system, and a method for operating a signal converter system is disclosed. In one embodiment, a system with a plurality of signal converter devices is provided, each signal converter device being adapted to variably be assigned one of several predefined roles in the system.

Abstract: An analogue-to-digital converter comprises a window comparator. The window comparator comprises an input for an analogue input signal and an output for a comparison result indicating a result of a comparison of the analogue input signal with an upper bound and a lower bound of a level window. The analogue-to-digital converter further comprises a level window position signal generator. The level window position signal generator comprises an output for a level window position signal adjusting a position of the level window based on an information derived from the comparison result and indicating whether the level window should be increased, decreased or maintained. The analogue-to-digital converter further comprises an output for a digital information based on the comparison result.

Abstract: Disclosed herein is an analog-to-digital conversion circuit configured to convert an input analog signal into a digital signal, said analog-to-digital conversion circuit includes: a first amplifying unit; a second amplifying unit; a comparing unit; a first averaging unit; a second averaging unit; and a third averaging unit.

Abstract: An analog-to-digital converter architecture is described. An analog-to-digital converter circuit includes a switched capacitor circuit structure to receive an input voltage signal and one or more reference voltage signals. The analog-to-digital converter circuit also includes a comparator device array coupled to the switched capacitor circuit structure.

Abstract: A folding and interpolating analog,-to-digital converter (ADC) includes a preamp unit, a first folding stage, a second folding stage, a comparison unit and an encoder. The preamp unit receives an analog input signal and reference voltages to generate reference signals. The first folding stage generates a first group of folding signals based on the reference signals. The second folding stage generates a second group of folding signals based the first group. The comparison unit generates a digital code based on the folding signals in the second group. The encoder encodes the digital code. Therefore, the ADC can increase a resolution and a conversion speed, but reduce interpolating errors.

Abstract: The invention relates to fast analogue-to-digital converters having differential inputs and a parallel structure, comprising at least one network of N series resistors with value r and one network of N comparators. The series resistor network receives a reference voltage and is traversed by a fixed current Io and the row i (i varying from 1 to N) comparator essentially comprises a dual differential amplifier with four inputs; two inputs receive a differential voltage VS?VN to be converted, a third being connected to a row i resistor of the network, and a fourth input being connected to an N-i row resistor of the network. The resistor network is supplied by a variable reference voltage originating from a servoloop circuit which locks the voltage level of the middle of the resistor network at a voltage equal to the common mode voltage (VS?VSN)/2 present at the output of the sample-and-hold module.

Abstract: An analog-to-digital converter comprising a positive input terminal, a negative input terminal, several difference detection means detecting a voltage difference between a positive input port and a negative input port, first resistors connecting each positive input port of each difference detection means with the positive input terminal and second resistors connecting each negative input port of each difference detection means with the negative input terminal. First current sources are connected to the positive input port of at least some of the difference detection means. Second current sources are connected to the negative input port of at least some of the difference detection means also generating different currents.

Abstract: The invention pertains to a comparison circuit for an analog/digital converter. In order to reduce the effect of the offset voltages of the various comparators of the comparison circuit, voltage followers and a resistor network delivering at its outputs, mean voltages that are the average of those present on outputs of the comparators are linked downstream of the outputs of the comparators.

Abstract: A parallel A/D converter includes a plurality of comparators for comparing an input signal in parallel, an input signal line for distributing the input signal to the plurality of comparators, and a sampling clock distributor for distributing sampling clock for sampling the input signal to the plurality of comparators at a distribution timing determined according to delay of the input signal due to the input signal line.

Abstract: ADC accuracy is increased by 1 bit by interpolation of comparator outputs in a comparator array, thereby increasing accuracy without significantly increasing power consumption and size. Specifically, an analog-to-digital converter includes a binary converter and a comparator array, which comprises a plurality of comparator blocks, each block having a primary comparator and an intepolating comparator. The intepolating comparator compares an output signal from the primary comparator with a negative output signal from a primary comparator of another block of the plurality of blocks to generate a least significant bit. The binary converter, which is coupled to the array, converts array output to binary code.

Abstract: A network for generating a set of intermediate voltages comprising two input ports for feeding two reference voltages. The intermediate voltages are generated by a number of self calibration units that correspond to the number of intermediate voltages to be generated. Each self calibration unit receives the voltages of the neighboring calibration units or the voltage of one neighboring calibration unit and one of the reference voltages.

Abstract: The present invention provides a multi-input A/D converter circuit capable of shorting a conversion time without increasing its layout area and current consumption. When a most significant bit of a binary counter is “L”, individual input signals are sampled by a sample and hold unit, and digital signals held in respective data holders are sequentially selected by a selector. When the most significant bit is brought to “H”, the respective input signals are held as analog signals and compared with each of reference voltages produced corresponding to a digital signal by a DAC. When decision signals outputted from comparators are changed from “L” to “H”, the digital signal at that time is held in the individual data holders as digital signals.

Abstract: An apparatus and method for providing an analog-to-digital converter (ADC) in programmable logic devices is disclosed. A plurality of multi-purpose input/output (I/O) blocks is configured to provide analog-to-digital conversion and other I/O functionality. The plurality of multi-purpose I/O blocks is also configured to save power when ADC mode is disabled.