Abstract: A miniature inspection system for observing an object. The system comprises a camera (4) defining an optical axis (8) defined between the camera (4) and the object when located at the object inspection location. A ring light (14) is located concentrically with respect to and along the optical axis at a location between an entrance aperture of the camera (4) and the object, when located at the object observing location. A field lens (10) is located along the optical axis at a location between the camera (4) and the object, when placed at the object observing location. A mirror or a penta-prism (34) may be located along the optical axis, between the camera (4) and the field lens, so that light reflected from the object along the optical axis is reflected by either the mirror or the penta-prism (34) toward the entrance aperture of the camera (4). An illumination source (50), may be also provided to supply illumination along the optical axis of the system.

Abstract: A workpiece is transported by a feeder to a sloping block. As the workpieces pass along a sloping portion of the sloping block, their attitudes are corrected so that all workpieces have the same attitude. They are then discharged into a free space, and images are picked up by CCD cameras of the four side surfaces of each workpiece as it is falling through the space along a downward curve. Images of the top surface and bottom surface of each falling workpiece are also picked up by CCD cameras positioned away from the downward curve of the workpiece.

Abstract: A screw auto-detection and selection device comprises a rotary machine table; a light source generating unit; a recording control unit; a camera detecting unit; and a time scale cam unit. The feature of device is that the camera detecting unit includes a press means, an ejecting- means and a second camera detector. The press means has a press arm extending above the notch of the dispatching disk and an elastic press installed at a predetermined position of the press arm. An ejecting means has an ejecting pin and a movement limiting unit for ejecting a screw pressed by the press arm so that tie screw is aligned to a radiating hole of the light source generating unit.

Abstract: A method and apparatus are provided for identifying differences between a stored pattern and a matching image subset, where variations in pattern position, orientation, and size do not give rise to false differences. The invention is also a system for analyzing an object image with respect to a model pattern so as to detect flaws in the object image. The system includes extracting pattern features from the model pattern; generating a vector-valued function using the pattern features to provide a pattern field; extracting image features from the object image; evaluating each image feature, using the pattern field and an n-dimensional transformation that associates image features with pattern features, so as to determine at least one associated feature characteristic; and using at least one feature characteristic to identify at least one flaw in the object image. The invention can find at least two distinct kinds of flaws: missing features, and extra features.

Abstract: A method and apparatus is provided which analyzes an image of an object to detect and identify defects in the object utilizing multi-dimensional wavelet neural networks. “The present invention generates a signal representing part of the object, then extracts certain features of the signal. These features are then provided to a multidimensional neural network for classification, which indicates if the features correlate with a predetermined pattern. This process of analyzing the features to detect and identify predetermined patterns results in a robust fault detection and identification system which is computationally efficient and economical because of the learning element contained therein which lessens the need for human assistance.

Abstract: The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.

Abstract: An inspection system which includes a memory for storing image data provided by picking up an image of a workpiece, a monitor for displaying the image data stored in the memory on a display screen with pixels arranged in an X-axis direction and a Y-axis direction perpendicular to the X-axis direction, a control panel for setting a window with four sides along the X- or Y-axis direction on the display screen, and an edge detection section for integrating the lightness values of the pixels with respect to each pixel string arranged in the Y- or X-axis direction in the setup window, and detecting as an edge the position in the X- or Y-axis direction corresponding to the maximum value of the portion where the absolute value of the differential operation result in the X- or Y-axis direction, of the integration result is equal to or greater than a threshold value.

Abstract: A system for inspecting signals of the circuits on a panel is disclosed. The system comprises a moveable stage with a transparent work area for holding the panel to be tested; a probe for contacting the panel; a tester for receiving a signal via the probe; an image sensing device disposed in an opposite side to the probe with respect to the stage; and image display device coupled to the image sensing device. The image display device includes a screen having a cross mark. When the system is operating, the probe is aligned with the image sensing device such that the captured image of the probe is displayed on the center of the cross. Furthermore, the present invention also relates to a method for inspecting the signals of the circuits on the panel by the system.

