Abstract: An alignment marker unit for an object holder for microscopic imaging of an object with a microscope, wherein the alignment marker unit can be removed from and remounted on the object holder, wherein the alignment marker unit has at least one alignment marker for microscope-supported detection, and wherein the alignment marker is designed to determine a coordinate system for the object holder which allows for the microscope-supported calibration of the object or an area of the object relative to its position to the object holder and the position of the object holder relative to the microscope. Furthermore, an object holder system including an object holder and an alignment marker unit as described above is provided.

Abstract: A light scanning microscope with an illumination module switchable between an illumination with m number of spots and an illumination with n number of spots, a deflecting unit which moves the m or n spots in a predetermined sample region, and a detector module for confocal and spectrally resolved detection of the sample radiation. The detector module has a confocal diaphragm unit, a splitting unit which is arranged downstream of the confocal diaphragm unit, a detector, and an imaging unit which images the partial beams on the detector in a spatially separated manner. The confocal diaphragm unit is switchable between a confocal diaphragm with exactly m apertures for m-spot illumination and a confocal diaphragm with n apertures for n-spot illumination. The splitting unit has a first beam path for m-spot illumination and a second beam path for n-spot illumination. The splitting unit is switchable between the two beam paths.

Abstract: An image acquisition device acquires an image of a subject by capturing images of plural regions of the subject. The image acquisition device includes an image capturing device including an image formation optical unit and an image capturing unit, a temperature measurement unit that measures a temperature of the image capturing device, a selection unit that selects the temperature or an evaluation function by referring to an image of a first region from among the plural regions, the temperature or the evaluation function being selected as reference information for a second region adjacent to the first region, an information acquisition unit that acquires the temperature or the evaluation function, and a control unit that adjusts relative positions of a surface conjugated with a light reception surface of the image capturing unit and the subject, and causes the image capturing unit to capture an image of the second region.

Abstract: Provided is a microscope system including a microscope provided with a multi-channel image-acquisition unit that acquires images of a specimen at respective wavelengths; an adjustment-method storage portion that stores, for respective channels, contrast adjusting methods for the images acquired by the image-acquisition unit; and a contrast adjusting portion that adjusts, for the respective channels, contrasts of the images acquired by the image-acquisition unit based on the contrast adjusting methods stored in the adjustment-method storage portion.

Abstract: A method of using a scanning microscope to rapidly form a digital image of an area. The method includes performing an initial set of scans to form a guide pixel set for the area and using the guide pixel set to identify regions representing structures of interest in the area. Then, performing additional scans of the regions representing structures of interest, to gather further data to further evaluate pixels in the regions, and not scanning elsewhere in the area.

Abstract: At least two chemically different substances of interest of an unstained biological specimen that for each a substance image is generated, indicating for every region of the image an amount of the substance. A multicolor image is generated on the basis of the substance images.

Abstract: A driver alertness detection system includes an imaging unit configured to image an area in a vehicle compartment where a driver's head is located; an image processing unit configured to receive the image from the imaging unit, and to determine positions of the driver's head and eyes; and a warning unit configured to determine, based on the determined position of the driver's head and eyes as output by the image processing unit, whether the driver is in an alert state or a non-alert state, and to output a warning to the driver when the driver is determined to be in the non-alert state.

Abstract: A portable eye tracker device is disclosed which includes a frame, at least one optics holding member, and a control unit. The frame may be adapted for wearing by a user. The at least one optics holding member may include at least one illuminator configured to selectively illuminate at least a portion of at least one eye of the user, and at least one image sensor configured to capture image data representing images of at least a portion of at least one eye of the user. The control unit may be configured to control the at least one illuminator for the selective illumination of at least a portion of at least one eye of the user, and receive the image data from the at least one image sensor.

Abstract: A method for measuring critical dimension (CD) includes steps of: scanning at least one area of interest of a die to obtain at least one scanned image; aligning the scanned image to at least one designed layout pattern to identify a plurality of borders within the scanned image; and averaging distances each measured from the border or the plurality of borders of a pattern associated with a specific type of CD corresponding to the designed layout pattern to obtain a value of CD of the die. The value of critical dimensions of dies can be obtained from the scanned image with lower resolution which is obtained by relatively higher scanning speed, so the above-mentioned method can obtain value of CD for every die within entire wafer to monitor the uniformity of the semiconductor manufacturing process within an acceptable inspection time.