Abstract: An apparatus and method of detecting defects or abnormalities in a wet polymeric surface coating of an object to limit or eliminate costs associated with retouching or reapplying the coatings on the object. The apparatus and method is accomplished by capturing an image of the wet coating surface of the object and comparing the image to known defect images to determine the type and location of the defect in the coating surface on the object. The coating application process can then be modified to remedy the coating application defect at the earliest possible instance.

Abstract: A reusable circuit design for use with electronic design automation EDA tools in designing integrated circuits is disclosed, as well as reticle inspection and fabrication methods that are based on such reusable circuit design. The reusable circuit design is stored on a computer readable medium and contains an electronic representation of a layout pattern for at least one layer of the circuit design on an integrated circuit. The layout pattern includes a flagged critical region which corresponds to a critical region on a reticle or integrated circuit that is susceptible to special inspection or fabrication procedures. In one aspect of the reusable circuit design, the special analysis is performed during one from a group consisting of reticle inspection, reticle production, integrated circuit fabrication, and fabricated integrated circuit inspection.

Abstract: An evolutionary algorithm evolves alternative architectures and parameters for an image classification system. In a preferred embodiment, a learning system is employed, and during the training period of the learning system, the architecture of the learning system is evolved so as to create a learning system that is well suited to the particular classification problem set. In like manner, other parameters of the image classification system are evolved by the evolutionary algorithm, including those that effect image characterization, learning, and classification. An initial set of parameters and architectures are used to create a set of trial classification systems. A number of pre-classified evaluation images are then applied to each system, and each system's resultant classifications for each test case is compared to the proper classification of each test case. Subsequent trial classification systems are evolved based upon the parameters and architecture of the better performing classification systems.

Abstract: A system and method for using electronically acquired imagery from a one-dimensional camera, to inspect an object for tolerance, color, blemishes, cracks or a wide variety of manufacturing defects that might be present in an object. The method used to detect manufacturing defects includes an algorithm for analyzing the pattern of annular elements in an array and detecting deviations from numerical acceptance norms, such as diameter, spacing, and symmetry, for the annular elements. In the inventive system, a one-dimensional video camera captures a single one-dimensional “slice” of target shape of an object with every line it scans. Each slice is broken down into “segments” consisting of sets of adjacent pixels that are similar in brightness, hue, or both. The one-dimensional camera delivers the segments to the system where they are sequenced. The system identifies every segment to determine what feature of the target shape the segment represents.

Abstract: A Time Delayed Integrator (TDI) sensor obtains images of a plurality of areas with the same pattern of an object of inspection such as a semiconductor wafer, and the obtained images are stored in an image storage part. The plurality of areas are designated in airs, and an image comparison part compares the images of the areas in each pair to detect a suspected pair including at least one possible defective area. A central processing unit (CPU) compares the images of the areas in the suspected pair with images of areas in other pairs to thereby find which area in the suspected pair is defective.

Abstract: A semiconductor device lead inspection apparatus and method are provided for capturing images of the semiconductor edges and leads along two optical axes which have different directions in a plane perpendicular to the semiconductor device edge. A first image is reflected off an optical surface of a prism to a direction corresponding to the camera optical axis. A second image is reflected by two optical surfaces of the prism to a direction corresponding to the camera optical axis.

Abstract: A device is provided which detects image patterns which may cause photosensitive attacks, based on the contrast intensity and values of frequency bands having a peak value. A frame image constituting video is image analyzed for contrast intensity and spatial frequency, in the contrast detector and the peak seeker respectively.

Abstract: A technique is described for detecting defects such as short circuits in a device such as a discrete pixel detector used in a digital x-ray system. The technique employs test circuits associated with each row driver of the detector. The test circuits are enabled by a test enable signal, and the row driver sequentially enables the rows of the detector, along with the individual test circuits. In a test sequence, output signals from the row test circuits are monitored to identify whether a defect, such as a short circuit, is likely to exist in the row or row driver. The test circuitry adds only minimal area and complexity to the row driver function, providing a high degree of test coverage at a low cost, with minimal likelihood of test circuitry-induced failures.

Abstract: A printing quality examining apparatus in which image data printing paper is successively taken in by a camera of a detection unit. The image data are compared with a previously taken-in reference data to detect a printing defect so that a decision as to whether printing quality is good or bad is made. The image data is averaged in time to calculate an estimated data, and the estimated data is compared with the previously taken-in reference data. When the estimated data is normal, pixels are determined to be normal. When the estimated data is unusual, the image data from the detection unit is compared with the reference data at next step so that when the image data from the detection is normal, the pixels are determined to be normal and when the image data is unusual, the pixels are determined to be defective and the paper is discharged.

Abstract: A digital non-contact blade position detection apparatus is provided for use on a wafer dicing machine for blade position detection so as to correct the position of the cutting blade.

Abstract: The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.

Abstract: An image recording system includes first imaging means for imaging operations of manufacturing equipment in a production line, second imaging means arranged downstream from the manufacturing equipment for imaging articles processed by the manufacturing equipment, inspection means for inspecting the processed articles based on image data outputted from the second imaging means, and an image recording apparatus for acquiring data outputted from the first imaging means and the inspection means, wherein the image recording apparatus is equipped with a temporary storage portion for temporarily storing image data from the imaging means, storage means, and control means for reading out any desired interval from the image data stored a prescribed time interval portion in the past in the temporary storage portion and storing such read out interval when a signal based on inspection results outputted from the inspection means is received.

Abstract: An inspection system and method uses a first illumination apparatus, such as a ring illumination apparatus to illuminate one or more reflective elements, such as solder balls on an electronic component or other protruding surfaces or objects. The ring illumination apparatus includes a substantially ring-shaped light source that provides a substantially even illumination across the one or more reflective elements. An illumination detection device detects light beams reflecting off of the illuminated reflective elements for forming a first captured image. The system and method then uses a second, different illumination apparatus, such as an on-axis illumination apparatus to illuminate the reflective elements. The second illumination apparatus is selected so as to illuminate unwanted reflective elements substantially the same as they are illuminated by the first illumination apparatus while illuminating the desired reflective elements differently.

Abstract: The present invention provides a method and apparatus for detecting defects in a display. The apparatus of the present invention comprises a camera for capturing an image of a display being inspected and processing circuitry, such as, for example, a microprocessor or a digital signal processor (DSP), for processing the captured image to determine whether or not the display being inspected is defective. Preferably, the processing circuitry is a microprocessor running image processing software which controls data acquisition as well as the processing of the acquired data to determine whether the display being inspected is defective. In accordance with the present invention, a relatively high resolution display can be inspected using a single camera, preferably a charge-coupled device (CCD) camera, which has a lower resolution than the display being inspected. The camera is focused on the display such that the entire display is within the field of view of the camera.

Abstract: A system for inspecting a display panel including a plurality of pixels, the system including a selective pixel actuator which causes only some of the plurality of pixels to be actuated, a sensor for acquiring an image of a pattern which is generated on the panel, and an image processor operative to identify nonuniformities in the intensities of pixels of the panel.

Abstract: A method for the automatic detection of surface defects for continuously cast products (2) with continuous mechanical removal of the material, which products are separated into part lengths while still in the hot state and are introduced before the final rolling in a rolling train to a material removing machine (1), in particular to a grinding machine, in which the material of the continuously cast product (2) is removed as a function of the defective areas determined by a defect localising equipment (6; 7) more or less intensively from the surface(s) to be machined, which method provides that the surface defect (12a, 12b) is introduced by the defect localising equipment (6; 7) as pictorial information to a picture processing processor (11) and read in by a computer (13), comprising an integrated comparison and evaluation module (15) and connected superposed to the machine control (17), in which computer the transmitted digital pictorial information is compared in a sample recognition process with stored pict

Abstract: A miniature inspection system for observing an object. The system comprises a camera defining an optical axis defined between the camera and the object when located at an inspection location. A ring light is located concentrically with respect to and along the optical axis at a location between an entrance aperture of the camera and the inspection location. A field lens is located along the optical axis at a location between the camera and the ring lights. A mirror or a penta-prism may be located along the optical axis, between the camera and the field lens, so that light reflected from the object along the optical axis is reflected by either the mirror or the penta-prism toward the entrance aperture of the camera. An illumination source, may be also provided to supply illumination along the optical axis of the system.