Abstract: An observation apparatus includes a stage on which a sample is placed, image capturing device for capturing an image of the sample placed on the stage, velocity calculation unit for calculating a velocity of the stage, display unit for displaying the image of the sample, and a control unit for switching an operating mode, on the basis of the velocity of the stage, between a first operating mode for causing the display unit to display an image, which has a dynamic range wider than original images and is generated by merging the plurality of original images that the image capturing device obtains by capturing images of the sample under a plurality of different image capturing conditions, and a second operating mode for causing the display unit to display an original image or an image obtained by processing the original image.

Abstract: A biological observation apparatus is configured as follows. Namely, the biological observation apparatus includes a marker attached to a living body in order to detect the vibration of the living body, a high-sensitivity camera which forms an observation image of the living body, a high-speed camera which forms an image of light from the marker, and an optical system including a first BA which prevents the light from the marker from entering the high-sensitivity camera.

Abstract: Provided is a camera including a housing; an intermediate plate that divides the interior of the housing into first and second chambers; image acquisition elements disposed in the first chamber within the housing; a motor disposed in the second chamber within the housing; a pivot shaft that extends through the intermediate plate and transmits a driving force from the motor; a bearing that is provided in a through-hole area for the pivot shaft extending through the intermediate plate and seals a gap formed around the pivot shaft; and a prism that is connected to the pivot shaft in the first chamber and is moved by the driving force transmitted by the pivot shaft so as to switchably guide light from a sample to at least one of the image acquisition elements.

Abstract: A handheld leakage detector for finding digital signal leaks in a HFC network, comprises a radio receiver, a leakage receiver, leakage sampler, a correlator, and a display. The radio receiver receives samples of the digital signal taken from the HFC network, called “reference samples.” The leakage receiver receives a leakage signal, which is a leaked version of the digital signal from the HFC network. The leakage sampler samples the leakage signal to form leakage samples. The correlator performs a cross-correlation of the reference samples and the leakage samples, to produce a correlation function. An optimizable value is determined from the correlation function. The value generally becomes more optimized as the detector approaches the leak. The leak is sought by iteratively changing the position of the detector until the value becomes substantially optimized or the leak is found.

Abstract: Microscope images are easily browsed even with a terminal, such as a tablet terminal, whose transmission speed is low. Provided is a microscope system that includes: a microscope that acquires a plurality of microscope images of a specimen; a system main unit provided with a storage section that sequentially stores the microscope images acquired by the microscope; and a terminal that is connected to the system main unit via a network, in which the system main unit delivers the microscope images stored in the storage section, via the network, in response to a request from the terminal; and the terminal sequentially displays the microscope images delivered from the system main unit.

Abstract: Two-dimensional scanning array microscope system, which has fields of view of individual objectives overlapping at the object, produces a composite image of the object that is devoid of optical distortions caused by such overlapping. Method for processing imaging data with the system includes precise identification of detector pixels corresponding to different portions of multiple image swaths projected on the detector by the system during the scan of the object, and, based on such identification, allocating or assigning of detector pixels that receive light from the object through more than one objective to only one of objectives, thereby correcting imaging data received in real time to remove a portion of data corresponding to image overlaps.

Abstract: An image-classification apparatus includes: a first feature extraction unit to acquire a feature value of each of block images obtained by segmenting an input image; an area-segmentation unit to assign each of the block images to any one of K areas based on the feature value; a second feature extraction unit to acquire, based on an area-segmentation result, a feature vector whose elements including, the number of adjacent spots, each including two block images adjacent to each other in the input image, for each combination of the areas whereto the two block images are assigned; or a ratio of the number of block images assigned to each of the K areas to all the number of block images adjacent to a block image assigned to each of the K areas; and a classification unit to classify to which of a plurality of categories the input image belongs.

Abstract: The invention relates to a method for carrying out measurements on at least one region of interest within a sample via a laser scanning microscope having focusing means for focusing a laser beam and having electro-mechano-optic deflector for deflecting the laser beam, the method comprising: providing a scanning trajectory for the at least one region of interest; providing a sequence of measurements and the corresponding scanning trajectories; providing cross-over trajectories between the scanning trajectories of two consecutive measurements; deflecting the laser beam via the electro-mechano-optic means for moving a focus spot of the focused laser beam along a scanning trajectory at an average scanning speed; and deflecting the laser beam via the electro-mechano-optic means for moving the focus spot of the laser beam along a cross-over trajectory at a cross-over speed having a maximum, the maximum of the cross-over speed being higher than the average scanning speed.

Abstract: There are provided an information processing apparatus, an information processing method, a program, and a microscope system which can compose a microscopically observed image having a wide field of view and a high resolution by highly accurately stitching a plurality of digital images together. An image acquisition unit provided in the information processing apparatus acquires a first partial image and a second partial image each formed by imaging a part of an observation target area, and a stitching position adjustment unit adjusts a stitching position of the second partial image with respect to the first partial image. The image acquisition unit controls drive of the microscope such that a partial image including a specimen is acquired as the second partial image when the first partial image includes a foreign matter.

Abstract: An image data-forming apparatus comprises an image data buffer unit that can temporarily store a part of pathological image data. When an image data output unit generates display image data from the pathological image data, the image data output unit uses data stored in the image data buffer unit when data required for generating display image data is stored in the image data buffer unit. The pathological image data includes data on a plurality of annotations attached to certain positions in the pathological image. A buffering control unit controls buffering based on information on the pathological diagnosis linked to each of the plurality of annotations.

Abstract: A charged particle beam adjustment assistance device that can assist work to adjust a charged particle beam apparatus having a three-dimensional observing function and reduce human labor and man-hours required for adjustment value inputting is provided. An adjustment value acquiring unit generates optimal three-dimensional adjustment value information on the basis of two-dimensional adjustment value information and two/three-dimensional adjustment value correspondence information generated according to information inputted from a charged particle beam adjuster terminal, transmits the three-dimensional adjustment value information to the charged particle beam apparatus, and sets the three-dimensional adjustment value information therein. Therefore, the charged particle beam adjuster can reduce adjusting work required for three-dimensional observation and facilitate the work of observing three-dimensional images.

Abstract: A user interface for operation of a scanning electron microscope device that combines lower magnification reference images and higher magnification images on the same screen to make it easier for a user who is not used to the high magnification of electron microscopes to readily determine where on the sample an image is being obtained and to understand the relationship between that image and the rest of the sample. Additionally, other screens, such as, for example, an archive screen and a settings screen allow the user to compare saved images and adjust the settings of the system, respectively.

Abstract: Provided is an information processing device including an image analysis unit which divides an entire image in which an entire observation target region is imaged into a plurality of regions, and then judges whether an observation target is present in each region, and an imaging control unit which controls imaging of partial images with a magnification higher than a magnification of the entire image corresponding to the regions based on judgment results of the image analysis unit.

Abstract: The invention provides a method for transforming an image from a Low Dynamic Range (LDR) image obtained with a given camera to a High Dynamic Range (HDR) image, the method comprising: obtaining the exposure-pixel response curve (21) for said given camera converting the LDR image to HSB color space arrays (22), said HSB color space arrays including a Hue array, a Saturation array and a Brightness array; and determining a Radiance array (23, 24) by inverse mapping each pixel in said Brightness array using the inverse of the exposure-pixel response curve (f?1).

Abstract: A sample observation method of the present invention comprises a step of defining, with respect to an electron microscope image, an outline of an observation object with respect to a sample (3), or a plurality of points located along the outline, and a step of arranging a plurality of fields of view for an electron microscope along the outline, wherein electron microscope images of the plurality of fields of view that have been defined and arranged along the shape of the observation object through each of the above-mentioned steps are acquired. It is thus made possible to provide a sample observation method that is capable of selectively acquiring, with respect to observation objects of various shapes, an electron microscope image based on a field of view definition that is in accordance with the shape of the observation object, as well as an electron microscope apparatus that realizes such a sample observation method.