Abstract: A printed circuit board inspection apparatus having upper and lower jigs with the former moveable horizontally and the latter movable vertically and with a camera mounted on the former. Reference holes are provided on the upper jig and on a positioning plate mounted on the lower jig and, in accordance with the method of the invention, photographs are taken of the reference marks simultaneously with the positioning plate engaging the upper jig. Reference mark alignment is calculated from the photographs and the upper jig is moved horizontally to correct misalignment.

Abstract: A video timing generator provides control and timing signals for a variety of different camera types by employing a circular buffer scanned rapidly before the occurrence of each potential control and timing signal. The circular buffer holds operation codes for generating the control and timing signal linked to target event signal times. An operation code having a target event signal time matching with the next event time is decoded and queued to be executed at that event time.

Abstract: A method and apparatus for inspecting solder joints are provided. A method for inspecting test solder joints includes the steps of illuminating the test solder joints on a printed circuit board to obtain sample images of the test solder joints by grabbing reflected light with a charge coupled device (CCD) camera, classifying the sample images by an inspector into a number of classes according to the soldering quality, inputting a specific sample image belonging to each class to a neural network to divide the class into a predetermined number of clusters; determining a synaptic weight of each class by learning each cluster, determining a confirmed synaptic weight by adjusting the synaptic weight according to a boundary condition between the clusters belonging to neighboring different classes, and selecting a similar cluster by comparing the similarities between the outputs of the neural network with respect to the test solder joints based on confirmed synaptic weights, and each output of the inspector's class.

Abstract: A non-contact gaging method and apparatus using a directional light beam develops a silhouette image on a CCD camera detector array; the image spanning opposite edges of an object to be gauged. The three dimensional object is imaged on the two dimensional camera array and, by means of computer analysis of pixels output from the camera, precise measurements to MIL Standards of physical dimensions are made at high rates for high volume production.Errors inherent in Prior Art devices are eliminated by only using a point source of light and eliminating the need for any additional optics. The system overcomes dimensional error by continuously gauging the high precision etched mark on the camera faceplate.

Abstract: Disclosed is an appearance inspecting device for a solid formulation, including a supply section for continuously supplying solid formulations such as capsules; an inspecting drum for holding on its outer peripheral portion the solid formulations supplied from the supply section, carrying the solid formulations in such a manner as to allow the solid formulations to be intermittently revolved, and allowing the solid formulations to be rotated on their axes at a specific carrying position; an image pickup device for photographing surfaces of the solid formulations being thus rotated on their axes; a quality determining section for processing images of the solid formulations thus picked up from the image pickup device and determining whether the solid formulations are nondefective or defective; and a classifying section for classifying the solid formulations into defective and nondefective solid formulations on the result determined by the quality determining section and recovering the defective and nondefective

Abstract: A method and apparatus for inspecting the surface of an object such as a semiconductor wafer for contaminant particles. The apparatus includes a light source for illuminating an area on the surface of the object. A camera is positioned above the surface of the object and detects light scattered by any particles present on the surface at that area, the camera detecting light scattered from the area over a field of view, or window, which is defined by the camera, a focusing lens and the relative distance therebetween. A computer is coupled to the camera and serves to store, process, identify and/or analyze the light detected by the camera. The computer also serves to calculate a minimum light intensity threshold level which is dynamic to compensate for variances in the background light intensity of different portions of the object. The value of the threshold level is calculated for each window of the object defined by the apparatus using the equation: T.sub.W =.mu..sub.W +.eta.-.delta..sub.W, where T.sub.

Abstract: Automated packaging of surgical needle-suture assemblies includes a framing operation in which adjacent sheets of polymer coated aluminum foils are conveyed through a sequence of steps in an apparatus which produces frames containing plastic packets of needle-suture assemblies. A vision system having video cameras connected to a specially adapted computer enables monitoring the product traveling through the framing operation to detect various defects in the foil and in the product formation. Upon detection of a defect, the computer system can either identify and separate rejected product from good product or shut down the apparatus.