Abstract: Time lapse observation method includes: before a process to obtain a first time lapse image, capturing an image of a reference area on a sample being a partial area of a target area or an area in a vicinity of the target area being a smaller area than the target area to obtain a reference image; storing a position of a capturing area in capturing the reference image as a reference position; before a process to obtain the time lapse image performed, setting a position of the capturing area sequentially at different positions in the optical axis direction of an objective including the reference position and capturing an image at each of the positions to obtain comparison target images; and matching the capturing area with the target area, based on a comparison result of the reference image and the comparison target images.

Abstract: A video-confocal microscopy method for creating an image of an optical section (?) of a sample (99), provides, in one aspect of the invention, illuminating the sample (99) with illumination beams (19) concentrated on spots (x,y) arranged in an illumination pattern (18) in an illumination plane (?0) at the optical section (?); translationally parallel moving the pattern (18) of spots (x,y) to a plurality of positions in the illumination plane; it also provides for each position (u,v) of the illumination pattern (18), receiving light (21) returned by the sample (99) by reflection and/or transmission and/or phosphorescence, and detecting raw images (52), each having a light intensity distribution Iu,v(x,y) on said image detector.

Abstract: The present invention is intended to provide a contour extraction method and a contour extraction device with an objective of either suppression of unnecessary contouring processings or selective contouring of necessary portions. To attain the objective, provided are a contour extraction method, and a device, with which contours of pattern edges on an image formed based on charged particles emitted from a sample are extracted and, when contouring of a pattern located in an overlapping region provided in connecting images of plural image-capturing regions to form a synthesized image is performed, either areas of the pattern in the plurality of image-capturing regions, or a pre-set measurement portion is found, and selective contour extraction of the pattern with respect to an image of an image-capturing region is carried out either on a side where the area is large, or on a side where a measurement portion regarding the pattern is located.

Abstract: Microscope and method for high resolution scanning microscopy of a sample, wherein the sample is illuminated; at least one point spot or line spot, which is guided in a scanning manner over the sample, is imaged into a still image; wherein the spot is imaged in a diffraction limited manner into the still image with magnification, and the still image lies still in a plane of detection; the still image is detected for different scan positions with a spatial resolution, which, taking into consideration the magnification, is at least twice as high as a full width at half maximum of the diffraction-limited still image, so that a diffraction pattern of the still image is detected; the diffraction pattern of the still image is evaluated for each scan position, and an image of the sample is generated that has a resolution that is increased beyond the diffraction limit, wherein a detector array is provided that has pixels and is larger than the still image; and radiation of the still image from the plane of detecti

Abstract: In a method of measuring a critical dimension of a pattern, a pattern image is obtained from an object pattern. A design pattern of the object pattern and the pattern image are matched to determine a detection region on the pattern image. An optimum turning point of the pattern contour is determined in the detection region and a ROI (region of interest) is set within a predetermined range from the optimum turning point. A critical dimension of the pattern is measured in the ROI.

Abstract: A system and method for dating gelatin silver photographic paper is provided. The system and method includes providing a database management system having physical texture characteristic profiles. The system implements a program of instructions to determine a probable date range or source for each textural characteristic profile. The system includes LED sources disposed around an inner surface of a dome; an LED controller, and a CCD imager microscope.

Abstract: The present invention concerns a system and method for calibration and adjustment of the pixel color values represented within a digital image of a sample by a transmission microscope. Furthermore the present invention is directed to providing sufficient color information in order to generate a color mapping matrix that allows for the creation of a synthetic image to depict the sample under a desired illumination. The system and method provides a solution that generates a destination-device independent image that is configurable to any calibrated display device.

Abstract: An image estimating method is configured to utilize image data of an object captured at N different positions zj that are spaced from each other at an interval ?z in an optical axis direction, and to estimate image data at a position z in the optical axis direction. N is an integer of 2 or larger. The image estimating method includes the steps of an image converting step of performing a frequency conversion for N pieces of image data in the optical axis direction, and of calculating N pieces of converted image data, and a coupling step of multiplying the N pieces of converted image data by a complex number determined for the N pieces of converted image data based upon z and ?z, and of summing up multiplied results.

Abstract: The invention relates to a light microscope comprising a polychromatic light source for emitting illumination light in the direction of a sample, focussing means for focussing illumination light onto the sample, wherein the focussing means, for generating a depth resolution, have a longitudinal chromatic aberration, and a detection device, which comprises a two-dimensional array of detector elements, for detecting sample light coming from the sample. According to the invention, the light microscope is characterized in that, for detecting both confocal portions and non-confocal portions of the sample light, a beam path from the sample to the detection device is free of elements for completely masking out non-confocal portions. In addition, the invention relates to a method for image recording using a light microscope.

Abstract: An image analysis method includes acquiring images of spatially different analysis regions. Each of the images of the analysis regions is constituted by pixels including a plurality of data acquired simultaneously or time-serially. The method further includes obtaining a cross-correlation between two analysis regions by using data of pixels of images of the analysis regions.

Abstract: Exemplary embodiments provide solid-state microscope (SSM) devices and methods for processing and using the SSM devices. The solid-state microscope devices can include a light emitter array having a plurality of light emitters with each light emitter individually addressable. During operation, each light emitter can be biased in one of three operating states including an emit state, a detect state, and an off state. The light emitter can include an LED (light emitting diode) including, but not limited to, a nanowire based LED or a planar LED to provide various desired image resolutions for the SSM devices. In an exemplary embodiment, for near-field microscopy, the resolution of the SSM microscope can be essentially defined by the pitch p, i.e., center-to-center spacing between two adjacent light emitters, of the light emitter array.

Abstract: Provided is a microscope comprising a recording unit, having a magnifying imaging optical unit and an image module, for recording images of a sample with a first image frequency and a digital evaluation unit, to which the recorded images are supplied and which carries out predetermined image processing based on the recorded images and produces, as a result, output images with a second image frequency that is smaller than the first image frequency or equal to the first image frequency and can transfer them to an output unit for representation.

Abstract: A charged particle microscope corrects distortion in an image caused by effects of drift in the sampling stage by measuring the correction reference image in a shorter time than the observation image, making corrections by comparing the shape of the observation image with the shape of the correction reference image, and reducing distortion in the observation images. The reference image for distortion correction is measured at the same position and magnification as when acquiring images for observation. In order to reduce effects from drift, the reference image is at this time measured within a shorter time than the essential observation image. The shape of the observation image is corrected by comparing the shapes of the reference image and observation image, and correcting the shape of the observation image to match the reference image.

Abstract: In one embodiment, identifying a parameter of interest from captured image data includes capturing image data with a signal-amplifying image detector having at least one detection element in a manner in which on average fewer than approximately 10 photons are detected by each detection element and estimating the parameter of interest from the image data with a standard deviation that is no greater than approximately 1.5 times the square root of the Cramer-Rao lower bound.

Abstract: A handheld diagnostic system may include a disposable sample holder and an analysis module having a chip-scale microscope. The sample holder may have a transparent portion having test chambers for containing respective portions of a biological sample. The analysis module may having a housing with an opening configured to receive the transparent portion of the sample holder. The chip-scale microscope may include an image sensor for capturing images of the biological sample as the transparent portion of the sample holder is inserted into the opening of the analysis module. The analysis module may include a light source for illuminating the sample during image capture operations and optics for gathering light from the sample and focusing the light onto the image sensor. The analysis module may transmit sample imaging information to a portable electronic device, which may in turn display corresponding sample analysis information for a user.

Abstract: An electron microscope according to the present invention includes: a backscattered electron detector provided with a backscattered electron detecting element (9); a low-vacuum secondary electron detector provided with a bias electrode (11) and a specimen stage (12); and a signal switch (14) that switches signals detected by the detectors. Optimal observation conditions are stored in an observation condition memory (20) for each of the detectors. A CPU (19) calls observation conditions stored in the observation condition memory (20) on the basis of the switching of the detectors, and sets conditions of the electron microscope to the called observation conditions. An image processing device (22) converts a plurality of the detected signals obtained on the basis of the switching of the detectors into two-dimensional image signals and evaluates the qualities of images of the two-dimensional image signals.

Abstract: An image processing apparatus which processes virtual slide image data to be displayed in an image display apparatus includes an image data obtaining unit which obtains image data obtained by capturing an image of a target object, and an image data generation unit which generates display image data corresponding to the image of the target object to be displayed in the image display apparatus in a display magnification corresponding to a predetermined field number of a microscope.