Abstract: A printing quality examining method in which image data printing paper is successively taken in by a camera of a detection unit. The image data are compared with a previously taken-in reference data to detect a printing defect so that a decision as to whether printing quality is good or bad is made. The image data is averaged in time to calculate an estimated data, and the estimated data is compared with the previously taken-in reference data. When the estimated data is normal, pixels are determined to be normal. When the estimated data is unusual, the image data from the detection unit is compared with the reference data at next step so that when the image data from the detection is normal, the pixels are determined to be normal and when the image data is unusual, the pixels are determined to be defective and the paper is discharged.

Abstract: The present invention relates to an apparatus and method for the automated inspection of objects for the presence of visual anomalies. The apparatus includes a first wide angle camera for acquiring an image of the object, a processor for detecting targets and generating target location from the image of the object, a two axis post-objective scanner associated with a high resolution camera for directing target image to the high resolution camera. The scanner provides a mechanism for saccadic emulation in combination with a high resolution video camera, which can be synchronized to the frame rate of the video camera for rapid high resolution examination of an object.

Abstract: A continuous edge of a strip of material is processed as it moves in a direction along the length of the strip. The condition of the continuous edge of the moving strip is inspected after it has been processed. The strip is cut into pieces. And the pieces are sorted into groups in response to the condition of the edge. The edge is continuously monitored by a pair of parallel, closely spaced laser beams. A visualization system includes a camera, a monitor, and a storage systems. The camera images an edge of the moving strip of material. The monitor, coupled to the camera, displays images captured by the camera. The storage system, coupled to the camera and the monitor, stores images captured by the camera. The monitor is capable of displaying the stored images.

Abstract: A lamp arc observing apparatus includes a lens unit installed in the path of light emitted from a lamp, a camera for viewing the image of the electrodes of the lamp through the lens unit, and a light intensity controlling device installed between the lens unit and the camera for controlling the intensity of light incident on the camera so that the camera can capture the image of the electrodes of the lamp.

Abstract: Apparatus and method are described for measuring and controlling the crimp characteristics of a moving crimped tow. A light source illuminates a section of the moving crimped tow and at least one camera acquires a video image of the tow. The acquired image is digitized and a processor decomposes the interlaced image into two non-interlaced field images. Crimp characteristics are derived based on the decomposed images.

Abstract: A flaw detection apparatus detects a flaw formed on an object's surface based on a digital image data indicative of said object's surface as regions which are groups of plural pixels utilizing the image processing technique. An image processor is provided for detecting an extending direction in which each region extends based on a contour line of each region, so that regions extending in the same direction are clustered as one region. The image processor further produces a flaw signal indicating sizes of thus clustered regions.

Abstract: The present invention relates to a method and apparatus for observing, before and after fusion-splicing of optical fibers such as ribbon fibers each including a plurality of optical fibers in particular, the butting state of the tip portion of each of fiber ribbons in a wide range with a high accuracy. In the observation method in accordance with the present invention, while the optical fibers to be fusion-spliced together are disposed on a predetermined reference surface such that their end faces butt each other, at least a pair of cameras are independently or synchronously moved along a direction perpendicular to the longitudinal direction of the optical fibers so as to change the shooting areas of the respective cameras, thereby realizing the collective observation or local observation of the observation area. The observation apparatus in accordance with the present invention comprises a driving system for moving the pair of cameras along a predetermined direction.

Abstract: A method of detecting and measuring voids in insulation material includes: providing a sample of insulation material; providing an imaging system for generating an image of the sample of the insulation material; analyzing the image to detect the presence of voids therein; and measuring the voids present in the sample to determine their size and density. Preferably, a nondestructive imaging system is utilized to detect and measure the voids.

Abstract: A method and system are described for use at a machine vision station to correctly identify errors within a sample image of an object by means of a probability image where a value of each pixel of the probability image is a probability. The probability image is created from a mean template image and a standard deviation image, both of which are created from a plurality of reference images of the object. The probability image is processed to detect the errors in the sample image independent of the values of the pixels which make up the sample image. Two different techniques are described for creating the probability image utilizing mean template, sample and standard deviation pixel values.