Abstract: Image data of a specimen is acquired by applying an image processing to imaging data obtained by imaging for the specimen by means of an imaging device while controlling an exposure amount. First image data is generated by using the exposure amount and a parameter of the image processing to be determined while permitting provision of different values for each of distinct pieces of the first image data on condition that pixel values of pixels corresponding to portions of the specimen having an identical transmittance have an identical value in relation to all pieces of the first image data to be generated. Second image data is generated by using the exposure amount and a parameter of the image processing to be adaptively determined on the basis of a feature of the specimen. Display screen data, which includes at least the first image data, is generated.

Abstract: The present technology provides methods, systems, and apparatuses to achieve high throughput and high speed acquisition of partial wave spectroscopic (PWS) microscopic images. In particular, provided herein are high-throughput, automated partial wave spectroscopy (HT/A-PWS) instruments and systems capable of rapid acquisition of PWS Microscopic images and clinical, diagnostic, and research applications thereof.

Abstract: Inspection apparatus includes an imaging module, which is configured to capture images of defects at different, respective locations on a sample. A processor is coupled to process the images so as to automatically assign respective classifications to the defects, and to autonomously control the imaging module to continue capturing the images responsively to the assigned classifications.

Abstract: The present invention provides an intuitive and easy-to-operate graphical user interface environment for charged-particle microscopes. By restricting the operation items of charged-particle microscopes to the control button operations on GUI screen, excluding the charged-particle microscope specific technical terms, and unifying the observation conditions in the simple terminology with which the observation object can be intuitively understood, the operation environment which is intuitive and easy to understand for users not caring charged-particle microscopes is realized, and by restricting each of electron optical conditions in conjunction with the change of the observation condition to the fixed values and tabling them, it is possible to omit the operation workload of the user.

Abstract: The image processing device has: a scanning direction decision unit which divides an captured image into a plurality of scanning regions and deciding a scanning direction of each scanning region based on a pattern edge captured in each scanning region in the captured image, a scanning order decision unit which performs a raster scan per pixel constituting each scanning region such that the scanning direction of each of the decided scanning region is directed to a horizontal direction of the raster scan, and a scanning image acquisition unit which acquires a scanning image by capturing each scanning region by the scanning-electron-microscope based on the decided scanning order.

Abstract: Various aspects of the present invention are generally directed to systems and methods for imaging at high spatial and/or temporal resolutions. In one aspect, the present invention is generally directed to an optical microscopy system and related methods adapted for high spatial and temporal resolution of dynamic processes. The system may be used in conjunction with fluorescence imaging wherein the fluorescence may be mediated by voltage-indicating proteins. In some cases, time resolutions may be enhanced by fitting predefined temporal waveforms to signal values received from an image. The system may also contain a high numerical aperture objective lens and a zoom lens located in an imaging optical path to an object region. Other aspects of the present invention are generally directed to techniques of making or using such systems, kits involving such systems, manufactured storage devices able to implement such systems or methods, and the like.

Abstract: The purpose of the present invention is to provide an image forming device and the like that is capable of forming a proper integrated signal even when an image or a signal waveform is acquired from a pattern having the possibility of preventing proper matching, such as a repetition pattern, a shrinking pattern, and the like. In order to achieve the purpose, there is proposed an image forming device that forms an integrated image by integrating a plurality of image signals and that is provided with: a matching processing section that performs a matching process between the plurality of image signals; an image integration section that integrates the plurality of image signals for which positioning has been performed by the matching processing section; and a periodicity determination section that determines a periodicity of a pattern contained in the image signals.

Abstract: A method for measuring overlay at a semiconductor device on which circuit patterns are formed by a plurality of exposure processes is characterized in including an image capturing step for capturing images of a plurality of areas of the semiconductor device, a reference image setting step for setting a reference image based on a plurality of the images captured in the image capturing step, a difference quantifying step for quantifying a difference between the reference image set in the reference image setting step and the plurality of images captured in the image capturing step, and an overlay calculating step for calculating the overlay based on the difference quantified in the difference quantifying step.

Abstract: In an image capturing and processing system, a device and method is provided. The lens is made of simple lens with high diffractive materials and known strong color aberrations. The method includes the steps of: calibrating or measuring a Point Spread Function (PSF) for each color components at a set of distances, capturing image data, and calculating the image obtained using a de-convolution method based on the PSF found.