Abstract: A display screen inspection method according to the present invention takes a display screen of a display device as an inspection subject and makes decisions on defects of the display screen. The method includes performing a separation between display operating portions and display non-operating portions of the inspection subject present in a gray image from image data of individual pixels of the gray image obtained by picking up an image of the inspection subject, selectively extracting image data of only proper display operating portions and compressing the image data to be inspected for defects, and inspecting the selectively extracted image data for any defects.

Abstract: An automated system and associated method of counting pillings in textile fabrics. Images of consecutive sections of a fabric sample are captured by a CCD camera. A system processor then processes the images to enhance image quality. Pillings on the processed, captured fabric sample images are counted, and the resulting data is fuzzified to determine the membership of the data in one or more of a plurality of fabric classes. The present invention provides an objective rating system and method with repeatable accuracy for fabric samples that eliminates the inherent subjectivity associated with conventional manual visual fabric inspection methods.

Abstract: The present invention relates to a device that measures and counts near surface bubbles on a copper bar, as well as the cracks on the lateral sides. The device detects said flaws in real time. The device is based on the image digitalization technique. The device consists of a personal computer, a video camera, a digitalization card, water and air sprinklers, external monitor and camera frame. The input of the images is performed with the video camera protected within the frame. The object of the water and air sprinklers is to make the bar flaws more visible. The external monitor allows to focus the area of interest and the digitalizing card within the computer, following the instructions of the program, performs the image analysis.

Abstract: A pair of cameras are mounted on a base member for monitoring an electronic equipment on a printed circuit board. A pair of first mirrors are provided for reflecting light from the electronic equipment in a first reflection direction which corresponds to an X-axis on the electronic equipment, and a pair of second mirrors are mounted for reflecting the light reflected on the first mirrors in a second reflection direction which is different from the first reflection direction and corresponds to a Y-axis. The base member is moved in two directions corresponding to the X- and Y-axis.

Abstract: A camera system utilizes a line scan (linear array) camera designed to scan a moving surface and subsequently to generate and to transmit a high quality digitized video signal over a long a distance by an optical fiber. The primary function of the system is: to scan a moving surface using a 2048 or a 1024 linear array; to condition and digitize the array analog video signal; and subsequently to transmit to a computer processing unit, without a noticeable loss in fidelity, the digitized video data over a long distance by means of an optical fiber connected to the camera and the computer processing unit. The system also functions to transmit both video signals and non-video information signals over a fiber optic link from the camera to the computer processing unit.

Abstract: A high speed method and apparatus for accepting and rejecting an object by identifying specific surface features of interest of an object includes providing at least one non-contact sensor capable of measuring a characteristic of a surface and a transporter system for creating relative motion between the sensor and an object while repetitively making measurements of a surface of the object with multiple readings being taken with the sensor at each of multiple locations in order to create a data set. A data analysis system mathematically processes the surface characteristic data and positional data into surface feature data which represents three-dimensional surface features of the object.

Abstract: The Invention includes a method and apparatus which analyzes an image of an object to detect and identify defects in the object. The present invention utilizes a scanning technique which converts a 2-D image of the object into a 1-D image, a transformation technique which extracts relevant features from the image, and a fuzzy inferencing technique which utilizes the features generated by the transformation technique to detect and identify defects. The present invention preferably includes an off-line learning process which selects the optimum transform coefficients for a given set of defects and stores the corresponding features in a rulebase. Preferably, the wavelet transform is used as the transformation technique to provide an analysis of the image which is localized in the frequency and time domains. The present invention may also include an on-line learning process when the present invention is incorporated into a manufacturing process for real time inspection of the object being manufactured.

Abstract: A system for inspecting a display panel including a plurality of pixels, the system including a selective pixel actuator which causes only some of the plurality of pixels to be actuated, a sensor for acquiring an image of a pattern which is generated on the panel, and an image processor operative to identify nonuniformities in the intensities of pixels of the panel.

Abstract: A visual inspection system for a product can test various kinds of liquid crystal displays by changing only the data in a video system for automatically testing a liquid crystal display panel, and comprises a data input block operated by a control signal or data inputted by the tester; a signal processor for inputting the data required for a control program and an operation from the data input block, and for testing a product; and an image sensor for inputting a video image, of a photograph of a product to be tested, to the signal processor.